- S
- SEW
- 2006
- 30th Annual IEEE/NASA Software Engineering Workshop SEW-30 (SEW'06)
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30th Annual IEEE/NASA Software Engineering Workshop SEW-30 (SEW'06) Columbia, Maryland April 24-April 28 ISBN: 0-7695-2624-1 Table of Contents
 | Introduction |
 | Keynote Speaker |
 | Requirements Issues |
Giuseppe Lami, Istituto di Scienze e Tecnologie dell'Informazione "A.Faedo", Italy pp. 7-10
Angelina Espinoza, Technical University of Madrid (UPM, Universidad Politecnica de Madrid), Spain
Pedro P. Alarcon, Technical University of Madrid (UPM, Universidad Politecnica de Madrid), Spain
Juan Garbajosa, Technical University of Madrid (UPM, Universidad Politecnica de Madrid), Spain pp. 21-32
 | Pot Pourri |
 | Project Management and Related Issues |
Mikael Lindvall, Fraunhofer Center for Experimental Software Engineering Maryland, USA pp. 66-75
 | Modeling and Processes |
Yves Ledru, Universite Joseph Fourier, IMAG, France pp. 97-106
Karin Becker, Pontificia Universidade do Rio Grande do Sul, Brazil pp. 107-118
 | Simulation and Model Checking |
Frantisek Plasil, Charles University, Czech Republic; Academy of Sciences of the Czech Republic
Jan Kofron, Charles University, Czech Republic; Academy of Sciences of the Czech Republic pp. 133-141
Ivano Rigo, Universita degli Studi di Milano-Bicocca, Italy
Luigi Ubezio, Universita degli Studi di Milano-Bicocca, Italy pp. 142-152
 | Applications |
Vadim Okum, National Institute of Standards and Technology, USA pp. 153-158
 | Concurrency and Real-Time Issues |
Jifeng He, East China Normal University, China pp. 179-189
Jifeng He, East China Normal University, China pp. 190-202
 | Formal Issues |
Thomas Bluhm, Lucent Technologies Network Systems GmbH, Nurnberg
Tobias Renner, Lucent Technologies Network Systems GmbH, Nurnberg pp. 207-211
Peter T. Breuer, Universidad Carlos III de Madrid, Spain; Florida Atlantic University, USA
Simon Pickin, Universidad Carlos III de Madrid, Spain; Florida Atlantic University, USA pp. 223-233
 | ZUM 2006 papers |
Y. Ledru, Universite Joseph Fourier, IMAG, France pp. 253-262
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