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12th Pacific Rim International Symposium on Dependable Computing (PRDC'06)
Riverside, California
December 18-December 20
ISBN: 0-7695-2724-8
Table of Contents
Introduction
Session 1: Reliability Modeling
Dejan Desovski, West Virginia University, Morgantown, WV
Bojan Cukic, West Virginia University, Morgantown, WV
pp. 11-18
Y.P. Wu, National University of Singapore
Q.P. Hu, National University of Singapore
M. Xie, National University of Singapore
S.H. Ng, National University of Singapore
pp. 19-25
Session 2: Fault Detection
Rui Abreu, Delft University of Technology
Peter Zoeteweij, Delft University of Technology
Arjan J.C. van Gemund, Delft University of Technology
pp. 39-46
Long Wang, University of Illinois at Urbana-Champaign, IL
Zbigniew Kalbarczyk, University of Illinois at Urbana-Champaign, IL
Weining Gu, University of Illinois at Urbana-Champaign, IL
Ravishankar K. Iyer, University of Illinois at Urbana-Champaign, IL
pp. 55-62
Antonio Fernandez, LADyR, GSyC, Universidad Rey Juan Carlos, 28933 Mostoles, Spain
Ernesto Jimenez, EUI, Universidad Politecnica de Madrid, 28031 Madrid, Spain
Sergio Arevalo, LADyR, GSyC, Universidad Rey Juan Carlos, 28933 Mostoles, Spain
pp. 63-72
Session 3: Software Test
Meng-Lai Yin, Engineering, Cal Poly Pomona
Bruce Orenstein, Network Centric Systems, Raytheon
pp. 89-96
Shyue-Kung Lu, Fu-Jen Catholic University,Taipei, Taiwan
Ting-Yu Chen, Fu-Jen Catholic University,Taipei, Taiwan
Wei-Yuan Liu, Fu-Jen Catholic University,Taipei, Taiwan
pp. 97-104
Session 4: Security
Raul Barbosa, Chalmers University of Technology, Sweden
Johan Karlsson, Chalmers University of Technology, Sweden
pp. 105-113
Yao-Hsin Chou, National Taiwan University
I-Ming Tsai, National Taiwan University
Chien-Ming Ko, National Taiwan University
Sy-Yen Kuo, National Taiwan University
Ing-Yi Chen, National Taipei University of Technology
pp. 121-128
Session 5: Availability
Ken-ichiro FUJIYAMA, Internet Systems Research Laboratories, NEC Corporation
Nobutatsu NAKAMURA, Internet Systems Research Laboratories, NEC Corporation
Ryuichi HIRAIKE, Internet Systems Research Laboratories, NEC Corporation
pp. 139-146
Kishor S. Trivede, Duke University
Ranjith Vasireddy, Duke University
David Trindale, Sun Microsystems, USA
Swami Nathan, Sun Microsystems, USA
Rick Castro, Sun Microsystems, USA
pp. 154-164
Session 6: Intrusion Detection
Satoshi Katsunuma, University of Tokyo
Hiroyuki Kurita, University of Tokyo
Ryota Shioya, University of Tokyo
Kazuto Shimizu, University of Tokyo
Hidetsugu Irie, Japan Science and Technology Agency
Masahiro Goshima, University of Tokyo
Shuichi Sakai, University of Tokyo
pp. 165-172
Ming-Wei Wu, National Taiwan University
Yennun Huang, AT&T Labs, Florham Park, NJ
Yi-Min Wang, Microsoft Research
Sy-Yen Kuo, National Taiwan University
pp. 173-182
Session 7: Reliability Prediction and Optimization
Wei-Chih Huang, National Tsing Hua University, Taiwan
Chin-Yu Huang, National Tsing Hua University, Taiwan
Chuan-Ching Sue, National Cheng Kung University, Taiwan
pp. 194-201
Q.P. Hu, National University of Singapore, Singapore
M. Xie, National University of Singapore, Singapore
S.H. Ng, National University of Singapore, Singapore
pp. 210-220
Session 8: Dependability Applications
Zheng-Yi Huang, National Taiwan University, Taipei, TAIWAN
Sheng-De Wang, National Taiwan University, Taipei, TAIWAN
pp. 221-229
Sheng-Tzong Cheng, National Cheng Kung University, Tainan, Taiwan
Jian-Liang Lin, National Cheng Kung University, Tainan, Taiwan
pp. 248-258
Session 9: Survivability
Achour MOSTEFAOUI, IRISA, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France
Michel RAYNAL, IRISA, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France
Gilles TREDAN, IRISA, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France
pp. 259-266
Michel RAYNAL, IRISA, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France
Corentin TRAVERS, IRISA, Universite de Rennes 1, Campus de Beaulieu, 35042 Rennes Cedex, France
pp. 267-274
Kaiyu Chen, Princeton University, Princeton, NJ
Sharad Malik, Princeton University, Princeton, NJ
pp. 275-286
Session 10: Optimization
Hakem Beitollahi, Katholieke Universiteit Leuven, Electrical Engineering, Kasteelpark Arenberg 10, Leuven, Belgium
Geert Deconinck, Katholieke Universiteit Leuven, Electrical Engineering, Kasteelpark Arenberg 10, Leuven, Belgium
pp. 296-304
Session 11: Maintenance and Recovery
Xiaobin Li, Enterprise Microprocessor Group Intel Corporation
Jean-Luc Gaudiot, University of California, Irvine
pp. 315-322
Timothy Tsai, Sun Microsystems, Inc.
