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2013 IEEE International Test Conference (ITC) (2002)
Baltimore, MD, USA
Oct. 7, 2002 to Oct. 10, 2002
ISBN: 0-7803-7543-2
TABLE OF CONTENTS
Introduction
Author Index (PDF)
pp. 1249
EXECUTIVE PANEL: HOMEGROWN VERSUS COMMERCIAL SOLUTIONS FOR LOW-COST TEST
SPECIAL PANEL: TESTING THE TESTER
Rochit Rajsuman , Advantest America R & D Center, Inc.
pp. 27
Rochit Rajsuman , Advantest America R & D Center, Inc.
pp. 30
Keynote Address
Invited Address
Peter Maxwell , Agilent Technologies
pp. 13
SESSION 2: MEMORY TESTING
L. Forli , ICF/L2MP-UMR CNRS and ST-Microelectronics
H. Aziza , ICF/L2MP-UMR CNRS and ST-Microelectronics
D. N? , ST-Microelectronics
pp. 31
Sau-Kwo Chiu , National Tsing Hua University
Jen-Chieh Yeh , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 37
SESSION 3: ADVANCES IN SOC TESTING
Tom Waayers , Philips Research Laboritories
Bart Vermeulen , Philips Research Laboritories
pp. 55
Sudhakar M. Reddy , University of Iowa
Wu-Tung Cheng , Mentor Graphics Corporation
Paul Reuter , Mentor Graphics Corporation
Nilanjan Mukherjee , Mentor Graphics Corporation
Chien-Chung Tsai , Mentor Graphics Corporation
Yu Huang , Mentor Graphics Corporation
Yahya Zaidan , Mentor Graphics Corporation
pp. 74
SESSION 4: DEFECT-ORIENTED TEST
Irith Pomeranz , Purdue University
Huaxing Tang , University of Iowa
Sudhakar M. Reddy , University of Iowa
Kozo Kinoshita , Osaka Gakuin University
pp. 83
Ali Keshavarzi , Intel Corp
Jerry Soden , Sandia National Labs
Jaume Segura , University of the Balearic Islands
pp. 90
C. Metra , University of Bologna
S. Di Francescantonio , University of Bologna
T. M. Mak , Intel Corporation
pp. 100
SESSION 5: HIGH-PERFORMANCE TIMING MEASUREMENTS
Hideo Okawara , Agilent Technologies Japan, Ltd.
pp. 110
Welela Haileselassie , University of Washington
Jessica Yan , University of Washington
Rajesh Raina , Motorola Inc.
pp. 120
SESSION 6: TEST DATA REDUCTION
J. Th. van der Linden , Scientificial, Delft
M. J. Geuzebroek , Delft University of Technology
pp. 138
Ajay Khoche , Agilent Laboratories
Erik H. Volkerink , Stanford University and Agilent Laboratories
pp. 154
SESSION 7: MEMORY DFT,BIST AND REPAIR
A. Suzuki , Toshiba Corporation
T. Yabe , Toshiba Corporation
A. Kawasumi , Toshiba Corporation
Y. Takeyama , Toshiba Corporation
K. Kushida , Toshiba Corporation
A. Tohata , Toshiba Microelectronics Corporation
N. Otsuka , Toshiba Corporation
pp. 164
Hiroaki Tanizaki , Mitsubishi Electric Engineering Co., Ltd.
Mitsutaka Niiro , Mitsubishi Electric Corporation
Masanao Maruta , Mitsubishi Electric Corporation
Hideto Hidaka , Mitsubishi Electric Corporation
T. Tada , Mitsubishi Electric Corporation
Kenji Gamo , Osaka University
pp. 170
Jayasanker Jayabalan , Infineon Technologies Asia Pacific Pte Ltd
pp. 187
SESSION 8: DESIGN VALIDATION — NOVEL ATPG APPLICATIONS
Jacob A. Abraham , University of Texas at Austin
Vivekananda M. Vedula , University of Texas at Austin
Daniel G. Saab , Case Western Reserve University
pp. 194
Madhu K. Iyer , University of California at Santa Barbara
Ganapathy Parthasarathy , University of California at Santa Barbara
Li-C. Wang , University of California at Santa Barbara
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
Magdy S. Abadir , Motorola
pp. 203
Magdy S. Abadir , Motorola
Mandana Amiri , University of Toronto
pp. 223
SESSION 9: NOVEL TECHNIQUES FOR DIAGNOSTICS
J. T. Chen , Carnegie Mellon University
R. Desineni , Carnegie Mellon University
K. N. Dwarakanath , Carnegie Mellon University
W. Maly , Carnegie Mellon University
T. J. Vogels , Carnegie Mellon University
pp. 233
Iwao Yamazaki , Hitachi, Ltd.
