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2012 45th Annual IEEE/ACM International Symposium on Microarchitecture (2007)
Chicago, Illinois, USA
Dec. 1, 2007 to Dec. 5, 2007
ISBN: 0-7695-3047-8
Session 1: Technology Issues
Session 1: Technology Issues
Session 2A: Instruction Scheduling
Session 2B: Wear-Out Aware Architectures
Session 3A: Memory
Session 3B: Networking and Security
Session 4A: Reliability
Session 4B: Simulation/Workload Analysis
Session 5: Prefetching and Snooping
Session 6: Parallelism and QoS in CMPs
Session 7: Parallel Architectures
Session 8: Cache Replacement Policies
Author Index
Author Index (PDF)
pp. 455
17 ms
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