ISBN: 0-7695-2091-X

Ant?nio Baptista, Oregon Health and Science University

Wagner T. Corr?, Princeton University

James T. Klosowski, IBM Research

Cl?udio T. Silva, University of Utah

Huijuan Zhang, University of Alabama in Huntsville

Timothy S. Newman, University of Alabama in Huntsville

Dmitry Brodsky, University of British Columbia

Jan B?kgaard Pedersen, University of Nevada Las Vegas

Kenneth Moreland, Sandia National Laboratories

David Thompson, Sandia National Laboratories

Aleksander Stompel, University of California at Davis

Kwan-Liu Ma, University of California at Davis

Eric B. Lum, University of California at Davis

James Ahrens, Los Alamos National Laboratory

John Patchett, Los Alamos National Laboratory

E. Wes Bethel, Lawrence Berkeley National Laboratory

Greg Humphreys, Universtiy of Virginia

Brian Paul, Tungsten Graphics

J. Dean Brederson, University of Utah

Gunther H. Weber, University of California, Davis; University of Kaiserslautern, Germany; Lawrence Berkeley National Laboratory

Martin ?hler, University of Kaiserslautern, Germany

Oliver Kreylos, University of California, Davis; Lawrence Berkeley National Laboratory

John M. Shalf, Lawrence Berkeley National Laboratory

E. Wes Bethel, Lawrence Berkeley National Laboratory

Bernd Hamann, University of California, Davis; Lawrence Berkeley National Laboratory

Gerik Scheuermann, University of Kaiserslautern, Germany

Eric LaMar, Lawrence Livermore National Laboratory

Valerio Pascucci, Lawrence Livermore National Laboratory

Al?cio P. D. Binotto, UFRGS

Jo?o L. D. Comba, UFRGS

Carla M. D. Freitas, UFRGS

Ingo Wald, Saarland University

Carsten Benthin, Saarland University

Philipp Slusallek, Saarland University

David E DeMarle, The University of Utah

Steven Parker, The University of Utah

Mark Hartner, The University of Utah

Christiaan Gribble, The University of Utah

Charles Hansen, The University of Utah

Shigeru Muraki, AIST, Japan

Eric. B. Lum, University of California, Davis

Kwan-Liu Ma, University of California, Davis

Masato Ogata, Mitsubishi Precision, Co., Ltd., Japan

Xuezhen Liu, Mitsubishi Precision, Co., Ltd., Japan

J. Chen, Rutgers University

D. Silver, Rutgers University

L. Jiang, Rutgers University

Dirk Staneker, University of T?bingen, Germany

Dirk Bartz, University of T?bingen, Germany

Michael Mei?ner, University of T?bingen, Germany

Joel H. Saltz, The Ohio State University