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2013 IEEE International Test Conference (ITC) (2001)
Baltimore, Maryland
Oct. 30, 2001 to Nov. 1, 2001
ISBN: 0-7803-7171-2
TABLE OF CONTENTS
INTRODUCTORY SECTION
Author Index (PDF)
pp. 1200
SPECIAL PANEL: CHANGING ECONOMICS OF SOC TESTING: WHO OWNS THE MARKET?
Tom Newsom , Agilent Technologies
pp. 26
Lori Watrous-deVersterre , Mentor Graphics Corporation
pp. 27
SPECIAL PANEL: STRUCTURED TEST: THEN AND NOW
Robert C. Aitken , Agilent Technologies
pp. 28
SESSION 1: PLENARY
null (PDF)
pp. null
Sue Billat , Robertson Stephens Investment Bankers
pp. 12
SESSION 2: IEEE 1149 — BEYOND DC TESTING AT BOARD TEST
null (PDF)
pp. null
Sung S. Chung , Cisco Systems, Inc.
Sang H. Baeg , Cisco Systems, Inc.
pp. 30
Stephen Sunter , LogicVision, Inc.
Ken Filliter , National Semiconductor Corp.
Joe Woo , Lockheed Martin - EPI
Pat McHugh , Lockheed Martin - EPI
pp. 38
Young Kim , Agilent Technologies
Benny Lai , Agilent Technologies
Kenneth P. Parker , Agilent Technologies
Jeff Rearick , Agilent Technologies
pp. 46
SESSION 3: BIST MEDLEY
null (PDF)
pp. null
Jongshin Shin , University of Illinois at Urbana-Champaign
Xiaoming Yu , University of Illinois at Urbana-Champaign
Elizabeth M. Rudnick , University of Illinois at Urbana-Champaign
Miron Abramovici , Agere Systems
pp. 64
SESSION 4: HOW CAN WE INPROVE I<sub>DDQ</sub> TESTING FOR DSM/VDSM?
null (PDF)
pp. null
Sagar Sabade , Texas A&M University
D.M.H. Walker , Texas A&M University
pp. 82
W. Robert Daasch , Portland State University
Kevin Cota , Portland State University
James McNames , Portland State University
Robert Madge , LSI Logic Corporation
pp. 92
Bram Kruseman , Philips Research Laboratories
Rutger van Veen , Philips Research Laboratories
Kees van Kaam , Philips Research Laboratories
pp. 101
SESSION 5: PRACTICAL EXPERIENCE WITH SOC TESTING
null (PDF)
pp. null
Patrick Gallagher , IBM Corp.
Vivek Chickermane , IBM Corp.
Steven Gregor , IBM Corp.
Thomas St. Pierre , IBM Deutschland GmbH.
pp. 111
Bart Vermeulen , Philips Research Laboratories
Steven Oostdijk , Philips Semiconductors North America
Frank Bouwman , Philips Semiconductors North America
pp. 121
Rohit Kapur , Synopsys Inc.
Tony Taylor , Synopsys Inc.
Paul Reuter , Mentor Graphics
Douglas Kay , Cisco
pp. 131
SESSION 6: SOME THORNY PROBLEMS FOR ATE SOFTWARE
null (PDF)
pp. null
A.T. Sivaram , Schlumberger Semiconductor Solutions
pp. 140
Andrew Moran , Galois Connections Inc.
Jim Teisher , Galois Connections Inc.
Andrew Gill , Galois Connections Inc.
Emir Pasalic , Oregon Graduate Institute
John Veneruso , Credence Systems Corporation
pp. 148
R. L. Stevenson , Canadian Microelectronics Corporation
M. E. Jarosz , Canadian Microelectronics Corporation
C. J. Verver , Communications Research Centre
pp. 157
SESSION 7: LECTURE SERIES — TEST AND REPAIR OF LARGE EMBEDDED DRAMS
null (PDF)
pp. null
Roderick McConnell , Infineon Technologies,
Rochit Rajsuman , Advantest America
Erik Nelson , IBM Microelectronics
Jeffrey Dreibelbis , IBM Microelectronics
pp. 163
Erik Nelson , IBM Microelectronics
Jeffrey Dreibelbis , IBM Microelectronics
Roderick McConnell , Infineon Technologies
pp. 173
Yoshihiro Nagura , Mitsubishi Electric Corp.
Michael Mullins , Mitsubishi Electronics America, Inc.
Anthony Sauvageau , Mitsubishi Electronics America, Inc.
Yoshinori Fujiwara , Mitsubishi Electric Corp.
Katsuya Furue , Mitsubishi Electric Corp.
Ryuji Ohmura , Mitsubishi Electric Corp.
Tatsunori Komoike , Mitsubishi Electric Corp.
Takenori Okitaka , Mitsubishi Electric Corp.
Tetsushi Tanizaki , Mitsubishi Electric Corp.
Katsumi Dosaka , Mitsubishi Electric Corp.
