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2011 IEEE International Vacuum Electronics Conference
Bangalore, Karnataka, India
February 21-February 24
ISBN: 978-1-4244-8662-5
Table of Contents
Papers
Front matter (Abstract)
pp. i-xxviii
Michael I. Petelin, Institute of Applied Physic RAS, 46 Ulyanov Str., Nizhny Novgorod, Russia
pp. 1-3
Swapan Chattopadhyay, Universities of Lancaster, Liverpool and Manchester & Cockcroft Institute, Daresbury, Warrington, Cheshire, UK
pp. 5
Lalit Kumar, Microwave Tube Research & Development Centre, Defence Research & Development Organisation, BE Complex, Jalahalli, Bangalore-560013, India
pp. 7-10
Tushar K. Ghosh, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Anthony J. Challis, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Anthony Tokeley, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Michael J. Duffield, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Kevin Rushbrook, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Ian Poston, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Daniel Scott, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Alan Jacob, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Darrin Bowler, e2v Technologies Ltd., 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
pp. 15-16
Tetsuo Machida, Netcomsec Co. Ltd., 1120, Shimokuzawa, Chuo-ku, Sagamihara, Kanagawa 252-5298, Japan
Wako Suzuki, Netcomsec Co. Ltd., 1120, Shimokuzawa, Chuo-ku, Sagamihara, Kanagawa 252-5298, Japan
Minoru Yoshida, Netcomsec Co. Ltd., 1120, Shimokuzawa, Chuo-ku, Sagamihara, Kanagawa 252-5298, Japan
Junichi Matsuoka, Netcomsec Co. Ltd., 1120, Shimokuzawa, Chuo-ku, Sagamihara, Kanagawa 252-5298, Japan
Kunio Tsutaki, Netcomsec Co. Ltd., 1120, Shimokuzawa, Chuo-ku, Sagamihara, Kanagawa 252-5298, Japan
pp. 17-18
W. Durr, Thales Electron Devices, Postfach 3929, D-89029 Ulm, Germany
J. Wegener, Thales Electron Devices, Postfach 3929, D-89029 Ulm, Germany
E. Bosch, Thales Electron Devices, Postfach 3929, D-89029 Ulm, Germany
pp. 19-20
Yinfu Hu, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
Jinjun Feng, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
Jun Cai, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
Yinhua Du, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
Ye Tang, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
Xianping Wu, Vacuum Electronics National Lab, Beijing Vacuum Electronics Research Institute, PO Box 749-41, 100015, Beijing, China
pp. 21-22
Sushil Raina, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
A. K. Agrawal, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
M. Vijay Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Ashok Bansiwal, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
M. K. Geetha, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
George Abraham, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Kiran Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 23-24
L. M. Joshi, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Rakesh Meena, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Subhash Nangru, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Deepender Kant, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Debashis Pal, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
O.S. Lamba, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Vishnu Jindal, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
Sushil Kumar Jangid, Central Electronics Engineering Research Institute, Pilani-333031, India, (Council of Scientific & Industrial Research)
D. P. Chakravarthy, Bhabha Atomic Research Centre, Mumbai, India
Kavita Dixit, Bhabha Atomic Research Centre, Mumbai, India
pp. 25-26
R. Magne, CEA, IRFM, F-13108 St Paul-lez-Durance, France
A. Armitano, CEA, IRFM, F-13108 St Paul-lez-Durance, France
A. Beunas, Thales Electron Devices, 2 rue M. Dassault, F-78414 Vélizy-Villacoublay, France
G. Berger-By, CEA, IRFM, F-13108 St Paul-lez-Durance, France
F. Bouquey, CEA, IRFM, F-13108 St Paul-lez-Durance, France
E. Corbel, CEA, IRFM, F-13108 St Paul-lez-Durance, France
L. Delpech, CEA, IRFM, F-13108 St Paul-lez-Durance, France
F. Kazarian, ITER Organization, F-13115 St Paul-lez-Durance, France
P. Mollard, CEA, IRFM, F-13108 St Paul-lez-Durance, France
M. Prou, CEA, IRFM, F-13108 St Paul-lez-Durance, France
F. Samaille, CEA, IRFM, F-13108 St Paul-lez-Durance, France
D. Volpe, CEA, IRFM, F-13108 St Paul-lez-Durance, France
pp. 27-28
Richard D. Kowalczyk, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Mark F. Kirshner, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Chris R. Walz, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Michael A. Boyle, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Holger Schult, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
John C. Cipolla, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Craig B. Wilsen, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Richard B. True, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
pp. 29-30
O. S. Lamba, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Meenu Kaushik, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
L. M. Joshi, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Rakesh Meena, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Debasish Pal, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Vishnu Jindal, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Priyanka Jangir, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Vijay Singh, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Sunit Kumar, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
Depender Kant, Microwave Tubes Division, Central Electronics Engineering Research Institute Pilani (Raj.), India (Council of Scientific and Industrial Research)
pp. 31-32
Yong Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
Jian Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
Ying Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
Zhi-qiang Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
pp. 33-34
R. Lawrence Ives, Calabazas Creek Research, San Mateo, CA 94404 USA, Surprise AZ 85387 USA
George Collins, Calabazas Creek Research, San Mateo, CA 94404 USA, Surprise AZ 85387 USA
David Marsden, Calabazas Creek Research, San Mateo, CA 94404 USA, Surprise AZ 85387 USA
George Miram, Calabazas Creek Research, San Mateo, CA 94404 USA, Surprise AZ 85387 USA
Louis R. Falce, Calabazas Creek Research, San Mateo, CA 94404 USA, Surprise AZ 85387 USA
pp. 35-36
Daniel Busbaher, Semicon Associates, 695 Laco Dr., Lexington, KY 40510, USA
pp. 37-38
M. Ravi, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
K. Santhosh Kumar, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
K. S. Bhat, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
pp. 39-40
Jinfeng Zhao, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Na Li, Beijing Vacuum Electronics Research Institute (BVERI), Beijing, China
Ji Li, Beijing Vacuum Electronics Research Institute (BVERI), Beijing, China
Larry Barnett, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Mike Banducci, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Diana Gamzina, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
N. C. Luhmann, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
pp. 41-42
R. K. Barik, School of Electrical Engineering and Computer Science, Seoul National University, South Korea
R. S. Raju, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.) 333 031, India
A. K. Tanwar, Department of Physics and Astronomy, Seoul National University, South Korea
Supriyo Das, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.) 333 031, India
G. S. Park, School of Electrical Engineering and Computer Science, Seoul National University, South Korea
pp. 43-44
Smrity Dwivedi, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221 005, India
P. K. Jain, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221 005, India
pp. 45-46
Amitava Roy, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Archana Sharma, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Rakhee Menon, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Sabyasachi Mitra, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
K. V. Nagesh, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
D. P. Chakravarthy, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
D. Senthil Kumar, Microwave Tube Research & Development Centre, DRDO, Bangalore, India
Saket Khandekar, Microwave Tube Research & Development Centre, DRDO, Bangalore, India
Vijay Bhaskar Somu, Microwave Tube Research & Development Centre, DRDO, Bangalore, India
Srinivas Nekkanti, Microwave Tube Research & Development Centre, DRDO, Bangalore, India
Ajay Kumar Saini, Microwave Tube Research & Development Centre, DRDO, Bangalore, India
Shiva Rai, Electronics & Radar Development Organisation, DRDO, Bangalore, India
Dheeraj Kumar Singh, Electronics & Radar Development Organisation, DRDO, Bangalore, India
Vishnu Sharma, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
S. K. Singh, Bhabha Atomic Research Centre, India
pp. 47-48
Rakhee Menon, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Amitava Roy, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Sabyasachi Mitra, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Senthil Kumar, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Vishnu Sharma, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Archana Sharma, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
K. V. Nagesh, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
D. P. Chakravarthy, Accelerator & Pulse Power Division, Bhabha Atomic Research Centre, Mumbai-400085, India
pp. 49-50
Vijay H. Bhosale, Electronics & Radar Development Establishment, Bangalore, India
D. C. Pande, Electronics & Radar Development Establishment, Bangalore, India
pp. 51-52
Purushottam Shrivastava, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
Y. D. Wanmode, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
D. Baxy, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
V. Rajput, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
P. Mohania, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
A. Mahawar, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
M. Acharya, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
J. Mulchandani, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
H. G. Singh, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
pp. 53-54
C. Paoloni, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
F. Brunetti, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
A. Di Carlo, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
M. Mineo, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
E. Tamburri, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
M. L. Terranova, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
G. Ulisse, Dept. of Electronic Engineering, University of Rome Tor Vergata, Rome, Italy
A. Durand, Thales Electron Devices, Vélizy, France
R. Marchesin, Thales Electron Devices, Vélizy, France
K. Pham, Thales Electron Devices, Vélizy, France
V. Krozer, Physikalisches Institute, Goethe-Universität Frankfurt am Main, Frankfurt am Main, Germany
M. Kotiranta, Physikalisches Institute, Goethe-Universität Frankfurt am Main, Frankfurt am Main, Germany
A. de Rossi, Thales Research & Technology, Palaiseau, France
D. Dolfi, Thales Research & Technology, Palaiseau, France
P. Guiset, Thales Research & Technology, Palaiseau, France
P. Legagneux, Thales Research & Technology, Palaiseau, France
J. P. Schnell, Thales Research & Technology, Palaiseau, France
A. Fiorello, Selex-SI, Rome, Italy
M. Dispenza, Selex-SI, Rome, Italy
A. Secchi, Selex-SI, Rome, Italy
V. Zhurbenko, Technical University of Denmark, Kgs. Lyngby, Denmark
S. Megtert, UMR137 CNRS/Thales, Palaiseau, France
F. Bouamrane, UMR137 CNRS/Thales, Palaiseau, France
C.-S. Cojocaru, LPICM - École Polytechnique, (UMR 7647) CNRS, Palaiseau, France
A. Gohier, LPICM - École Polytechnique, (UMR 7647) CNRS, Palaiseau, France
pp. 55-56
A. V. Galdetskiy, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
I. I. Golenitskiy, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
V. U. Myakinkov, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
A. A. Negirev, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
U. B. Rudy, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
pp. 57-58
Chinmay A. Jain, Department of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247 667, India
Ankit Verma, Department of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247 667, India
Ashish Kumar, Department of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247 667, India
M. V. Kartikeyan, Department of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247 667, India
E. Borie, Karlsruhe Institute of Technology, IHM, North Campus, Post Box 3640, D76021 Karlsruhe, Germany
M. Thumm, Karlsruhe Institute of Technology, IHM, North Campus, Post Box 3640, D76021 Karlsruhe, Germany
pp. 59-60
Young-Min Shin, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Larry R. Barnett, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Anisullah Baig, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Wen-Ching Tsai, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Neville C. Luhmann, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
pp. 61-62
Arindrajit Chaudhury, Department of Physics, Burdwan University, Burdwan, West Bengal-713104, India
P. C. Panda, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI), Pilani, Rajasthan-333031, India
Vishnu Srivastava, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI), Pilani, Rajasthan-333031, India
pp. 63-64
Tao Huang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
MingHua Yang, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100016, P.R. China
Quan Hu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
ZhongHai Yang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
JianQing Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
XiaoLin Jin, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
XiaoFang Zhu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
Bin Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology, of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
pp. 65-66
Thuc Bui, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
Lawrence Ives, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
Michael Read, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
pp. 67
Cesar C. Xavier, Instituto de Pesquisas Energéticas e Nucleares/CNEN-SP
Claudio C. Motta, University of Sao Paulo, Av. Lineu Prestes 2242 - Cid. Universitária - Sao Paulo - Brazil - 05508-000
pp. 69-70
R. K. Barik, School of Electrical Engineering and Computer Science, Seoul National University, South Korea
R. S. Raju, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India, (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSI
Supriyo Das, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India, (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSI
Sneh Rathore, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India, (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSI
pp. 71-72
A. Grede, Technische Universitaet Berlin, Sekr. EN2, Einsteinufer 17, 10587 Berlin, Germany
