The Community for Technology Leaders
RSS Icon
Subscribe
Proceedings. Ninth International Workshop on Frontiers in Handwriting Recognition (2004)
Kokubunji, Tokyo, Japan
Oct. 26, 2004 to Oct. 29, 2004
ISBN: 0-7695-2187-8
TABLE OF CONTENTS
Papers
Reviewers (PDF)
pp. xvi
Sponsors (PDF)
pp. xvii
Foreword (PDF)
pp. xiii
Introduction
Foreword (PDF)
pp. xiii
Handwriting Recognition and Shape Analysis
Hiroto Mitoma , Kyushu University
Hiroaki Sakoe , Kyushu University
pp. 3-8
Lionel Prevost , Laboratoire des Instruments et Systèmes déIle de France
Loïc Oudot , Laboratoire des Instruments et Systèmes déIle de France
pp. 9-13
Sanparith Marukatat , Universit? Paris 6
Thierry Arti?res , Universit? Paris 6
pp. 14-19
Balaji Krishnapuram , Microsoft Research
Christopher M. Bishop , Microsoft Research
Martin Szummer , Microsoft Research
pp. 20-25
Martin Szummer , Microsoft Research
Yuan Qi , Microsoft Research
pp. 32-37
Classification Techniques
Luiz S. Oliveira , Pontifícia Universidade Católica do Paraná
Robert Sabourin , Pontifícia Universidade Católica do Paraná
pp. 39-44
M. Cheriet , Ecole de Technologie Superieure
C. Y. Suen , Concordia University
pp. 51-56
Mohamed Cheriet , ?cole de Technologie Sup?rieure
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 57-62
Rainer Lindwurm , Siemens Dematic AG
pp. 75-80
Luiz S. Oliveira , Pontifícia Universidade Católica do Paraná
Marisa Morita , Pontifícia Universidade Católica do Paraná
pp. 81-86
Handwriting Analysis and Gesture Recognition
Brian C. Lovell , University of Queensland
Nianjun Liu , University of Queensland
Richard I. A. Davis , University of Queensland
pp. 100-105
Sung-Jung Cho , Samsung Advanced Institute of Technology
Jong Koo Oh , Samsung Advanced Institute of Technology
Won-Chul Bang , Samsung Advanced Institute of Technology
Wook Chang , Samsung Advanced Institute of Technology
Eunseok Choi , Samsung Advanced Institute of Technology
Yang Jing , Samsung Advanced Institute of Technology
Joonkee Cho , Samsung Advanced Institute of Technology
Dong Yoon Kim , Samsung Advanced Institute of Technology
pp. 106-111
Sung-Jung Cho , Samsung Advanced Institute of Technology
Won-Chul Bang , Samsung Advanced Institute of Technology
Wook Chang , Samsung Advanced Institute of Technology
Eunseok Choi , Samsung Advanced Institute of Technology
Jing Yang , Samsung Advanced Institute of Technology
Joonkee Cho , Samsung Advanced Institute of Technology
Dong Yoon Kim , Samsung Advanced Institute of Technology
pp. 112-117
Yu Qiao , University of Electro-Communications
Makato Yasuhara , University of Electro-Communications
pp. 118-123
Hyunil Choi , Korea Advanced Institute of Science and Technology
Sung Jung Cho , Samsung Advanced Institute of Technology
Jin H. Kim , Korea Advanced Institute of Science and Technology
pp. 130-135
Sriganesh Madhvanath , Hewlett-Packard Labs
M. N. S. S. K. Pavan Kumar , International Institute of Information Technology
A. Balasubramanian , International Institute of Information Technology
Ajay S. Bhaskarabhatla , Hewlett-Packard Labs
pp. 136-141
Markus Svensén , Microsoft Research
Christopher M. Bishop , Microsoft Research
pp. 142-147
J. Blanchard , Universit? Paris 6
pp. 148-153
Ming Ye , Microsoft Corporation
Paul Viola , Microsoft Corporation
pp. 154-159
Signature Verification and Writer Identification
Sargur N. Srihari , State University of New York at Buffalo
Aihua Xu , State University of New York at Buffalo
Meenakshi K. Kalera , State University of New York at Buffalo
pp. 161-166
Andreas Schlapbach , University of Bern
Horst Bunke , University of Bern
pp. 167-172
Katrin Franke , Fraunhofer Institute for Production Systems and Design Technology
pp. 173-178
S. Impedovo , Universit? degli Studi di Bari
M. G. Lucchese , Universit? degli Studi di Bari
G. Dimauro , Universit? degli Studi di Bari
G. Pirlo , Universit? degli Studi di Bari
pp. 179-184
Hansheng Lei , State University of New York at Buffalo
Srinivas Palla , State University of New York at Buffalo
Venu Govindaraju , State University of New York at Buffalo
pp. 191-195
Thierry Paquet , University of Rouen
Laurent Heutte , University of Rouen
pp. 196-201
Recognition of Word and Text
Cinthia O. De A. Freitas , Pontif?cia Universidade Cat?lica do Paran?