Hiroki Yamanaka , Hitachi, Ltd.
Yasuo Sato , Hitachi, Ltd.
Masahiro Takakura , Hitachi Engineering Co., Ltd.
pp. 242
Rene Segers , Philips Semiconductors
Stefan Eichenberger , Philips Semiconductors
Camelia Hora , Eindhoven University of Technology
pp. 260
SESSION 10: CONNECTING DISCONNECTS
Gregory A. Maston , Synopsys, Inc.
pp. 290
SESSION 11: TEST DATA COMPRESSION
Jerzy Tyzer , Poznan University of Technology
Mark Kassab , Mentor Graphics Corporation
Nilanjan Mukherjee , Mentor Graphics Corporation
Rob Thompson , Mentor Graphics Corporation
Kun-Han Tsai , Mentor Graphics Corporation
Andre Hertwig , Mentor Graphics Corporation
Nagesh Tamarapalli , Mentor Graphics Corporation
Grzegorz Mrugalski , Poznan University of Technology
Geir Eide , Mentor Graphics Corporation
Januz Rajki , Mentor Graphics Corporation
pp. 301
C.V. Krishna , University of Texas at Austin
pp. 321
Francis G. Wolff , Case Western Reserve University
Chris Papachristou , Case Western Reserve University
pp. 331
SESSION 12: LECTURE SERIES — EMBEDDED IP FOR SOC INFRASTRUCTURE
SESSION 13: CHIP-LEVEL CROSSTALK IDENTIFICATION AND TESTING
Hang Huang , University of Southern California
Suriyaprakash Natarajan , University of Southern California
Shahin Nazarian , University of Southern California
Melvin A Breuer , University of Southern California
pp. 365
SESSION 14: ADVANCES IN FAULT SIMULATION AND TEST GENERATION
Magdy S. Abadir , ASP Motorola
Li-C. Wang , University of California at Santa Barbara
pp. 398
Li-C. Wang , University of California at Santa Barbara
Kwang-Ting Cheng , University of California at Santa Barbara
Jennifer Dworak , Texas A&M University
Jing-Jia Liou , University of California at Santa Barbara
Rohit Kapur , Synopsys Inc.
Thomas W. Williams , Synopsys Inc.
