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2013 IEEE International Test Conference (ITC) (2003)
Charlotte, NC, USA
Sept. 30, 2003 to Oct. 2, 2003
ISBN: 0-7803-8107-6
TABLE OF CONTENTS
Author Index (PDF)
pp. 1333
Session 1: Plenary
Janusz Rajski , Mentor Graphics Corporation
pp. 13
Session 2: Memory Testing And Diagnosis
J. M. Portal , IMT - Technop?le de Ch?teau Gombert
H. Aziza , IMT - Technop?le de Ch?teau Gombert; ST-Microelectronics
D. N? , ST-Microelectronics
pp. 23
Chih-Wea Wang , National Tsing Hua University
Kuo-Liang Cheng , National Tsing Hua University
Jih-Nung Lee , National Tsing Hua University
Yung-Fa Chou , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Frank Huang , Spirox Co.
Hong-Tzer Yang , Spirox Co.
pp. 29
Session 3: Jitter Testing Techniques for > GB/S TX/RX Links
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Mani Soma , University of Washington, Seattle, WA
Masahiro Ishida , Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Makoto Kurosawa , Advantest Corporation, Gunma, Japan
Hirobumi Musha , Advantest Corporation, Gunma, Japan
pp. 58
Karen Taylor , University of Washington, Seattle, WA
Alan Chong , University of Washington, Seattle, WA
Eddie Chan , University of Washington, Seattle, WA
Mani Soma , University of Washington, Seattle, WA
Hosam Haggag , Santa Clara Design Center, National Semiconductor, Santa Clara, CA
Henry C. Lin , University of Washington, Seattle, WA
Jim Braatz , Tacoma Design Center, National Semiconductor, Federal Way, WA
pp. 67
Session 4: High Yield And Effective Testing And Burn-In
Thomas S. Barnett , IBM Microelectronics
Adit D. Singh , Auburn University
pp. 77
Yoshihito Nishizaki , Kawasaki Microelectronics, Inc.
Osamu Nakayama , Kawasaki Microelectronics, Inc.
Chiaki Matsumoto , Kawasaki Microelectronics, Inc.
Yoshitaka Kimura , Kawasaki Microelectronics, Inc.
Toshimi Kobayashi , Kawasaki Microelectronics, Inc.
Hiroyuki Nakamura , Kawasaki Microelectronics, Inc.
pp. 85
Arman Vassighi , University of Waterloo, Canada
Manoj Sachdev , University of Waterloo, Canada
Ali Keshavarzi , Intel Corporation, Hillsboro, OR
C.F. Hawkins , University of New Mexico, Albuquerque
pp. 95
Session 5: Crosstalk And Delay Test
Xiaoliang Bai , University of California, San Diego, CA
Sujit Dey , University of California, San Diego, CA
Angela Krstic , University of California, Santa Barbara, CA
pp. 112
Rahul Kundu , Carnegie Mellon University, Pittsburgh, PA
R. D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA
pp. 122
Session 6: Improving Design Validation Coverage
S. R. Seward , University of Arkansas, Fayetteville
P. K. Lala , University of Arkansas, Fayetteville
pp. 131
Amir Hekmatpour , IBM Microelectronics, Research Triangle Park, North Carolina
James Coulter , IBM Microelectronics, Research Triangle Park, North Carolina
pp. 148
Session 7: Lecture Series-Board And System Test: Is PXI The Future of Functional Board Test?
Eric Starkloff , National Instruments, Austin, TX
Garth Black , National Instruments, Austin, TX
pp. 156
Session 8: Pushing The Envelope of ATE
J.S. Davis , Georgia Institute of Technology
D.C. Keezer , Georgia Institute of Technology
O. Liboiron-Ladouceur , Columbia University
K. Bergman , Columbia University
pp. 166
D. Minier , IBM Canada
D.C. Keezer , Georgia Institute of Technology, Atlanta
pp. 191
Session 9: ADC Test
M. Comte , University of Montpellier / CNRS, France
F. Aza? , University of Montpellier / CNRS, France
Y. Bertrand , University of Montpellier / CNRS, France
M. Renovell , University of Montpellier / CNRS, France
pp. 201
Carsten Wegener , University College Cork, Ireland
Tom O'Dwyer , Raheen Industrial Estate, Limerick, Ireland
Gwenol? Maugard , Raheen Industrial Estate, Limerick, Ireland
pp. 210
Kumar Parthasarathy , Iowa State University, Ames
Turker Kuyel , Iowa State University, Ames
Degang Chen , Texas Instruments Inc., Dallas
Randall L. Geiger , Texas Instruments Inc., Dallas
pp. 218
Session 10: Advances in Testing And Analysis Methods
Peilin Song , IBM T.J. Watson Research Center, Yorktown Heights, NY
Moyra K. McManus , IBM T.J. Watson Research Center, Yorktown Heights, NY
Robert Gauthier , IBM Microelectronics Semiconductor and Research Development Center, Essex Junction, VT
Alan J. Weger , IBM T.J. Watson Research Center, Yorktown Heights, NY
Kiran Chatty , IBM Microelectronics Semiconductor and Research Development Center, Essex Junction, VT
Mujahid Muhammad , IBM Microelectronics Semiconductor and Research Development Center, Essex Junction, VT
Pia Sanda , IBM Systems Group, Poughkeepsie, NY
pp. 236
K. R. Wilsher , NPTest, San Jose, CA
pp. 246
Felix Beaudoin , CNES- French Space Agency, France
Romain Desplats , CNES- French Space Agency, France
Nagamani Nataraj , NPTest, San Jose, CA
Ted Lundquist , NPTest, San Jose, CA
Ketan Shah , NPTest, San Jose, CA
pp. 254
Session 11: Novel ATPG Approaches
Vishwani D. Agrawal , Rutgers University, Piscataway, NJ
Madhusudan V. Atre , Agere Systems, Bangalore, India
pp. 274
Qingwei Wu , Virginia Tech, Blacksburg, VA
Michael S. Hsiao , Virginia Tech, Blacksburg, VA
pp. 281
Indradeep Ghosh , Fujitsu Labs. of America Inc., Sunnyvale, CA
Michael Hsiao , Virginia Tech, Blacksburg, VA
pp. 290
Session 12: Advances in Diagnostics
Thomas J. Vogels , Carnegie Mellon University, Pittsburgh, PA
Wojciech Maly , Carnegie Mellon University, Pittsburgh, PA
R.D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA
pp. 309
Wu-Tung Cheng , Mentor Graphics Corporation, Wilsonville, OR
Sudhakar M. Reddy , University of Iowa, Iowa City
Cheng-Ju Hsieh , Faraday Technology Corporation
Yu Huang , Mentor Graphics Corporation, Wilsonville, OR
pp. 319
Kun-Han Tsai , Mentor Graphics Corporation
Malgorzata Marek-Sadowska , University of California, Santa Barbara
Zhiyuan Wang , University of California, Santa Barbara
pp. 329
Session 13: Board And System Test: Advanced Applications of Boundary-Scan
DongSub Song , Yonsei University
YongSeung Shin , Yonsei University
Sunghoon Chun , Yonsei University
YongJoon Kim , Yonsei University
pp. 349
Hina Arora , Cadence Design Systems - Test Design Automation - Endicott, NY
Paul Setlak , Cadence Design Systems - Test Design Automation - Endicott, NY
Gary Kunselman , IBM Microelectronics - DFTS Development and Methodology - Burlington, VT
Kevin Melocco , Cadence Design Systems - Test Design Automation - Endicott, NY
pp. 358
Henk D.L. Hollmann , Philips Research Laboratories
Erik Jan Marinissen , Philips Research Laboratories
Bart Vermeulen , Philips Research Laboratories
pp. 369
Session 14: Embedded Memory BIST and Repair
P. Bernardi , Politecnico di Torino, Italy
A. Fudoli , ST Microelectronics, Cornaredo, Italy
M. Rebaudengo , Politecnico di Torino, Italy
D. Appello , ST Microelectronics, Cornaredo, Italy
V. Tancorre , ST Microelectronics, Cornaredo, Italy
M. Violante , Politecnico di Torino, Italy
pp. 379
Theo J. Powell , Texas Instruments Inc.
