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2013 IEEE International Test Conference (ITC) (2010)
Kochi, Kerala, India
Mar. 12, 2010 to Mar. 13, 2010
ISBN: 978-0-7695-3975-1
TABLE OF CONTENTS
Papers
pp. C1
Title Page i (PDF)
pp. i
pp. iii
pp. v-xii
VMAIL (Abstract)
pp. 284-286
Author Index (PDF)
pp. 387-390
7 ms
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