H. Henke, Technische Universitaet Berlin, Sekr. EN2, Einsteinufer 17, 10587 Berlin, Germany
pp. 73-74
Jean Gastaud, Thales Electron Devices, 2 rue Marcel Dassault, 78141 Vélizy-Villacoublay cedex (France)
Evelyne Gerard, Thales Electron Devices, 2 rue Marcel Dassault, 78141 Vélizy-Villacoublay cedex (France)
Alain Laurent, Thales Electron Devices, 2 rue Marcel Dassault, 78141 Vélizy-Villacoublay cedex (France)
pp. 75-76
R. Lakshminarasimhan, ISRO Satellite Centre, ISRO, Vimanapura Post, Bangalore, India
V. Venkatesh, ISRO Satellite Centre, ISRO, Vimanapura Post, Bangalore, India
M. Ravindra, ISRO Satellite Centre, ISRO, Vimanapura Post, Bangalore, India
T. S. Nanjundaswamy, ISRO Satellite Centre, ISRO, Vimanapura Post, Bangalore, India
pp. 77-78
D. R. Dibb, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
S. Aldana-Gutierrez, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
R. T. Benton, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
W. L. McGeary, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
W. L. Menninger, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
X. Zhai, L-3 Communications Electron Technologies Inc., 3100 Lomita Blvd., Torrance, CA 90505
pp. 79-80
Michael Kaliski, Space Systems/Loral, Palo Alto, CA, USA
pp. 81-82
Marinella Aloisio, European Space Agency, Keplerlaan 1 - 2200 AG - Noordwijk ZH - The Netherlands
Piero Angeletti, European Space Agency, Keplerlaan 1 - 2200 AG - Noordwijk ZH - The Netherlands
Salvatore D'Addio, European Space Agency, Keplerlaan 1 - 2200 AG - Noordwijk ZH - The Netherlands
pp. 83-84
Peter Horoyski, Communications and Power Industries, Canada, Georgetown, Ontario, Canada
Dave Berry, Communications and Power Industries, Canada, Georgetown, Ontario, Canada
Brian Steer, Communications and Power Industries, Canada, Georgetown, Ontario, Canada
pp. 85
John Pasour, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Khanh Nguyen, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Edward Wright, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Adam Balkcum, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Baruch Levush, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
pp. 87-88
Igor A. Chernyavskiy, SAIC, McLean, VA, 22102, USA
Alexander N. Vlasov, Naval Research Laboratory, Washington, DC, 20375, USA
Thomas M. Antonsen, Univeristy of Maryland, College Park, MD, USA
David Chernin, SAIC, McLean, VA, 22102, USA
Baruch Levush, Naval Research Laboratory, Washington, DC, 20375, USA
Mark Hyttinen, CPI, Georgetown, Ontario, Canada
Albert Roitman, CPI, Georgetown, Ontario, Canada
Peter Horoyski, CPI, Georgetown, Ontario, Canada
Richard Dobbs, CPI, Georgetown, Ontario, Canada
Dave Berry, CPI, Georgetown, Ontario, Canada
pp. 89-90
Cunjun Ruan, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing, China, 100190
Shuzhong Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing, China, 100190
Wang Ruan, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing, China, 100190
Xiaofeng Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing, China, 100190
pp. 91-92
A. Jensen, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
C. Adolphsen, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
K. Bane, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
A. Burke, SAIC, 700 Technology Park Drive, Billerica, MA 01821 USA
A. Haase, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
E. Jongewaard, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
Z. Li, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
D. Martin, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
D. Sprehn, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
G. Stupakov, SLAC National Accelerator Laboratory, 2575 Sandhill Road, Menlo Park, CA 94025, USA
pp. 93-94
Matt Kirley, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
Bozidar Novakovic, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
Marcus Weber, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
Nishant Sule, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
John Scharer, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
Irena Knezevic, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
John H. Booske, Electrical and Computer Engineering Department, University of Wisconsin-Madison, WI 53706 USA
pp. 95-96
Padmakar G. Chavan, Center for Advanced Studies in Materials Science and Condensed Matter Physics, Department of Physics, University of Pune, Pune 411 007, India
Satish S. Badadhe, Physical and Materials Chemistry Division, National Chemical Laboratory, Pune 411 008, India
Imtiaz S. Mulla, Physical and Materials Chemistry Division, National Chemical Laboratory, Pune 411 008, India
Mahendra A. More, Center for Advanced Studies in Materials Science and Condensed Matter Physics, Department of Physics, University of Pune, Pune 411 007, India
Dilip S. Joag, Center for Advanced Studies in Materials Science and Condensed Matter Physics, Department of Physics, University of Pune, Pune 411 007, India
pp. 97-98
K. Santhosh Kumar, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
M. Ravi, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
S. Prasanna Kumar, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
K. S. Bhat, Microwave Tube Research & Development Centre, Bangalore, Karnataka-560013, India
pp. 99-100
Shen Shou Max Chung, Department of Electronics Engineering, Southern Taiwan University, Tainan, Taiwan, 710, & Center for Micro-Nano Science and Technology, National Cheng Kung University, Taina
pp. 101-102
M. C. Lin, NSSL, Department of Physics, Fu Jen Catholic University, Taipei County, Taiwan
P. S. Lu, NSSL, Department of Physics, Fu Jen Catholic University, Taipei County, Taiwan
J. P. Verboncoeur, PTSG, Department of Nuclear Engineering, University of California, Berkeley, CA, USA
pp. 103-104
M. Thumm, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
G. Gantenbein, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
V. Erckmann, Max-Planck-Institut fuer Plasmaphysik, Teilinstitut Greifswald, Association EURATOM-IPP, Wendelsteinstr. 1, D-17491 Greifswald, Germany
S. Illy, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
S. Kern, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
W. Kasparek, Universitaet Stuttgart, Institut fuer Plasmaforschung (IPF), Pfaffenwaldring 31, D-70569 Stuttgart, Germany
C. Lechte, Universitaet Stuttgart, Institut fuer Plasmaforschung (IPF), Pfaffenwaldring 31, D-70569 Stuttgart, Germany
W. Leonhardt, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
C. Lievin, Thales Electron Devices, 2 Rue Marcel Dassault, F-78141 Vélizy-Villacoublay, France
A. Samartsev, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
A. Schlaich, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
M. Schmid, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
pp. 105-106
David A. Constable, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, Scotland, United Kingdom
Kevin Ronald, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, Scotland, United Kingdom
Wenlong He, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, Scotland, United Kingdom
Alan D. R. Phelps, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, Scotland, United Kingdom
Adrian W. Cross, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, Scotland, United Kingdom
Ilya V. Bandurkin, Institute of Applied Physics, Russian Academy of Science, Nizhny Novgorod
Andrey V. Savilov, Institute of Applied Physics, Russian Academy of Science, Nizhny Novgorod
Vladimir L. Bratman, Institute of Applied Physics, Russian Academy of Science, Nizhny Novgorod
pp. 107-108
M. V. Kartikeyan, Millimeter Wave Laboratory, Department of Electronics and Computer Engineering, Indian Institute of Technology, Roorkee 247 667, India
E. Borie, Karlsruhe Institute of Technology (KIT), North Campus, IHM, Post Box 3640, D 76021 Karlsruhe, Germany
Manfred Thumm, Karlsruhe Institute of Technology (KIT), North Campus, IHM, Post Box 3640, D 76021 Karlsruhe, Germany
pp. 109-110
J. Flamm, Institute of High Frequency Techniques und Electronics, Karlsruhe Institute of Technology, Association EURATOM-KIT, Kaiserstr. 12, D-76131Karlsruhe, Germany
J. Jin, Institute for High Power and Microwave Techniques, Karlsruhe Institute of Technology, Association EURATOM-KIT, Kaiserstr. 12, D-76131Karlsruhe, Germany
M. Thumm, Institute of High Frequency Techniques und Electronics, Karlsruhe Institute of Technology, Association EURATOM-KIT, Kaiserstr. 12, D-76131Karlsruhe, Germany
pp. 111-112
Anil Kumar, Gyrotron Laboratory, Microwave Tube Area, Central Electronics Engineering Research Institute (CEERI, CSIR), Pilani, Rajasthan-333031, India
Nitin Kumar, Gyrotron Laboratory, Microwave Tube Area, Central Electronics Engineering Research Institute (CEERI, CSIR), Pilani, Rajasthan-333031, India
Hasina Khatun, Gyrotron Laboratory, Microwave Tube Area, Central Electronics Engineering Research Institute (CEERI, CSIR), Pilani, Rajasthan-333031, India
Udaybir Singh, Gyrotron Laboratory, Microwave Tube Area, Central Electronics Engineering Research Institute (CEERI, CSIR), Pilani, Rajasthan-333031, India
V. Vyas, Department of Physics, Banasthali University, Banasthali, Rajasthan-304022, India
A. K. Sinha, Gyrotron Laboratory, Microwave Tube Area, Central Electronics Engineering Research Institute (CEERI, CSIR), Pilani, Rajasthan-333031, India
pp. 113-114
Amarjit Singh, Institute for Res. in Electronics & App. Physics (Retd), University of Maryland, College Park, MD, 20742, 12, Auburn Court, Vernon Hills, IL, USA, 20061
William B. Herrmannsfeldt, SLAC National Accelerator Laboratory (Retd), 2575 Sand Hill Road, Menlo Park, CA, USA, 94025
R. Lawrence Ives, Calabazas Creek Research 690 Port Drive, San Mateo, CA 94404, USA
pp. 115-116
M. C. Lin, Tech-X Corporation, 5621 Arapahoe Avenue Suite A, Boulder, CO 80303, USA
D. N. Smithe, Tech-X Corporation, 5621 Arapahoe Avenue Suite A, Boulder, CO 80303, USA
pp. 117-118
Li Xu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
Zhen Ye, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
ZhongHai Yang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
JianQing Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
Bin Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
pp. 119-120
Zhaoyun Duan, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China
Yubin Gong, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China
Yanmei Wang, Beijing Vacuum Electronics Research Institute, Beijing, 100016, China
Yanyu Wei, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China
Hairong Yin, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China
Wenxiang Wang, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan, 610054, China
pp. 121-122
Konstantin A. Lukin, Department of Nonlinear Dynamics of Electronic Systems, Institute for Radiophysics and Electronics, National Academy of Science of Ukraine, IRE NASU, 12, Acad. Proskura Str., Khark
Eduard M. Khutoryan, Department of Nonlinear Dynamics of Electronic Systems, Institute for Radiophysics and Electronics, National Academy of Science of Ukraine, IRE NASU, 12, Acad. Proskura Str., Khark
pp. 123-124
Alexander A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
Tatiana L. Popkova, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
Alexey O. Rak, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
pp. 125-126
Alexander A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
Tatiana L. Popkova, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
Alexey O. Rak, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk - 220013, Belarus
pp. 127-128
A. Kovalenko Yu, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute named after V.I. Lenin", (FGUP VEI) State Science Center Russian Federation, 12 Krasnokazarmennaya Stree
D. S. Korolev, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute named after V.I. Lenin", (FGUP VEI) State Science Center Russian Federation, 12 Krasnokazarmennaya Stree
pp. 129-130
Daniel T. Lopes, Instituto de Pesquisas Energéticas e Nucleares, São Paulo, SP, Brazil
Claudio C. Motta, University of São Paulo, São Paulo, SP, Brazil
pp. 131-132
Daniel T. Lopes, Instituto de Pesquisas Energéticas e Nucleares
Robson K. B. e Silva, Instituto de Pesquisas Energéticas e Nucleares
Claudio C. Motta, University of Sâo Paul, Sâo Paulo, SP, Brazil
pp. 133-134
Anirban Bera, School of Electrical Engineering and Computer Sciences, Seoul National University, Seoul, 151-741 Korea
Ohjoon Kwon, Center for THz-Bio Application System, Department of Physics and Astronomy, Seoul National University, Seoul, 151-741 Korea
Ranjan Kumar Barik, School of Electrical Engineering and Computer Sciences, Seoul National University, Seoul, 151-741 Korea
Anil Tanwar, Center for THz-Bio Application System, Department of Physics and Astronomy, Seoul National University, Seoul, 151-741 Korea
M.A. Sattorov, Center for THz-Bio Application System, Department of Physics and Astronomy, Seoul National University, Seoul, 151-741 Korea
Gun-Sik Park, Center for THz-Bio Application System, Department of Physics and Astronomy, Seoul National University, Seoul, 151-741 Korea
pp. 135-136
Amy MacLachlan, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
I. V. Konoplev, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
C. W. Robertson, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
A. W. Cross, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
K. Ronald, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
A. D. R. Phelps, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
C. R. Donaldson, SUPA, Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
pp. 137-138
Young-Min Shin, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Larry R. Barnett, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Anisullah Baig, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Neville C. Luhmann, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
John Pasour, US Naval Research Laboratory (NRL), SW Washington, DC 20375
Paul Larsen, US Naval Research Laboratory (NRL), SW Washington, DC 20375
pp. 139-140
YuLu Hu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science, and Technology of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
YanMei Wang, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100016, P.R. China
ZhongHai Yang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science, and Technology of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
JianQing Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science, and Technology of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
XiaoFang Zhu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science, and Technology of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
Bin Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science, and Technology of China, No.4, Section 2, North Jianshe Road, Chengdu, P.R
pp. 141-142
WeiFeng Peng, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
YiXue Wei, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100016, P.R. China
YuLu Hu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
ZhongHai Yang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
JianQing Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
Bin Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, P.
pp. 143-144
Li Fei, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Xiao Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Liu Pu-Kun, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Yi Hong-Xia, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
pp. 145-146
Liu Xiao, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Pu-kun Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Hong-xia Yi, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Fei Li, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 147-148
Xiao Liu, Institute of Electronics, Chinese Academy of Science, Beijing, 100190, China
Li Fei, Institute of Electronics, Chinese Academy of Science, Beijing, 100190, China
Liu Pu-Kun, Institute of Electronics, Chinese Academy of Science, Beijing, 100190, China
Yi Hong-Xia, Institute of Electronics, Chinese Academy of Science, Beijing, 100190, China
pp. 149-150
Ying Han, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Cunjun Ruan, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Yong Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Xiaofeng Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
pp. 151-152
Lieming Yao, Vacuum Electronics National Laboratory Institute of High Energy Electronics, University of Electronic Science and Technology of China
Kai Zhang, Vacuum Electronics National Laboratory Institute of High Energy Electronics, University of Electronic Science and Technology of China
Hailong Yu, Vacuum Electronics National Laboratory Institute of High Energy Electronics, University of Electronic Science and Technology of China
Tao Huang, Vacuum Electronics National Laboratory Institute of High Energy Electronics, University of Electronic Science and Technology of China
Bin Li, Vacuum Electronics National Laboratory Institute of High Energy Electronics, University of Electronic Science and Technology of China
pp. 153-154
Efeng Wang, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
BenTian Liu, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
ZhiLiang Li, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
LiJun Qian, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
JinJun Feng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
Xun Zeng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research, Institute PO Box 749 EXT Box 41, China
pp. 155-156
Liu Bentian, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
Wang Efeng, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
Qian Lijun, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
Zeng Xu, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
Li Zhiliang, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
Feng Jinjun, Vacuum Electronics National laboratory, Beijing Vacuum Electronics Research Institute, PO Box 749 Ext 41, Beijing, China
pp. 157-158
Xingqun Zhao, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Pu Wei, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Ningfeng Bai, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Shilu Zhao, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Yanmei Wang, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Tiechang Yan, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Xiaohan Sun, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
pp. 159-160
Nischey Grover, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, India
Satish Gajawada, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, India
Kartikeyan V. Machavaram, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, India
pp. 161-162
S. K. Vyas, Central Electronics Engineering Research Institute, (CSIR) Pilani - 333031, India
S. Maurya, Central Electronics Engineering Research Institute, (CSIR) Pilani - 333031, India
N. Shekhawat, Central Electronics Engineering Research Institute, (CSIR) Pilani - 333031, India
V. V. P. Singh, Central Electronics Engineering Research Institute, (CSIR) Pilani - 333031, India
pp. 163-164
Udaybir Singh, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Nitin Kumar, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
L. P. Purohit, Department of Physics, Gurukul Kangri Vishwavidyalaya, Haridwar-249404, India
Ashok K. Sinha, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
pp. 165-166
Mukesh Kumar Alaria, Microwave Tubes Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial, Research (CSIR) Pilani-333031, Rajasthan, India
P. Mukherjee, Microwave Tubes Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial, Research (CSIR) Pilani-333031, Rajasthan, India
R. R. Rao, Microwave Tubes Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial, Research (CSIR) Pilani-333031, Rajasthan, India
A. K. Sinha, Microwave Tubes Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and Industrial, Research (CSIR) Pilani-333031, Rajasthan, India
pp. 167-168
S. Maurya, Central Electronics Engineering Research Institute, Pilani-333 031 (Council of Scientific and Industrial Research)
V. V. P. Singh, Central Electronics Engineering Research Institute, Pilani-333 031 (Council of Scientific and Industrial Research)
P. K. Jain, CRMT, IT-BHU, Varanasi, India
pp. 169-170
Debabrata Biswas, Theoretical Physics Division, Bhabha Atomic Research Centre, Mumbai-400085, India
Raghwendra Kumar, Theoretical Physics Division, Bhabha Atomic Research Centre, Mumbai-400085, India
pp. 171-172
Abhishek Jain, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
Dheeraj Kumar, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
R. S. Tomar, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
S. K. Ghosh, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
R. K. Sharma, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
Vishnu Srivastava, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Raj.)-333031, India
pp. 173-174
Nidhi Parmar, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
P. Deshpande, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
Y. Choyal, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
K. S. Bhat, Microwave Tube Research and Development Centre, BEL Complex, Jalahalli, Bangalore, India
pp. 175-176
K. Shiva Sai Prasad, Millimeter Wave Laboratory, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, Roorkee-247 667, India
Shiv Aasheesh Singh, Millimeter Wave Laboratory, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, Roorkee-247 667, India
S. S. Shanmukha, Millimeter Wave Laboratory, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, Roorkee-247 667, India
R. Seshadri, MTRDC, Microwave Tube Research Development Centre, Bangalore-560 013, India
M. V. Kartikeyan, Millimeter Wave Laboratory, Department of Electronics and Computer Engineering, Indian Institute of Technology Roorkee, Roorkee-247 667, India
pp. 177-178
Thuc Bui, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
Michael Read, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
Lawrence Ives, Calabazas Creek Research Inc., 1074 Solana Dr., Mountain View, CA 94040, USA
pp. 179
A. Mercy Latha, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Rajasthan)-333031, India
R. K. Gupta, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Rajasthan)-333031, India
S. K. Ghosh, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani (Rajasthan)-333031, India
pp. 181-182
Vishant Gahlaut, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research, (CSIR)), Pilani, Rajasthan-333031
R. K. Sharma, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research, (CSIR)), Pilani, Rajasthan-333031
S. M. Sharma, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research, (CSIR)), Pilani, Rajasthan-333031
V. Srivastava, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research, (CSIR)), Pilani, Rajasthan-333031
S. K. Ghosh, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research, (CSIR)), Pilani, Rajasthan-333031
pp. 183-184
N. Kalyanasundaram, Department of Electronics and Communication, Jaypee Institute of IT, Sector 62, Noida, India
G. Naveen Babu, Department of Electronics and Communication, Jaypee Institute of IT, Sector 62, Noida, India
pp. 185-186
Ashok Nehra, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031, Rajasthan, India
L. M. Joshi, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031, Rajasthan, India
S. Kaushik, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031, Rajasthan, India
R. K. Gupta, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific and Industrial Research (CSIR), Pilani-333031, Rajasthan, India
pp. 187-188
M. Ravi, Microwave Tube Research & Development Centre, Bangalore, Karnataka, India-560013
K. S. Bhat, Microwave Tube Research & Development Centre, Bangalore, Karnataka, India-560013
Mamta Khaneja, Solid State Physics Laboratory, New Delhi, India
P. K. Chaudhury, Solid State Physics Laboratory, New Delhi, India
Harsh, Solid State Physics Laboratory, New Delhi, India
pp. 189-190
B. K. Shukla, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat-382428, India
Dhiraj Bora, Institute for Plasma Research, Bhat, Gandhinagar, Gujarat-382428, India
pp. 191-192
M. Sumathy, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
K. J. Vinoy, Department of Electrical Communication Engineering, Indian Institute of Science, Bangalore-560003, India
S. K. Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 193-194
A. K. Agrawal, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Sushil Raina, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 195-196
M. Vijay Kumar, Microwave Tube Research & Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
M. K. Geetha, Microwave Tube Research & Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
A. K. Agrawal, Microwave Tube Research & Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Sushil Raina, Microwave Tube Research & Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research & Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
pp. 197-198
S. K. Chhotray, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
M. Sumathy, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
K. S. Bhat, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 199-200
Zhi-Hui Geng, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Yi-Nong Su, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Pu-Kun Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Shi-Chang Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Wei Gu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Shou-Xi Xu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
Zhi-Chao Zeng, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, P.O. Box 2652, Beijing, P.R. China, 100190
pp. 201
Renu Bahl, Microwave Plasma Interaction Group, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
K. Sathyanarayna, Microwave Plasma Interaction Group, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
V. P. Anitha, Microwave Plasma Interaction Group, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Priyavandna J. Rathod, Microwave Plasma Interaction Group, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Y. C. Saxena, Microwave Plasma Interaction Group, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
pp. 203-204
Subal Kar, Institute of Radio Physics and Electronics, University of Calcutta, 92, A.P.C Road, Calcutta: 700009, India
Tapashree Roy, Institute of Radio Physics and Electronics, University of Calcutta, 92, A.P.C Road, Calcutta: 700009, India
Souvik Pal, Institute of Radio Physics and Electronics, University of Calcutta, 92, A.P.C Road, Calcutta: 700009, India
Promit Gangooly, Institute of Radio Physics and Electronics, University of Calcutta, 92, A.P.C Road, Calcutta: 700009, India
pp. 205-206
Ciersiang Chua, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Sheel Aditya, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Zhongxiang Shen, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Min Tang, Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore
Julius Tsai, Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore
pp. 207-208
Paul B. Larsen, Naval Research Laboratory, Code 6841, Washington, DC USA 20742
David K. Abe, Naval Research Laboratory, Code 6841, Washington, DC USA 20742
Baruch Levush, Naval Research Laboratory, Code 6841, Washington, DC USA 20742
Thomas M. Antonsen, University of Maryland, College Park, MD USA 20742
pp. 209-210
Subrata Kumar Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Baidyanath Basu, College of Engineering and Technology, Moradabad-244 001, India
pp. 211-212
A. Grede, Technische Universitaet Berlin, Sekr. EN2, Einsteinufer 17, 10587 Berlin, Germany
H. Henke, Technische Universitaet Berlin, Sekr. EN2, Einsteinufer 17, 10587 Berlin, Germany
