loading...
  • S
  • SADFE
  • 2007
  • Second International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'07)
Advanced Search 
Second International Workshop on Systematic Approaches to Digital Forensic Engineering (SADFE'07)
Seattle, Washington, USA
April 10-April 12
ISBN: 0-7695-2808-2
Table of Contents
Introduction
Editorial (PDF)
pp. viii-xii
Session 1: Use of Models in Forensics (Part I-Papers)
Sean Peisert, University of California, San Diego, USA
Matt Bishop, University of California, Davis, USA
Sidney Karin, University of California, San Diego, USA
Keith Marzullo, University of California, San Diego, USA
pp. 3-15
Session 2: Use of Models in Forensics (Part II-Invited Paper)
Session 3: Gathering and Understanding Digital Forensic Data (Part I-Papers)
K.P. Chow, The University of Hong Kong, Hong Kong
Frank Y.W. Law, The University of Hong Kong, Hong Kong
Michael Y.K. Kwan, The University of Hong Kong, Hong Kong
Pierre K.Y. Lai, The University of Hong Kong, Hong Kong
pp. 71-85
Session 4: Gathering and Understanding Digital Forensic Data (Part II-Panels)
Session 5: Forensic Analysis Tools: Are They Performing the Way They Should?
Sudhir Aggarwal, Florida State University, USA
Daniel Beech, Florida State University, USA
Rajarshi Das, Florida State University, USA
Breno de Medeiros, Florida State University, USA
Eric Thompson, AccessData Corporation, Utah, USA
pp. 105-116
Session 6: Challenge Papers
Adel Elmaghraby, University of Louisville, USA
James Graham, University of Louisville, USA
Jana Godwin, University of Louisville, USA
Michael Losavio, University of Louisville, USA
Deborah Wilson, University of Louisville, USA
pp. 147-149
Robert F. Erbacher, Member, IEEE; Utah State University, USA
Barbara Endicott-Popovsky, Student Member, IEEE; University of Washington, USA
Deborah A. Frincke, Senior Member, IEEE; Pacific Northwest National Laboratory, USA
pp. 150-154
Session 7: Education and Training
Carol Taylor, University of Idaho, USA
Barbara Endicott-Popovsky, University of Washington, USA
Amelia Phillips, Highline Community College
pp. 155-165
Author Index
Usage of this product signifies your acceptance of the Terms of Use.