Wu-Tung Cheng , Mentor Graphics Corporation
Joseph Rayhawk , Mentor Graphics Corporation
Omer Samman , Mentor Graphics Corporation
Paul Policke , Texas Instruments Inc.
Sherry Lai , Texas Instruments Inc.
pp. 386
Jen-Chieh Yeh , National Tsing Hua University
Rei-Fu Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
Peir-Yuan Tsai , ADMTek Incorporated
Archer Hsu , ADMTek Incorporated
Eugene Chow , ADMTek Incorporated
pp. 393
Session 15: Interface Magic
Kranthi K. Pinjala , Arizona State University
Bruce C. Kim , Arizona State University
Pramod Variyam , Texas Instruments, Inc.
pp. 403
Session 16: Test And Verification For Cores And SOCS
Tetsuo Uchiyama , SOC Design Center, CANON INC.
Tomokazu Yoneda , Nara Institute of Science and Technology, Japan
pp. 415
J. Brandon Liu , University of Toronto, ON
Paul Thadikaran , Intel Corporation, OR
Yu-Shen Yang , University of Toronto, ON
pp. 423
G. Xenoulis , University of Piraeus, Greece
A. Paschalis , University of Athens, Greece
D. Gizopoulos , University of Piraeus, Greece
N. Kranitis , University of Athens, Greece
pp. 431
Session 17: Keep Compressing This Test Data!
Christofer S. Tautermann , University of Innsbruck, Austria
Sybille Hellebrand , University of Innsbruck, Austria
pp. 451
Lei Li , Duke University, Durham, NC
Krishnendu Chakrabarty , Duke University, Durham, NC
pp. 460
Session 18: Low-Power Scan
Sharad C. Seth , University of Nebraska-Lincoln
Bhargab B. Bhattacharya , Indian Statistical Institute
pp. 470
Takaki Yoshida , Matsushita Electric Industrial Co., Ltd.
pp. 480
P. Girard , LIRMM, Universit? Montpellier II/CNRS, France
L. Guiller , Synopsys Inc., Mountain View, CA
Y. Bonhomme , LIRMM, Universit? Montpellier II/CNRS, France
S. Pravossoudovitch , LIRMM, Universit? Montpellier II/CNRS, France
pp. 488
Session 19: Lecture Series-Board And System Test: IEEE 1149.6-A Practical Perspective
Carl Barnhart , Cadence Design Systems, Ojai, CA
Mike Ricchetti , Intellitech, Durham, NH
Terry Borroz , Teradyne, North Reading, MA
pp. 494
Session 20: Extremely Low-Cost Testers
Ken Posse , Teseda, Corporation
Geir Eide , Teseda, Corporation
pp. 503
Session 21: Application Series-Developing Test Interfaces
Jie Sun , Wavecrest Corporation, San Jose, CA
pp. 528
Session 22: Practical Application of I<sub>DDQ</sub>
Xiaoyun Sun , University of Minnesota, Minneapolis
Bapiraju Vinnakota , University of Minnesota, Minneapolis
pp. 545
Yukio Okuda , Platform Technology Center, Sony Corp.