R. K. Sharma, Technische Universitaet Berlin, Sekr. EN2, Einsteinufer 17, 10587 Berlin, Germany
pp. 213-214
Hong-xia Yi, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Liu Xiao, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Pu-kun Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
Fei Li, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, People's Republic of China
pp. 215-216
V. P. Anitha, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Renu Bahl, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Priyavandna J. Rathod, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Jayesh Raval, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Y. C. Saxena, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
pp. 217-218
K. P. Maheshwari, Vardhaman Mahaveer Open University, Kota, India
Harish Malav, Vardhaman Mahaveer Open University, Kota, India
Y. Choyal, Devi Ahilya Vishwavidyalaya, Indore, India
pp. 219-220
Niraj Kumar, Microwave Tubes Division, CEERI, Pilani, India
M. Kumar, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
B. L. Meena, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
M. S. Tyagi, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
A. K. Sharma, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
V. Srivastava, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
U. N. Pal, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India, (A constituent laboratory under CSIR, India)
pp. 221-222
P. Raja Ramana Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
V. A. Deshmukh, Department of Electronics Engineering, Defence Institute of Advanced Technology, Pune-411025, India
S. K. Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 223-224
U. N. Pal, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
P. Gulati, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
Niraj Kumar, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
M. Kumar, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
M. S. Tyagi, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
B. L. Meena, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
A. K. Sharma, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333031, India (A Constituent R&D laboratory of Council of Scientific and Industrial Research (CSIR)
Ram Prakash, Birla Institute of Technology (BIT), Jaipur Campus, 27 - Malviya Industrial Area, Jaipur-302017, India
pp. 225-226
Chong-Qing Jiao, School of Electrical and Electronic Engineering, North China Electric Power University, Beijing-102206, China
pp. 227-228
Junyi Xing, Vacuum Electronics National Laboratory, Post Box 749-41, 100015, Beijing, China
Jinjun Feng, Vacuum Electronics National Laboratory, Post Box 749-41, 100015, Beijing, China
pp. 229-230
Wenxin Liu, Institute of Electronics, Chinese Academy of Science, Beijing-100190, China
Rui Zhang, Institute of Electronics, Chinese Academy of Science, Beijing-100190, China
Yong Wang, Institute of Electronics, Chinese Academy of Science, Beijing-100190, China
Cunjun Ruan, Institute of Electronics, Chinese Academy of Science, Beijing-100190, China
Pukun Liu, Institute of Electronics, Chinese Academy of Science, Beijing-100190, China
pp. 231-232
Yuhe Dong, School of Science, Inner Mongolia University of Science & Technology, BaoTou, Inner Mongolia-014010, China
Xingjuan Xie, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
Chuanlu Huang, Institute of Electronics, Chinese Academy of Sciences, Beijing-100190, China
pp. 233-234
Hui-Peng Han, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Yong Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 235-236
Peng Gao, Research Institute of Electronic Science and Technology, University of Electronic and Science Technology of China, Chengdu, Sichuan 610054, China
John H Booske, Department of Electrical and Computer Engineering, University of Wisconsin, Madison, WI 53706, USA
pp. 237-238
Xin Hu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Gang Wang, Space Traveling Wave Tube Research and Development Center, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Zi-Cheng Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Ji-Run Luo, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 239-240
Chao-Hai Du, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, P.O. Box 2652, Beijing 100190, China
Pu-Kun Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, P.O. Box 2652, Beijing 100190, China
Qian-zhong Xue, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, P.O. Box 2652, Beijing 100190, China
Shichang Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, P.O. Box 2652, Beijing 100190, China
pp. 241-242
Baoli Shen, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Zhaochuan Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Yunping Huang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
pp. 243-244
Xiaofeng Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Cunjun Ruan, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Jirun Luo, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Wang Ruan, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Ying Han, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Ding Zhao, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
pp. 245-246
Bo Chen, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100015, P.R. China
QingPing Zhao, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100015, P.R. China
ShaoLun Cai, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100015, P.R. China
Jinjun Feng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100015, P.R. China
Ming Q. Ding, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, P.O. Box 749, Beijing 100015, P.R. China
pp. 247-248
Alexander A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk-220013, Belarus
Alexey O. Rak, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk-220013, Belarus
Anatoly K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk-220013, Belarus
pp. 249-250
Anatoli V. Aksenchyk, Byelarusian State University of Informatics and Radioelectronics, P. Brovky Str., 6, Minsk-220027, Republic Byelarus
Irina F. Kirinovich, Byelarusian State University of Informatics and Radioelectronics, P. Brovky Str., 6, Minsk-220027, Republic Byelarus
pp. 251-252
Victor D. Yeryomka, Usikov Institute for Radiophysics and Electronics of National Academy of Sciences of Ukraine, 12, Ac. Proscura Str., Kharkiv, Ukraine 61085
Alexandr V. Gurevich, Belarusian State University of Informatics and Radioelectronics, 6, P. Brovka Str., Minsk, R. Byelarus 2200027
Alexanr A. Kurayev, Belarusian State University of Informatics and Radioelectronics, 6, P. Brovka Str., Minsk, R. Byelarus 2200027
Anatoliy K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, 6, P. Brovka Str., Minsk, R. Byelarus 2200027
pp. 253-254
A. A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk, Belarus 220027
D. V. Lukashonok, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk, Belarus 220027
A. K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, P. Brovka str., 6, Minsk, Belarus 220027
pp. 255-256
S. V. Kolosov, Belarus State University of Informatics and Radioelectronics (BSUIR), P. Brovka 6, Minsk, Belarus 220013
A. A. Kurayev, Belarus State University of Informatics and Radioelectronics (BSUIR), P. Brovka 6, Minsk, Belarus 220013
A. V. Senko, Belarus State University of Informatics and Radioelectronics (BSUIR), P. Brovka 6, Minsk, Belarus 220013
pp. 257-258
B. S. Dmitriev, Saratov State University, Russia
Ju. D. Zharkov, Saratov State University, Russia
V. N. Skorokhodov, Saratov State University, Russia
A. O. Stepanov, Saratov State University, Russia
S. A. Sadovnikov, Saratov State University, Russia
pp. 259-260
A. V. Yakovlev, Department of Nonlinear Physics, Saratov State University, 83 Astrakhanskaya St., Saratov 410012, Russia
N. M. Ryskin, Department of Nonlinear Physics, Saratov State University, 83 Astrakhanskaya St., Saratov 410012, Russia
pp. 261-262
A. W. Cross, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
D. Bowes, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
H. Yin, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
W. He, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
K. Ronald, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
A. D. R. Phelps, SUPA Department of Physics, University of Strathclyde, Glasgow, G4 0NG, UK
D. Li, Department of Electronic Engineering, Queen Mary University of London, London, E1 4NS, UK
X. Chen, Department of Electronic Engineering, Queen Mary University of London, London, E1 4NS, UK
pp. 263-264
Mauro Mineo, Department of Electronic Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133, Rome, Italy
Claudio Paoloni, Department of Electronic Engineering, University of Roma Tor Vergata, Via del Politecnico 1, 00133, Rome, Italy
pp. 265-266
Mauro Mineo, Dept. of Electronic Engineering, University of Roma, Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
Claudio Paoloni, Dept. of Electronic Engineering, University of Roma, Tor Vergata, Via del Politecnico 1, 00133 Roma, Italy
David Bariou, Thales Components and Subsystems, 2 Rue Marcel Dassault 78 141, Velizy-Villacoublay Cedex, France
Jean-Francois David, Thales Components and Subsystems, 2 Rue Marcel Dassault 78 141, Velizy-Villacoublay Cedex, France
Alain J. Durand, Thales Components and Subsystems, 2 Rue Marcel Dassault 78 141, Velizy-Villacoublay Cedex, France
pp. 267-268
A. Samartsev, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
G. Gantenbein, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
G. Dammertz, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
S. Illy, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
S. Kern, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
W. Leonhardt, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
A. Schlaich, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
M. Schmid, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
M. Thumm, Karlsruhe Institute of Technology (KIT), Association EURATOM-KIT, Kaiserstr. 12, D-76131 Karlsruhe, Germany
pp. 269-270
Jianbo Jin, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology (IHM), Association EURATOM-KIT, D-76131 Karlsruhe, Germany
Gerd Gantenbein, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology (IHM), Association EURATOM-KIT, D-76131 Karlsruhe, Germany
Stefan Kern, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology (IHM), Association EURATOM-KIT, D-76131 Karlsruhe, Germany
Tomasz Rzesnicki, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology (IHM), Association EURATOM-KIT, D-76131 Karlsruhe, Germany
Manfred Thumm, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology (IHM), Association EURATOM-KIT, D-76131 Karlsruhe, Germany
pp. 271-272
Michael Read, Calabazas Creek Research Inc., San Mateo, CA, 94404
Thuc Bui, Calabazas Creek Research Inc., San Mateo, CA, 94404
Robert Jackson, Calabazas Creek Research Inc., San Mateo, CA, 94404
Lawrence Ives, Calabazas Creek Research Inc., San Mateo, CA, 94404
Henry Freund, Science Applications International Corp., McLean, Virginia 22102, USA
pp. 273-274
Anisullah Baig, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Diana Gamzina, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Micheal Johnson, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Calvin W. Domier, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Alexander Spear, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Larry R. Barnett, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Neville C. Luhmann, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
Young-Min Shin, Department of Engineering & Applied Science, University of California, Davis, CA 95616, USA
pp. 275-276
Joaquim J. Barroso, National Institute for Space Research-INPE, 12227-010 S. José dos Campos, SP, Brazil
pp. 277-278
A. S. Nirmala Devi, Microwave Tubes Division, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India (A constituent laboratory under CSIR, India)
L. M. Joshi, Microwave Tubes Division, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India (A constituent laboratory under CSIR, India)
S. K. Ghosh, Microwave Tubes Division, Central Electronics Engineering Research Institute, Pilani, Rajasthan-333031, India (A constituent laboratory under CSIR, India)
pp. 279-280
Nisha Goyal, Department of Electronics and Communication, Banasthali University, Banasthali, Rajasthan
Nitin J. Shrivastav, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSIR)), Pilani, Rajasthan-333 031
Vishant Gahlaut, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSIR)), Pilani, Rajasthan-333 031