Marcelo N. Kapp , Pontif?cia Universidade Cat?lica do Paran?
pp. 209-214
Alessandro L. Koerich , Pontifical Catholic University of Paraná
Robert Sabourin , École de Technologie Supérieure
Ching Y. Suen , Concordia University
pp. 232-237
Document Analysis and Applications
Chen Yan , Nanyang Technological University
Graham Leedham , Nanyang Technological University
pp. 239-244
Thierry Paquet , Universit? de Rouen
St?phane Nicolas , Universit? de Rouen
pp. 245-250
Yiping Yang , Tokyo University of Agriculture and Technology Affiliation
Masaki Nakagawa , Tokyo University of Agriculture and Technology Affiliation
pp. 251-256
Emmanuel Augustin , Artificial Intelligence and Image Analysis
Ching Y. Suen , Concordia University
Olivier Baret , Artificial Intelligence and Image Analysis
Mohamed Cheriet , ?cole de Technologie Sup?rieure
pp. 263-268
Hisashi Ikeda , Hitachi, Ltd.
Yosuke Kato , Hitachi, Ltd.
Naohiro Furukawa , Hitachi, Ltd.
pp. 269-274
History and Future Prospects
Segmentation and Preprocessing
Yun Lei , Tsinghua University
X. Q. Ding , Tsinghua University
Qiang Fu , Tsinghua University
pp. 294-299
N. Tripathy , Indian Statistical Institute
pp. 306-311
Stathis Stamatatos , TEI of Ionian Islands
Hera Antonopoulou , Computer Technology Institute
pp. 312-316
C. Y. Suen , Concordia University
T. D. Bui , Concordia University
pp. 317-322
Wataru Ohyama , Mie University
Fumitaka Kimura , Mie University
M Shridhar , University of Michigan-Dearborn
pp. 328-333
Misako Suwa , Fujitsu Labs. Ltd.
Satoshi Naoi , Fujitsu Labs. Ltd.
pp. 334-339
Feature Extraction and Feature Selection
T. D. Bui , Concordia University
P. Zhang , Concordia University
pp. 347-352
Swe Myo Htwe , University of Nottingham
Colin Higgins , University of Nottingham
Graham Leedham , Nanyang Technological University,
Ma Yang , Nanyang Technological University,
pp. 359-364
Alceu de S. Britto Jr. , Pontif?cia Universidade Cat?lica do Paran? and Universidade Estadual de Ponta Grossa
Celso A. A. Kaestner , Pontif?cia Universidade Cat?lica do Paran?
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 365-370
Robert Sabourin , ?cole de Technologie Sup?rieure and Centre for Pattern Recognition and Machine Intelligence
Flavio Bortolozzi , Pontif?cia Universidade Cat?lica do Paran?
