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2007 IEEE International Workshop on Memory Technology, Design and Testing
Taipei, Taiwan
December 03-December 05
ISBN: 978-1-4244-1656-1
Table of Contents
Papers
Ching-Te Chuang, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Saibal Mukhopadhyay, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Jae-Joon Kim, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Keunwoo Kim, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
Rahul Rao, IBM T. J. Watson Research Center, Yorktown Heights, NY 10598, U. S. A.
pp. 4-12
Yi-Chou Chen, Emerging Central Lab. of Macronix International Co. Ltd., Taiwan
Rich Liu, Emerging Central Lab. of Macronix International Co. Ltd., Taiwan
pp. 17-18
Hiroyuki Yamauchi, Faculty of Information Engineering, Dept. of Computer Science and Engineering, Fukuoka Institute of Technology, 3-30-1, Wajiro-Higashi, Higashi-ku, 811-0295, Japan
pp. 19-22
M. Yap San Min, LIRMM, Montpellier, France
P. Maurine, LIRMM, Montpellier, France
M. Robert, LIRMM, Montpellier, France
M. Bastian, INFINEON TECHNOLOGIES, Sophia Antipolis, France
pp. 23-26
Hao-I Yang, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Ming-Hung Chang, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Tay-Jyi Lin, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Shih-Hao Ou, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Siang-Sen Deng, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Chih-Wei Liu, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
Wei Hwang, Department of Electronics Engineering&Institute of Electronics, Microelectronics and Information System Research Center (MIRC), National Chiao-Tung University, Hsin-Chu 300, Ta
pp. 27-30
Cheng-Wen Wu, SOC Technology Center (STC), Industrial Technology Research Institute (ITRI), China
pp. 31-32
Yu-Tsao Hsing, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Song-Guang Wu, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Cheng-Wen Wu, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
pp. 33-38
Ya-Chun Lai, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Shi-Yu Huang, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
pp. 39-41
Yuan-Wei Chao, Department of Electronic Engineering, National Changhua University of Education, Taiwan
Hsin-Ling Chen, Department of Electronic Engineering, National Changhua University of Education, Taiwan
Chih-Jong Chen, Department of Electronic Engineering, National Changhua University of Education, Taiwan
Tsung-Chu Huang, Department of Electronic Engineering, National Changhua University of Education, Taiwan
pp. 42-45
Wei-Lun Wang, Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung County, Taiwan
Zheng-Wei Song, Department of Computer Science and Information Engineering, Cheng Shiu University, Kaohsiung County, Taiwan
pp. 46-49
Kuan-Ti Wang, Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
Tien-Sheng Chao, Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
Woei-Cherng Wu, Department of Electrophysics, National Chiao Tung University, 1001 Ta Hsueh Rd, Hsinchu, Taiwan
Chao-Sung Lai, Department of Electronic Engineering, Chang Gung University, 259 Wen-Hwa 1st Road, Kwei-Shan, Tao-Yuan, Taiwan
pp. 51-54
Hsin-Hwei Hsu, Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Horng-Chih Lin, Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Jian-Fu Huang, Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
Tiao-Yuan Huang, Department of Electronics Engineering and Institute of Electronics, National Chiao Tung University, 1001 Ta Hsueh Road, Hsinchu, 300, China
pp. 55-56
Meng-Fan Chang, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Shu-Meng Yang, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Kuang-Ting Chen, Department of Electrical Engineering, National Tsing Hua University, Hsinchu, Taiwan
Hung-Jen Liao, Design Technology Platform, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
Robin Lee, Design Technology Platform, Taiwan Semiconductor Manufacturing Company, Hsinchu, Taiwan
pp. 57-60
Hanjae Jeong, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Younsung Choi, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Woongryel Jeon, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Fei Yang, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Yunho Lee, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Seungjoo Kim, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
Dongho Won, Information Security Group, Sungkyunkwan University, 300 Cheoncheon-dong, Jangan-gu, Suwon, Gyeonggi-do, 440-746, Korea
pp. 61-64
C.H. Kuo, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
J.C. Wang, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Yu-Der Chih, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
James Wang, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
T.Y. Yew, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Der-Shin Shyu, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Jim Huang, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
Kyle Liu, Design Service Division, Taiwan Semiconductor Manufacturing Company, Ltd., Taiwan
pp. 65-66
Chia-Yi Liou, Department of Communication Engineering, National Chiao Tung University, HsinChu, Taiwan
Herming Chiueh, Department of Communication Engineering, National Chiao Tung University, HsinChu, Taiwan
pp. 67-70
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