pp. 555
B. Benware , LSI Logic Corporation, Gresham, Oregon
C. Schuermyer , LSI Logic Corporation, Gresham, Oregon
R. Madge , LSI Logic Corporation, Gresham, Oregon
R. Daasch , Portland State University, Oregon
L. Ning , Portland State University, Oregon
pp. 565
Session 23: Delay Test
Puneet Gupta , Virginia Tech, Blacksburg
Michael S. Hsiao , Virginia Tech, Blacksburg
pp. 584
Session 24: Optimizing Efficiency in SOC Testing
Ozgur Sinanoglu , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 602
Luigi Carro , Universidade Federal do Rio Grande do Sul
Fl?vio Wagner , Universidade Federal do Rio Grande do Sul
Marcelo Lubaszewski , Universidade Federal do Rio Grande do Sul
pp. 612
Qiang Xu , McMaster University, Hamilton, ON
pp. 622
Session 25: Board And System Test: AC-Interconnect Board Test Techniques
Suzette Vandivier , Agilent Technologies, Ft. Collins, CO.
Mark Wahl , Agilent Technologies, Ft. Collins, CO.
Jeff Rearick , Agilent Technologies, Ft. Collins, CO.
pp. 632
Ivan Duzevik , National Semiconductor, South Portland, Maine
pp. 640
Lee Whetsel , Texas Instruments
pp. 641
Session 26: RF Testing
Guido Gronthoud , Philips Research Laboratories
Rashid Amine , Philips Research Laboratories
pp. 651
Achintya Halder , Georgia Institute of Technology, Atlanta
Soumendu Bhattacharya , Georgia Institute of Technology, Atlanta
Abhijit Chatterjee , Georgia Institute of Technology, Atlanta
pp. 665
Session 27: Lecture Series-Introduction to MEMS
Jeremy A. Walraven , Sandia National Laboratories, Albuquerque, NM
pp. 674
Tamal Mukherjee , Carnegie Mellon University, Pittsburgh, PA
pp. 681
MEMS Fabrication (Abstract)
Gary K. Fedder , Carnegie Mellon University, Pittsburgh, PA
pp. 691
Session 28: Application of I<sub>DDX</sub>
Eric Peterson , Guidant Corporation
Bob Robotka , Guidant Corporation
pp. 699
Dhruva Acharyya , University of Maryland, Baltimore County
Jim Plusquellic , University of Maryland, Baltimore County
pp. 709
B. Bloechel , Intel Corporation, Hillsboro, Oregon
A. Keshavarzi , Intel Corporation, Hillsboro, Oregon
B. Alorda , Intel Corporation, Hillsboro, Oregon
pp. 719
Session 29: Logic BIST
Janusz Rajski , Mentor Graphics Corporation
Jerzy Tyszer , Poznan University of Technology
Chen Wang , Mentor Graphics Corporation
Sudhakar M. Reddy , University of Iowa
pp. 745
Session 30: Microprocessor Test
Paul Dickinson , Sun Microsystems, Inc.
Peter Dahlgren , Sun Microsystems, Inc.
pp. 755
Richard Davies , Hewlett-Packard Company
pp. 764
Session 31: Board And System Test: Advances in Testing Microprocessor Motherboards
Frank van der Heyden , Philips Research Eindhoven, The Netherlands
Leon van de Logt , Philips Research Eindhoven, The Netherlands
pp. 785
Session 32: Latest Developments in ATE Software
S. Di Carlo , Politecnico di Torino, Italy
G. Di Natale , Politecnico di Torino, Italy
P. Prinetto , Politecnico di Torino, Italy
L. Tagliaferri , Politecnico di Torino, Italy
pp. 802
Steve Roehling , NPTest, Inc. LLC
Daniel Fan , NPTest, Inc. LLC
pp. 811
Paul Buxton , The Alba Centre, The Alba Campus, Livingston, Scotland
Paul Tabor , Test Advantage Inc, Tempe, AZ
pp. 818
Session 33: Lecture Series-MEMS Testing
Jeremy A. Walraven , Sandia National Laboratories, Albuquerque, NM
pp. 828
Jeremy A. Walraven , Sandia National Laboratories, Albuquerque, NM
pp. 834
Alex Hardt , Motorola, Tempe, AZ
Rick Nielsen , Motorola, Tempe, AZ
Dennis Stanerson , Motorola, Tempe, AZ
Ron Bieschke , Motorola, Tempe, AZ
Mike Miller , Motorola, Tempe, AZ
pp. 843
Jeremy A. Walraven , Sandia National Laboratories, Albuquerque, NM
pp. 850
Session 34: Failure Mechanisms And Test Solutions For DSM ICS
T. Zanon , Carnegie Mellon University, Pittsburgh, PA
T. Vogels , Carnegie Mellon University, Pittsburgh, PA
R. D. Blanton , Carnegie Mellon University, Pittsburgh, PA
T. Storey , PDF Solutions
pp. 856
Bram Kruseman , Philips Research Laboratories
pp. 866
R. D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA
Kumar N. Dwarakanath , Carnegie Mellon University, Pittsburgh, PA
Anirudh B. Shah , Carnegie Mellon University, Pittsburgh, PA
pp. 876
Daniele Rossi , D.E.I.S. University of Bologna, Italy
Cecilia Metra , D.E.I.S. University of Bologna, Italy
pp. 886
Session 35: Can Concurrent Detection Be Achieved At Low Cost?
