Searching...
Advanced Search
M
MTV
2007
2007 Eighth International Workshop on Microprocessor Test and Verification
This Publication
Digital Library
Advanced Search
This Publication
Subscribe to this Publication
Login to access your subscribed content
Bibliographic References
ASCII Text
BibTex
Refworks Procite/RefMan
2007 Eighth International Workshop on Microprocessor Test and Verification
December 05-December 06
ISBN: 978-0-7695-3241-7
Table of Contents
Papers
Cover Art
(PDF)
pp. C4,C1
ABSTRACT
PDF
Title Page i
(PDF)
pp. i
ABSTRACT
PDF
Title Page iii
(PDF)
pp. iii
ABSTRACT
PDF
Copyright Page
(PDF)
pp. iv
ABSTRACT
PDF
Table of Contents
(PDF)
pp. v-vi
ABSTRACT
PDF
Preface
(PDF)
pp. vii
ABSTRACT
PDF
Acknowledgment
(PDF)
pp. viii
ABSTRACT
PDF
Committees
(PDF)
pp. ix-x
ABSTRACT
PDF
Assertion-Based Modal Power Estimation
(Abstract)
Sumit Ahuja
Deepak A. Mathaikutty
Sandeep Shukla
Ajit Dingankar
pp. 3-7
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Early Models for System-Level Power Estimation
(Abstract)
Dam Sunwoo
Hassan Al-Sukhni
Jim Holt
Derek Chiou
pp. 8-14
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Reduction of Power Dissipation during Scan Testing by Test Vector Ordering
(Abstract)
Wang-Dauh Tseng
Lung-Jen Lee
pp. 15-21
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Mechanized Certification of Secure Hardware Designs
(Abstract)
Sandip Ray
Warren A. Hunt Jr.
pp. 25-32
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Application of Lifting in Partial Design Analysis
(Abstract)
Marc Herbstritt
Vanessa Struve
Bernd Becker
pp. 33-38
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Model Checking Bluespec Specified Hardware Designs
(Abstract)
Gaurav Singh
Sandeep K. Shukla
pp. 39-43
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Runtime Verification of k-Mutual Exclusion for SoCs
(Abstract)
Selma Ikiz
Alper Sen
pp. 44-50
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A Scalable Symbolic Simulator for Verilog RTL
(Abstract)
Sasidhar Sunkari
Supratik Chakraborty
Vivekananda Vedula
Kailasnath Maneparambil
pp. 51-59
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Top Level SOC Interconnectivity Verification Using Formal Techniques
(Abstract)
Subir K. Roy
pp. 63-70
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
On Automatic Test Block Generation for Peripheral Testing in SoCs via Dynamic FSMs Extraction
(Abstract)
D. Ravotto
E. Sanchez
M. Schillaci
M. Sonza Reorda
G. Squillero
pp. 71-76
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Automotive Microcontroller End-of-Line Test via Software-Based Methodologies
(Abstract)
W. Di Palma
D. Ravotto
E. Sanchez
M. Schillaci
M. Sonza Reorda
G. Squillero
pp. 77-82
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Intel First Ever Converged Core Functional Validation Experience: Methodologies, Challenges, Results and Learning
(Abstract)
Tommy Bojan
Igor Frumkin
Robert Mauri
pp. 85-90
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Chico: An On-chip Hardware Checker for Pipeline Control Logic
(Abstract)
Andrew DeOrio
Adam Bauserman
Valeria Bertacco
pp. 91-97
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
A CLP-Based Functional ATPG for Extended FSMs
(Abstract)
Franco Fummi
Cristina Marconcini
Graziano Pravadelli
Ian G. Harris
pp. 98-105
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Application of Automated Model Generation Techniques to Analog/Mixed-Signal Circuits
(Abstract)
Scott Little
Alper Sen
Chris Myers
pp. 109-115
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
An ADL for Functional Specification of IA32
(Abstract)
Wei Qin
Asa Ben-Tzur
Boris Gutkovich
pp. 119-127
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Automatic Testbench Generation for Rearchitected Designs
(Abstract)
Mark Nodine
pp. 128-136
ABSTRACT
PDF
PURCHASE ARTICLE: $19
IEEE
Xplore
Subscribers
Author Index
(PDF)
pp. 137
ABSTRACT
PDF
Publisher's Information
(PDF)
pp. 138
ABSTRACT
PDF
Peer Review Notice
|
Give Us Feedback
Usage of this product signifies your acceptance of the
Terms of Use
.
Open
Download