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Proceedings. Ninth International Workshop on Frontiers in Handwriting Recognition (2004)
Kokubunji, Tokyo, Japan
Oct. 26, 2004 to Oct. 29, 2004
ISBN: 0-7695-2187-8
TABLE OF CONTENTS
Papers
Reviewers (PDF)
pp. xvi
Sponsors (PDF)
pp. xvii
Foreword (PDF)
pp. xiii
Introduction
Foreword (PDF)
pp. xiii
Handwriting Recognition and Shape Analysis
Hiroto Mitoma , Kyushu University
Seiichi Uchida , Kyushu University
Hiroaki Sakoe , Kyushu University
pp. 3-8
Loïc Oudot , Laboratoire des Instruments et Systèmes déIle de France
Lionel Prevost , Laboratoire des Instruments et Systèmes déIle de France
Alvaro Moises , Laboratoire des Instruments et Systèmes déIle de France
pp. 9-13
Sanparith Marukatat , Universit? Paris 6
Thierry Arti?res , Universit? Paris 6
pp. 14-19
Balaji Krishnapuram , Microsoft Research
Christopher M. Bishop , Microsoft Research
Martin Szummer , Microsoft Research
pp. 20-25
Martin Szummer , Microsoft Research
Yuan Qi , Microsoft Research
pp. 32-37
Classification Techniques
Luiz S. Oliveira , Pontifícia Universidade Católica do Paraná
Robert Sabourin , Pontifícia Universidade Católica do Paraná
pp. 39-44
K. T. Abou-Moustafa , Concordia University and Ecole de Technologie Superieure
M. Cheriet , Ecole de Technologie Superieure
C. Y. Suen , Concordia University
pp. 51-56
Jonathan Milgram , ?cole de Technologie Sup?rieure
Mohamed Cheriet , ?cole de Technologie Sup?rieure
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 57-62
Rainer Lindwurm , Siemens Dematic AG
Jörg Rottland , Siemens Dematic AG
pp. 75-80
Marisa Morita , Pontifícia Universidade Católica do Paraná
Luiz S. Oliveira , Pontifícia Universidade Católica do Paraná
Robert Sabourin , Pontifícia Universidade Católica do Paraná
pp. 81-86
C. Chatelain , Universit? de Rouen
L. Heutte , Universit? de Rouen
T. Paquet , Universit? de Rouen
pp. 93-98
Handwriting Analysis and Gesture Recognition
Nianjun Liu , University of Queensland
Brian C. Lovell , University of Queensland
Peter J. Kootsookos , University of Queensland
Richard I. A. Davis , University of Queensland
pp. 100-105
Sung-Jung Cho , Samsung Advanced Institute of Technology
Jong Koo Oh , Samsung Advanced Institute of Technology
Won-Chul Bang , Samsung Advanced Institute of Technology
Wook Chang , Samsung Advanced Institute of Technology
Eunseok Choi , Samsung Advanced Institute of Technology
Yang Jing , Samsung Advanced Institute of Technology
Joonkee Cho , Samsung Advanced Institute of Technology
Dong Yoon Kim , Samsung Advanced Institute of Technology
pp. 106-111
Jong K. Oh , Samsung Advanced Institute of Technology
Sung-Jung Cho , Samsung Advanced Institute of Technology
Won-Chul Bang , Samsung Advanced Institute of Technology
Wook Chang , Samsung Advanced Institute of Technology
Eunseok Choi , Samsung Advanced Institute of Technology
Jing Yang , Samsung Advanced Institute of Technology
Joonkee Cho , Samsung Advanced Institute of Technology
Dong Yoon Kim , Samsung Advanced Institute of Technology
pp. 112-117
Yu Qiao , University of Electro-Communications
Makato Yasuhara , University of Electro-Communications
pp. 118-123
Claudio De Stefano , Universit? di Cassino
Marco Garruto , Universit? di Salerno
Angelo Marcelli , Universit? di Salerno
pp. 124-129
Hyunil Choi , Korea Advanced Institute of Science and Technology
Sung Jung Cho , Samsung Advanced Institute of Technology
Jin H. Kim , Korea Advanced Institute of Science and Technology
pp. 130-135
Ajay S. Bhaskarabhatla , Hewlett-Packard Labs
Sriganesh Madhvanath , Hewlett-Packard Labs
M. N. S. S. K. Pavan Kumar , International Institute of Information Technology
