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Software Metrics, IEEE International Symposium on (1997)
Albuquerque, NM
Nov. 5, 1997 to Nov. 7, 1997
ISBN: 0-8186-8093-8
TABLE OF CONTENTS
Process Improvement: Session Chair: J. Herbsleb
F. Maurice , Universit? Paul Sabatier
A. Benzekri , Universit? Paul Sabatier
Y. Raynaud , Universit? Paul Sabatier
pp. 12
M M Lehman , Imperial College of Science, Technology and Medicine
P D Wernick , Imperial College of Science, Technology and Medicine
D E Perry , Bell Laboratories
W M Turski , Warsaw University
pp. 20
Theory and Methodology I: Session Chair: J. Verner
Metrics Applied to Testing: Session Chair: TBA
Stuart C. Reid , Cranfield University Royal Military College of Science
pp. 64
P. Oman , Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
R. Pichai , Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
Jianqiang Zhuo , Software Eng. Test Lab., Idaho Univ., Moscow, ID, USA
pp. 74
G. J. Knafl , DePaul University
J. A. Morgan , DePaul University
pp. 82
Application/Phase/Paradigm Specific Measurement: Session Chair: TBA
T. Nikzadeh , Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
J.B. Dugan , Dept. of Comput. Sci. & Electr. Eng., West Virginia Univ., Morgantown, WV, USA
pp. 108
Theory and Methodology II: Session Chair: H. Zuse
S. Morasca , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
L.C. Briand , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
pp. 119
N.F. Schneidewind , Naval Postgraduate Sch., Monterey, CA, USA
pp. 127
Uses of Software Measurement: Session Chair: D. Goldenson
A. Fuggetta , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
P. Fusaro , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
C.G. Von Wangenheim , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
L. Lavazza , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
S. Manca , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
M.R. Pagone , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
G. Ruhe , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
R. Soro , Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
pp. 144
R. Van Solingen , Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
E. Berghout , Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
E. Kooiman , Schlumberger RPS, Eindhoven Univ. of Technol., Netherlands
pp. 152
Raghavan N. Pratiwadi , AT&T Network and Computer Services
Richard N. Ferri , AT&T Network and Computer Services
Mohammed Shakir , AT&T Network and Computer Services
John J. Snyder , AT&T Network and Computer Services
D. W. Thomas , AT&T Network and Computer Services
Yih-Farn Chen , AT&T Labs - Research
Glenn S. Fowler , AT&T Labs - Research
Balachander Krishnamurthy , AT&T Labs - Research
Kiem-Phong Vo , AT&T Labs - Research
pp. 165
pp. 175
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