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International Test Conference 2004 (ITC'04)
On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design
Charlotte, NC, USA
October 26-October 28
ISBN: 0-7803-8581-0
ASCII Text
x 
 
J. Zeng, M. Abadir, A. Kolhatkar, G. Vandling, L. Wang, J. Abraham, "On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design," 2012 IEEE International Test Conference, pp. 31-37, International Test Conference 2004 (ITC'04), 2004.
 
 
BibTex
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@article{ 10.1109/ITC.2004.127,
author = {J. Zeng and M. Abadir and A. Kolhatkar and G. Vandling and L. Wang and J. Abraham},
title = {On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design},
journal ={2012 IEEE International Test Conference},
volume = {0},
year = {2004},
issn = {1089-3539},
pages = {31-37},
doi = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.127},
publisher = {IEEE Computer Society},
address = {Los Alamitos, CA, USA},
}
 
 
RefWorks Procite/RefMan/Endnote
x 
 
TY - CONF
JO - 2012 IEEE International Test Conference
TI - On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design
SN - 1089-3539
SP31
EP37
A1 - J. Zeng,
A1 - M. Abadir,
A1 - A. Kolhatkar,
A1 - G. Vandling,
A1 - L. Wang,
A1 - J. Abraham,
PY - 2004
KW - null
VL - 0
JA - 2012 IEEE International Test Conference
ER -
 
J. Zeng, Freescale Semiconductor Inc., Austin, TX
M. Abadir, Freescale Semiconductor Inc., Austin, TX
A. Kolhatkar, Freescale Semiconductor Inc., Austin, TX
G. Vandling, Cadence Design Systems, Endicott, NY
L. Wang, University of California, Santa Barbara, CA
J. Abraham, University of Texas at Austin, Austin, TX
The use of functional vectors has been an industry standard for speed binning purposes of high performance ICs. This practice can be prohibitively expensive as the ICs become faster and more complex. In comparison, structural patterns can target performance related faults in a more systematic manner. To make structural testing an effective alternative to functional testing for speed binning, structural patterns need to correlate with functional test frequencies closely. In this paper, we investigate the correlation between functional test frequency and that of various types of structural patterns onMPC7455, aMotorola processor executing to the PowerPC 1 instruction set architecture.
Citation:
J. Zeng, M. Abadir, A. Kolhatkar, G. Vandling, L. Wang, J. Abraham, "On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design," itc, pp.31-37, International Test Conference 2004 (ITC'04), 2004
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