ISBN: 0-7695-2090-1

Norman Makoto Su, University of California, Los Angeles

Heemin Park, University of California, Los Angeles

Eric Bostrom, University of California, Los Angeles

Jeff Burke, University of California, Los Angeles

Mani B. Srivastava, University of California, Los Angeles

Deborah Estrin, University of California, Los Angeles

Martin M?hlenbrock, Xerox Research Centre Europe, Meylan, France

Oliver Brdiczka, Xerox Research Centre Europe, Meylan, France

Dave Snowdon, Xerox Research Centre Europe, Meylan, France

Jean-Luc Meunier, Xerox Research Centre Europe, Meylan, France

Lisa Ran, University of Florida, Gainesville

Sumi Helal, University of Florida, Gainesville

Steve Moore, University of Florida, Gainesville

Shichao Ou, University of Massachusetts, Amherst

Deepak R. Karuppiah, University of Massachusetts, Amherst

Andrew H. Fagg, University of Massachusetts, Amherst

Edward Riseman, University of Massachusetts, Amherst

Yoshifumi Nishida, Digital Human Research Center, AIST, Japan

Toshio Hori, Digital Human Research Center, AIST, Japan

Takeo Kanade, Digital Human Research Center, AIST, Japan

Koji Kitamura, Tokyo University of Science, Japan

Akifumi Nishitani, Tokyo University of Science, Japan

Hiroshi Mizoguchi, Tokyo University of Science, Japan

R. K. Harle, University of Cambridge, UK

A. Hopper, University of Cambridge, UK

Christian Becker, University of Stuttgart, Germany

Marcus Handte, University of Stuttgart, Germany

Gregor Schiele, University of Stuttgart, Germany

Kurt Rothermel, University of Stuttgart, Germany

Karen Henricksen, The University of Queensland

Jadwiga Indulska, The University of Queensland

Dipanjan Chakraborty, University of Maryland Baltimore County

Hui Lei, IBM T.J. Watson Research Center

Esko O. Dijk, Eindhoven University of Technology, The Netherlands; Philips Research Laboratories Eindhoven, The Netherlands

C. H. (Kees) van Berkel, Eindhoven University of Technology, The Netherlands; Philips Research Laboratories Eindhoven, The Netherlands

Ronald M. Aarts, Philips Research Laboratories Eindhoven, The Netherlands

Evert J. van Loenen, Philips Research Laboratories Eindhoven, The Netherlands

Ezekiel S. Bhasker, University of California, San Diego

Steven W. Brown, University of California, San Diego

William G. Griswold, University of California, San Diego

Charalampos Fretzagias, University of North Carolina at Chapel Hill

Maria Papadopouli, University of North Carolina at Chapel Hill

Christian Poellabauer, Georgia Institute of Technology, Atlanta

Karsten Schwan, Georgia Institute of Technology, Atlanta

Giuseppe Anastasi, University of Pisa, Italy

Eleonora Borgia, Istituto IIT, Italy

Marco Conti, Istituto IIT, Italy

Enrico Gregori, Istituto IIT, Italy

Rajiv Chakravorty, University of Cambridge, UK

Pablo Vidales, University of Cambridge, UK

Kavitha Subramanian, University of Cambridge, UK

Ian Pratt, University of Cambridge, UK

Jon Crowcroft, University of Cambridge, UK

Regina Bischoff, ETH Zurich, Switzerland

Roger Wattenhofer, ETH Zurich, Switzerland

Adnan Agbaria, University of Illinois at Urbana-Champaign

William H. Sanders, University of Illinois at Urbana-Champaign

Savvas Gitzenis, Stanford University, CA

Nicholas Bambos, Stanford University, CA

Robert C. Chalmers, University of California, Santa Barbara

Kevin C. Almeroth, University of California, Santa Barbara

George Lee, Massachusetts Institute of Technology, Cambridge

Peyman Faratin, Massachusetts Institute of Technology, Cambridge

Steven Bauer, Massachusetts Institute of Technology, Cambridge

John Wroclawski, Massachusetts Institute of Technology, Cambridge

Danyu Zhu, Michigan State University, East Lansing

Matt Mutka, Michigan State University, East Lansing

Rafael Ballagas, RWTH Aachen University, Germany

Andy Szybalski, Stanford University, CA

Armando Fox, Stanford University, CA

Martin Modahl, Georgia Institute of Technology, Atlanta

Ilya Bagrak, Georgia Institute of Technology, Atlanta

Matthew Wolenetz, Georgia Institute of Technology, Atlanta

Phillip Hutto, Georgia Institute of Technology, Atlanta

Umakishore Ramachandran, Georgia Institute of Technology, Atlanta

Marco Mamei, DISMI - Universit? di Modena e Reggio Emilia, Italy

Franco Zambonelli, DISMI - Universit? di Modena e Reggio Emilia, Italy

Harry Chen, University of Maryland Baltimore County

Tim Finin, University of Maryland Baltimore County

Anupam Joshi, University of Maryland Baltimore County

Bin Wang, Ira A. Fulton School of Engineering at Arizona State University, Tempe

John Bodily, Ira A. Fulton School of Engineering at Arizona State University, Tempe

Sandeep K. S. Gupta, Ira A. Fulton School of Engineering at Arizona State University, Tempe

Othmar Lehmann, Georgia Institute of Technology

Martin Bauer, Universit?t Stuttgart, Germany

Christian Becker, Universit?t Stuttgart, Germany

Daniela Nicklas, Universit?t Stuttgart, Germany

Thomas Martin, Virginia Tech

Michael Hsiao, Virginia Tech

Dong Ha, Virginia Tech

Jayan Krishnaswami, Virginia Tech

Allan Beaufour, University of Copenhagen

Philippe Bonnet, University of Copenhagen

Feng Zhu, Michigan State University, East Lansing

Matt Mutka, Michigan State University, East Lansing

Lionel Ni, Hong Kong University of Science and Technology, Kowloon

Tatsuo Nakajima, Waseda University, Japan

Ichiro Satoh, National Institute of Informatics, Japan

Esko Kurvinen, Helsinki Institute for Information Technology

Antti Oulasvirta, Helsinki Institute for Information Technology

Laurent Bussard, Institut Eur?com, France

Refik Molva, Institut Eur?com, France

Ichiro Satoh, National Institute of Informatics, Tokyo, Japan

Gregory Biegel, Trinity College Dublin

Vinny Cahill, Trinity College Dublin

Shuji Senda, NEC Corporation

Kyosuke Nishiyama, NEC Corporation

Toshiyuki Asahi, NEC Corporation

Keiji Yamada, NEC Corporation