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International Test Conference 2002 (ITC'02)
A Set of Benchmarks fo Modular Testing of SOCs
Baltimore, MD, USA
October 07-October 10
ISBN: 0-7803-7543-2
| ASCII Text | x | ||
| Erik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty, "A Set of Benchmarks fo Modular Testing of SOCs," 2012 IEEE International Test Conference, pp. 519, International Test Conference 2002 (ITC'02), 2002. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.2002.1041802, author = {Erik Jan Marinissen and Vikram Iyengar and Krishnendu Chakrabarty}, title = {A Set of Benchmarks fo Modular Testing of SOCs}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2002}, isbn = {0-7803-7543-2}, pages = {519}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2002.1041802}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - A Set of Benchmarks fo Modular Testing of SOCs SN - 0-7803-7543-2 SP EP A1 - Erik Jan Marinissen, A1 - Vikram Iyengar, A1 - Krishnendu Chakrabarty, PY - 2002 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
This paper presents the ITC?02 SOC Test Benchmarks. The purpose of this new benchmark set is to stimulate research into new methods and tools for modular testing of SOCs and to enable the objective comparison of such methods and tools with respect to effectiveness and efficiency. The paper defines the benchmark format and naming scheme, and presents the benchmark SOCs. In addition, it provides an overview of the research problems that can be addressed and evaluated by means of this benchmark set. These research problems include the design of optimized test access infrastructures and test schedules.
Citation:
Erik Jan Marinissen, Vikram Iyengar, Krishnendu Chakrabarty, "A Set of Benchmarks fo Modular Testing of SOCs," itc, pp.519, International Test Conference 2002 (ITC'02), 2002
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