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International Test Conference 2002 (ITC'02)
Improved Digital I/O Ports Enhance Testability of Interconnections
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
| ASCII Text | x | ||
| Adam Kristof, "Improved Digital I/O Ports Enhance Testability of Interconnections," 2012 IEEE International Test Conference, pp. 763, International Test Conference 2002 (ITC'02), 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.2002.1041829, author = {Adam Kristof}, title = {Improved Digital I/O Ports Enhance Testability of Interconnections}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {763}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041829}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - Improved Digital I/O Ports Enhance Testability of Interconnections SN - 0-7803-7543-2 SP EP A1 - Adam Kristof, PY - 2002 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
In this paper improved I/O ports for digital integrated circuits are presented. These new I/O ports have controllable electrical properties and built-in overload detectors. The first feature ensures a desirable interconnection fault model during testing. The built-in overload detectors enable short circuits and overloads to be detected on-line. An example design, cost estimation and experimental results are described.
Citation:
Adam Kristof, "Improved Digital I/O Ports Enhance Testability of Interconnections," itc, pp.763, International Test Conference 2002 (ITC'02), 2002
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