A. Balasubramanian , International Institute of Information Technology
C. V. Jawahar , International Institute of Information Technology
pp. 136-141
Christopher M. Bishop , Microsoft Research
Markus Svensén , Microsoft Research
Geoffrey E. Hinton , University of Toronto
pp. 142-147
J. Blanchard , Universit? Paris 6
T. Arti?res , Universit? Paris 6
pp. 148-153
Ming Ye , Microsoft Corporation
Paul Viola , Microsoft Corporation
pp. 154-159
Signature Verification and Writer Identification
Sargur N. Srihari , State University of New York at Buffalo
Aihua Xu , State University of New York at Buffalo
Meenakshi K. Kalera , State University of New York at Buffalo
pp. 161-166
Andreas Schlapbach , University of Bern
Horst Bunke , University of Bern
pp. 167-172
Katrin Franke , Fraunhofer Institute for Production Systems and Design Technology
Steffen Rose , Fraunhofer Institute for Production Systems and Design Technology
pp. 173-178
G. Dimauro , Universit? degli Studi di Bari
S. Impedovo , Universit? degli Studi di Bari
M. G. Lucchese , Universit? degli Studi di Bari
R. Modugno , Universit? degli Studi di Bari
G. Pirlo , Universit? degli Studi di Bari
pp. 179-184
Hansheng Lei , State University of New York at Buffalo
Srinivas Palla , State University of New York at Buffalo
Venu Govindaraju , State University of New York at Buffalo
pp. 191-195
Ameur Bensefia , University of Rouen
Thierry Paquet , University of Rouen
Laurent Heutte , University of Rouen
pp. 196-201
Recognition of Word and Text
Matthias Zimmermann , University of Bern
Horst Bunke , University of Bern
pp. 203-208
Marcelo N. Kapp , Pontif?cia Universidade Cat?lica do Paran?
Cinthia O. De A. Freitas , Pontif?cia Universidade Cat?lica do Paran?
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 209-214
Alessandro L. Koerich , Pontifical Catholic University of Paraná
Robert Sabourin , École de Technologie Supérieure
Ching Y. Suen , Concordia University
pp. 232-237
Document Analysis and Applications
Chen Yan , Nanyang Technological University
Graham Leedham , Nanyang Technological University
pp. 239-244
St?phane Nicolas , Universit? de Rouen
Thierry Paquet , Universit? de Rouen
Laurent Heutte , Universit? de Rouen
pp. 245-250
Yiping Yang , Tokyo University of Agriculture and Technology Affiliation
Masaki Nakagawa , Tokyo University of Agriculture and Technology Affiliation
pp. 251-256
Yuan-Xiang Li , National University of Singapore
Chew Lim Tan , National University of Singapore
pp. 257-262
Hanshen Tang , Concordia University
Emmanuel Augustin , Artificial Intelligence and Image Analysis
Ching Y. Suen , Concordia University
Olivier Baret , Artificial Intelligence and Image Analysis
Mohamed Cheriet , ?cole de Technologie Sup?rieure
pp. 263-268
Naohiro Furukawa , Hitachi, Ltd.
Hisashi Ikeda , Hitachi, Ltd.
Yosuke Kato , Hitachi, Ltd.
Hiroshi Sako , Hitachi, Ltd.
pp. 269-274
History and Future Prospects
Segmentation and Preprocessing
Yun Lei , Tsinghua University
C. S. Liu , Tsinghua University
X. Q. Ding , Tsinghua University
Qiang Fu , Tsinghua University
pp. 294-299
N. Tripathy , Indian Statistical Institute
U. Pal , Indian Statistical Institute
pp. 306-311
Ergina Kavallieratou , TEI of Ionian Islands
Stathis Stamatatos , TEI of Ionian Islands
Hera Antonopoulou , Computer Technology Institute
pp. 312-316
J. Sadri , Concordia University
C. Y. Suen , Concordia University
T. D. Bui , Concordia University
pp. 317-322
Yimei Ding , Mie University
Wataru Ohyama , Mie University
Fumitaka Kimura , Mie University
M Shridhar , University of Michigan-Dearborn
pp. 328-333
Misako Suwa , Fujitsu Labs. Ltd.
