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- RTAS
- 1996
- Second IEEE Real-Time Technology and Applications Symposium (RTAS'96)
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Second IEEE Real-Time Technology and Applications Symposium (RTAS'96) Boston, MA June 10-June 12 ISBN: 0-8186-7448-2 Table of Contents
 | Session I - Case Studies and Applications |
I.J. Bate, Dept. of Comput. Sci., York Univ., UK
A. Burns, Dept. of Comput. Sci., York Univ., UK pp. 2
D.H. Jameson, Comput. Music Center, IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, US pp. 11
C. Bickford, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA
M.S. Teo, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA
G. Wallace, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA
J.A. Stankovic, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA
K. Ramamritham, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA pp. 19
A. Vina, CESAT, Coruna Univ., Spain pp. 29
| Session II - Databases and Concurrency Control |
Young-Kuk Kim, Dept. of Comput. Sci., Chungnam Nat. Univ., Taejon, South Korea
S.H. Son, Dept. of Comput. Sci., Chungnam Nat. Univ., Taejon, South Korea pp. 38
Ching-Shan Peng, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Kwei-Jay Lin, Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA pp. 59
| Tutorial I |
Chia Shen, Mitsubishi Electr. Res. Labs., Cambridge, MA, USA pp. 70
| Session III - Software Engineering |
R. Ginis, Dept. of Comput. Sci., Rhode Island Univ., Kingston, RI, USA
V.F. Wolfe, Dept. of Comput. Sci., Rhode Island Univ., Kingston, RI, USA
J.J. Prichard, Dept. of Comput. Sci., Rhode Island Univ., Kingston, RI, USA pp. 82
Chih Lai, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
H.R. Callison, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA pp. 91
M. Gagliardi, Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
R. Rajkumar, Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA
Lui Sha, Software Eng. Inst., Carnegie Mellon Univ., Pittsburgh, PA, USA pp. 100
| Session IV - Communications |
S. Balakrishnan, Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
F. Ozguner, Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA pp. 120
A. Mehra, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
A. Indiresan, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
K.G. Shin, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA pp. 130
| Session V - Real-Time System Development and Analysis Tools |
M. Humphrey, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA
J.A. Stankovic, Dept. of Comput. Sci., Massachusetts Univ., Amherst, MA, USA pp. 150
M.F. Storch, Dept. of Comput. Sci., Illinois Univ., Urbana, IL, USA
J.W.-S. Liu, Dept. of Comput. Sci., Illinois Univ., Urbana, IL, USA pp. 160
Lo Ko, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA
C. Healy, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA
E. Ratliff, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA
R. Arnold, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA
D. Whalley, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA
M. Harmon, Dept. of Comput. Sci., Florida State Univ., Tallahassee, FL, USA pp. 170
| Tutorial III |
| Session VII - Operating Systems and Distributed Systems |
Sung-Kwan Kim, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
Sang Lyul Min, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea
Rhan Ha, Dept. of Comput. Eng., Seoul Nat. Univ., South Korea pp. 230
K.M. Zuberi, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
K.G. Shin, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA pp. 241
T. Abdelzaher, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
A. Shaikh, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
F. Jahanian, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
K. Shin, Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA pp. 250 Usage of this product signifies your acceptance of the Terms of Use.
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