R. K. Gupta, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSIR)), Pilani, Rajasthan-333 031
V. Srivastava, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSIR)), Pilani, Rajasthan-333 031
S. K. Ghosh, Central Electronics Engineering Research Institute (CEERI), (A Constituent R&D Laboratory of Council of Scientific and Industrial Research (CSIR)), Pilani, Rajasthan-333 031
pp. 281-282
S. Senthil Kumar, Microwave Tube Division, Bharat Electronics, Jalahalli, Bangalore-560 013, India
V. Shankarappa, Microwave Tube Division, Bharat Electronics, Jalahalli, Bangalore-560 013, India
P. Raja Ramana Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post
S. K. Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post
Srinivasa Prasad, Microwave Tube Division, Bharat Electronics, Jalahalli, Bangalore-560 013, India
pp. 283-284
R. S. Tomar, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
Pardeep, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
S. Ghosh, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
S. M. Sharma, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
R. K. Sharma, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
V. Srivastava, Central Electronics Engineering Research Institute (CEERI), (A constituent Laboratory of Council of Scientific and Industrial Research, CSIR), Pilani, Rajasthan-333031, India
pp. 285-286
Ashutosh, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221 005, India
Rupendra Singh, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221 005, India
P. K. Jain, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221 005, India
pp. 287-288
M. S. Chauhan, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221005, India
P. K. Jain, Center of Research in Microwave Tubes, Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221005, India
pp. 289-290
P. Vamshi Krishna, Dept. of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247667, India
M. V. Kartikeyan, Dept. of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247667, India
M. Thumm, IHM, Karlsruhe Institute of Technology, North Campus, Post Box 3640, D76021 Karlsruhe, Germany
pp. 291-292
P. Vamshi Krishna, Dept. of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247667, India
M. V. Kartikeyan, Dept. of Electronics & Computer Engineering, Indian Institute of Technology, Roorkee-247667, India
M. Thumm, IHM, Karlsruhe Institute of Technology, North Campus, Post Box 3640, D76021 Karlsruhe, Germany
pp. 293-294
Nitin Kumar, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI),. Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Sudeep Saran, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI),. Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Udaybir Singh, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI),. Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Vivek Yadav, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI),. Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
B. Jha, Center of Research in Microwave Tubes, IT-BHU, Varansi, India
P. K. Jain, Center of Research in Microwave Tubes, IT-BHU, Varansi, India
T. P. Singh, Department of Physics, JV College, Baraut, India
Ashok K. Sinha, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI),. Council of Scientific and Industrial Research (CSIR), Pilani, Rajasthan-333031, India
pp. 295-296
Alexander A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk, Byelarus 220027
Anatoly A. Navrotsky, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk, Byelarus 220027
Anatoly K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk, Byelarus 220027
pp. 297-298
Purna C. Panda, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani, (Rajasthan)-333031, India
Vishnu Srivastava, MWT Division, Central Electronics Engineering Research Institute/Council of Scientific & Industrial Research (CSIR), Pilani, (Rajasthan)-333031, India
Anil Vohra, Department of Electronics Science, Kurukshetra University, Kurukshetra, Haryana, India
pp. 299-300
Patrick Ferguson, Calabazas Creek Research Inc., San Mateo, CA, 94404
Michael E. Read, Calabazas Creek Research Inc., San Mateo, CA, 94404
David Marsden, Calabazas Creek Research Inc., San Mateo, CA, 94404
R. Lawrence Ives, Calabazas Creek Research Inc., San Mateo, CA, 94404
pp. 301-302
Vishnu Srivastava, Microwave Tubes Division, Central Electronics Engineering Research Institute (CEERI)/ Council of Scientific & Industrial Research (CSIR), Pilani-333031, Rajasthan, India
pp. 303-304
Simon J. Cooke, Naval Research Laboratory, Code 6841, 4555 Overlook Ave. S.W., Washington, DC 20375
Alexander N. Vlasov, Naval Research Laboratory, Code 6841, 4555 Overlook Ave. S.W., Washington, DC 20375
Baruch Levush, Naval Research Laboratory, Code 6841, 4555 Overlook Ave. S.W., Washington, DC 20375
Igor A. Chernyavskiy, Science Applications International Corporation, McLean, VA 22102
Thomas M. Antonsen, Inst. for Research in Electronics and Applied Physics, University of Maryland, College Park, MD 20742
pp. 305-306
Pierre Bernardi, THALES Electron Devices, 2 rue Marcel Dassault, 78140 Vélizy-Villacoublay, France
Frederic Andre, THALES Electron Devices, 2 rue Marcel Dassault, 78140 Vélizy-Villacoublay, France
David Bariou, THALES Electron Devices, 2 rue Marcel Dassault, 78140 Vélizy-Villacoublay, France
Jean-Francois David, THALES Electron Devices, 2 rue Marcel Dassault, 78140 Vélizy-Villacoublay, France
Alain Le Clair, THALES Electron Devices, 2 rue Marcel Dassault, 78140 Vélizy-Villacoublay, France
Fabrice Doveil, Laboratoire de PIIM-UMR6633, Université de Provence, Centre de Saint Jérôme-C21, 13397 Marseille, France
pp. 307-308
Khanh Nguyen, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
John Pasour, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Edward Wright, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
David Abe, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Lars Ludeking, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Dean Pershing, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
Baruch Levush, Vacuum Electronics Branch, US Naval Research Laboratory, Washington, DC 20375
pp. 309-310
M. Thottappan, Centre of Research in Microwave Tubes (CRMT), Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221005, India
P. K. Jain, Centre of Research in Microwave Tubes (CRMT), Department of Electronics Engineering, Institute of Technology, Banaras Hindu University, Varanasi-221005, India
pp. 311-312
Zhaochuan Zhang, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Yaogen Ding, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Bin Shen, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Honghong Gu, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Jing Cao, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Haibing Ding, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
pp. 313-314
R. Marchesin, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
A. Beunas, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
F. Legrand, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
P. Thouvenin, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
M. Caplot, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
E. Boghossian, Thales Electron Devices, 2 Rue M. Dassault, F-78414 Vélizy-Villacoublay, France
pp. 315-316
Lawrence Ives, Calabazas Creek Research Inc., 690 Port Drive, San Mateo, CA, 94404
Michael Read, Calabazas Creek Research Inc., 690 Port Drive, San Mateo, CA, 94404
David Marsden, Calabazas Creek Research Inc., 690 Port Drive, San Mateo, CA, 94404
R. H. Jackson, Calabazas Creek Research Inc., 690 Port Drive, San Mateo, CA, 94404
Thuc Bui, Calabazas Creek Research Inc., 690 Port Drive, San Mateo, CA, 94404
Takuji Kimura, Communications & Power Industries Inc., 811 Hansen Way, Palo Alto, CA 94303
Edward Eisen, Communications & Power Industries Inc., 811 Hansen Way, Palo Alto, CA 94303
pp. 319-320
Mithilesh Kumar, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
M. Vijay Kumar, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Ashok Bansiwal, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
A. K. Agrawal, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Ravi Ninavath, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Venkat, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Sushil Raina, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, BE Complex, Jalahalli, Bangalore-560013, India
pp. 321-322
Daniel Busbaher, Semicon Associates, 695 Laco Dr., Lexington, KY 40510, USA
Wen Liu, Mechanical Engineering Department, University of Kentucky, Lexington, KY 40506, USA
David Mocher, Department of Earth and Environmental Sciences, University of Kentucky, Lexington, KY 40506, USA
Dusan P. Sekulic, Mechanical Engineering Department, University of Kentucky, Lexington, KY 40506, USA
pp. 323-324
Anindya Roy, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
R. B. Bhole, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
J. Akhtar, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
R. C. Yadav, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
Sarbajit Pal, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
D. Sarkar, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
R.K. Bhandari, Variable Energy Cyclotron Centre, 1/AF Bidhan Nagar, Kolkata-700064, India
pp. 325-326
Manjiri Pande, Technical Physics Division, Bhabha Atomic Research Center, Mumbai-400085, India
Sandip Shrotriya, Technical Physics Division, Bhabha Atomic Research Center, Mumbai-400085, India
Sonal Sharma, Technical Physics Division, Bhabha Atomic Research Center, Mumbai-400085, India
Niranjan Patel, Technical Physics Division, Bhabha Atomic Research Center, Mumbai-400085, India
Verander Handu, Technical Physics Division, Bhabha Atomic Research Center, Mumbai-400085, India
pp. 327-328
Xingqun Zhao, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Suiren Wan, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Yixue Wei, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Ningfeng Bai, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Shilu Zhao, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Tiechang Yan, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Xiaohan Sun, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
pp. 329-330
Huarong Gong, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
Yubin Gong, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
Tao Tang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
Wenxiang Wang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, Chengdu, Sichuan 610054, China
pp. 331-332
Michael J. Duffield, e2v technologies ltd, 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
Richard North, e2v technologies ltd, 106 Waterhouse Lane, Chelmsford, UK, CM1 2QU
pp. 333-334
Zhiliang Li, Vacuum Electronics National Laboratory, P.O. Box 749-41, 100015, Beijing, China
Jinjun Feng, Vacuum Electronics National Laboratory, P.O. Box 749-41, 100015, Beijing, China
Efeng Wang, Vacuum Electronics National Laboratory, P.O. Box 749-41, 100015, Beijing, China
Bentian Liu, Vacuum Electronics National Laboratory, P.O. Box 749-41, 100015, Beijing, China
pp. 335-336
N. Kalyasundaram, Department of Electronics and Communication Engineering, Jaypee Institute of IT, Sector 62, Noida, India
Jasmine Saini, Department of Electronics and Communication Engineering, Jaypee Institute of IT, Sector 62, Noida, India
G. Naveen Babu, Department of Electronics and Communication Engineering, Jaypee Institute of IT, Sector 62, Noida, India
pp. 337-338
Narugopal Nayek, SAMEER, Hill Side, IIT Campus, Powai, Mumbai-400076, India
K. Subhadra, SAMEER, Hill Side, IIT Campus, Powai, Mumbai-400076, India
Arvind Naik, SAMEER, Hill Side, IIT Campus, Powai, Mumbai-400076, India
Subrata Das, SAMEER, Hill Side, IIT Campus, Powai, Mumbai-400076, India
pp. 339-340
V. Bhanu Naidu, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
P. Raja Ramana Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Narasimha Murthy, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
S. U. M. Reddy, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
P. K. Jain, Department of Electronics Engineering, Banaras Hindu University, Varanasi, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 341-342
Colin D. Joye, US Naval Research Laboratory, Code 6840, 4555 Overlook Ave. SW, Washington, DC 20375 USA
Jeffrey P. Calame, US Naval Research Laboratory, Code 6840, 4555 Overlook Ave. SW, Washington, DC 20375 USA
Khanh T. Nguyen, Beam Wave Research, Inc., Bethesda, MD 20814, USA
Dean Pershing, Beam Wave Research, Inc., Bethesda, MD 20814, USA
