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2013 IEEE 13th International Working Conference on Source Code Analysis and Manipulation (SCAM) (2007)
Paris, France
Sept. 30, 2007 to Oct. 1, 2007
ISBN: 0-7695-2880-5
TABLE OF CONTENTS
Introduction
Reviewers (PDF)
pp. xii
Keynote Paper
Oege de Moor , Semmle Limited, UK
Mathieu Verbaere , Semmle Limited, UK
Elnar Hajiyev , Semmle Limited, UK
Pavel Avgustinov , Semmle Limited, UK
Torbjorn Ekman , Semmle Limited, UK
Neil Ongkingco , Semmle Limited, UK
Damien Sereni , Semmle Limited, UK
Julian Tibble , Semmle Limited, UK
pp. 3-16
Session 1: Slicing
Dennis Giffhorn , Universitat Passau, Germany
Christian Hammer , Universitat Passau, Germany
pp. 17-26
Mariano Ceccato , IRST, Italy
Mila Dalla Preda , University of Trento, Italy
Jasvir Nagra , University of Trento, Italy
Christian Collberg , University of Arizona, USA
Paolo Tonella , IRST, Italy
pp. 27-36
Jens Krinke , FernUniversitat in Hagen, Germany
pp. 37-48
Session 2: Static Analysis I
Andreas Lochbihler , Universitat Passau, Germany
Gregor Snelting , Universitat Passau, Germany
pp. 49-58
Tobias Gutzmann , Vaxjo University, Sweden
Jonas Lundberg , Vaxjo University, Sweden
Welf Lowe , Vaxjo University, Sweden
pp. 59-68
Eva Magnusson , Lund University, Sweden
Torbjorn Ekman , Oxford University, UK
Gorel Hedin , Lund University, Sweden
pp. 69-80
Session 3: Transformations
Nicolas Juillerat , University of Fribourg, Switzerland
Beat Hirsbrunner , University of Fribourg, Switzerland
pp. 81-90
Walter Binder , University of Lugano, Switzerland
Jarle Hulaas , EPFL, Switzerland
Philippe Moret , EPFL, Switzerland
pp. 91-100
Marius Marin , Delft University of Technology, The Netherlands
Leon Moonen , Delft University of Technology, The Netherlands
Arie van Deursen , Delft University of Technology, The Netherlands; CWI
pp. 101-110
Arnoldo Jose Muller Molina , Kyushu Institute of Technology, Japan
Takeshi Shinohara , Kyushu Institute of Technology, Japan
pp. 111-122
Session 4: Static Analysis II
Eric Larson , Seattle University, USA
pp. 123-132
Matthew Naylor , University of York, UK
Colin Runciman , University of York, UK
pp. 133-142
Jason Sawin , Ohio State University, USA
Atanas Rountev , Ohio State University, USA
pp. 143-154
Session 5: Tool Demonstrations
Serguei Roubtsov , Technische Universiteit Eindhoven, The Netherlands
Alexandru Telea , Technische Universiteit Eindhoven, The Netherlands
Danny Holten , Technische Universiteit Eindhoven, The Netherlands
pp. 155-156
Cristina Marinescu , "Politehnica" University of Timisoara, Romania
pp. 157-158
Jendrik Johannes , Technische Universitat Dresden, Germany
pp. 159-160
Session 6: Metrics and Empirical Studies
Huib van den Brink , Utrecht University, The Netherlands
Rob van der Leek , Software Improvement Group, The Netherlands
Joost Visser , Software Improvement Group, The Netherlands
pp. 163-170
Patricia L. Roden , University of Alabama in Huntsville, USA; University of North Alabama, USA
Shamsnaz Virani , University of Alabama in Huntsville, USA
Letha H. Etzkorn , University of Alabama in Huntsville, USA
Sherri Messimer , University of Alabama in Huntsville, USA
pp. 171-179
Lerina Aversano , University of Sannio, Italy
Luigi Cerulo , University of Sannio, Italy
Massimiliano Di Penta , University of Sannio, Italy
pp. 180-192
Session 7: Comprehension
Einar W. Host , Norwegian Computing Center, Norway
Bjarte M. Ostvold , Norwegian Computing Center, Norway
pp. 193-202
Zhen Ming Jiang , University of Victoria, Canada
Ahmed E. Hassan , University of Victoria, Canada
pp. 203-212
Dawn Lawrie , Loyola College, USA
Henry Feild , Loyola College, USA
David Binkley , Loyola College, USA
pp. 213-222
Author Index
Author Index (PDF)
pp. 223
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