Kalyan Vaidyanathan, Sun Microsystems, Inc.
Kenny Gross, Sun Microsystems, Inc.
pp. 329-340
Session 12: Performance and Reliability
Matthias Wiesmann, Japan Advanced Institute of Science and Technology
Xavier D?fago, Japan Advanced Institute of Science and Technology
pp. 341-350
Swapna S. Gokhale, University of Connecticut, Storrs, CT 06269, USA
Paul J. Vandal, University of Connecticut, Storrs, CT 06269, USA
Jijun Lu, University of Connecticut, Storrs, CT 06269, USA
pp. 351-358
Kotaro Shimamura, Hitachi Research Laboratory, Hitachi, Ltd.
Takeshi Takehara, Mito Transportation Systems Product Division, Hitachi, Ltd.
Yosuke Shima, Mito Transportation Systems Product Division, Hitachi, Ltd.
Kunihiko Tsunedomi, Hitachi Research Laboratory, Hitachi, Ltd.
pp. 359-368
Short Paper Track 1
Kuo-Feng Ssu, National Cheng Kung University
Chih-Hsun Chou, National Cheng Kung University
Wei-Te Shih, National Cheng Kung University
Pau-Choo Chung, National Cheng Kung University
Hewijin C. Jiau, National Cheng Kung University
pp. 373-374
Christof Fetzer, Technische Universitat Dresden, Germany
Martin Subkraut, Technische Universitat Dresden, Germany
pp. 375-376
Johannes Osrael, Vienna University of Technology
Lorenz Froihofer, Vienna University of Technology
Karl M. Goeschka, Vienna University of Technology
pp. 377-378
Shin-Hung Chung, National Cheng Kung University, Tainan, Taiwan
Kuo-Feng Ssu, National Cheng Kung University, Tainan, Taiwan
Chih-Hsun Chou, National Cheng Kung University, Tainan, Taiwan
Hewijin Christine Jiau, National Cheng Kung University, Tainan, Taiwan
pp. 379-380
Marco Vieira, CISUC - University of Coimbra, Portugal
Ant?nio Casimiro Costa, FC - University of Lisbon, Portugal
Henrique Madeira, CISUC - University of Coimbra, Portugal
pp. 381-382
Jose Fonseca, CISUC - Polithecnic Institute of Guarda, Portugal
Marco Vieira, CISUC - Polithecnic Institute of Guarda, Portugal
Henrique Madeira, CISUC - Polithecnic Institute of Guarda, Portugal
pp. 383-386
Short Paper Track 2
Carl Bergenhem, National Testing and Research Institute, Sweden
Johan Karlsson, Chalmers University of Technology, Sweden
Christian Archer, Chalmers University of Technology, Sweden
Andreas Sjoblom, Chalmers University of Technology, Sweden
pp. 387-388
Stefan Fenz, Secure Business Austria - Security Research, Vienna, Austria
Edgar Weippl, Secure Business Austria - Security Research, Vienna, Austria
pp. 389-390
Jinjing Zhao, National University of Defense Technology, Changsha 410073, China
Peidong Zhu, National University of Defense Technology, Changsha 410073, China
Xicheng Lu, National University of Defense Technology, Changsha 410073, China
Feng Zhao, National University of Defense Technology, Changsha 410073, China
pp. 391-392
Hakem Beitollahi, Katholieke Universiteit Leuven, Electrical Engineering, Kasteelpark Arenberg 10, Leuven, Belgium
Geert Deconinck, Katholieke Universiteit Leuven, Electrical Engineering, Kasteelpark Arenberg 10, Leuven, Belgium
pp. 395-396
Yung-Chiao Chen, National Taiwan University, Taipei, Taiwan
Chuan-Ching Sue, National Cheng Kung University, Tainan, Taiwa
Sy-Yen Kuo, National Taiwan University, Taipei, Taiwan
pp. 397-398
Chuan-Ching Sue, National Cheng Kung University, Tainan, Taiwan
Ren-Jie Chiou, National Cheng Kung University, Tainan, Taiwan
pp. 399-400
Wei Wang, Tongji University, Shanghai
Guosun Zeng, Tongji Branch, National Engineering and Computing, Shanghai 201804, China
pp. 401-402
Author Index
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