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Fifth International Symposium on Software Metrics (METRICS'98)
Bethesda, Maryland
March 20-March 21
ISBN: 0-8186-9201-4
Table of Contents
Keynote Address:
Testing for Year 2000 Conversion
Session 1A: Architectural Metrics
G. Antoniol, Istituto per la Ricerca Scientifica e Tecnologica
R. Fiutem, Istituto per la Ricerca Scientifica e Tecnologica
L. Cristoforetti, Istituto per la Ricerca Scientifica e Tecnologica
pp. 23
Session 2A: Software Process Improvement
Khaled El Emam, Fraunhofer Institute for Experimental Software Engineering
Sonia Rousseau, Sanofi Pharma
Eric Jacquet, Sanofi Pharma
pp. 38
Frank McGarry, Computer Sciences Corporation
Steve Burke, Computer Sciences Corporation
Bill Decker, Computer Sciences Corporation
pp. 52
Session 2B: New and Novel ? Short Presentations
David Escala, Universitat Polit?cnica de Catalunya
Maurizio Morisio, Politecnico di Torino
pp. 89
Session 3A: Error Models and Measures
Session 3B: State of the Art Reports
A.J.C. Cowderoy, The Multimedia House of Quality
A.J.M. Donaldson, Center for MultiMedia Quality
J.O. Jenkins, City University and Middlesex University
pp. 144
Session 4A: Object-Oriented Measures
R. Harrison, University of Southampton
S. Counsell, University of Southampton
R. Nithi, University of Southampton
pp. 150
Session 4B: State of the Art Reports
Session 5A: Program Management Measures
Jacob W. Ulvila, Decision Science Associates, Inc
James O. Chinnis Jr, Decision Science Associates, Inc
John E. Gaffney Jr, Lockheed Martin
pp. 184
Gerald Atkinson, Microsoft Corporation
Jack Hagemeister, University of Idaho
Paul Oman, University of Idaho
Ambika Baburaj, University of Idaho
pp. 193
Session 5B: Formal Models
Session 6A: Testing Measures
Lionel C. Briand, Fraunhofer Institute for Experimental Software Engineering
Jürgen Wüst, Fraunhofer Institute for Experimental Software Engineering
John Daly, Hewlett Packard Ltd
Victor Porter, IBM Perth
pp. 246
Todd L. Graves, National Institute of Statistical Sciences and Bell Laboratories
Audris Mockus, Bell Laboratories
pp. 267
Session 6B: State of the Art Reports ? Industrial Practices
The Future of Metrics and Their Application in an Information Systems and Information Technology Environment
Concluding Panel
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