A High Precision I&lt;sub&gt;DDQ&lt;/sub&gt; Measurement System With Improved Dynamic Load Regulation

Nobuhiro Sato; Yoshihiro Hashimoto

doi:10.1109/TEST.2003.1270865

I
ITC
2003
International Test Conference 2003 (ITC'03)
Abstract - A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation

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International Test Conference 2003 (ITC'03)

A High Precision I_DDQ Measurement System With Improved Dynamic Load Regulation

Charlotte, NC, USA

September 30-October 02

ISBN: 0-7803-8107-6

	ASCII Text	x
	Nobuhiro Sato, Yoshihiro Hashimoto, "A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation," 2012 IEEE International Test Conference, pp. 410, International Test Conference 2003 (ITC'03), 2003.

	BibTex	x
	@article{ 10.1109/TEST.2003.1270865, author = {Nobuhiro Sato and Yoshihiro Hashimoto}, title = {A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2003}, issn = {1089-3539}, pages = {410}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270865}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 2012 IEEE International Test Conference TI - A High Precision I<sub>DDQ</sub> Measurement System With Improved Dynamic Load Regulation SN - 1089-3539 SP EP A1 - Nobuhiro Sato, A1 - Yoshihiro Hashimoto, PY - 2003 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER -

Nobuhiro Sato, Advantest Corp., Japan

Yoshihiro Hashimoto, Advantest Corp., Japan

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270865

This paper describes a system for performing high precision IDDQ measurement of CMOS ICs having a large peak current during operation. Although the measurement rate is at a low speed of 200uS, the average current of up to 1A during operation may be accepted by improving the dynamic load regulation. This system is also applicable to conventional testing apparatus. This paper covers problems in IDDQ testing, solution for the problems, embodiment of each circuit, verification of the results, conclusion and future issues.

Citation:

Nobuhiro Sato, Yoshihiro Hashimoto, "A High Precision I_DDQ Measurement System With Improved Dynamic Load Regulation," itc, pp.410, International Test Conference 2003 (ITC'03), 2003

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