Satoshi Naoi , Fujitsu Labs. Ltd.
pp. 334-339
Feature Extraction and Feature Selection
P. Zhang , Concordia University
T. D. Bui , Concordia University
C. Y. Suen , Concordia University
pp. 347-352
Swe Myo Htwe , University of Nottingham
Colin Higgins , University of Nottingham
Graham Leedham , Nanyang Technological University,
Ma Yang , Nanyang Technological University,
pp. 359-364
Carlos M. Nunes , Pontif?cia Universidade Cat?lica do Paran?
Alceu de S. Britto Jr. , Pontif?cia Universidade Cat?lica do Paran? and Universidade Estadual de Ponta Grossa
Celso A. A. Kaestner , Pontif?cia Universidade Cat?lica do Paran?
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 365-370
Alceu de S. Britto Jr. , Pontif?cia Universidade Cat?lica do Paran? and Universidade Estadual de Ponta Grossa
Robert Sabourin , ?cole de Technologie Sup?rieure and Centre for Pattern Recognition and Machine Intelligence
Flavio Bortolozzi , Pontif?cia Universidade Cat?lica do Paran?
Ching Y. Suen , Centre for Pattern Recognition and Machine Intelligence
pp. 371-376
Toshio Sakata , Kyushu University
Ryuei Nishii , Kyushu University
Tan Siang Chin , Kyushu University
Ryuichi Sawae , Okayama University of Science
pp. 377-381
Character Recognition
Takao Kobayashi , Tokyo University of Agriculture and Technology
Masaki Nakagawa , Tokyo University of Agriculture and Technology
pp. 389-394
John A. Fitzgerald , University College Dublin
Franz Geiselbrechtinger , University College Dublin
Tahar Kechadi , University College Dublin
pp. 395-400
Sanparith Marukatat , Universit? Paris 6
Thierry Arti?res , Universit? Paris 6
Patrick Gallinari , Universit? Paris 6
pp. 401-406
Henri Binsztok , Universit? Paris VI
Thierry Arti?res , Universit? Paris VI
pp. 407-412
S. Chindaro , University of Kent
K. Sirlantzis , University of Kent
M. C. Fairhurst , University of Kent
S. Hoque , University of Kent
pp. 413-418
U. Bhattacharya , Indian Statistical Institute
S. Vajda , LORIA Research Center
A. Mallick , Indian Statistical Institute
B. B. Chaudhuri , Indian Statistical Institute
A. Belaid , LORIA Research Center
pp. 419-424
Asian Character Recognition
Guang-yuan Zhang , Northeastern University and Shenyang University
Jing-jiao Li , Northeastern University
Rong-wei He , Liaoning archives Library
Ai-xia Wang , Northeastern University
pp. 432-437
K. H. Aparna, , Indian Institute of Technology - Chennai
Vidhya Subramanian , Indian Institute of Technology - Chennai
M. Kasirajan , Indian Institute of Technology - Chennai
G. Vijay Prakash , Indian Institute of Technology - Chennai
V. S. Chakravarthy , Indian Institute of Technology - Chennai
Sriganesh Madhvanath , Hewlett-Packard India
pp. 438-443
Niranjan Joshi , Indian Institute of Science - Bangalore
G. Sita , Indian Institute of Science - Bangalore
A. G. Ramakrishnan , Indian Institute of Science - Bangalore
Sriganesh Madhvanath , Hewlett-Packard Labs
pp. 444-449
Ithipan Methasate , National Science and Technology Development Agency - Thailand
Sutat Sae-tang , National Science and Technology Development Agency - Thailand
pp. 450-454
Word Recognition and Linguistic Approaches
Jahwan Kim , Korea Advanced Institute of Science Technology
Sungho Ryu , Korea Advanced Institute of Science Technology
Jin H. Kim , Korea Advanced Institute of Science Technology
pp. 456-461
Guillaume Koch , Universit? de Rouen
Thierry Paquet , Universit? de Rouen
Laurent Heutte , Universit? de Rouen
pp. 468-473
Srinivas Palla , University at Buffalo
Hansheng Lei , University at Buffalo
Venu Govindaraju , University at Buffalo
pp. 474-478
Alessandro L. Koerich , Pontifical Catholic University of Paraná
pp. 479-484
Loïc Oudot , Laboratoire des Instruments et Systèmes déIle de France
Lionel Prevost , Laboratoire des Instruments et Systèmes déIle de France
Maurice Milgram , Laboratoire des Instruments et Systèmes déIle de France
pp. 485-490
Signature Verification and Writer Identification
R. M. Guest , University of Kent
pp. 492-497
Cesar Santos , Pontif?cia Universidade Cat?lica do Paran?
Edson J. R. Justino , Pontif?cia Universidade Cat?lica do Paran?
Fl?vio Bortolozzi , Pontif?cia Universidade Cat?lica do Paran?
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 498-502
M. Wirotius , Universit? de Tours
J.-Y. Ramel , Universit? de Tours
N. Vincent , Universit? Paris 5
pp. 503-508
Xianliang Wang , Tsinghua University
Xiaoqing Ding , Tsinghua University
pp. 509-603
Applications
Hala Bezine , National School of Engineers of Sfax
Adel M. Alimi , National School of Engineers of Sfax
Nasser Sherkat , School of Computing and Mathematics of Nottingham
pp. 515-520
Tatsuo Akiyama , NEC Corporation
Daisuke Nishiwaki , NEC Corporation
Eiki Ishidera , NEC Corporation
Katsuhiko Kondoh , NEC Corporation
Masato Hayashi , NEC Corporation
Toshifumi Yamauchi , NEC Corporation
pp. 527-532
Naomi Iwayama , Fujitsu Laboratories Ltd.
Katsuhiko Akiyama , Fujitsu Laboratories Ltd.
Hiroshi Tanaka , Fujitsu Laboratories Ltd.
Hiroaki Tamura , Fujitsu Laboratories Ltd.
Kazushi Ishigaki , Fujitsu Laboratories Ltd.
pp. 533-538
Chunheng Wang , Fujitsu R&D Center Co. Ltd.
Yoshinobu Hotta , Fujitsu Laboratories Ltd.
Misako Suwa , Fujitsu Laboratories Ltd.
Satoshi Naoi , Fujitsu Laboratories Ltd.
pp. 539-544
Hideto Oda , Tokyo University of Agriculture and Technology
Akihito Kitadai , Tokyo University of Agriculture and Technology
Motoki Onuma , Tokyo University of Agriculture and Technology
Masaki Nakagawa , Tokyo University of Agriculture and Technology
pp. 545-550
Tomokazu Terai , Waseda University
Shinji Mizuno , Toyohashi University of Technology
Minoru Okada , Waseda University
pp. 551-556
Kamesh Madduri , Indian Institute of Technology - Madras
K. H. Aparna , Indian Institute of Technology - Madras
V. S. Chakravarthy , Indian Institute of Technology - Madras
pp. 557-562
Katrin Franke , Fraunhofer Institute
Isabelle Guyon , ClopiNet
Lambert Schomaker , Rijksuniversiteit Groningen
Louis Vuurpijl , University of Nijmegen
pp. 563-568
Michael Shilman , Microsoft Research
Paul Viola , Microsoft Research
Kumar Chellapilla , Microsoft Research
pp. 569-574
William B. Huber , Pace University
Sung-Hyuk Cha , Pace University
Charles C. Tapper , Pace University
Vicki L. Hanson , IBM T. J. Watson Research Center
pp. 575-579
K. Roy , Indian Statistical Institute
S. Vajda , LORIA Research Center
U. Pal , Indian Statistical Institute
B. B. Chaudhuri , Indian Statistical Institute
pp. 580-585
Louis Vuurpijl , Nijmegen Institute for Cognition and Information
Ralph Niels , Nijmegen Institute for Cognition and Information
Merijn van Erp , Nijmegen Institute for Cognition and Information
Lambert Schomaker , University of Groningen
Eugene Ratzlaff , IBM Research
pp. 586-591
Meng Shi , Mie University
Wataru Ohyama , Mie University
Tetsushi Wakabayashi , Mie University
Fumitaka Kimura , Mie University
pp. 592-596
Stéphane Rossignol , University of Nijmegen
Don Willems , University of Nijmegen
Andre Neumann , University of Nijmegen
Louis Vuurpijl , University of Nijmegen
pp. 597-602
Author Index
Author Index (PDF)
pp. 603-605
5 ms
(Ver 2.0)

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