Paul B. Larsen, US Naval Research Laboratory, Code 6840, 4555 Overlook Ave. SW, Washington, DC 20375 USA
Morag Garven, Scientific Applications International Corp (SAIC), McLean, VA 22102, USA
Doewon Park, US Naval Research Laboratory, Code 6850, 4555 Overlook Ave. SW, Washington, DC 20375 USA
Robert Bass, US Naval Research Laboratory, Code 6850, 4555 Overlook Ave. SW, Washington, DC 20375 USA
Baruch Levush, US Naval Research Laboratory, Code 6840, 4555 Overlook Ave. SW, Washington, DC 20375 USA
pp. 343-344
Diana Gamzina, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Robert Barchfeld, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Larry R. Barnett, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Neville C. Luhmann, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
Young-Min Shin, Department of Applied Science, University of California-Davis (UCD), CA 95616, USA
pp. 345-346
Benjamin B. Yang, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison, Wisconsin 53706, USA
Sarah L. Katz, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison, Wisconsin 53706, USA
John H. Booske, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, 1415 Engineering Drive, Madison, Wisconsin 53706, USA
pp. 347-348
Marcus J. Weber, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
Benjamin B. Yang, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
Sarah L. Katz, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
John H. Booske, Department of Electrical and Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706, USA
pp. 349-350
Anisullah Baig, Department of Engineering, Applied Science, University of California, Davis, Davis, CA 95616, USA
Jian-Xun Wang, Department of Engineering, Applied Science, University of California, Davis, Davis, CA 95616, USA
Larry R. Barnett, Department of Engineering, Applied Science, University of California, Davis, Davis, CA 95616, USA
Neville Luhmann, Department of Engineering, Applied Science, University of California, Davis, Davis, CA 95616, USA
Young-Min Shin, Department of Engineering, Applied Science, University of California, Davis, Davis, CA 95616, USA
pp. 351-352
Alexander A. Kurayev, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk 220013, Belarus
Tatiana L. Popkova, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk 220013, Belarus
Alexey O. Rak, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk 220013, Belarus
pp. 353-354
Xi Gao, Information and Communication College, Guilin University of Electronic Technology, No. 1, Jinji Road, Guilin 541004, P.R. China
Simin Li, Information and Communication College, Guilin University of Electronic Technology, No. 1, Jinji Road, Guilin 541004, P.R. China
Weiping Cao, Information and Communication College, Guilin University of Electronic Technology, No. 1, Jinji Road, Guilin 541004, P.R. China
Yannan Jiang, Information and Communication College, Guilin University of Electronic Technology, No. 1, Jinji Road, Guilin 541004, P.R. China
Xinhua Yu, Information and Communication College, Guilin University of Electronic Technology, No. 1, Jinji Road, Guilin 541004, P.R. China
pp. 355-356
Zhu Fang, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Zhang Zhao-Chuan, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Luo Ji-run, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 357-358
Sergey V. Korolev, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin" (FGUP VEI), State Science Center Russian Federation, 12 Krasnokazarmennaya St.,
pp. 359-360
Sergey V. Korolev, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute named after V.I. Lenin" (FGUP VEI), State Science Center Russian Federation, 12 Krasnokazarmennaya St.,
pp. 361-362
Sergy V. Korolev, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
Vera I. Alekhina, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
Artur N. Ermilov, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
Yurij A. Kovalenko, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
Alexandr L. Shapiro, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
Alexandr P. Shumilin, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin", State Science Center Russian Federation, 12 Krasnokazarmennaya St., 112250 Mosc
pp. 363-364
Cheng Cheng, Cathode Electronics Laboratory, Beijing Vacuum Electronics Research Institute, 13 Jiuxianqiao Road, Chaoyang district, Beijing 100015, China
Ji Li, Cathode Electronics Laboratory, Beijing Vacuum Electronics Research Institute, 13 Jiuxianqiao Road, Chaoyang district, Beijing 100015, China
Zhiqiang Yu, Cathode Electronics Laboratory, Beijing Vacuum Electronics Research Institute, 13 Jiuxianqiao Road, Chaoyang district, Beijing 100015, China
Hui Wang, Cathode Electronics Laboratory, Beijing Vacuum Electronics Research Institute, 13 Jiuxianqiao Road, Chaoyang district, Beijing 100015, China
pp. 365-366
Vivek Yadav, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute, Pilani-333031, India (A Constituent Laboratory of Council of Scientific and Industrial Research)
Sudeep Sharan, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute, Pilani-333031, India (A Constituent Laboratory of Council of Scientific and Industrial Research)
Nitin Kumar, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute, Pilani-333031, India (A Constituent Laboratory of Council of Scientific and Industrial Research)
M. K. Alaria, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute, Pilani-333031, India (A Constituent Laboratory of Council of Scientific and Industrial Research)
Narugopal Nayek, Society for Applied Microwave Electronics Engineering and Research (SAMEER), Mumbai-400076, India
Subrata Das, Society for Applied Microwave Electronics Engineering and Research (SAMEER), Mumbai-400076, India
S. C. Deorani, Department of Physics, R.R. College, Alwar-301001, India
A. K. Sinha, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute, Pilani-333031, India (A Constituent Laboratory of Council of Scientific and Industrial Research)
pp. 367-368
Min Zhang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Xiaoxia Wang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Jirun Luo, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Qinglan Zhao, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
pp. 369-370
Mingchen Zhang, Research and Development of Center for Space TWT, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Honglai Zhang, Research and Development of Center for Space TWT, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Shiji Yu, Research and Development of Center for Space TWT, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Pukun Liu, Research and Development of Center for Space TWT, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
pp. 371-372
Daniel Busbaher, Semicon Associates, 695 Laco Dr., Lexington, KY 40510, USA
Peter C. Smith, Oasis Materials Corporation, 12131 Community Rd., Poway, CA 92064, USA
Robert W. LeClair, Oasis Materials Corporation, 12131 Community Rd., Poway, CA 92064, USA
pp. 373-374
Yiman Wang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Wei Liu, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Jinshu Wang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Xizhu Zhang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
pp. 375-376
XiaoLin Jin, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
ZhongHai Yang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
Tao Huang, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
XiaoFang Zhu, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
JianQing Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
Bin Li, Vacuum Electronics National Laboratory, School of Physical Electronics, University of Electronic Science and Technology of China, No. 4, Section 2, North Jianshe Road, Chengdu, 610
pp. 377-378
Hanyan Li, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Jinjun Feng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Guodong Bai, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
pp. 379-380
Shengyi Yin, Key Labouratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Jingxin Yang, Key Labouratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Honglai Zhang, Key Labouratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 381-382
Ming Q. Ding, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Bo Qu, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Guodong Bai, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Junyi Xing, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Xiaofeng Liang, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Shaolun Cai, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
Jinjun Feng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing 100016, P.R. China
pp. 383-384
U. N. Pal, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
V. P. Dubey, Ch. Beeri Singh College of Engineering & Management, Agra, UP, India
M. K. Barik, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
V. Lamba, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
D. K. Verma, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
N. Kumar, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
M. Kumar, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
B. L. Meena, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
M. S. Tyagi, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
A. K. Sharma, Central Electronics Engineering Research Institute (CEERI), Pilani (Raj.)-333 031, India
pp. 385-386
Ming Q. Ding, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing-100016
Lili Li, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing-100016
Guodong Bai, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing-100016
Yingfu Hu, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing-100016
Jinjun Feng, Vacuum Electronics National Laboratory, Beijing Vacuum Electronics Research Institute, Beijing-100016
pp. 387-388
K. Ashok, Vardhaman College of Engg., Kacharam, Shamshabad, R.R. 501 218, A.P
V. S. Raju, CCCM, BARC, ECIL, Hyderabad-500 062, A.P, India
S. Chandralingam, Department of Physics, JNTUH College of Engineering Hyderabad-500 085, A.P., India
P. Sarah, Vardhaman College of Engg., Kacharam, Shamshabad, R.R. 501 218, A.P
pp. 389-390
Michael P. Effgen, Semicon Associates-695 Laco Drive, Lexington, Kentucky 40510
pp. 391-392
Oksana I. Naranovich, Belarusian State University of Informatics and Radioelectronics, 6, P. Brovki Str., Minsk-220013, Belarus
Anatoliy K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, 6, P. Brovki Str., Minsk-220013, Belarus
pp. 393-394
P. Y. Nabhiraj, Variable Energy Cyclotron Centre, Sector-1, Block-AF, Salt Lake, Kolkata-700064, India
Ranjini Menon, Variable Energy Cyclotron Centre, Sector-1, Block-AF, Salt Lake, Kolkata-700064, India
G. Mohan Rao, Department of Instrumentation, Indian Institute of Science, Bangalore-560012, India
S. Mohan, Department of Instrumentation, Indian Institute of Science, Bangalore-560012, India
R. K. Bhandari, Variable Energy Cyclotron Centre, Sector-1, Block-AF, Salt Lake, Kolkata-700064, India
pp. 395-396
Scott Roberts, Semicon Associates, 695 Laco Drive, Lexington, KY 40336, USA
Mike Effgen, Semicon Associates, 695 Laco Drive, Lexington, KY 40336, USA
pp. 397-398
T. J. Balk, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
P. Rottmann, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
D. Bowling, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
E. Fadde, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
A. Floyd, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
R. Wilson, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
S. Roberts, Semicon Associates, Lexington, KY 40510, USA
pp. 399-400
P. Swartzentruber, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
T. J. Balk, Department of Chemical and Materials Engineering, University of Kentucky, Lexington, KY 40506, USA
S. Roberts, Semicon Associates, Lexington, KY 40510, USA
pp. 401-402
R. Lawrence Ives, Calabazas Creek Research, San Mateo, CA 94404 USA
David Marsden, Calabazas Creek Research, San Mateo, CA 94404 USA
Max Mizuhara, Calabazas Creek Research, San Mateo, CA 94404 USA
George Collins, Calabazas Creek Research, San Mateo, CA 94404 USA
Jeff Neilson, Calabazas Creek Research, USA
Philipp Borchard, Calabazas Creek Research, USA
pp. 403-404
E. M. Choi, School of Electrical & Computer Engineering, Ulsan National Institute of Science and Technology (UNIST), 100 Banyeon-ri, Eonyang-eup, Ulju-gun, Ulsan 689-798, South Korea
pp. 405-406
