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- PRDC
- 2000
- Seventh Pacific Rim International Symposium on Dependable Computing (PRDC'00)
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Seventh Pacific Rim International Symposium on Dependable Computing (PRDC'00) Los Angeles, California December 18-December 20 ISBN: 0-7695-0975-4 Table of Contents
 | Invited Presentation I |
 | Invited Presentation II |
 | Session 1: Fault-Tolerant Hardware |
Y. Hayashi, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan
T. Matsubara, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan
Y. Koga, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan pp. 11
C. Trinitis, Inst. fur Inf., Tech. Univ. Munchen, Germany
W. Karl, Inst. fur Inf., Tech. Univ. Munchen, Germany pp. 19
T. Hanyu, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
T. Ike, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
M. Kameyama, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan pp. 27
 | Session 2: Group Communication |
A. Yamaguchi, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
M. Arai, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
K. Iwasaki, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan pp. 37
W. Yurcik, Dept. of Appl. Comput. Sci., Illinois State Univ., Normal, IL, USA
D. Tipper, Dept. of Appl. Comput. Sci., Illinois State Univ., Normal, IL, USA pp. 53
 | Session 3: Analysis and Evaluation |
K. Trivedi, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA pp. 69
T. Dohi, Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
K.S. Trivedi, Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan pp. 77
J.-C. Fabre, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
M. Rodriguez, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
J. Arlat, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
J.-M. Sizun, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France pp. 85
 | Invited Presentation III |
 | Invited Presentation IV |
 | Session 4: Coding and Data Compression |
Jong-Hoon Youn, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
B. Bose, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA pp. 103
G.R. Redinbo, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
R. Manomohan, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA pp. 110
Wei-Je Huang, Dept. of Electr. Eng., Stanford Univ., CA, USA pp. 128
 | Session 5: Testing and Reconfiguration |
I. Pomeranz, Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
S.M. Reddy, Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA pp. 139
M. Tsukisaka, Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
T. Nanya, Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan pp. 148
Siu-Cheung Chau, Dept. of Phys. & Comput., Wilfrid Laurier Univ., Waterloo, Ont., Canada
Ada Wai-Chee Fu, Dept. of Phys. & Comput., Wilfrid Laurier Univ., Waterloo, Ont., Canada pp. 156
 | Session 6: Distributed Systems |
L.R. Klos, Dept. of Comput. Sci., New Orleans Univ., LA, USA pp. 169
M.D. Lemmon, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
J. Ganguly, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
L. Xia, Dept. of Electr. Eng., Notre Dame Univ., IN, USA pp. 177
C. Fetzer, AT&T Labs Res., Florham Park, NJ, USA pp. 185
H. Yokota, Syst. Dev. Lab., Hitachi Ltd., Japan pp. 193 Usage of this product signifies your acceptance of the Terms of Use.
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