The Community for Technology Leaders
RSS Icon
Subscribe
Fifth International Workshop on Microprocessor Test and Verification (MTV'04) (2006)
Austin, Texas
Dec. 4, 2006 to Dec. 5, 2006
ISBN: 0-7695-2839-2
TABLE OF CONTENTS
Introduction
Preface (PDF)
pp. vii
pp. viii
Section 1: Test
P. Bernardi , Politecnico di Torino, Italy
L. Bolzani , Politecnico di Torino, Italy
A. Manzone , Centro Ricerche Fiat, Italy
M. Osella , Centro Ricerche Fiat, Italy
M. Violante , Politecnico di Torino, Italy
M. Sonza Reorda , Politecnico di Torino, Italy
pp. 3-8
Jorge Campos , University of California, Davis, USA
Hussain Al-Asaad , University of California, Davis, USA
pp. 9-14
Vijay Gangaram , Intel Corporation, USA
Deepa Bhan , Intel Corporation, USA
James K. Caldwell , Intel Corporation, USA
pp. 15-19
Jozsef Sziray , Szechenyi University, Hungary
pp. 20-32
Section 2: Verification and Test Generation
Heon-Mo Koo , University of Florida, USA
Prabhat Mishra , University of Florida, USA
Jayanta Bhadra , Freescale Semiconductor Inc., USA
Magdy Abadir , Freescale Semiconductor Inc., USA
pp. 33-36
Marc Herbstritt , Albert-Ludwigs-University, Germany
Bernd Becker , Albert-Ludwigs-University, Germany
Christoph Scholl , Albert-Ludwigs-University, Germany
pp. 37-44
Tamarah Arons , Intel Corporation
Elad Elster , Intel Corporation
Terry Murphy , Intel Corporation
Eli Singerman , Intel Corporation
pp. 45-51
Noah Bamford , Freescale Semiconductor Ltd., China, Mexico, USA
Rekha K Bangalore , Freescale Semiconductor Ltd., China, Mexico, USA
Eric Chapman , Freescale Semiconductor Ltd., China, Mexico, USA
Hector Chavez , Freescale Semiconductor Ltd., China, Mexico, USA
Rajeev Dasari , Freescale Semiconductor Ltd., China, Mexico, USA
Yinfang Lin , Freescale Semiconductor Ltd., China, Mexico, USA
Edgar Jimenez , Freescale Semiconductor Ltd., China, Mexico, USA
pp. 52-60
Section 3: Architectural and Design Issues
Hassan Al-Sukhni , Freescale Semiconductor, Inc., USA
David Lindberg , Freescale Semiconductor, Inc., USA
James Holt , Freescale Semiconductor, Inc., USA
Michele Reese , Freescale Semiconductor, Inc., USA
pp. 61-67
Hiren D. Patel , Virginia Polytechnic Institute and State University, USA
Sandeep K. Shukla , Virginia Polytechnic Institute and State University, USA
pp. 68-75
Section 4: Design Error Debug & Diagnosis
Jianmin Zhang , National University of Defense Technology, China
Ming Yan , National University of Defense Technology, China
Sikun Li , National University of Defense Technology, China
pp. 83-87
Sean Safarpour , University of Toronto, Canada
Andreas Veneris , University of Toronto, Canada
pp. 88-93
Chia-Chih Yen , Springsoft, Inc., Taiwan
Ten Lin , Springsoft, Inc., Taiwan
Hermes Lin , Springsoft, Inc., Taiwan
Kai Yang , Novas Software, Inc., USA
Tayung Liu , Novas Software, Inc., USA
Yu-Chin Hsu , Novas Software, Inc., USA
pp. 94-98
Author Index
Author Index (PDF)
pp. 99
7 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool