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Fourth International Software Metrics Symposium (METRICS'97)
Albuquerque, NM
November 05-November 07
ISBN: 0-8186-8093-8
Table of Contents
Process Improvement: Session Chair: J. Herbsleb
F. Maurice, Universit? Paul Sabatier
A. Benzekri, Universit? Paul Sabatier
Y. Raynaud, Universit? Paul Sabatier
pp. 12
M M Lehman, Imperial College of Science, Technology and Medicine
J F Ramil, Imperial College of Science, Technology and Medicine
P D Wernick, Imperial College of Science, Technology and Medicine
D E Perry, Bell Laboratories
W M Turski, Warsaw University
pp. 20
Theory and Methodology I: Session Chair: J. Verner
Metrics Applied to Testing: Session Chair: TBA
Jianqiang Zhuo, Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
P. Oman, Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
R. Pichai, Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
S. Sahni, Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
pp. 74
W. E. Wong, Bell Communications Research
G. J. Knafl, DePaul University
J. A. Morgan, DePaul University
pp. 82
Application/Phase/Paradigm Specific Measurement: Session Chair: TBA
H.H. Ammar, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
T. Nikzadeh, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
J.B. Dugan, Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
pp. 108
Theory and Methodology II: Session Chair: H. Zuse
S. Morasca, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
L.C. Briand, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
pp. 119
Uses of Software Measurement: Session Chair: D. Goldenson
G. Cugola, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
A. Fuggetta, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
P. Fusaro, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
C.G. Von Wangenheim, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
L. Lavazza, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
S. Manca, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
M.R. Pagone, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
G. Ruhe, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
R. Soro, Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
pp. 144
R. Van Solingen, Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
E. Berghout, Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
E. Kooiman, Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
pp. 152
Richard N. Ferri, AT&T Network and Computer Services
Raghavan N. Pratiwadi, AT&T Network and Computer Services
Lynn M. Rivera, AT&T Network and Computer Services
Mohammed Shakir, AT&T Network and Computer Services
John J. Snyder, AT&T Network and Computer Services
D. W. Thomas, AT&T Network and Computer Services
Yih-Farn Chen, AT&T Labs - Research
Glenn S. Fowler, AT&T Labs - Research
Balachander Krishnamurthy, AT&T Labs - Research
Kiem-Phong Vo, AT&T Labs - Research
pp. 165
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