Kazutami Arimito , Mitsubishi Electric Corp.
Yukiyoshi Koda , Mitsubishi Electric Corp.
Tetsuo Tada , Mitsubishi Electric Corp.
pp. 182
SESSION 8: DFT INNOVATIONS
null (PDF)
pp. null
Kee Sup Kim , Intel Corporation
Rathish Jayabharathi , Intel Corporation
Craig Carstens , Intel Corporation
Praveen Vishakantaiah , Intel Corporation
Derek Feltham , Intel Corporation
Adrian Carbine , Intel Corporation
pp. 188
Stephen Sunter , LogicVision, Inc.
Charles McDonald , LogicVision, Inc.
Givargis Danialy , LogicVision, Inc.
pp. 204
SESSION 9: ON-LINE TEST
null (PDF)
pp. null
Karl Thaller , Vienna University ofTechnology
pp. 230
Shu-Yi Yu , Stanford University
Edward J. McCluskey , Stanford University
pp. 240
Silvia CHIUSANO , Politecnico di Torino
Giorgio DI NATALE , Politecnico di Torino
Paolo PRINETTO , Politecnico di Torino
Franco BIGONGIARI , Aurelia Microelectronica
pp. 250
SESSION 10: NOVEL TECHNIQUES FOR FAULT DIAGNOSIS
null (PDF)
pp. null
John T Chen , Carnegie Mellon University
Jitendra Khare , Intel Corporation
Ken Walker , Intel Corporation
Saghir Shaikh , Intel Corporation
Janusz Rajski , Mentor Graphics Corporation
Wojciech Maly , Carnegie Mellon University
pp. 258
David B. Lavo , Agilent Technologies
Tracy Larrabee , University of California at Santa Cruz
pp. 278
Thomas Bartenstein , IBM Microelectronics Division
Douglas Heaberlin , IBM Microelectronics Division
Leendert Huisman , IBM Microelectronics Division
David Sliwinski , IBM Microelectronics Division
pp. 287
SESSION 11: TESTING ABOVE A GIGAHERTZ
null (PDF)
pp. null
Amir Attarha , University of Texas at Dallas
Mehrdad Nourani , University of Texas at Dallas
pp. 305
Ming-Jun Hsiao , National Tsing-Hua University
Jing-Reng Huang , National Tsing-Hua University
Shao-Shen Yang , National Tsing-Hua University
Tsin-Yuan Chang , National Tsing-Hua University
pp. 315
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd.
Mani Soma , University of Washington
Jim Nissen , Motorola Inc.
David Halter , Motorola Inc.
Rajesh Raina , Motorola Inc.
Masahiro Ishida , Advantest Laboratories, Ltd.
pp. 323
SESSION 12: TEST METHODS FOR HIGH-DENSITY MODULES
null (PDF)
pp. null
Aranggan Venkataratnam , Rochester Institute of Technology
Kimberly E. Newman , Rochester Institute of Technology
pp. 332
Thomas S. Barnett , Auburn University
Adit D. Singh , Auburn University
Victor P. Nelson , Auburn University
pp. 340
SESSION 13: HIGH-QUALITY TEST
null (PDF)
pp. null
Chao-Wen Tseng , Stanford University
Edward J. McCluskey , Stanford University
pp. 358
SESSION 14: NEW IDDX AND ENERGY TEST TECHNIQUES
null (PDF)
pp. null
Eric Peterson , Guidant Corporation
Wanli Jiang , Guidant Corporation
pp. 386
Abhishek Singh , University of Maryland, Baltimore County
Chintan Patel , University of Maryland, Baltimore County
Shirong Liao , University of Maryland, Baltimore County
Jim Plusquellic , University of Maryland, Baltimore County
Anne Gattiker , IBM Austin Research Lab
pp. 395
Hoki Kim , Texas A&M University
D.M.H. Walker , Texas A&M University
David Colby , Texas Instruments
pp. 405
SESSION 15: ATE HARDWARE: IMPROVING YOUR TEST RESULTS
null (PDF)
pp. null
Klaus Helmreich , Advantest Test Engineering Solutions GmbH
pp. 415
Sunil K. Jain , Intel Corporation
Greg P. Chema , Intel Corporation
pp. 424
G. Dajee , Schlumberger Probe Systems
N. Goldblatt , Schlumberger Probe Systems
T. Lundquist , Schlumberger Probe Systems
S. Kasapi , Schlumberger Probe Systems
K. Wilsher , Schlumberger Probe Systems
pp. 433
SESSION 16: ADVANCED MICROPROCESSOR TEST METHODOLOGIES
null (PDF)
pp. null
Don Douglas Josephson , Hewlett-Packard Company
Steve Poehlman , Intel Corporation
Vincent Govan , Hewlett-Packard Company
pp. 451
Michael Kessler , IBM Deutschland Entwicklung GmbH
Gundolf Kiefer , University of Stuttgart
Jens Leenstra , IBM Deutschland Entwicklung GmbH
Knut Schünemann , IBM Deutschland Entwicklung GmbH
Thomas Schwarz , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 461
SESSION 17: LECTURE SERIES — SOLVING BOARD TEST AND IN-SYSTEM PROBLEMS
null (PDF)
pp. null
Stephen Harrison , Motorola
Greg Noeninckx , Motorola
Peter Horwood , Firecron Ltd
Peter Collins , JTAG Technologies
pp. 480
SESSION 18: MIXED-SIGNAL TESTING TECHNIQUES
null (PDF)
pp. null
Mamoru Tamba , Agilent Technologies Japan, Ltd
Atsushi Shimizu , Agilent Technologies Japan, Ltd
Hideharu Munakata , Agilent Technologies Japan, Ltd
Takanori Komuro , Agilent Technologies Japan, Ltd
pp. 512
SESSION 19: ADVANCED TECHNIQUES FOR EMBEDDED CORE TESTING
null (PDF)
pp. null
Ozgur Sinanoglu , University of California, San Diego
Alex Orailoglu , University of California, San Diego
pp. 521
Rainer Dorsch , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 530
Frank F. Hsu , Texas Instruments Inc.
Kenneth M. Butler , University of Illinois at Urbana-Champaign
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 538
SESSION 20: TEST GENERATION FOR CROSSTALK FAULTS
null (PDF)
pp. null
Liang-Chi Chen , University of Southern California, Los Angeles
T. M. Mak , Intel Corporation
Melvin A. Breuer , University of Southern California, Los Angeles
Sandeep K. Gupta , University of Southern California, Los Angeles
pp. 548
Angela Krstic , University of California, Santa Barbara
Jing-Jia Liou , University of California, Santa Barbara
Yi-Min Jiang , Synopsys, Inc.
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 558
Keith J. Keller , University of Wisconsin-Madison
Kewal K. Saluja , University of Wisconsin-Madison
Hiroshi Takahashi , Ehime University
Yuzo Takamatsu , Ehime University
pp. 568
SESSION 21: MICROPROCESSOR TESTING
null (PDF)
pp. null
Don Douglas Josephson , Hewlett-Packard Company
Steve Poehlman , Intel Corporation
Vincent Govan , Hewlett-Packard Company
Clint Mumford , Hewlett-Packard Company
pp. 578
SESSION 22: STANDARDS AND TECHNIQUES — BOARD TEST DEVELOPMENT
null (PDF)
pp. null
Andrea BALDINI , Politecnico di Torino
Alfredo BENSO , Politecnico di Torino
Paolo PRINETTO , Politecnico di Torino
Sergio MO , Magneti Marelli Electronic Systems
Andrea TADDEI , Magneti Marelli Electronic Systems
pp. 600
Robert Tappe , AUDI AG Ingolstadt, Germany
Dietmar Ehrhardt , University of Siegen, Germany
pp. 609
Bill Eklow , Cisco Systems Inc.
Richard Sedmak , Self Test Services, voice net
Dan Singletary , Cisco Systems Inc.
Toai Vo , Cisco Systems Inc.
pp. 615
SESSION 23: DELAY TEST
null (PDF)
pp. null
Jeff Rearick , Agilent Technologies
pp. 624
Manish Sharma , University of Illinois at Urbana Champaign
Janak H. Patel , University of Illinois at Urbana Champaign
pp. 634
S. Padmanaban , Southern Illinois University
M. Michael , Southern Illinois University
S. Tragoudas , Southern Illinois University
pp. 642
SESSION 24: IDEAS FOR LOW-POWER SCAN OPERATION
null (PDF)
pp. null
Lei Xu , Tsinghua University
Yihe Sun , Tsinghua University
Hongyi Chen , Tsinghua University
pp. 652
Tsung-Chu Huang , National Cheng Kung University
Kuen-Jong Lee , National Cheng Kung University
pp. 660
Jayashree Saxena , Texas Instruments Inc.
Kenneth M. Butler , Texas Instruments Inc.
Lee Whetsel , Texas Instruments Inc.
pp. 670
SESSION 25: UNCOVERING AND UNDERSTANDING WHY CIRCUITS FAIL
null (PDF)
pp. null
V. Krishnaswamy , Intel Corporation
A.B. Ma , Intel Corporation
P. Vishakantaiah , Intel Corporation
pp. 688
Zoran Stanojevic , Texas A&M University
D.M.H. Walker , Texas A&M University
pp. 696
SESSION 26: ATE HW: CONQUERING THOSE STUBBORN TEST PROBLEMS
null (PDF)
pp. null
Chintan Patel , University of Maryland, Baltimore County
Fidel Muradali , University of Maryland, Baltimore County
Jim Plusquellic , University of Maryland, Baltimore County
pp. 704
Jamie Cullen , Schlumberger Semiconductor Solutions
pp. 713
SESSION 27: ADVANCES IN SCAN TESTING
null (PDF)
pp. null
Rohit Kapur , Synopsys, