Challenges in Low Cost Test Approach for ARM9&lt;sup&gt;TM&lt;/sup&gt; Core Based Mixed-Signal SoC DragonBall&lt;sup&gt;TM&lt;/sup&gt;-MX1

George Bao

doi:10.1109/TEST.2003.1270877

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - Challenges in Low Cost Test Approach for ARM9<sup>TM</sup> Core Based Mixed-Signal SoC DragonBall<sup>TM</sup>-MX1

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International Test Conference 2003 (ITC'03)

Challenges in Low Cost Test Approach for ARM9^TM Core Based Mixed-Signal SoC DragonBall^TM-MX1

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	George Bao, "Challenges in Low Cost Test Approach for ARM9<sup>TM</sup> Core Based Mixed-Signal SoC DragonBall<sup>TM</sup>-MX1," 2012 IEEE International Test Conference, pp. 512, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270877, author = {George Bao}, title = {Challenges in Low Cost Test Approach for ARM9<sup>TM</sup> Core Based Mixed-Signal SoC DragonBall<sup>TM</sup>-MX1}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {512}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270877}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 2012 IEEE International Test Conference TI - Challenges in Low Cost Test Approach for ARM9<sup>TM</sup> Core Based Mixed-Signal SoC DragonBall<sup>TM</sup>-MX1 SN - 1089-3539 SP EP A1 - George Bao, PY - 2003 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER -

George Bao, Motorola Semiconductors Hong Kong Limited

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270877

This paper discussed the challenges that we faced when we developed the low cost test strategies for the new generation ARM9^TM Core based mixed-signal System-on-a-Chip (SoC), DragonBall^TM-MX1 (DBMX1). First of all, we presented a tailored cost model to select our Automatic Test Equipment (ATE). With this low cost tester, we developed a method for at-speed digital tests with slower tester clock, a new embedded PLL jitter test approach with sliding delta cycle and fixed strobe, and a loop-back self-test proposal for embedded ADC and DAC. Our final target is to achieve all the mixed-signal tests on a very low cost pure digital ATE.

Citation:

George Bao, "Challenges in Low Cost Test Approach for ARM9^TM Core Based Mixed-Signal SoC DragonBall^TM-MX1," itc, pp.512, International Test Conference 2003 (ITC'03), 2003

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