- M
- MTV
- 2006
- Seventh International Workshop on Microprocessor Test and Verification (MTV'06)
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| | | | Bibliographic References | | | |
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Seventh International Workshop on Microprocessor Test and Verification (MTV'06) Austin, Texas December 04-December 05 ISBN: 0-7695-2839-2 Table of Contents
 | Introduction |
 | Section 1: Test |
 | Section 2: Verification and Test Generation |
Noah Bamford, Freescale Semiconductor Ltd., China, Mexico, USA
Eric Chapman, Freescale Semiconductor Ltd., China, Mexico, USA
Yinfang Lin, Freescale Semiconductor Ltd., China, Mexico, USA pp. 52-60
 | Section 3: Architectural and Design Issues |
Hiren D. Patel, Virginia Polytechnic Institute and State University, USA pp. 68-75
 | Section 4: Design Error Debug & Diagnosis |
Ming Yan, National University of Defense Technology, China
Sikun Li, National University of Defense Technology, China pp. 83-87
 | Author Index | Usage of this product signifies your acceptance of the Terms of Use.
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