Kartik Mohanram , University of Texas at Austin, TX
Nur A. Touba , University of Texas at Austin, TX
pp. 893
B. Kiran Kumar , University of Arkansas, Fayetteville
pp. 912
Grigori Kuznetsov , University of Potsdam
Ramesh Karri , Polytechnic University
pp. 919
Session 36: Test Economics
F. J. Meyer , Northeastern University, Boston, Mass
F. Lombardi , Northeastern University, Boston, Mass
H. Hashempour , Northeastern University, Boston, Mass
pp. 927
Session 37: Board And System Test: Testing Multiboard Systems
Enyedi Szil?rd , Technical University of Cluj-Napoca, Romania
Gavril Toderean , Technical University of Cluj-Napoca, Romania
Alfredo Benso , Politecnico di Torino, Italy
Paolo Prinetto , Politecnico di Torino, Italy
pp. 952
Ismet Bayraktaroglu , Sun Microsystems, Sunnyvale, CA
Amitava Majumdar , Sun Microsystems, Sunnyvale, CA
Richard Lee , Microsoft Corporation, Mountain View, CA
John Bell , Sun Microsystems, Sunnyvale, CA
Lisa Curhan , Sun Microsystems, Sunnyvale, CA
pp. 961
Tiziana Margaria , University of Dortmund, Germany; METAFrame Technologies GmbH, Germany
Bernhard Steffen , University of Dortmund, Germany
pp. 971
Rakesh N. Joshi , Texas Instruments, Inc. Sherman, Texas
Lee Whetsel , Texas Instruments, Inc. Sherman, Texas
pp. 981
Session 38: Lecture Series-P1500 Mergeable Cores
Yervant Zorian , Virage Logic, Fremont, CA
Lee Whetsel , Texas Instruments, Dallas, TX
Karim Arabi , PMC Sierra, Burnaby, BC
Francisco DaSilva , Synopsys, Inc., Mountain View, CA
pp. 988
Sudipta Bhawmik , Agere Systems
Kamran Zarrineh , Sun Microsystems
Pradipta Ghosh , Sun Microsystems
Michael G. Wahl , Universit?t Siegen
pp. 998
Session 39: I/O Testing-Probe or Not?
