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- PRDC
- 2000
- Seventh Pacific Rim International Symposium on Dependable Computing (PRDC'00)
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Seventh Pacific Rim International Symposium on Dependable Computing (PRDC'00)
Los Angeles, California
December 18-December 20
ISBN: 0-7695-0975-4
Table of Contents
 | Invited Presentation I |
 | Invited Presentation II |
 | Session 1: Fault-Tolerant Hardware |
Y. Hayashi, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan
T. Matsubara, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan
Y. Koga, Dept. of Comput. Sci., Nat. Defense Acad., Kanagawa, Japan
pp. 11
C. Trinitis, Inst. fur Inf., Tech. Univ. Munchen, Germany
W. Karl, Inst. fur Inf., Tech. Univ. Munchen, Germany
pp. 19
T. Hanyu, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
T. Ike, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
M. Kameyama, Dept. of Comput. & Math. Sci., Tohoku Univ., Sendai, Japan
pp. 27
 | Session 2: Group Communication |
A. Yamaguchi, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
M. Arai, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
K. Iwasaki, Graduate Sch. of Eng., Tokyo Metropolitan Univ., Japan
pp. 37
W. Yurcik, Dept. of Appl. Comput. Sci., Illinois State Univ., Normal, IL, USA
D. Tipper, Dept. of Appl. Comput. Sci., Illinois State Univ., Normal, IL, USA
pp. 53
 | Session 3: Analysis and Evaluation |
K. Trivedi, Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
pp. 69
T. Dohi, Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
K.S. Trivedi, Dept. of Ind. & Syst. Eng., Hiroshima Univ., Japan
pp. 77
J.-C. Fabre, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
M. Rodriguez, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
J. Arlat, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
J.-M. Sizun, Lab. d'Autom. et d'Anal. des Syst., CNRS, Toulouse, France
pp. 85
 | Invited Presentation III |
 | Invited Presentation IV |
 | Session 4: Coding and Data Compression |
Jong-Hoon Youn, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
B. Bose, Dept. of Comput. Sci., Oregon State Univ., Corvallis, OR, USA
pp. 103
G.R. Redinbo, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
R. Manomohan, Dept. of Electr. & Comput. Eng., California Univ., Davis, CA, USA
pp. 110
Wei-Je Huang, Dept. of Electr. Eng., Stanford Univ., CA, USA
pp. 128
 | Session 5: Testing and Reconfiguration |
I. Pomeranz, Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
S.M. Reddy, Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
pp. 139
M. Tsukisaka, Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
T. Nanya, Res. Center for Adv. Sci. & Technol., Tokyo Univ., Japan
pp. 148
Siu-Cheung Chau, Dept. of Phys. & Comput., Wilfrid Laurier Univ., Waterloo, Ont., Canada
Ada Wai-Chee Fu, Dept. of Phys. & Comput., Wilfrid Laurier Univ., Waterloo, Ont., Canada
pp. 156
 | Session 6: Distributed Systems |
L.R. Klos, Dept. of Comput. Sci., New Orleans Univ., LA, USA
pp. 169
M.D. Lemmon, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
J. Ganguly, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
L. Xia, Dept. of Electr. Eng., Notre Dame Univ., IN, USA
pp. 177
C. Fetzer, AT&T Labs Res., Florham Park, NJ, USA
pp. 185
H. Yokota, Syst. Dev. Lab., Hitachi Ltd., Japan
pp. 193
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