Wei Liu, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Jinshu Wang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Yiman Wang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Yuntao Cui, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Xizhu Zhang, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
Meiling Zhou, School of Materials Science and Engineering, Beijing University of Technology, 100 Pingleyuan, Beijing 100124, China
pp. 407-408
N. Nalini, Applied Physics Division, Bhabha Atomic Research center, Mumbai, India
M. Kale, Applied Physics Division, Bhabha Atomic Research center, Mumbai, India
T. C. Kaushik, Applied Physics Division, Bhabha Atomic Research center, Mumbai, India
S. C. Gupta, Applied Physics Division, Bhabha Atomic Research center, Mumbai, India
pp. 409-410
K. Sunitha, Pulsed Power and EMC Laboratory, Department of Electrical Engineering, Indian Institute of Science, Bangalore-560012, India
M. Joy Thomas, Pulsed Power and EMC Laboratory, Department of Electrical Engineering, Indian Institute of Science, Bangalore-560012, India
pp. 411-412
Jiu Xing Zhang, Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology-100124, Beijing
Li Hong Bao, Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology-100124, Beijing
Shen Lin Zhou, Key Laboratory of Advanced Functional Materials, Ministry of Education, College of Materials Science and Engineering, Beijing University of Technology-100124, Beijing
pp. 413-414
Shibaji Basu, Bhaba Atomic Research Centre, Mumbai-400085, India
S. V. Desai, Bhaba Atomic Research Centre, Mumbai-400085, India
Archana Sharma, Bhaba Atomic Research Centre, Mumbai-400085, India
S. Mitra, Bhaba Atomic Research Centre, Mumbai-400085, India
K. V. Nagesh, Bhaba Atomic Research Centre, Mumbai-400085, India
M. R. Kulkarni, Bhaba Atomic Research Centre, Mumbai-400085, India
D. P. Chakravarthy, Bhaba Atomic Research Centre, Mumbai-400085, India
pp. 415-416
Fan Hehong, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Xu Yishu, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Bai Ningfeng, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Li Ji, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Xiao Jinbiao, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Sun Xiaohan, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
pp. 417-418
Yao Li Liu, Department of Physics, National Central University, Jhongli 32001, Taiwan
Ling Chieh Tai, Department of Physics, National Central University, Jhongli 32001, Taiwan
Shih Hung Chen, Department of Physics, National Central University, Jhongli 32001, Taiwan
Lay Kee Ang, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Wee Shing Koh, Institute of High Performance Computing, Singapore 639798
pp. 419-420
Feng Gao, School of Electronic Science & Engineering, Southeast University, Nanjing 210096, PR China
Mei Xiao, School of Electronic Science & Engineering, Southeast University, Nanjing 210096, PR China
Xiaobing Zhang, School of Electronic Science & Engineering, Southeast University, Nanjing 210096, PR China
Wei Lei, School of Electronic Science & Engineering, Southeast University, Nanjing 210096, PR China
pp. 421-422
B. Ch. Dyubua, SRPC "Istok", Cathode Department, Fryazino, Moscow Reg., Vokzalnaya Str., 2a, Russia
O. V. Polivnikova, SRPC "Istok", Cathode Department, Fryazino, Moscow Reg., Vokzalnaya Str., 2a, Russia
pp. 423-424
Xu Shouxi, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Pu-Kun Liu, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Zhang Shi-Chang, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Du Chao-Hai, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
Gu Wei, Key Laboratory of High Power Microwave Sources and Technologies, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, P.R. China
pp. 425-426
R. Ranga Rao, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Narendra Kumar, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Ravi Prakash, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
Udaybir Singh, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
M. K. Alaria, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
A. K. Sinha, Gyrotron Laboratory, MWT Area, Central Electronics Engineering Research Institute (CEERI), Council of Scientific and, Industrial Research (CSIR), Pilani, Rajasthan-333031, India
pp. 427-428
Dharmendra Kumar, LRDE, C.V. Raman Nagar, Bangalore-560 093, India
B. R. Sushma, LRDE, C.V. Raman Nagar, Bangalore-560 093, India
Venkatesh Prabhu, LRDE, C.V. Raman Nagar, Bangalore-560 093, India
Meera Das, LRDE, C.V. Raman Nagar, Bangalore-560 093, India
N. C. Saha, LRDE, C.V. Raman Nagar, Bangalore-560 093, India
pp. 429-430
N. V. Bijeev, Space Application Centre, Indian Space Research Organization (ISRO) Ahmedabad, India
Anju Malhotra, Space Application Centre, Indian Space Research Organization (ISRO) Ahmedabad, India
Virender Kumar, Space Application Centre, Indian Space Research Organization (ISRO) Ahmedabad, India
Surinder Singh, Space Application Centre, Indian Space Research Organization (ISRO) Ahmedabad, India
K. S. Dasgupta, Space Application Centre, Indian Space Research Organization (ISRO) Ahmedabad, India
Rajesh N. Motta, Bharat Electronics, Bangalore, India
B. Venugopal, Bharat Electronics, Bangalore, India
Sandhyarani, Bharat Electronics, Bangalore, India
O. K. Jinan, Bharat Electronics, Bangalore, India
B. K. Jayakumar, Bharat Electronics, Bangalore, India
pp. 431-432
P. Sidharthan, Microwave Tube Research & Development Centre, Jalahalli, Bangalore-560013, India
K. Mirjith, Microwave Tube Research & Development Centre, Jalahalli, Bangalore-560013, India
A. J. Zabiulla, Microwave Tube Research & Development Centre, Jalahalli, Bangalore-560013, India
Sudhir Kamath, Microwave Tube Research & Development Centre, Jalahalli, Bangalore-560013, India
pp. 433-434
Ch. Durga Prasad, Defence Avionics Research Establishment (DARE), C.V. Raman Nagar, Bangalore-560093, India
G. Baranidharan, Defence Avionics Research Establishment (DARE), C.V. Raman Nagar, Bangalore-560093, India
K. B. Venkataraman, Defence Avionics Research Establishment (DARE), C.V. Raman Nagar, Bangalore-560093, India
U. K. Revankar, Defence Avionics Research Establishment (DARE), C.V. Raman Nagar, Bangalore-560093, India
pp. 435-436
A. A. Borisov, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
U. A. Budzinsky, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
S. V. Bykovsky, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
A. V. Galdetskiy, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
A. N. Korolev, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
M. I. Lopin, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
A. A. Negirev, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
V. I. Pugnin, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
G. V. Ruvinsky, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
B. V. Sazonov, FSUE Istok, Vokzalnaia st. 2a, Fryazino, 141190, Russia
pp. 437-438
Mark F. Kirshner, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Richard D. Kowalczyk, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Craig B. Wilsen, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Richard B. True, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
Ian T. Simpson, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
John T. Wray, L-3 Communications Electron Devices, 960 Industrial Road, San Carlos, CA 94070, USA
pp. 439-440
S Maurya, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
Sharda Prasad, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
M Kumar, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
P Chaudhary, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
N Shekhawat, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
Vvp Singh, Microwave Tubes Division, Central Electronics Engineering Research Institute (CSIR)
pp. 441-442
Monika C. Balk, CST AG, Bad Nauheimerstr. 19, 64289 Darmstadt, Germany
pp. 443-444
Matthew Franzi, Plasma, Pulsed Power and Microwave Lab, Nuclear, Engineering and Radiological Sciences Dept., University of Michigan, Ann Arbor, MI 48109-2104
Ronald Gilgenbach, Plasma, Pulsed Power and Microwave Lab, Nuclear, Engineering and Radiological Sciences Dept., University of Michigan, Ann Arbor, MI 48109-2104
David French, Plasma, Pulsed Power and Microwave Lab, Nuclear, Engineering and Radiological Sciences Dept., University of Michigan, Ann Arbor, MI 48109-2104
Brad Hoff, Air Force Research Lab, Kirtland AFB, NM
Y. Y. Lau, Plasma, Pulsed Power and Microwave Lab, Nuclear, Engineering and Radiological Sciences Dept., University of Michigan, Ann Arbor, MI 48109-2104
David Simon, Plasma, Pulsed Power and Microwave Lab, Nuclear, Engineering and Radiological Sciences Dept., University of Michigan, Ann Arbor, MI 48109-2104
John W. Luginsland, Air Force Office of Scientific Research, Arlington, VA
pp. 445-446
Yu. A. Kovalenko, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin" (FGUP VEI) State Science Center Russian Federation, 12 Krasnokazarmennaya street
D. S. Korolev, Federal State Unitary Enterprise "All-Russia Electronic Technical Institute Named After V.I. Lenin" (FGUP VEI) State Science Center Russian Federation, 12 Krasnokazarmennaya street
pp. 447-448
V. V. Matveenko, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk, Byelarus 220027
A. K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics, P. Brovka Str., 6, Minsk, Byelarus 220027
pp. 449-450
Cui Jian, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Luo Ji-Run, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Zhu Min, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
Guo Wei, Institute of Electronics, Chinese Academy of Sciences, Beijing 100190, China
pp. 451-452
Alexey I. Korchagin, Electron Devices Department, Saratov State Technical University, Polytechnical Str., 77, Saratov 410054, Russia
Alexey Yu. Miroshnichenko, Electron Devices Department, Saratov State Technical University, Polytechnical Str., 77, Saratov 410054, Russia
Vladislav A. Tsarev, Electron Devices Department, Saratov State Technical University, Polytechnical Str., 77, Saratov 410054, Russia
pp. 453-454
A. A. Kurayev, Belarusian State University of Informatics and Radioelectronics P. Brovka str., 6, Minsk, Belarus, 220027
D. V. Lukashonok, Belarusian State University of Informatics and Radioelectronics P. Brovka str., 6, Minsk, Belarus, 220027
A. K. Sinitsyn, Belarusian State University of Informatics and Radioelectronics P. Brovka str., 6, Minsk, Belarus, 220027
pp. 455-456
Ming-Guang Huang, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Bao-Liang Hao, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Pu-Kun Liu, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Wei Liu, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
Zi-Cheng Wang, Institute of Electronics, Chinese Academy of Sciences, No. 19 Beisihuan Xilu, Beijing 100190, China
pp. 457-458
Bhoopendrakumar Singh, Centum Electronics Limited, 44, KHB Industrial Area, Yelahanka New Town, Bangalore, India
Santosh Joteppa, Centum Electronics Limited, 44, KHB Industrial Area, Yelahanka New Town, Bangalore, India
Satyanarayana Prasad, Centum Electronics Limited, 44, KHB Industrial Area, Yelahanka New Town, Bangalore, India
Vinod S. Chippalkatti, Centum Electronics Limited, 44, KHB Industrial Area, Yelahanka New Town, Bangalore, India
R. N. Garvalia, Space Applications Centre (SAC), Indian Space Research Organisation, Ahmedabad, India
K. G. Domadia, Space Applications Centre (SAC), Indian Space Research Organisation, Ahmedabad, India
R. M. Parmar, Space Applications Centre (SAC), Indian Space Research Organisation, Ahmedabad, India
R. K. Dave, Space Applications Centre (SAC), Indian Space Research Organisation, Ahmedabad, India
D. R. M. Samudraiah, Space Applications Centre (SAC), Indian Space Research Organisation, Ahmedabad, India
pp. 459-460
Yaogen Ding, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Zhaochuan Zhang, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Bin Shen, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Haibin Ding, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
Xiaoxin Sun, Institute of Electronics, Chinese Academy of Sciences, 19 Beisihuan Xilu, Beijing 100190, China
pp. 461-462
Andrey D. Andreev, Air Force Research Laboratory, Directed Energy Directorate, High-Power Microwave Division, 3550 Aberdeen Dr., Kirtland Air Force Base, NM 87117-5776
Kyle J. Hendricks, Air Force Research Laboratory, Directed Energy Directorate, High-Power Microwave Division, 3550 Aberdeen Dr., Kirtland Air Force Base, NM 87117-5776
pp. 463-464
