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- MTV
- 2003
- Fourth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions
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Fourth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions Hyatt Town Lake Hotel, Austin, Texas May 29-May 30 ISBN: 0-7695-2045-6 Table of Contents
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 | Session A: Functional Test Generation |
Roy Emek, IBM Research Laboratory in Haifa pp. 3
 | Session B: Special Session, Research at University of Texas and Texas A&M |
 | Session C: Issues in Microprocessor Test and Verification |
 | Session E: Debug and Diagnosis |
 | Session F: SAT and ATPG |
A. Bhalla, Technical University of Lisbon, Portugal
I. Lynce, Technical University of Lisbon, Portugal pp. 69
Ohad Shacham, IBM Haifa Research Laboratory, University Campus pp. 75
 | Session G: Embedded System Validation |
 | Session H: Simulation Techniques |
Madhup Chandra, Virginia Polytechnic and State University, Blacksburg, VA
Hiren Patel, Virginia Polytechnic and State University, Blacksburg, VA
Shekhar Sharad, Virginia Polytechnic and State University, Blacksburg, VA
Syed Suhaib, Virginia Polytechnic and State University, Blacksburg, VA pp. 103
 | Session I: Case Study |
 | Session K: High-Level Verification | Usage of this product signifies your acceptance of the Terms of Use.
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