A Case Study of IR-Drop in Structured At-Speed Testing

Jayashree Saxena; Subhendu Kundu; N. V. Arvind; Kenneth M. Butler; Vinay B. Jayaram; Pravin Sreeprakash; Manfred Hachinger

doi:10.1109/TEST.2003.1271098

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - A Case Study of IR-Drop in Structured At-Speed Testing

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International Test Conference 2003 (ITC'03)

A Case Study of IR-Drop in Structured At-Speed Testing

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger, "A Case Study of IR-Drop in Structured At-Speed Testing," 2012 IEEE International Test Conference, pp. 1098, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1271098, author = {Jayashree Saxena and Kenneth M. Butler and Vinay B. Jayaram and Subhendu Kundu and N. V. Arvind and Pravin Sreeprakash and Manfred Hachinger}, title = {A Case Study of IR-Drop in Structured At-Speed Testing}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {1098}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271098}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 2012 IEEE International Test Conference TI - A Case Study of IR-Drop in Structured At-Speed Testing SN - 1089-3539 SP EP A1 - Jayashree Saxena, A1 - Kenneth M. Butler, A1 - Vinay B. Jayaram, A1 - Subhendu Kundu, A1 - N. V. Arvind, A1 - Pravin Sreeprakash, A1 - Manfred Hachinger, PY - 2003 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER -

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1271098

At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful application of structural at-speed tests. In this paper we characterize these problems on commercial ASICs in order to understand how to implement more effective solutions.

Citation:

Jayashree Saxena, Kenneth M. Butler, Vinay B. Jayaram, Subhendu Kundu, N. V. Arvind, Pravin Sreeprakash, Manfred Hachinger, "A Case Study of IR-Drop in Structured At-Speed Testing," itc, pp.1098, International Test Conference 2003 (ITC'03), 2003

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