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Memory Technology, Design and Testin, IEEE International Workshop on (2004)
San Jose, California, USA
Aug. 9, 2004 to Aug. 10, 2004
ISBN: 0-7695-2193-2
TABLE OF CONTENTS
Introduction
Session 1: Special Session
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pp. null
Session 2: Fast ECC and Efficient Cache Controllers
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pp. null
Elaine Ou , Harvard University
Woodward Yang , Harvard University
pp. 8-12
Adil Akaaboune , Southern Illinois University at Carbondale
Nazeih Botros , Southern Illinois University at Carbondale
Jaafar Alghazo , Southern Illinois University at Carbondale
pp. 13-18
Jaafar Alghazo , Southern Illinois University at Carbondale
Adil Akaaboune , Southern Illinois University at Carbondale
Nazeih Botros , Southern Illinois University at Carbondale
pp. 19-24
Session 3: Memory Fault Coverage and Test Analysis
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pp. null
Ad J. van de Goor , Delft University of Technology
Said Hamdioui , Delft University of Technology
Zaid Al-Ars , Delft University of Technology
pp. 26-31
Zaid Al-Ars , CatRam Solutions, Delft University of Technology and Infineon Technologies
Martin Herzog , Infineon Technologies
Ivo Schanstra , Infineon Technologies
Ad J. van de Goor , Delft University of Technology
pp. 32-37
Luca Schiano , Northeastern University
Marco Ottavi , Northeastern University
Fabrizio Lombardi , Northeastern University
pp. 38-43
Session 4: Special Session
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pp. null
Session 5: Embedded Memory Test Trends and Future
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pp. null
Said Hamdioui , Delft University of Technology
Georgi Gaydadjiev , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
pp. 54-59
Shyue-Kung Lu , Fu Jen Catholic University
Shih-Chang Huang , Fu Jen Catholic University
pp. 60-64
Li-Ming Denq , National Tsing Hua University
Rei-Fu Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Yeong-Jar Chang , Industrial Technology Research Institute
Wen-Ching Wu , Industrial Technology Research Institute
pp. 65-69
Session 6: Industrial Practices on BIST, BISD and BISR
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pp. null
R. Zappa , STMicroelectronics
C. Selva , STMicroelectronics
D. Rimondi , STMicroelectronics
C. Torelli , STMicroelectronics
M. Crestan , STMicroelectronics
G. Mastrodomenico , STMicroelectronics
L. Albani , STMicroelectronics
pp. 72-77
Carolina Selva , STMicroelectronics
Cosimo Torelli , STMicroelectronics
Danilo Rimondi , STMicroelectronics
Rita Zappa , STMicroelectronics
Stefano Corbani , STMicroelectronics
Giovanni Mastrodomenico , STMicroelectronics
Lara Albani , STMicroelectronics
pp. 84-89
Session 7: EDA Solutions to Test and Repair Memories
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pp. null
R. Dean Adams , Magma Design Automation
Robert Abbott , Magma Design Automation
Xiaoliang Bai , Magma Design Automation
Dwayne Burek , Magma Design Automation
Eric MacDonald , University of Texas at El Paso
pp. 92-95
Saman Adham , LogicVision, Inc.
Benoit Nadeau-Dostie , LogicVision, Inc.
pp. 98-101
Session 8: Making Memories More Reliable
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pp. null
N. Derhacobian , Virage Logic Corporation
V. A. Vardanian , Virage Logic Corporation
Y. Zorian , Virage Logic Corporation
pp. 104-110
Michael Spica , Intel Corporation
TM Mak , Intel Corporation
pp. 111-116
Rob Aitken , Artisan Components
pp. 117-120
Author Index
Author Index (PDF)
pp. 121
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