Alceu de S. Britto Jr. , Pontif?cia Universidade Cat?lica do Paran? and Universidade Estadual de Ponta Grossa
pp. 371-376
Ryuei Nishii , Kyushu University
Tan Siang Chin , Kyushu University
Ryuichi Sawae , Okayama University of Science
pp. 377-381
Character Recognition
Takao Kobayashi , Tokyo University of Agriculture and Technology
pp. 389-394
John A. Fitzgerald , University College Dublin
Franz Geiselbrechtinger , University College Dublin
Tahar Kechadi , University College Dublin
pp. 395-400
Thierry Arti?res , Universit? Paris 6
Patrick Gallinari , Universit? Paris 6
pp. 401-406
S. Vajda , LORIA Research Center
A. Mallick , Indian Statistical Institute
B. B. Chaudhuri , Indian Statistical Institute
A. Belaid , LORIA Research Center
pp. 419-424
Asian Character Recognition
Guang-yuan Zhang , Northeastern University and Shenyang University
Rong-wei He , Liaoning archives Library
Ai-xia Wang , Northeastern University
pp. 432-437
K. H. Aparna, , Indian Institute of Technology - Chennai
M. Kasirajan , Indian Institute of Technology - Chennai
G. Vijay Prakash , Indian Institute of Technology - Chennai
V. S. Chakravarthy , Indian Institute of Technology - Chennai
Sriganesh Madhvanath , Hewlett-Packard India
pp. 438-443
G. Sita , Indian Institute of Science - Bangalore
A. G. Ramakrishnan , Indian Institute of Science - Bangalore
Niranjan Joshi , Indian Institute of Science - Bangalore
pp. 444-449
Ithipan Methasate , National Science and Technology Development Agency - Thailand
pp. 450-454
Word Recognition and Linguistic Approaches
Jahwan Kim , Korea Advanced Institute of Science Technology
Sungho Ryu , Korea Advanced Institute of Science Technology
Jin H. Kim , Korea Advanced Institute of Science Technology
pp. 456-461
Thierry Paquet , Universit? de Rouen
Guillaume Koch , Universit? de Rouen
pp. 468-473
Hansheng Lei , University at Buffalo
Venu Govindaraju , University at Buffalo
pp. 474-478
Alessandro L. Koerich , Pontifical Catholic University of Paraná
pp. 479-484
Lionel Prevost , Laboratoire des Instruments et Systèmes déIle de France
Loïc Oudot , Laboratoire des Instruments et Systèmes déIle de France
pp. 485-490
Signature Verification and Writer Identification
R. M. Guest , University of Kent
pp. 492-497
Edson J. R. Justino , Pontif?cia Universidade Cat?lica do Paran?
Cesar Santos , Pontif?cia Universidade Cat?lica do Paran?
Robert Sabourin , ?cole de Technologie Sup?rieure
pp. 498-502
J.-Y. Ramel , Universit? de Tours
N. Vincent , Universit? Paris 5
pp. 503-508
Applications
Hala Bezine , National School of Engineers of Sfax
Adel M. Alimi , National School of Engineers of Sfax
Nasser Sherkat , School of Computing and Mathematics of Nottingham
pp. 515-520
Katsuhiko Akiyama , Fujitsu Laboratories Ltd.
Hiroshi Tanaka , Fujitsu Laboratories Ltd.
Hiroaki Tamura , Fujitsu Laboratories Ltd.
Naomi Iwayama , Fujitsu Laboratories Ltd.
pp. 533-538
Yoshinobu Hotta , Fujitsu Laboratories Ltd.
Chunheng Wang , Fujitsu R&D Center Co. Ltd.
Satoshi Naoi , Fujitsu Laboratories Ltd.
pp. 539-544
Hideto Oda , Tokyo University of Agriculture and Technology
Akihito Kitadai , Tokyo University of Agriculture and Technology
Motoki Onuma , Tokyo University of Agriculture and Technology
Masaki Nakagawa , Tokyo University of Agriculture and Technology
pp. 545-550
Shinji Mizuno , Toyohashi University of Technology
Tomokazu Terai , Waseda University
pp. 551-556
Kamesh Madduri , Indian Institute of Technology - Madras
K. H. Aparna , Indian Institute of Technology - Madras
V. S. Chakravarthy , Indian Institute of Technology - Madras
pp. 557-562
Katrin Franke , Fraunhofer Institute
Isabelle Guyon , ClopiNet
Lambert Schomaker , Rijksuniversiteit Groningen
Louis Vuurpijl , University of Nijmegen
pp. 563-568
Michael Shilman , Microsoft Research
Kumar Chellapilla , Microsoft Research
pp. 569-574
Sung-Hyuk Cha , Pace University
Charles C. Tapper , Pace University
William B. Huber , Pace University
pp. 575-579
S. Vajda , LORIA Research Center
U. Pal , Indian Statistical Institute
B. B. Chaudhuri , Indian Statistical Institute
pp. 580-585
Louis Vuurpijl , Nijmegen Institute for Cognition and Information
Ralph Niels , Nijmegen Institute for Cognition and Information
Merijn van Erp , Nijmegen Institute for Cognition and Information
Lambert Schomaker , University of Groningen
Eugene Ratzlaff , IBM Research
pp. 586-591
Wataru Ohyama , Mie University
Tetsushi Wakabayashi , Mie University
Meng Shi , Mie University
pp. 592-596
Don Willems , University of Nijmegen
Stéphane Rossignol , University of Nijmegen
Louis Vuurpijl , University of Nijmegen
pp. 597-602
Author Index
Author Index (PDF)
pp. 603-605
5 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool