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2008 IEEE Southwest Symposium on Image Analysis and Interpretation
Santa Fe, NM, USA
March 24-March 26
ISBN: 978-1-4244-2296-8
Table of Contents
Papers
Hsiao-Chiang Chuang, School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana, chuangh@purdue.edu
Mary L. Comer, School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana, comerm@purdue.edu
Jeff P. Simmons, AFRL/MLLMD, Wright Patterson AFB, Dayton, Ohio
pp. 1-4
Nick A. Mould, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 USA
Chuong T. Nguyen, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 USA
Joseph P. Havlicek, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 USA
pp. 5-8
Arjuna Flenner, Naval Air Weapons Center, Physics and Computational Sciences, China Lake, CA, USA, arjuna.flenner@navy.mil
pp. 9-12
Peter C. Tay, Dept. of Engineering and Technology, Western Carolina University, Cullowhee, NC 28723, ptay@email.wcu.edu
pp. 13-16
Victor Murray, The University of New Mexico, Department of Electrical and Computer Engineering, Albuquerque, N.M. 87131, U.S.A., Email: vmurray@ieee.org
Marios S. Pattichis, The University of New Mexico, Department of Electrical and Computer Engineering, Albuquerque, N.M. 87131, U.S.A., Email: pattichis@ece.unm.edu
pp. 17-20
Scott T. Acton, C. L. Brown Dept. of Electrical&Computer Engineering, University of Virginia, Charlottesville, VA, USA, acton@virginia.edu
Adam Rossi, Platinum Solutions, Reston, VA, USA, adam.rossi@platinumsolutions.com
pp. 21-24
Sina Jahanbin, Department of Electrical and Computer Engineering, The University of Texas at Austin, USA, jahanbin@ece.utexas.edu
Alan C. Bovik, Department of Electrical and Computer Engineering, The University of Texas at Austin, USA, bovik@ece.utexas.edu
Hyohoon Choi, Computer Vision Research Laboratory, Sealed Air Corp., San Jose, USA, hyohoon@alumni.utexas.net
pp. 25-28
Kuang-Man Huang, Electrical and Computer Engineering, University of California at San Diego, La Jolla, CA, 92093-0407, USA
Pamela Cosman, Electrical and Computer Engineering, University of California at San Diego, La Jolla, CA, 92093-0407, USA
William R. Schafer, Cell Biology Division, MRC Laboratory of Molecular Biology, Cambridge, CB2 0QH, UK
pp. 29-32
James Monaco, The University of Texas at Austin, Department of Electrical and Computer Engineering, Austin, TX 78712-1084 USA, monaco@ece.utexas.edu
Alan C. Bovik, The University of Texas at Austin, Department of Electrical and Computer Engineering, Austin, TX 78712-1084 USA, bovik@ece.utexas.edu
Lawrence K. Cormack, The University of Texas at Austin, Department of Psychology, Austin, TX 78712-0187 USA
pp. 33-36
San-Fan Lan, Institute of Electrical Engineering, National Tsing Hua University, HsinChu, Taiwan, R.O.C.
Meng-Fen Ho, Institute of Electrical Engineering, National Tsing Hua University, HsinChu, Taiwan, R.O.C.; Dept. of Electronic Engineering, Hsiuping Institute of Technology, Taichung, Taiwan, R.
Chung-Lin Huang, Institute of Electrical Engineering, National Tsing Hua University, HsinChu, Taiwan, R.O.C.; Dept. of Informatics, Fo-Guang university, I-Lan, Taiwan, ROC, e-mail: clhuang@ee.nthu.
pp. 37-40
Randy C. Hoover, Dept. of Electrical and Computer Eng., Colorado State University, Fort Collins, CO 80523-1373, USA, Email: hooverr@colostate.edu
Anthony A. Maciejewski, Dept. of Electrical and Computer Eng., Colorado State University, Fort Collins, CO 80523-1373, USA, Email: aam@colostate.edu
Rodney G. Roberts, Dept. of Electrical and Computer Eng., Florida A&M - Florida State University, Tallahassee, FL 32310-6046, USA, Email: rroberts@eng.fsu.edu
pp. 41-44
Shape (Abstract)
Nikolay Metodiev Sirakov, Dept of Mathematics, Dept of Computer Science, Texas A&M University-Commerce, Commerce, TX 75429, Email: Nikolay_Sirakov@tamu-commerce.edu
pp. 45-48
Yasuyuki Shimohata, Graduate School of Information Science and Technology, The University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo 113-8654, JAPAN, simohata@isi.imi.i.u-tokyo.ac.jp
Nobuyuki Otsu, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, JAPAN, otsu.n@aist.go.jp
pp. 49-52
Thomas Arnow, Laboratory for Image and Video Engineering (LIVE), Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX 78712-1084, USA
Alan C. Bovik, Laboratory for Image and Video Engineering (LIVE), Department of Electrical and Computer Engineering, The University of Texas at Austin, Austin, TX 78712-1084, USA, Email: bovik@ec
pp. 53-56
Christian Lipski, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, lipski@cg.tu-bs.de
Bjorn Scholz, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, scholz@cg.tu-bs.de
Kai Berger, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, berger@cg.tu-bs.de
Christian Linz, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, linz@cg.tu-bs.de
Timo Stich, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, stich@cg.tu-bs.de
Marcus Magnor, Computer Graphics Lab, TU Braunschweig, Mühlenpfordtstrasse 23, 38106 Braunschweig, Germany, magnor@cg.tu-bs.de
pp. 57-60
Rogers F. Silva, Electrical and Computer Engineering, University of New Mexico, Medical Imaging Analysis Laboratory, MIND Research Network, Albuquerque, NM 87131, USA, rogers@ece.unm.edu
Vince D. Calhoun, Electrical and Computer Engineering, University of New Mexico, Medical Imaging Analysis Laboratory, MIND Research Network, Albuquerque, NM 87131, USA, vcalhoun@unm.edu
pp. 61-64
P. Soliz, VisionQuest Biomedical; University of Iowa Department of Ophthalmology and Vision Sciences, bert@visionquest-bio.com
S.R. Russell, University of Iowa Department of Ophthalmology and Vision Sciences
M.D. Abramoff, University of Iowa Department of Ophthalmology and Vision Sciences
S. Murillo, University of New Mexico, Department of Electrical and Computer Engineering
M. Pattichis, University of New Mexico, Department of Electrical and Computer Engineering
H. Davis, VisionQuest Biomedical
pp. 65-68
Vamsi K. Potluru, MIND Research Network, Dept. of Comp Science, Univ of New Mexico, ismav@cs.unm.edu
Sergey M. Plis, Dept. of Comp Science, Univ of NewMexico, pliz@cs.unm.edu
Vince D. Calhoun, MIND Research Network, Dept. of Elec and Comp Engg, Univ of New Mexico, vcalhoun@unm.edu
pp. 69-72
C. T. Vu, Image Coding and Analysis Lab, School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, cuong.vu@okstate.edu
E. C. Larson, Image Coding and Analysis Lab, School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, ericcl@okstate.edu
D. M. Chandler, Image Coding and Analysis Lab, School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, damon.chandler@okstate.edu
pp. 73-76
Chuong T. Nguyen, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK, USA
Roy A. Sivley, BAE Systems, Burlington, MA, USA
Joseph P. Havlicek, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK, USA
pp. 77-80
Jason Fritz, Colorado State University, Vexcel Corp., a Microsoft Company, jpfritz@ieee.org
Mark Tabb, Microsoft Corp., 1680 38th St., Boulder, CO 80301
V. Chandrasekar, Colorado State University, Elec.&Comp. Eng. Dept., Fort Collins, CO 80523-1373
pp. 81-84
Johannes Brauers, RWTH Aachen University, Institute of Imaging&Computer Vision, D-52056 Aachen, Germany, email: jb@lfb.rwth-aachen.de
Til Aach, RWTH Aachen University, Institute of Imaging&Computer Vision, D-52056 Aachen, Germany, email: ta@lfb.rwth-aachen.de
pp. 85-88
Youzuo Lin, Department of Mathematics and Statistics, Arizona State University, Tempe, AZ 85287 USA. Email: youzuo.lin@asu.edu, Tel: (+1 480) 727 8537
Brendt Wohlberg, T-7 Mathematical Modeling and Analysis, Los Alamos National Laboratory, Los Alamos, NM 87545, USA. Email: brendt@t7.lanl.gov, Tel: (+1 505) 667 6886, Fax: (+1 505) 665 5757
pp. 89-92
Charles D. Creusere, New Mexico State University, Las Cruces, NM, Email: ccreuser@nmsu.edu
Ivan Mecimore, New Mexico State University, Las Cruces, NM, Email: imecimore@gmail.com
pp. 93-96
Insu Park, School of Computational Engineering and Science, McMaster University
David W. Capson, School of Computational Engineering and Science, McMaster University
pp. 97-100
Sungmin Kim, Department of Computer Engineering, Pusan National University, morethannow@pusan.ac.kr
Takgi Lee, Department of Computer Engineering, Pusan National University, zero@pusan.ac.kr
Kodong Chung, Department of Computer Engineering, Pusan National University, kdchung@pusan.ac.kr
pp. 101-104
Rohit Nayak, School of Engineering, San Francisco State University, rohit@sfsu.edu
Ying Chen, School of Engineering, San Francisco State University, yingchen@sfsu.edu
pp. 105-108
Jie Zhu-Jacquot, School of Electrical and Computer Engineering, Cornell University, Ithaca, NY 14853
pp. 109-112
S.J. Richerson, Biomedical Engineering Program, Milwaukee School of Engineering, Milwaukee Wisconisn, USA
A. P. Condurache, Institute for Signal Processing, University of Lübeck, Lübeck Germany
J.A. Lohmeyer, Plastic and Hand Surgery, Burn unit, University Hospital of Schleswig-Holstein, Campus Lübeck, Germany
K. Schultz, Biomedical Engineering Program, Milwaukee School of Engineering, Milwaukee Wisconisn, USA
P. Ganske, Biomedical Engineering Program, Milwaukee School of Engineering, Milwaukee Wisconisn, USA
pp. 113-116
Sunil Seepuri, Electrical&Computer Engr., University of Arizona Tucson, AZ, Sunils@email.arizona.edu
Jeffrey J. Rodriguez, Electrical&Computer Engr., University of Arizona, Tucson, AZ, Jrod@ece.arizona.edu
David A. Elliott, Cell Biology&Anatomy, University of Arizona, Tucson, AZ, Elliott@arizona.edu
pp. 117-120
Felix Renard, Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616
Yongyi Yang, Department of Electrical and Computer Engineering, Illinois Institute of Technology, Chicago, IL 60616
pp. 121-124
Andrew M. Michael, Center for Imaging Science, Rochester Ins. of Tech., Rochester, NY 14623; The MIND Research Network, Albuquerque, NM 87131, Andru4u@gmail.com
Jill F. Fries, The MIND Research Network, Albuquerque, NM 87131
Stefi A. Baum, Center for Imaging Science, Rochester Ins. of Tech., Rochester, NY 14623
Beng C. Ho, MHCRC, University of Iowa, Iowa City, IA 52242
Nancy C. Andreasen, MHCRC, University of Iowa, Iowa City, IA 52242
Vince D. Calhoun, Center for Imaging Science, Rochester Ins. of Tech., Rochester, NY 14623; Dept. of ECE, University of New Mexico, Albuquerque, NM 87131
pp. 125-128
Rana Jahanbin, The University of Texas Department of Biomedical Engineering, Austin, TX, USA, rana_jahanbin@mail.utexas.edu
Mehul P. Sampat, Center for Neurological Imaging, Brigham and Women¿s Hospital, Boston, MA, USA, mehul.sampat@ieee.org
Gautam S. Muralidhar, The University of Texas Department of Biomedical Engineering, Austin, TX, USA, gautam@mail.utexas.edu
Gary J. Whitman, The University of Texas M. D. Anderson Cancer Center, Houston, TX, USA
Alan C. Bovik, Department of Electrical and Computer Engineering, The University of Texas at Austin, TX, USA
Mia K. Markey, The University of Texas Department of Biomedical Engineering, Austin, TX, USA, mia.markey@mail.utexas.edu
pp. 129-132
Jian Ling, Southwest Research Institute, 6220 Culebra Road, San Antonio, Texas, 78238, jling@swri.org
Keith Bartels, Southwest Research Institute, 6220 Culebra Road, San Antonio, Texas, 78238, kbartels@swri.org
Daniel Nicolella, Southwest Research Institute, 6220 Culebra Road, San Antonio, Texas, 78238, dnicolella@swri.org
pp. 133-136
Srivani Pinneli, Image Coding and Analysis Lab, School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, srivanp@okstate.edu
Damon M. Chandler, Image Coding and Analysis Lab, School of Electrical and Computer Engineering, Oklahoma State University, Stillwater, OK 74078, damon.chandler@okstate.edu
pp. 137-140
Shoji Tominaga, Graduate School of Advanced Integration Science, Chiba University, shoji@faculty.chiba-u.jp
Tsuyashi Fukuda, Department of Engineering of Informatics, Osaka Electro-Communication University, tuyosi@tmlab.osakac.ac.jp
pp. 141-144
Enrique Corona, Department of Electrical and Computer Engineering, Texas Tech University, enrique.corona@ttu.edu
Brian Nutter, Department of Electrical and Computer Engineering, Texas Tech University, brian.nutter@ttu.edu
Sunanda Mitra, Department of Electrical and Computer Engineering, Texas Tech University, sunanda.mitra@ttu.edu
pp. 145-148
Bijan G. Mobasseri, Center for Advanced Communications, Villanova University, Villanova, PA 19085 USA, bijan.mobasseri@villanova.edu
