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Reliable Distributed Systems, IEEE Symposium on (1999)
Lausanne, Switzerland
Oct. 18, 1999 to Oct. 21, 1999
ISBN: 0-7695-0290-3
TABLE OF CONTENTS
Referees (PDF)
pp. xii
Invited Speaker
Robert C.B. Cooper , Lucent Technologies
pp. 2
Session 1: Mobile Computing
Goutham Karumanchi , University of Texas at Dallas
Srinivasan Muralidharan , University of Texas at Dallas
Ravi Prakash , University of Texas at Dallas
pp. 4
Giuseppe Anastasi , University of Pisa
Francesco Spadoni , University of Pisa
Alberto Bartoli , University of Trieste
pp. 14
P. Couderc , Universitaire de Beaulieu
A.-M. Kermarrec , University Of Rennes 1
pp. 24
Session 2: Distributed Algorithms
Klaus Schossmaier , Technische Universit?t Wien
Bettina Weiss , Technische Universit?t Wien
pp. 36
C. Delporte-Gallet , Universit? Denis Diderot
H. Fauconnier , Universit? Denis Diderot
pp. 48
Michel Hurfin , Universit? de Beaulieu
Michel Raynal , Universit? de Beaulieu
Frédéric Tronel , Universit? de Beaulieu
Raimundo Macêdo , Universit? de Ondina
pp. 56
Session 3: Formal Methods
Hamdan Dammag , The University of Reading
Nimal Nissanke , The University of Reading
pp. 78
Session 4: Replication Techniques
Session 5: Scalability
Roy Friedman , Technion - Israel Institute of Technology
Shiri Manor , Technion - Israel Institute of Technology
Katherine Guo , Bell Laboratories
pp. 124
Session 6: Failure Analysis
Sherif M. Yacoub , West Virginia University
Bojan Cukic , West Virginia University
Hany H. Ammar , West Virginia University
pp. 158
M. Kalyanakrishnam , University of Illinois at Urbana-Champaign
Z. Kalbarczyk , University of Illinois at Urbana-Champaign
R. Iyer , University of Illinois at Urbana-Champaign
pp. 178
Session 7: System Support
HAMFS File System (Abstract)
Yoshitake Shinkai , Fujitsu Laboratories Limited
Yoshihiro Tsuchiya , Fujitsu Laboratories Limited
Takeo Murakami , Fujitsu Laboratories Limited
Jim Williams , Amdahl Corporation
pp. 190
Angkul Kongmunvattana , University of Southwestern Louisiana
Nian-Feng Tzeng , University of Southwestern Louisiana
pp. 202
Nagarajan Kandasamy , University of Michigan
John P. Hayes , University of Michigan
Brian T. Murray , Delphi Automotive Systems
pp. 212
Session 8: Logging and Checkpointing
Mangesh Kasbekar , Pennsylvania State University
Chita R. Das , Pennsylvania State University
Shalini Yajnik , Bell Laboratories, Lucent Technologies
Reinhard Klemm , Bell Laboratories, Lucent Technologies
Yennun Huang , AT&T Labs-Research,
pp. 224
Kuo-Feng Ssu , University of Illinois at Urbana-Champaign
Bin Yao , Purdue University
W. Kent Fuchs , Purdue University
pp. 244
Session 9: CORBA
Lau Cheuk Lung , University of Federal de Santa Catarina
Joni da Silva Fraga , University of Federal de Santa Catarina
Jean-Marie Farines , University of Federal de Santa Catarina
Michael Ogg , Bell Laboratories
Aleta Ricciardi , Bell Laboratories
pp. 254
P. Narasimhan , University of California at Santa Barbara
L.E. Moser , University of California at Santa Barbara
P.M. Melliar-Smith , University of California at Santa Barbara
pp. 263
Aad P.A. Van Moorsel , Bell Laboratories Research, Lucent Technologies
pp. 274
Work in Progress (Fast Abstracts)
J. Villadangos , University P?blica de Navarra
F. Fariña , University P?blica de Navarra
J.R. González de Mendívil , University P?blica de Navarra
J.R. Garitagoitia , University P?blica de Navarra
J. Bernabéu-Aubán , University Polit?cnica de Valencia
G. Vossen , Wilhems-University M?nster
pp. 288
Eugene Gendelman , University of California at Irvine
Lubomir F. Bic , University of California at Irvine
Michael B. Dillencourt , University of California at Irvine
pp. 290
L. Bellissard , INRIA Rh?ne-Alpes
N. de Palma , INRIA Rh?ne-Alpes
A. Freyssinet , INRIA Rh?ne-Alpes
M. Herrmann , INRIA Rh?ne-Alpes
S. Lacourte , INRIA Rh?ne-Alpes
pp. 294
Alexey Vaysburd , Lucent Technologies, Bell Laboratories
Shalini Yajnik , Lucent Technologies, Bell Laboratories
pp. 296
Soojung Lee , Inchon National University of Education
Youngjun Lee , Kisan Telecom Company, Limited
pp. 298
Leïla Azouz Saïdane , Ecole Nationale des Sciences de Informatique (E.N.S.I.)
Farouk Kamoun , Ecole Nationale des Sciences de Informatique (E.N.S.I.)
pp. 302
Ting Liu , University of Illinois at Urbana-Champaign
Zbignew Kalbarczyk , University of Illinois at Urbana-Champaign
Ravishankar K. Iyer , University of Illinois at Urbana-Champaign
pp. 306
Workshop on Reliable Middleware (Wremi)
Pascal Felber , Oracle Corporation
Rachid Guerraoui , Swiss Federal Institute of Technology and Hewlett-Packard Laboratories
pp. 309
Werner Froidevaux , Object Middleware Experts AG
Stephan Murer , Credit Suisse
Martin Prater , Credit Suisse
pp. 310
M.C. Little , Newcastle University
S.K. Shrivastava , Newcastle University
pp. 316
Alexey Vaysburd , Lucent Technologies, Bell Laboratories
pp. 322
Workshop on Electronic Commerce (Welcom)
Sebastian Staamann , Swiss Federal Institute of Technology
Uwe Wilhelm , Swiss Federal Institute of Technology
pp. 329
Frédéric Bapst , Swiss Federal Institute of Technology
Christine Vanoirbeek , Swiss Federal Institute of Technology
pp. 330
Alexander Marton , Hewlett-Packard Laboratories
Giacomo Piccinelli , Hewlett-Packard Laboratories
Chris Turfin , Hewlett-Packard Laboratories
pp. 336
Andreas Bartelt , Oldenburger Forschungs - und Entwicklungsinstitut
Jochen Meyer , Oldenburger Forschungs - und Entwicklungsinstitut
pp. 348
Kornelia Konrad , Technical University of Darmstadt
Gerhard Fuchs , Center of Technology Assessment in Baden-W?rttemberg
Jochen Barthel , Center of Technology Assessment in Baden-W?rttemberg
pp. 360
Rolf Opplinger , Swiss Federal Strategy Unit for Information Technology
pp. 366
J. Zöllner , Dresden University of Technology
pp. 372
Paulo Jorge Marques , Universidade de Coimbra
Luís Moura Silva , Universidade de Coimbra
João Gabriel Silva , Universidade de Coimbra
pp. 378
Levente Buttyán , Swiss Federal Institute of Technology
Jean-Pierre Hubaux , Swiss Federal Institute of Technology
pp. 384
F. Panzieri , Universit? di Bologna
S.K. Shrivastava , University of Newcastle upon Tyne
pp. 390
The Usability Risk (Abstract)
pp. 396
pp. 401
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