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International Test Conference 2004 (ITC'04)
Future Trends in Test: The Adoption and Use of Low Cost Structural Testers
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
| ASCII Text | x | ||
| Alfred L. Crouch, "Future Trends in Test: The Adoption and Use of Low Cost Structural Testers," 2012 IEEE International Test Conference, pp. 698-703, International Test Conference 2004 (ITC'04), 2004. | |||
| BibTex | x | ||
| @article{ 10.1109/ITC.2004.82, author = {Alfred L. Crouch}, title = {Future Trends in Test: The Adoption and Use of Low Cost Structural Testers}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2004}, issn = {1089-3539}, pages = {698-703}, doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.82}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - Future Trends in Test: The Adoption and Use of Low Cost Structural Testers SN - 1089-3539 SP698 EP703 A1 - Alfred L. Crouch, PY - 2004 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/ITC.2004.82
become popular for various reasons. Although originally aimed at reducing production test costs, they have quickly migrated to other niches and have proven useful in reducing not only cost, but time-to-market. Tracking the "use" spaces has resulted in identifying three clearly different areas of application: design-desktop, correlationlab, and the production-test floor. These spaces have defined tasks such as characterization, first silicon bringup, test program development, yield-learning diagnosis, and production probe, some of which will be described as case studies.
Citation:
Alfred L. Crouch, "Future Trends in Test: The Adoption and Use of Low Cost Structural Testers," itc, pp.698-703, International Test Conference 2004 (ITC'04), 2004
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