Ming Hui Liu, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Fu Jiang Liao, Beijing Vacuum Electronics Research Institute, Beijing 100015, China
Xiaohan Sun, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Wenxuan Qian, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
Mingfang Chen, Research Center for Electronic Device and System Reliability, Southeast University, Nanjing 210096, China
pp. 465-466
Nidhi Parmar, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
P. Deshpande, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
Y. Choyal, School of Physics, D.A. University, Khandwa Road Campus, Indore, India
K. P. Maheshwari, Vardhman Mahaveer Open University, Kota, India
K. S. Bhat, Microwave Tube Research and Development Centre, BEL Complex, Jalahalli, Bangalore, India
pp. 467-468
H. S. Vasudeva Murthy, ISRO Satellite Centre, Bangalore, India
Amit Kumar Sharma, ISRO Satellite Centre, Bangalore, India
K. Badarinarayana, ISRO Satellite Centre, Bangalore, India
P. Lakshminarasimhan, ISRO Satellite Centre, Bangalore, India
pp. 469-470
P. C. Saroj, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
Ritu Agrawal, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
A. Roy, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
R. Menon, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
Sandeep Singh, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
S. R. Raul, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
M. R. Kulkarni, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
Archana Sharma, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
K. V. Nagesh, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
D. P. Chakravarthy, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-400085, India
pp. 471-472
T. S. Kolge, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
S. Mitra, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
Ritu Agarwal, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
P. C. Saroj, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
Ankur Patel, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
K. Senthil, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
Archana Sharma, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
K. V. Nagesh, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
D. P. Chakravarthy, Accelerator and Pulsed Power Division, Bhabha Atomic Research Centre, Trombay, Mumbai-85, India
pp. 473-474
Ankur Patel, Bhabha Atomic Research Centre, Mumbai-400094, India
K. Senthil, Bhabha Atomic Research Centre, Mumbai-400094, India
S. Acharya, Bhabha Atomic Research Centre, Mumbai-400094, India
S. Mitra, Bhabha Atomic Research Centre, Mumbai-400094, India
Rehim N. Rajan, Bhabha Atomic Research Centre, Mumbai-400094, India
Tanmay Kolge, Bhabha Atomic Research Centre, Mumbai-400094, India
A. Roy, Bhabha Atomic Research Centre, Mumbai-400094, India
Archana Sharma, Bhabha Atomic Research Centre, Mumbai-400094, India
Hitesh Kewlani, Bhabha Atomic Research Centre, Mumbai-400094, India
K. V. Nagesh, Bhabha Atomic Research Centre, Mumbai-400094, India
D. P. Chakravarthy, Bhabha Atomic Research Centre, Mumbai-400094, India
pp. 475-476
Pritam Singh Bagduwal, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
Nitesh Tiwari, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
M. Prasad, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
M. Lad, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
Ashish Bohrey, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
S. J. Buhari, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
P. R. Hannurkar, Raja Ramanna Centre for Advanced Technology, Indore-452013, India
pp. 477-478
K. Senthil, Bhabha Atomic Research Centre, Mumbai, India
S. Mitra, Bhabha Atomic Research Centre, Mumbai, India
Archana Sharma, Bhabha Atomic Research Centre, Mumbai, India
K. V. Nagesh, Bhabha Atomic Research Centre, Mumbai, India
D. P. Chakravarthy, Bhabha Atomic Research Centre, Mumbai, India
pp. 479-480
V. P. Anitha, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Amita Das, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Y. C. Saxena, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Anurag Shyam, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
P. K. Kaw, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
pp. 481-482
Priyavandna J. Rathod, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
V. P. Anitha, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Z. H. Sholapurwala, Zeonics Systech, Maruthinagar, New Thippasandra Post, Bangalore-560 075, India
Jayesh Raval, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Renu Bahl, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
Y. C. Saxena, Institute for Plasma Research, Bhat, Gandhinagar-382428, Gujarat, India
pp. 483-484
Manmath K. Badapanda, RF System Division, Raja Ramanna Centre for Advanced Technology, Indore, M.P.-452013, India
Akhilesh Tripathi, RF System Division, Raja Ramanna Centre for Advanced Technology, Indore, M.P.-452013, India
Rinki Upadhyay, RF System Division, Raja Ramanna Centre for Advanced Technology, Indore, M.P.-452013, India
Pundlik R. Hannurkar, RF System Division, Raja Ramanna Centre for Advanced Technology, Indore, M.P.-452013, India
pp. 485-486
T. V. Prakash Rao, DRDO, Dr. Raja Ramanna Complex, Bengaluru-560001, India
R. S. N. Moorthy, Dr. Raja Ramanna Complex, Bengaluru-560001, India
Sowbhagya, LRDE, CV. Raman Nagar, Bengaluru-560093, India
pp. 487-488
Rajesh Kumar, Institute for Plasma Research, Gandhinagar, India
Jignesh Patel, Institute for Plasma Research, Gandhinagar, India
V. P. Anitha, Institute for Plasma Research, Gandhinagar, India
Anurag Shyam, Institute for Plasma Research, Gandhinagar, India
pp. 489-490
Rishi Verma, Institute for Plasma Research, Bhat, Gandhinagar-382428, India
Anurag Shyam, Bhabha Atomic Research Center, Autonagar, Vishakapatnam 530012, India
Tushar Patel, Institute for Plasma Research, Bhat, Gandhinagar-382428, India
Y. C. Saxena, Institute for Plasma Research, Bhat, Gandhinagar-382428, India
pp. 491-492
J. Sundara Moorthy, Targeted Training Center, Dr. Raja Ramanna Complex, DRDO, Bengaluru, India
P. Mohan Rao, Targeted Training Center, Dr. Raja Ramanna Complex, DRDO, Bengaluru, India
Raghu Ramudu, Targeted Training Center, Dr. Raja Ramanna Complex, DRDO, Bengaluru, India
T. V. Prakash Rao, Targeted Training Center, Dr. Raja Ramanna Complex, DRDO, Bengaluru, India
pp. 493-494
J. Koner, Microwave Tubes Division, Bharat Electronic, Jalahalli, Bangalore-560 013, India
P. V. Bhaskar, Microwave Tubes Division, Bharat Electronic, Jalahalli, Bangalore-560 013, India
K. S. Prasad, Microwave Tubes Division, Bharat Electronic, Jalahalli, Bangalore-560 013, India
S. Prasad, Microwave Tubes Division, Bharat Electronic, Jalahalli, Bangalore-560 013, India
R. P. Rajagopalan, Microwave Tubes Division, Bharat Electronic, Jalahalli, Bangalore-560 013, India
pp. 495-496
S. P. Nayak, Applied Physics Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
N. Nalini, Applied Physics Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
Mahesh Kale, Applied Physics Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
T. C. Kaushik, Applied Physics Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
S. C. Gupta, Applied Physics Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
Archana Sharma, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
K. Senthik, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
Rakhee Menon, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
Amitava Roy, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
K. V. Nagesh, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
D. P. Chakravarthy, Accelerator and Pulse Power Division, Bhabha Atomic Research Centre, Trombay, Maharastra-400085, India
pp. 497-498
Nital R. Panchal, Department of Physics, University School of Sciences, Gujarat University, Ahmedabad-380 009, Gujarat, India
Rajshree B. Jotania, Department of Physics, University School of Sciences, Gujarat University, Ahmedabad-380 009, Gujarat, India
pp. 499-500
A. J. Banerjee, Central Mechanical Engineering Research Institute, Durgapur, India
B. Sampath Kumar, Central Mechanical Engineering Research Institute, Durgapur, India
R. K. Sharma, Central Electronics Engineering Research Institute, Pilani, India
A. Ghosh, Department of Applied Optics and Photonics of university of Calcutta, India
P. Saha, Central Mechanical Engineering Research Institute, Durgapur, India
pp. 501-502
Vemula Bhanu Naidu, Microwave Tube Research and Development Centre, Defence Research & Development Organisation, Jalahalli, Bangalore-560013, India
Subrata Kumar Datta, Microwave Tube Research and Development Centre, Defence Research & Development Organisation, Jalahalli, Bangalore-560013, India
Sudhir Kamath, Microwave Tube Research and Development Centre, Defence Research & Development Organisation, Jalahalli, Bangalore-560013, India
pp. 503-504
P. Srikrishna, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
P. V. Siva Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
S. Subramanian, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 505-506
P. Raja Ramana Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Subrata Kumar Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 507-508
P. Raja Ramana Rao, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
S. K. Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
V. A. Deshmukh, Department of Electronics Engineering, Defence Institute of Advanced Technology, Pune-411025, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 509-510
C. Narasimha Murthy, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
A. K. Singh, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
S. Subramanian, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
V. A. Deshmukh, Department of Electronics Engineering, Defence Institute of Advanced Technology, Girinagar, Pune-411025, India
S. K. Datta, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
George Abraham, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
Lalit Kumar, Microwave Tube Research and Development Centre, Bharat Electronics Complex, Jalahalli Post, Bangalore-560013, India
pp. 511-512
C. W. Robertson, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
A. D. R. Phelps, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
C. G. Whyte, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
A. R. Young, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
K. Ronald, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
A. W. Cross, SUPA, Department of Physics, University of Strathclyde, Glasgow G4 0NG, UK
pp. 513-514
Chen Guo, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of, China, Chengdu 610054, China
Zhaoyun Duan, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of, China, Chengdu 610054, China
Jucheng Lu, Institute of High Energy Electronics, School of Physical Electronics, University of Electronic Science and Technology of, China, Chengdu 610054, China
Min Chen, Department of Physics, Massachusetts Institute of Technology, Cambridge, USA, MA02139
pp. 515-516
Yashwant D. Wanmode, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
J. Mulchandani, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
M. Acharya, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
A. Bhisikar, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
H. G. Singh, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
Purushottam Shrivastava, Pulsed High Power Microwave Section, Raja Ramanna Centre for Advanced Technology, Indore, India
pp. 517-518
Ciersiang Chua, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Sheel Aditya, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Zhongxiang Shen, School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798
Min Tang, Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore
Julius Tsai, Institute of Microelectronics, A*STAR (Agency for Science, Technology and Research), Singapore
pp. 519-520
Manfred Thumm, Karlsruhe Institute of Technology (KIT), Institute for Pulsed Power and Microwave Technology and Institute of High Frequency Techniques and Electronics, Kaiserstr, 12, 76131 Karlsr
pp. 521-524
Yaogen Ding, Institute of Electronics, Chinese Academy of Sciences, China
Pukun Liu, Institute of Electronics, Chinese Academy of Sciences, China
Zhaochuan Zhang, Institute of Electronics, Chinese Academy of Sciences, China
Yong Wang, Institute of Electronics, Chinese Academy of Sciences, China
pp. 525-528
Author index (PDF)
pp. 529-536
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