Toshihiro Itoh , University of Tokyo
Kenichi Kataoka , University of Tokyo
pp. 1008
T.M. Mak , Intel Corporation
Mike Tripp , Intel Corporation
pp. 1014
Cheng Jia , Georgia Institute of Technology, Atlanta
Linda Milor , Georgia Institute of Technology, Atlanta
pp. 1023
Session 40: Quality
Chris Schuermyer , LSI Logic Corporation, Gresham, OR
Sreenevasan Ranganathan , LSI Logic Corporation, Gresham, OR
Robert Madge , LSI Logic Corporation, Gresham, OR
Prabhu Krishnamurthy , LSI Logic Corporation, Gresham, OR
Nagesh Tamarapalli , Mentor Graphics Corporation, Wilsonville, OR
Kun-Han Tsai , Mentor Graphics Corporation, Wilsonville, OR
Brady Benware , LSI Logic Corporation, Gresham, OR
pp. 1031
Angela Krstic , UC-Santa Barbara
Leonard Lee , UC-Santa Barbara
Kwang-Ting Cheng , UC-Santa Barbara
M. Ray Mercer , Texas A&M U.
T. W. Williams , Synopsys, Inc.
Li-C. Wang , UC-Santa Barbara
pp. 1041
Piet Engelke , Albert-Ludwigs-University
Michel Renovell , LIRMM - UMII
Bernd Becker , Albert-Ludwigs-University
pp. 1051
Session 41: Test Data Compression
Irith Pomeranz , Purdue University, W. Lafayette, IN
Sudhakar M. Reddy , University of Iowa, IA
Masao Naruse , RENASAS, Technology corp., Kodaira-shi, Tokyo
pp. 1060
Friedrich Hapke , Philips Semiconductors, Germany
Soenke Rogge , Philips Semiconductors, Germany
Harald Vranken , Philips Research, Digital Design & Test, The Netherlands
Erik Volkerink , Agilent Technologies, Palo Alto, CA
pp. 1069
Huaxing Tang , University of Iowa, IA
Irith Pomeranz , Purdue University, West Lafayette, IN
pp. 1079
Session 42: At-Speed Testing-New Solutions to Old Problems
Kun Young Chung , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 1089
Haluk Konuk , Broadcom Corporation, Santa Clara, California
pp. 1105
Session 43: Extending IEEE 1149.1 Into The Backplane
Clayton Gibbs , Texas Instruments, Inc., Sherman, Texas
pp. 1115
Session 44: Infrastructure IP
J. M. Portal , IMT - Technop?le de Ch?teau Gombert, France
D. N? , ST-Microelectronics, France
B. Borot , ST-Microelectronics, France
pp. 1129
Tom Waayers , Philips Research Laboratories, The Netherlands
pp. 1145
Session 45: Analog Model-Based Testing
Zhen Guo , New Jersey Institute of Technology
pp. 1155
Randy Newby , Texas Instruments Inc., Tucson, AZ
Sasi Cherubal , Ardext Technologies, Tucson, AZ
Bob Cometta , Texas Instruments Inc., Tucson, AZ
Thomas Kuehl , Texas Instruments Inc., Tucson, AZ
David Majernik , Arctic Systems Inc, Burtonsville, MD
Ram Voorakaranam , Ardext Technologies, Tucson, AZ
pp. 1174
Session 46: Test of Future Integrated Systems
Arun A. Joseph , University of Twente, The Netherlands
pp. 1182
Sule Ozev , Duke University, Durham, NC
Fei Su , Duke University, Durham, NC
pp. 1192
Mahim Mishra , Carnegie Mellon University, Pittsburgh, PA
Seth C. Goldstein , Carnegie Mellon University, Pittsburgh, PA
pp. 1201
Session 47: DFT Industrial Case Studies
Matthias Beck , Infineon Technologies AG, Munich, Germany
Ralf Arnold , Infineon Technologies AG, Munich, Germany
Peter Muhmenthaler , Mentor Graphics Corporation, Wilsonville, OR
Nagesh Tamarapalli , Mentor Graphics Corporation, Wilsonville, OR
Mark Kassab , Mentor Graphics Corporation, Wilsonville, OR
Nilanjan Mukherjee , Mentor Graphics Corporation, Wilsonville, OR
Janusz Rajski , Mentor Graphics Corporation, Wilsonville, OR
pp. 1211
Mike Lin , Intel Corporation
Subhasish Mitra , Intel Corporation
Kee Sup Kim , Intel Corporation
Anil Sabbavarapu , Intel Corporation
Talal Jaber , Intel Corporation
Pete Johnson , Intel Corporation
Dale March , Intel Corporation
Greg Parrish , Intel Corporation
pp. 1229
Session 48: Interconnect Testing And BIST For FPGAS
Erik Chmelar , Stanford University
pp. 1239
Dereck A. Fernandes , University of Massachusetts, Amherst
Ian G. Harris , University of California Irvine
pp. 1248
Charles E. Stroud , Auburn University, AL
Thomas A. Slaughter , University of North Carolina at Charlotte
pp. 1258
Session 49: Board And System Test: Other Aspects of Board Test
Wouter Rijckaert , Philips Research Laboratories, Eindhoven, NL
pp. 1277
Frans de Jong , Philips Research Eindhoven, NL
Leon van de Logt , Philips Research Eindhoven, NL
pp. 1278
Panel 1: How (In) Adequate is One-Time Testing?
