- S
- SCAM
- 2002
- Second IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)
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Second IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02) Montreal, Canada October 01-October 01 ISBN: 0-7695-1793-5 Table of Contents
 | Introduction |
 | Keynote Address |
 | Session I: Testing, Metrics, Maintenance |
 | Session II: Source Transformation, Source Processing |
 | Session III: Slicing |
 | Session IV: Dependence Graphs, Static Analysis |
 | Author Index | Usage of this product signifies your acceptance of the Terms of Use.
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