pp. 407
SESSION 15: ADVENTURES IN INTERFACING
D. Gessel , Teradyne Integra Test Division
A. Slcoum , Massachusetts Institute of Technology
A. Sprunt , Massachusetts Institute of Technology
S. Ziegenhagen , Teradyne Connection Systems
pp. 417
Toshihiro Itoh , University of Tokyo
Katsuya Okumura , University of Tokyo
Kenichi Kataoka , University of Tokyo
pp. 424
SESSION 16: DFT TESTERS
J.S. Davis , Georgia Institute of Technology
pp. 438
John Johnson , Intel Corporation
Navid Shahriari , Intel Corporation
Mike Mayberry , Intel Corporation
pp. 456
SESSION 17: PRODUCTION TEST AUTOMATION
David Abercrombie , LSI Logic
James McNames , Portland State University
David Turner , Portland State University
Robert Madge , LSI Logic
pp. 464
David Williams , Dell Computer Corporation and University of Texas at Austin
Anthony P. Ambler , University of Texas at Austin
pp. 482
SESSION 18: SOFT AND HARD FAILURE ANALYSIS AND ON-LINE TESTING
Li Chen , University of California at San Diego
Yi Zhao , University of California at San Diego
pp. 491
S. Di Carlo , Politecnico di Torino
G. Di Natale , Politecnico di Torino
P. Prinetto , Politecnico di Torino
pp. 500
Ankur Jain , Intel Corporation
Nandakumar Radhakrishnan , Intel Corporation
Eric W Savage , Intel Corporation
Sujit T Zachariah , Intel Corporation
pp. 509
SESSION 19: SOC BENCHMARKS
Vikram Iyengar , IBM Microelectronics
Erik Jan Marinissen , Philips Research Laboratories
pp. 519
Sandeep Kumar Goel , Philips Research Laboratories
Erik Jan Marinissen , Philips Research Laboratories
pp. 529
SESSION 20: APPLICATION SERIES — HIGH-SPEED TEST INTERFACES
Todd Sargent , For Intest Corporation
pp. 549
SESSION 21: TEST AND DEBUG OF MICROPROCESSORS
A. Metayer , Motorola Inc.
B. Svrcek , Motorola Inc.
N. Tendolkar , Motorola Inc.
E. Wolf , Motorola Inc.
E. Fiene , Motorola Inc.
M. Alexander , Motorola Inc.
R. Woltenberg , Motorola Inc.
R. Raina , Motorola Inc.
pp. 574
Timothe Litt , Alpha Development Group
pp. 584
Praveen Parvathala , Intel? Corporation
William Lindsay , Intel? Corporation
pp. 590
SESSION 22: FPGA TESTING
Andrew Lai , Xilinx
pp. 599
Subhasish Mitra , Intel Corporation
Shahin Toutounchi , Xilinx Inc.
Mehdi Baradaran Tahoori , Stanford University
pp. 608
Jeremy Nall , University of North Carolina at Charlotte
Matthew Lashinsky , University of North Carolina at Charlotte
Charles Stroud , University of North Carolina at Charlotte
pp. 618
SESSION 23: LECTURE SERIES — SILICON DEBUG
Kenneth M. Butler , Texas Instruments
Neil Simpson , Texas Instruments
pp. 628
Bart Vermeulen , Philips Research Laboratories
Tom Waayers , Philips Research Laboratories
Sandeep Kumar Goel , Philips Research Laboratories
pp. 638
Xinli Gu , Cisco Systems, Inc.
Weili Wang , Cisco Systems, Inc.
Kevin Li , Cisco Systems, Inc.
Heon Kim , Cisco Systems, Inc.
Sung S. Chung , Cisco Systems, Inc.
pp. 648
Don Douglas Josephson , Hewlett-Packard Company
pp. 657
Rekha Bangalore , Motorola, Inc.
Dawit Belete , Motorola, Inc.
Jason Goertz , Motorola, Inc.
Ashutosh Razdan , Motorola, Inc.
Denise Younger , Motorola, Inc.
pp. 664
SESSION 24: DATA ANALYSIS AND YIELD MODEL VALIDATION
B.H. Goh , LSI Logic Corporation
V. Rajagopalan , LSI Logic Corporation
C. Macchietto , LSI Logic Corporation
R. Daasch , Portland State University
C. Schuermyer , Portland State University
C. Taylor , Portland State University
D. Turner , Portland State University
pp. 673
Tuan Pham , Agilent Technologies Company
Tim Figal , Agilent Technologies Company
Minh Quach , Agilent Technologies Company
Pete O?Neill , Agilent Technologies Company
pp. 683
SESSION 25: JITTER TESTING IN MULTI-GIGAHERTZ DIGITAL SYSTEMS
S.A. Werner , Agere Systems, Inc.
G.J. Zhang , Agere Systems, Inc.
M.J. Olsen , Agere Systems, Inc.
R.D. Brink , Agere Systems, Inc.
pp. 700
Mani Soma , University of Washington
Masahiro Ishida , Advantest Laboratories, Ltd.
Hirobumi Musha , Advantest Corporation
Louis Malarsie , Agere Systems
pp. 717
SESSION 26: EFFICIENT APPROACHES TO SOC TESTING
Ishwar Parulkar , Sun Microsystems, Inc.
Thomas Ziaja , Sun Microsystems, Inc.
Rajesh Pendurkar , Sun Microsystems, Inc.
Anand D'Souza , Sun Microsystems, Inc.
Amitava Majumdar , Sun Microsystems, Inc.
pp. 726
Sungbae Hwang , University of Texas at Austin
Jacob A. Abraham , University of Texas at Austin
pp. 736
SESSION 27: 1149.1 VERIFICATION AND VALIDATION
Adam Kristof , Silesian University of Technology
pp. 763
Sezer G?ren , University of California at Santa Cruz
F. Joel Ferguson , University of California at Santa Cruz
pp. 773
SESSION 28: SCAN STITCHING
David Berthelot , Magma Design Automation, Inc.
Samit Chaudhuri , Magma Design Automation, Inc.
