• M
  • MTV
  • 2006
  • Seventh International Workshop on Microprocessor Test and Verification (MTV'06)
Advanced Search 
Seventh International Workshop on Microprocessor Test and Verification (MTV'06)
Austin, Texas
December 04-December 05
ISBN: 0-7695-2839-2
Table of Contents
Introduction
Section 1: Test
P. Bernardi, Politecnico di Torino, Italy
L. Bolzani, Politecnico di Torino, Italy
A. Manzone, Centro Ricerche Fiat, Italy
M. Osella, Centro Ricerche Fiat, Italy
M. Violante, Politecnico di Torino, Italy
M. Sonza Reorda, Politecnico di Torino, Italy
pp. 3-8
Jorge Campos, University of California, Davis, USA
Hussain Al-Asaad, University of California, Davis, USA
pp. 9-14
Section 2: Verification and Test Generation
Heon-Mo Koo, University of Florida, USA
Prabhat Mishra, University of Florida, USA
Jayanta Bhadra, Freescale Semiconductor Inc., USA
Magdy Abadir, Freescale Semiconductor Inc., USA
pp. 33-36
Marc Herbstritt, Albert-Ludwigs-University, Germany
Bernd Becker, Albert-Ludwigs-University, Germany
Christoph Scholl, Albert-Ludwigs-University, Germany
pp. 37-44
Noah Bamford, Freescale Semiconductor Ltd., China, Mexico, USA
Rekha K Bangalore, Freescale Semiconductor Ltd., China, Mexico, USA
Eric Chapman, Freescale Semiconductor Ltd., China, Mexico, USA
Hector Chavez, Freescale Semiconductor Ltd., China, Mexico, USA
Rajeev Dasari, Freescale Semiconductor Ltd., China, Mexico, USA
Yinfang Lin, Freescale Semiconductor Ltd., China, Mexico, USA
Edgar Jimenez, Freescale Semiconductor Ltd., China, Mexico, USA
pp. 52-60
Section 3: Architectural and Design Issues
Hassan Al-Sukhni, Freescale Semiconductor, Inc., USA
David Lindberg, Freescale Semiconductor, Inc., USA
James Holt, Freescale Semiconductor, Inc., USA
Michele Reese, Freescale Semiconductor, Inc., USA
pp. 61-67
Hiren D. Patel, Virginia Polytechnic Institute and State University, USA
Sandeep K. Shukla, Virginia Polytechnic Institute and State University, USA
pp. 68-75
Section 4: Design Error Debug & Diagnosis
Jianmin Zhang, National University of Defense Technology, China
Ming Yan, National University of Defense Technology, China
Sikun Li, National University of Defense Technology, China
pp. 83-87
Chia-Chih Yen, Springsoft, Inc., Taiwan
Ten Lin, Springsoft, Inc., Taiwan
Hermes Lin, Springsoft, Inc., Taiwan
Kai Yang, Novas Software, Inc., USA
Tayung Liu, Novas Software, Inc., USA
Yu-Chin Hsu, Novas Software, Inc., USA
pp. 94-98
Author Index
Usage of this product signifies your acceptance of the Terms of Use.