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2000 IEEE International Workshop on Memory Technology, Design and Testing (MTDT'00)
San Jose, California
August 07-August 08
ISBN: 0-7695-0689-5
Table of Contents
Plenary Session
Welcome Message
Program Introduction
Session 1: Failure Mechanism/Defects: Chair: Betty Prince, Memory Strategy International
Session 2: Flash/EEPROM Design: Chair: Alex Shubat, Virage Logic
Rino Micheloni, STMicroelectronics
Matteo Zammattio, STMicroelectronics
Giovanni Campardo, STMicroelectronics
Osama Khouri, University of Pavia
Guido Torelli, University of Pavia
pp. 29
Osama Khouri, STMicroelectronics and University of Pavia
Rino Micheloni, STMicroelectronics
Stefano Gregori, University of Pavia
Guido Torelli, University of Pavia
pp. 34
Jean Michel Daga, ATMEL ROUSSETRANCE
Caroline Papaix, ATMEL ROUSSETRANCE
Marc Merandat, ATMEL ROUSSETRANCE
Stephane Ricard, ATMEL ROUSSETRANCE
Giuseppe Medulla, ATMEL ROUSSETRANCE
Jeanine Guichaoua, ATMEL ROUSSETRANCE
Daniel Auvergne, Montpellier II University
pp. 39
Session 3: New Ideas: Chair: Fabrizio Lombardi, Northeastern University
Ruili Zhang, Texas Instruments
William C. Black Jr, Iowa State University
Marwan M. Hassoun, Iowa State University
pp. 47
Session 4
Future Memory Challenges
Session 5: Test and Yield: Chair: Robert Evans, Mosaid
Session 6: Memory Testing and Built-in Self-Test: Chair: Swamy Irrinki, LSI Logic
Said Hamdioui, Delft University of Technology and Intel Corporation
Ad J. van de Goor, Delft University of Technology
Mike Rodgers, Intel Corporation
David Eastwick, Intel Corporation
pp. 73
Michael Redeker, University of Hannover
Markus Rudack, University of Hannover
Thomas Lobbe, University of Hannover
Dirk Niggemeyer, University of Illinois at Urbana-Champaign
pp. 85
Invited Address
1-T Sram
Session 7: Memory Design: Chair: Robert Gibbins, Nortel
Valerie Lines, Mosaid Technologies Incorporated
Abdullah Ahmed, Mosaid Technologies Incorporated
Peter Ma, Mosaid Technologies Incorporated
Stanley Ma, Mosaid Technologies Incorporated
Robert McKenzie, Mosaid Technologies Incorporated
Hong-Seok Kim, Mosaid Technologies Incorporated
Cynthia Mar, Mosaid Technologies Incorporated
pp. 101
C. Frey, ST Microelectronics
F. Genevaux, ST Microelectronics
C. Issartel, ST Microelectronics
D. Turgis, ST Microelectronics
Jp. Schoellkopf, ST Microelectronics
pp. 106
Session 8: Diagnosis: Chair: Sharon Murray, Medtronic Micro-Rel
Dirk Niggemeyer, University of Illinois at Urbana-Champaign
Elizabeth M. Rudnick, University of Illinois at Urbana-Champaign
Michael Redeker, University of Hannover
pp. 113
Zemo Yang, Santa Clara University
Samiha Mourad, Santa Clara University
pp. 125
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