Hamid Savoj , Magma Design Automation, Inc.
pp. 781
F. Neuveux , Synopsys, Inc.
S. Duggirala , Synopsys, Inc.
L. Guiller , Synopsys, Inc.
R. Kapur , Synopsys, Inc.
pp. 788
Y. Bonhomme , Universit? Montpellier II /CNRS
P. Girard , Universit? Montpellier II /CNRS
C. Landrault , Universit? Montpellier II /CNRS
S. Pravossoudovitch , Universit? Montpellier II /CNRS
pp. 796
Ad Peeters , Philips Research Laboratories
Marc Verra , Philips Research Laboratories
Kees van Berkel , Philips Research Laboratories and Eindhoven University of Technology
Frank te Beest , University of Twente
pp. 804
SESSION 29: DFT FOR MANUFACTURING PROBLEMS
M.B. Santos , IST/Inesc-id
I.C. Teixeira , IST/Inesc-id
J.P. Teixeira , IST/Inesc-id
S. Manich , Università Politecnica de Catalunya
R. Rodriquez , Università Politecnica de Catalunya
J. Figueras , Università Politecnica de Catalunya
pp. 814
Ismet Bayraktaroglu , University of California at San Diego
Ozgur Sinanoglu , University of California at San Diego
pp. 844
SESSION 30: MIXED-SIGNAL TEST TECHNIQUES
M. Stancic , University of Twente
M. H. H. Weusthof , University of Twente
R. M. W. Tijink , University of Twente
H. G. Kerkhoff , University of Twente
pp. 861
Marco Rona , Infineon Technologies Microelectronic Design Centers Austria GmbH
Gunter Krampl , Infineon Technologies Microelectronic Design Centers Austria GmbH
pp. 870
SESSION 31: GO-FAST ATE!
Toshiyuki Okayasu , ADVANTEST Corporation
Kazuhiro Yamamoto , ADVANTEST Corporation
pp. 894
SESSION 32: SYSTEM TEST DESIGN, BIST AND SYSTEM VERIFICATION
Alfredo Benso , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
Andrea Baldini , Politecnico di Torino
Andrea Taddei , Magneti Marelli Electronic Systems
pp. 930
Enyedi Szil?rd , Technical University of Cluj-Napoca
Liviu Miclea , Technical University of Cluj-Napoca
pp. 940
SESSION 33: ADVANCES IN I<sub>DDX</sub>
B. Alorda , University Illes Balears
M. Rosales , University Illes Balears
J. Soden , Sandia National Laboratories
C. Hawkins , University of New Mexico
J. Segura , University Illes Balears
pp. 947
David I. Bergman , National Institute of Standards and Technology
pp. 954
Bram Kruseman , Philips Research Laboratories
Stefan van den Oetelaar , Philips Research Laboratories
Josep Rius , DEE of Universitat Politecnica de Catalunya
pp. 964
SESSION 34: DELAY-TEST
Manish Sharma , University of Illinois at Urbana Champaign
pp. 974
Michael Hsiao , Virginia Tech
Sreejit Chakravarty , Virginia Tech and Intel Corporation
Xiao Liu , Virginia Tech
pp. 983
Ramesh C. Tekumalla , Sun Microsystems, Inc.
Scott Davidson , Sun Microsystems, Inc.
pp. 993
SESSION 35: EMBEDDED TEST FOR ANALOG AND DIGITAL
Michinobu Nakao , Hitachi, Ltd.
Yoshikazu Kiyoshige , Hitachi, Ltd.
Koichiro Natsume , Hitachi, Ltd.
Yasuo Sato , Hitachi, Ltd.
Takaharu Nagumo , Hitachi, Ltd.
pp. 1003
Sudhakar M. Reddy , University of Iowa
Nadir Z. Basturkmen , University of Iowa
pp. 1013
Mohamed Hafed , McGill University
Gordon W. Roberts , McGill University
pp. 1022
SESSION 36: MAXIMIZING TEST EFFECTIVENESS AND MINIMIZING COST
Stephen Sunter , LogicVision (Canada), Inc.
Alessandra Fudoli , STMicroelectronics
Davide Appello , STMicroelectronics
pp. 1031
Lee Song , Teradyne Inc.
John Gatej , Teradyne Inc.
Rajesh Raina , Motorola Inc.
Tom Munns , Motorola Inc.
pp. 1040
Peter C. Maxwell , Agilent Technologies
pp. 1050
SESSION 37: BOARD TEST AND BIST FOR MEMS
Kathy Hird , Agilent Technologies
Kenneth P. Parker , Agilent Technologies
Bill Follis , Agilent Technologies
pp. 1066
N. Deb , Carnegie Mellon University
R.D. (Shawn) Blanton , Carnegie Mellon University
pp. 1075
SESSION 38: DEBUG AND DIAGNOSIS
Andreas Veneris , University of Toronto
Hiroshi Takahashi , Ehime University
pp. 1085
Sandeep Kumar Goel , Philips Research Laboratories
Bart Vermeulen , Philips Research Laboratories
pp. 1103
SESSION 39: DELAY-TEST: PRACTICAL EXPERIENCE AND SOLUTIONS
Ashutosh Razdan , Motorola Inc.
