• S
  • SCAM
  • 2002
  • Second IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)
Advanced Search 
Second IEEE International Workshop on Source Code Analysis and Manipulation (SCAM'02)
Montreal, Canada
October 01-October 01
ISBN: 0-7695-1793-5
Table of Contents
Introduction
Keynote Address
Session I: Testing, Metrics, Maintenance
Session II: Source Transformation, Source Processing
Mark Harman, Brunel University
Chris Fox, Essex University
Rob Hierons, Brunel University
Lin Hu, Brunel University
Sebastian Danicic, Goldsmiths College
Joachim Wegener, DaimlerChrysler
pp. 55
Xingyuan Zhang, University of Durham
Malcolm Munro, University of Durham
Mark Harman, Brunel University
Lin Hu, Brunel University
pp. 73
Thomas R. Dean, Queen?s University
James R. Cordy, Queen?s University
Andrew J. Malton, University of Waterloo
Kevin A. Schneider, University of Saskatchewan
pp. 93
Session III: Slicing
Mark Harman, BruneI University
Lin Hu, BruneI University
Malcolm Munro, University of Durham
Xingyuan Zhang, University of Durham
Sebastian Danicic, Goldsmiths College
Mohammed Daoudi, Goldsmiths College
Lahcen Ouarbya, Goldsmiths College
pp. 105
Session IV: Dependence Graphs, Static Analysis
Byeong-Mo Chang, Sookmyung Women?s University
Jang-Wu Jo, Pusan University of Foreign Studies
Soon Hee Her, Sookmyung Women?s University
pp. 173
Author Index
Usage of this product signifies your acceptance of the Terms of Use.