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2011 International Conference on Reconfigurable Computing and FPGAs
Using Self-Reconfiguration to Increase Manufacturing Yield of CNTFET-based Architectures
Cancun, Quintana Roo Mexico
November 30-December 02
ISBN: 978-0-7695-4551-6
Among the key issues facing the semiconductor industry as increasingly unreliable emerging and nanoscale technologies come to the fore are design reliability and manufacturing yield. In this paper, we propose a fault-tolerant architecture based on Carbon Nanotube Field-Effect-Transistors (CNTFET). The architecture is composed of statically interconnected reconfigurable cells. Static interconnects offer possibilities for scalable and low power circuits while cell reconfiguration is extensively used to increase the architecture fault-tolerance. We show that in the proposed architecture, for a 96% carbon nanotube manufacturing yield, up to 83% of the hardware resources can still be used.
Index Terms:
Self-Reconfiguration, CNTFET
Citation:
Hui Zhu, Sébastien Le Beux, Nataliya Yakymets, Ian O'Connor, "Using Self-Reconfiguration to Increase Manufacturing Yield of CNTFET-based Architectures," reconfig, pp.111-116, 2011 International Conference on Reconfigurable Computing and FPGAs, 2011
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