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2005 IEEE International Workshop on Memory Technology, Design, and Testing (MTDT'05)
Taipei, Taiwan
August 03-August 05
ISBN: 0-7695-2313-7
Table of Contents
Introduction
Session T1: Nonvolatile Memory
Kung-Hong Lee, National Tsing-Hua University
Shih-Chen Wang, National Tsing-Hua University
Ya-Chin King, National Tsing-Hua University
pp. 3-8
Ching-Yuan Lin, eMemory Technology Incorporation
Chung-Hung Lin, eMemory Technology Incorporation
Chien-Hung Ho, eMemory Technology Incorporation
Wei-Wu Liao, eMemory Technology Incorporation
Shu-Yueh Lee, eMemory Technology Incorporation
Ming-Chou Ho, eMemory Technology Incorporation
Shih-Chen Wang, eMemory Technology Incorporation
Shih-Chan Huang, eMemory Technology Incorporation
Yuan-Tai Lin, eMemory Technology Incorporation
Charles Ching-Hsiang Hsu, eMemory Technology Incorporation
pp. 13-15
Meng-Fan Chang, National Chiao Tung University and Intellectual Property Library Company
Ding-Ming Kwai, Intellectual Property Library Company
Kuei-Ann Wen, National Chiao Tung University
pp. 16-21
Star Sung, Taiwan ImagingTek Corporation
Thomas Chang, Vanguard Semiconductor Corporation
JueiLung Chen, Vanguard Semiconductor Corporation
pp. 22-28
Session T2: New Memory Device
Simon C. Li, National Yunlin University of Science and Technology
J. M. Lee, National Yunlin University of Science and Technology
M. F. Shu, National Yunlin University of Science and Technology
J. P. Su, National Yunlin University of Science and Technology
T.-H. Wu, National Yunlin University of Science and Technology
pp. 29-34
Meng-Yi Wu, National Tsing-Hua University
Shin-Chang Feng, National Tsing-Hua University
Ya-Chin King, National Tsing-Hua University
pp. 35-37
Session T3: Design and Test of DRAM
Valerie Lines, MOSAID Technologies Incorporated
Robert McKenzie, MOSAID Technologies Incorporated
Hak-June Oh, MOSAID Technologies Incorporated
Hong-Beom Pyeon, MOSAID Technologies Incorporated
Matthew Dunn, MOSAID Technologies Incorporated
Susan Palapar, MOSAID Technologies Incorporated
Susan Coleman, MOSAID Technologies Incorporated
Peter Nyasulu, MOSAID Technologies Incorporated
Tony Mai, MOSAID Technologies Incorporated
Seanna Pike, MOSAID Technologies Incorporated
John McCready, MOSAID Technologies Incorporated
Jody Defazio, MOSAID Technologies Incorporated
Jin-Ki Kim, MOSAID Technologies Incorporated
Robert Penchuk, Analog Devices, Inc.
Zvika Greenfield, Analog Devices, Inc.
Fredy Lange, Analog Devices, Inc.
Alberto Mandler, Analog Devices, Inc.
Eric C. Jones, Analog Devices, Inc.
Matthew Silverstein, Analog Devices, Inc.
pp. 47-51
Sheng-Chih Shen, National Cheng Kung University
Hung-Ming Hsu, National Cheng Kung University
Yi-Wei Chang, National Cheng Kung University
Kuen-Jong Lee, National Cheng Kung University
pp. 52-57
Shibaji Banerjee, Indian Institute of Technology - Kharagpur
Dipanwita Roy Chowdhury, Indian Institute of Technology - Kharagpur
Bhargab B. Bhattacharya, Indian Institute of Technology - Kharagpur
pp. 58-63
Session T4: Built-In Self-Test
Po-Chang Tsai, National Chung-Hsing University
Sying-Jyan Wang, National Chung-Hsing University
Feng-Ming Chang, National Chung-Hsing University
pp. 72-77
Yang-Han Lee, Tamkang University
Yih-Guang Jan, Tamkang University
Jei-Jung Shen, Tamkang University
Shian-Wei Tzeng, Tamkang University
Ming-Hsueh Chuang, Tamkang University
Jheng-Yao Lin, Tamkang University
pp. 78-82
Session T5: Memory Test and Repair
Jen-Chieh Yeh, National Tsing Hua University
Shyr-Fen Kuo, National Tsing Hua University
Cheng-Wen Wu, National Tsing Hua University
Chih-Tsun Huang, National Tsing Hua University
Chao-Hsun Chen, Winbond Electronics Corp.
pp. 97-102
Said Hamdioui, Delft University of Technology
Zaid Al-Ars, Delft University of Technology
Ad J. van de Goor, Delft University of Technology
Rob Wadsworth, ST Microlelctronics
pp. 103-108
Keiichi Kushida, Toshiba Corporation
Nobuaki Otsuka, Toshiba Corporation
Osamu Hirabayashi, Toshiba Corporation
Yasuhisa Takeyama, Toshiba Corporation
pp. 109-114
Shyue-Kung Lu, Fu Jen Catholic University
Yu-Cheng Tsai, Fu Jen Catholic University
Shih-Chang Huang, Fu Jen Catholic University
pp. 121-126
Session T6: SRAM Design and Characterization
Shin-Pao Cheng, National Tsing-Hua University
Shi-Yu Huang, National Tsing-Hua University
pp. 135-139
Ching-Hua Hsiao, Intellectual Property Library Company and National Chiao Tung University
Ding-Ming Kwai, Intellectual Property Library Company
pp. 140-145
Chin-Long Wey, National Central University
Meng-Yao Liu, National Central University
Shaolei Quan, Michigan State University
pp. 146-151
Author Index
Author Index (PDF)
pp. 153-154
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