Rubin A. Parekhji , Texas Instruments (India) Pvt. Ltd., Murugeshpalya, Bangalore
pp. 1279
Phil Nigh , IBM Microelectronics, Essex Junction, Vermont
pp. 1281
Peter Ehlig , Texas Instruments, Inc., Stafford, Texas
pp. 1283
Yervant Zorian , Virage Logic Corporation, Fremont, California
pp. 1284
Panel 2: My DFT Is Better Than Yours... Is Better than None...
Panel 3: RF Test 101: Defining The Problem, Finding Solutions
Jim Paviol , Intersil Corporation-Wireless Division, Melbourne, FL
pp. 1289
Panel 4: The Confluence of Manufacturing Test And Design Validation
Ian G. Harris , University of California Irvine
pp. 1290
Franco Fummi , Universit? di Verona, Verona, Italy
pp. 1291
Prab Varma , Veritable Inc., Mountain View, CA
pp. 1292
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 1293
Panel 5: PXI: A Solution For Board Functional Test?
Jim Webster , Bae Systems, Edinburgh
pp. 1294
Bob Stasonis , Teradyne, Inc., North Reading, MA
pp. 1296
Panel 6: Future ATE: Perspectives And Requirements
Fidel Muradali , Agilent Technologies
pp. 1297
John Roberts , ST Assembly Test Services, Inc.
pp. 1299
Lee Y. Song , Teradyne, Inc., Agoura Hills, CA
pp. 1300
Panel 7: Diagnosis In Modern Time-To-Volume-The Tip of The Iceberg
Robert Molyneaux , Sun Microsystems Inc., Austin, Texas
pp. 1303
Wu-Tung Cheng , Mentor Graphics Corporation, Wilsonville, Oregon
pp. 1305
Panel 8: Multi-GB/S IC Test Challenges And Solutions
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd.
pp. 1307
Ulrich Schoettmer , Agilent Technologies, Boeblingen
pp. 1310
Yi Cai , Agere Systems, Allentown, Pennsylvania
pp. 1312
Panel 9: DFM: The Real 90-NM Hurdle
Rob Aitken , Artisan Components, Sunnyvale, CA
pp. 1313
Rob Aitken , Artisan Components, Sunnyvale, CA
pp. 1314
Cliff Ma , Anchor Semiconductor, Inc., Santa Clara, California
pp. 1315
Stefan Eichenberger , Philips Semiconductors, The Netherlands
pp. 1316
Jitendra B. Khare , Ample Communications, Inc. Fremont, CA
pp. 1317
Panel 10: Testing 3G-Controlled Systems: A Time to Rejoice or A Time to Feel Pain?
Alfredo Benso , Politecnico di Torino, Italy
pp. 1320
ITC 2002 Best Paper:
John Ferrario , IBM RF & Analog Test Development, Essex Junction, Vt
Randy Wolf , IBM RF & Analog Test Development, Essex Junction, Vt
Steve Moss , IBM RF & Analog Test Development, Essex Junction, Vt
pp. 1325
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