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  • Fifth International Workshop on Microprocessor Test and Verification (MTV'04)
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Fifth International Workshop on Microprocessor Test and Verification (MTV'04)
Austin, Texas
September 09-September 10
ISBN: 0-7695-2320-X
Table of Contents
Introduction
Session A: Functional Test Generation
W. Lindsay, Intel® Corporation
E. Sanchez, Politecnico di Torino
M. Sonza Reorda, Politecnico di Torino
G. Squillero, Politecnico di Torino
pp. 8-13
Session B: SOC Test
Arkan Abdulrahman, Southern Illinois University
Spyros Tragoudas, Southern Illinois University
pp. 16-21
Session C: Modeling and Verification Method
Syed Suhaib, Virginia Polytechnic and State University
Deepak Mathaikutty, Virginia Polytechnic and State University
Sandeep Shukla, Virginia Polytechnic and State University
David Berner, Institut de Recherche en Informatique et Systèmes Aléatoires
pp. 30-35
Xiuli Sun, Chinese Academy of Sciences
Jinzhao Wu, Universität Mannheim
Xiaoyu Song, Portland State University
Mila Majster-Cederbaum, Universität Mannheim
pp. 36-41
Session D: SAT and Applications
Moayad Fahim Ali, University of Toronto
Andreas Veneris, University of Toronto
Sean Safarpour, University of Toronto
Magdy Abadir, Freescale Semiconductor, Inc.
Rolf Drechsler, University of Bremen
Alexander Smith, University of Toronto
pp. 44-49
Tobias Schubert, Albert - Ludwigs - University of Freiburg
Bernd Becker, Albert - Ludwigs - University of Freiburg
pp. 56-61
Session E: Functional Verification
Prabhat Mishra, University of Florida
Nikil Dutt, University of California at Irvine
Yaron Kashai, Verisity Design, Inc.
pp. 79-84
M. Borgatti, ST-Microlectronics
A. Fedeli, ST-Microlectronics
U. Rossi, ST-Microlectronics
J.-L. Lambert, TNI-Valiosys
I. Moussa, TNI-Valiosys
F. Fummi, Università di Verona
C. Marconcini, Università di Verona
G. Pravadelli, Università di Verona
pp. 85-90
Session F: Advanced Test
M. Moiz Khan, Southern Illinois University
Spyros Tragoudas, Southern Illinois University
Magdy Abadir, Freescale Semiconductor Inc.
Brandon Liu, Freescale Semiconductor Inc.
pp. 92-96
Xiang Lu, Texas A&M University
Zhuo Li, Texas A&M University
Wangqi Qiu, Texas A&M University
D. M. H. Walker, Texas A&M University
Weiping Shi, Texas A&M University
pp. 97-102
J. Zeng, Freescale Semiconductor Inc.
M. S. Abadir, Freescale Semiconductor Inc.
G. Vandling, Cadence Design Systems
L.-C. Wang, University of California at Santa Barbara
S. Karako, Freescale Semiconductor Inc.
J. A. Abraham, University of Texas at Austin
pp. 103-109
Special Session G: Micro-Architecture Verification
Backmatter
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