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10th IEEE International Symposium on Software Metrics (METRICS'04)
Chicago, Illinois
September 11-September 17
ISBN: 0-7695-2129-0
Table of Contents
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Keynote (PDF)
pp. xii-xii
Session 1a: Studies of Maintenance and Evolution
Birgit Geppert, Avaya Labs, Software Technology Research
Frank R??ler, Avaya Labs, Software Technology Research
pp. 14-25
Nikolaos Tsantalis, University of Macedonia, Greece
Alexander Chatzigeorgiou, University of Macedonia, Greece
George Stephanides, University of Macedonia, Greece
Ignatios Deligiannis, Technological Education Institute of Thessaloniki, Greece
pp. 26-33
Session 1b: Theory and Measurement
Mark Harman, Brunel University, UK
John Clark, The University of York, UK
pp. 58-69
Session 2a: Component-Based Software Engineering
Jingyue Li, Norwegian Univ. of Science and Technology, Norway
Finn Olav Bj?rnson, Norwegian Univ. of Science and Technology, Norway
Reidar Conradi, Norwegian Univ. of Science and Technology, Norway; Simula Research Laboratory, Norway
Vigdis By Kampenes, Simula Research Laboratory, Norway
pp. 72-83
Trung Dinh-Trong, Colorado State University, Fort Collins
James M. Bieman, Colorado State University, Fort Collins
pp. 96-105
Session 2b: Data Analysis Methods
Per J?nsson, Blekinge Institute of Technology, Ronneby, Sweden
Claes Wohlin, Blekinge Institute of Technology, Ronneby, Sweden
pp. 108-118
Taghi M. Khoshgoftaar, Florida Atlantic University, Boca Raton
Naeem Seliya, Florida Atlantic University, Boca Raton
pp. 119-130
Maureen Brown, University of North Carolina
Dennis Goldenson, Software Engineering Institute
pp. 131-138
Session 4a: Advances in Empirical Software Engineering
Session 4b: Project Management
Austen Rainer, University of Hertfordshire, England
Tracy Hall, University of Hertfordshire, England
pp. 184-195
Jyrki Kontio, Helsinki University of Technology, Finland
Jani-Pekka Jokinen, Helsinki University of Technology, Finland
Esa Rosendahl, Finnish Institute of Occupational Health, Finland
pp. 196-206
Session 5a: Software Industry Surveys
Kjetil Mol?kken-?stvold, Simula Research Laboratory, Lysaker, Norway; Department of Informatics, Oslo, Norway
Magne J?rgensen, Simula Research Laboratory, Lysaker, Norway
Sinan S. Tanilkan, Department of Informatics, Oslo, Norway
pp. 208-219
Juhana Hietala, Helsinki University of Technology, Finland
Jyrki Kontio, Helsinki University of Technology, Finland
Jani-Pekka Jokinen, Helsinki University of Technology, Finland
Jarkko Pyysi?inen, Helsinki University of Technology, Finland
pp. 232-243
Session 5b: Empirical Studies of Inspections
Thomas Thelin, Lund University, Sweden
Carina Andersson, Lund University, Sweden
Per Runeson, Lund University, Sweden
Nina Dzamashvili-Fogelstr?, Blekinge Institute of Technology, Sweden
pp. 246-256
B. Bern?rdez, University of Seville, Spain
M. Genero, University of Castilla-La Mancha, Spain
A. Dur?, University of Seville, Spain
M. Toro, University of Seville, Spain
pp. 257-268
Filippo Lanubile, University of Bari, Italy
Teresa Mallardo, University of Bari, Italy
Fabio Calefato, University of Bari, Italy
Christian Denger, Fraunhofer IESE, Kaiserslautern, Germany
Marcus Ciolkowski, University of Kaiserslautern, Kaiserslautern, Germany
pp. 269-279
Session 6a: Software Size Measurement
Giovanni Cantone, University of Rome "Tor Vergata", DISP, Italy
Davide Pace, University of Rome "Tor Vergata", DISP, Italy
Giuseppe Calavaro, IBM - Rational Software, Italy
pp. 280-291
Shinji Kusumoto, Osaka University, Japan
Fumikazu Matukawa, Osaka University, Japan
Katsuro Inoue, Osaka University, Japan
Shigeo Hanabusa, Hitachi Systems & Services, Ltd., Japan
Yuusuke Maegawa, Hitachi Systems & Services, Ltd., Japan
pp. 292-299
Ang?lica Toffano Calazans, Caixa Econ?mica Federal, Brazil
K?thia Mar?al de Oliveira, Catholic University of Bras?lia, Brazil
Rildo Ribeiro dos Santos, Catholic University of Bras?lia, Brazil
pp. 300-311
Session 8a: Assessment
Michael Berry, National ICT Australia; University of New South Wales, Australia
Ross Jeffery, National ICT Australia; University of New South Wales, Australia
Ayb? Aurum, University of New South Wales, Australia
pp. 314-325
Maurizio Morisio, Politecnico di Torino, Italy
Marco Torchiano, Politecnico di Torino, Italy
Giovanni Argentieri, Politecnico di Torino, Italy
pp. 326-336
Guy Saward, University of Hertfordshire, UK
Tracy Hall, University of Hertfordshire, UK
Trevor Barker, University of Hertfordshire, UK
pp. 337-346
Session 8b: Industry Experience Papers
Achieving Statistical Process Control in Software Development: Practical SPC Examples
The Long Term Impact of Domain Engineering on Software Quality and Change Effort
Determining Defect Trends and Identifying Critical Discriminators: A Case Study
Session 9a: Effort Prediction for Web Development
Silvia Abrah?, Valencia University of Technology, Spain
Geert Poels, Ghent University, Belgium
Oscar Pastor, Valencia University of Technology, Spain
pp. 358-369
Paul Umbers, Internistic Ltd, Birmingham, UK
Gail Miles, Lenoir-Rhyne College, North Carolina, USA
pp. 370-381
Session 9b: Defect Analysis
W. Abdelmoez, West Virginia University, Morgantown WV
D. M. Nassar, West Virginia University, Morgantown WV
M. Shereshevsky, West Virginia University, Morgantown WV
N. Gradetsky, West Virginia University, Morgantown WV
R. Gunnalan, West Virginia University, Morgantown WV
H. H. Ammar, West Virginia University, Morgantown WV
Bo Yu, New Jersey Institute of Technology, Newark NJ
A. Mili, New Jersey Institute of Technology, Newark NJ
pp. 384-393
A. Geras, University of Calgary
M. Smith, University of Calgary
J. Miller, University of Alberta
pp. 405-416
Author Index (PDF)
pp. 417-417
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