William Schwarz , Motorola Inc.
Rajesh Raina , Motorola Inc.
Christopher Hawkins , Motorola Inc.
Dawit Belete , Motorola Inc.
pp. 1111
Kenneth M. Butler , Texas Instruments Inc.
John Gatt , Texas Instruments Inc.
R Raghuraman , Texas Instruments Inc.
Jayashree Saxena , Texas Instruments Inc.
Supatra Basu , Texas Instruments Inc.
David J. Campbell , Texas Instruments Inc.
John Berech , Texas Instruments Inc.
pp. 1120
SESSION 40: RF TESTING
Yasuo Furukawa , Advantest Gunma R&D Center
Michael Purtell , Advantest America, Inc.
Motoo Ueda , Advantest America, Inc.
Karl Watanabe , Advantest America, Inc.
Koji Asami , Advantest Gunma R&D Center
pp. 1140
Randy Wolf , IBM RF & Analog Test Development
John Ferrario , IBM RF & Analog Test Development
pp. 1151
SESSION 41: TEST RESOURCE PARTITIONING
Vikram Iyengar , IBM Microelectronics
Sandeep Kumar Goel , Philips Research Laboratories
Erik Jan Marinissen , Philips Research Laboratories
Krishnendu Chakrabarty , Duke University
pp. 1159
Rainer Dorsch , University of Stuttgart
Ram?n Huerta Rivera , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
Martin Fischer , Agilent Technologies
pp. 1169
Mohsen Nahvi , University of British Columbia
Andr? Ivanov , University of British Columbia
Resve Saleh , University of British Columbia
pp. 1176
PANEL 1: CAN SYSTEM TEST AND IC TEST LEARN FROM EACH OTHER?
David Williams , Dell Computer Corporation and University of Texas at Austin
pp. 1185
Rochit Rajsuman , Advantest America R & D Center Inc.
pp. 1186
Scott Davidson , Sun Microsystems Inc.
pp. 1187
Anthony P. Ambler , University of Texas at Austin
pp. 1188
PANEL 2: TAPS ALL OVER MY CHIPS
Bart Vermeulen , Philips Semiconductors
pp. 1190
Lee Whetsel , Texas Instruments
pp. 1191
Steven F. Oakland , IBM Microelectronic Division
pp. 1192
PANEL 3: CAN SCAN ACHIEVE THE QUALITY LEVEL WE ARE LOOKING FOR?
David M. Wu , Intel
pp. 1199
PANEL 4: MIXED-SIGNAL BIST: FACT OR FICTION?
Arnold Frisch , Integrated Measurement Systems™, Inc. A Credence Company
pp. 1201
Karim Arabi , PMC Sierra, Inc.
pp. 1202
Lee Y. Song , Teradyne, Inc.
pp. 1203
PANEL 5: MISSION POSSIBLE?: AN OPEN ATE TESTER ARCHITECTURE
Dennis R. Conti , IBM Microelectronic Division
pp. 1207
Paul F. Scrivens , Third Millennium Test Solutions
pp. 1208
Sergio M Perez , Advantest America, Inc.
pp. 1210
PANEL 6: THE IMPACTS OF OUTSOURCING ON TEST
Davide Appello , STMicroelectronics
pp. 1215
Fidel Muradali , Agilent Technologies
pp. 1216
Peter Muhmenthaler , Infineon Technologies AG
pp. 1217
PANEL 7: TEST AND REPAIR OF COMMODITY AND EMBEDDED FLASH MEMORIES
PANEL 8: TESTING HIGHLY INTEGRATED CIRCUITS AND SYSTEMS USING A LOW-COST TESTER:HOW TO OVERCOME THE CHALLENGE?
PANEL 9: MULTI-GHZ ERA: TEST CHALLENGES AND SOLUTIONS
C. Hawkins , University of New Mexico
pp. 1228
D. C. Keezer , Georgia Institute of Technology
pp. 1230
PANEL 10: BOARD TEST AND ITC: WHAT DOES THE FUTURE HOLD?
Bill Eklow , Cisco Systems, Inc.
pp. 1235
Gordon D Robinson , Third Millennium Test Solutions
pp. 1236
Kenneth M. Butler , Texas Instruments Inc.
pp. 1237
Kenneth P. Parker , Agilent Technologies
pp. 1238
2001 ITC BEST PAPER:
Kevin Cota , Portland State University
James McNames , Portland State University
Robert Madge , LSI Logic Corporation
pp. 1240
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