Zachary Rosenbaum, Center for Advanced Communications, Villanova University, Villanova, PA 19085 USA, zachary.rosenbaum@villanova.edu
pp. 149-152
Vimal Thilak, Klipsch School of Electrical and Computer Engineering, New Mexico State University, P.O. Box 30001, MSC 3-O, Las Cruces, NM 88003, vimal@nmsu.edu
Charles D. Creusere, Klipsch School of Electrical and Computer Engineering, New Mexico State University, P.O. Box 30001, MSC 3-O, Las Cruces, NM 88003, ccreuser@nmsu.edu
David G. Voelz, Klipsch School of Electrical and Computer Engineering, New Mexico State University, P.O. Box 30001, MSC 3-O, Las Cruces, NM 88003, davvoelz@nmsu.edu
pp. 153-156
Randy C. Hoover, Dept. of Electrical and Computer Eng., Colorado State University, Fort Collins, CO 80523-1373, USA, Email: hooverr@colostate.edu
Anthony A. Maciejewski, Dept. of Electrical and Computer Eng., Colorado State University, Fort Collins, CO 80523-1373, USA, Email: aam@colostate.edu
Rodney G. Roberts, Dept. of Electrical and Computer Eng., Florida A&M - Florida State University, Tallahassee, FL 32310-6046, USA, Email: rroberts@eng.fsu.edu
pp. 157-160
Yi Wang, University of North Dakota, Department of Electrical Engineering, yi.wang@und.nodak.edu
Aldo Camargo, University of North Dakota, Department of Electrical Engineering
Ronald Fevig, University of North Dakota, Department of Electrical Engineering
Florent Martel, University of North Dakota, Department of Electrical Engineering
Richard. R. Schultz, University of North Dakota, Department of Electrical Engineering
pp. 161-164
James Theiler, Space and Remote Sensing Sciences, Los Alamos National Laboratory, Los Alamos, NM 87545, Email: jt@lanl.gov
pp. 165-168
Aria Pezeshk, Applied Research Lab, The Pennsylvania State University, axp934@psu.edu
Richard L. Tutwiler, Applied Research Lab, The Pennsylvania State University, rltl@psu.edu
pp. 173-176
M. Rahman, Dept. of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, E-mail: mtr062000@utdallas.edu
M. Gamadia, Dept. of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, E-mail: markg@utdallas.edu
N. Kehtarnavaz, Dept. of Electrical Engineering, University of Texas at Dallas, Richardson, TX 75080, E-mail: kehtar@utdallas.edu
pp. 177-180
Branislav Kisacanin, DSP R&D Center, Texas Instruments Inc., b.kisacanin@ieee.org
pp. 181-184
Mark Smith, Department of Electrical Engineering, Southern Methodist University, Dallas, Texas 75275
Alireza Khotanzad, Department of Electrical Engineering, Southern Methodist University, Dallas, Texas 75275
pp. 185-188
Hernan Badino, J. W. Goethe University, VSI Laboratory, Frankfurt am Main, Germany, hernan.badino@vsi.cs.uni-frankfurt.de
Rudolf Mester, J. W. Goethe University, VSI Laboratory, Frankfurt am Main, Germany, rudolf.mester@vsi.cs.uni-frankfurt.de
Tobi Vaudrey, The University of Auckland, Computer Science Department, Auckland, New Zealand, tvau003@ec.auckland.ac.nz
Uwe Franke, Environment Perception, Stuttgart, Germany, uwe.franke@daimler.com
AG Daimler, Environment Perception, Stuttgart, Germany
pp. 189-192
Hong Liu, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 USA, Email: liu.edu@ou.edu
Da Zhang, School of Electrical and Computer Engineering, University of Oklahoma, Norman, OK 73019 USA, Email: zhangda@ou.edu
Xizeng Wu, Department of Radiology, University of Alabama at Birmingham, Birmingham, AL 35233 USA, Email: xwu@uabmc.edu
pp. 193-196
Arunkumar Gururajan, Department of Electrical and Computer Engineering, Texas Tech University, arunkumar.gururajan@ttu.edu
Sridharan Kamalakannan, Department of Electrical and Computer Engineering, Texas Tech University
Muneem Shahriar, Department of Electrical and Computer Engineering, Texas Tech University
Hamed Sari-Sarraf, Department of Electrical and Computer Engineering, Texas Tech University
pp. 197-200
Eric K. T. Hui, University of Waterloo, Ontario, Canada
S.S. Mohamed, University of Waterloo, Ontario, Canada, E-mail smohamed@hivolt.uwaterloo.ca
M.M.A. Salama, University of Waterloo, Ontario, Canada
K. Rizkalla, University of Western Ontario, Ontario, Canada
pp. 205-208
Matineh Shaker, Control and Intelligent Processing Center of Excellence, Department of Electrical and Computer Engineering, University of Tehran, Tehran, Iran, m.shaker@ece.ut.ac.ir
Hamid Soltanian-Zadeh, Control and Intelligent Processing Center of Excellence, Department of Electrical and Computer Engineering, University of Tehran, Tehran, Iran; Image Analysis Lab., Department of R
pp. 209-212
Author Index (PDF)
pp. A-1-A-2
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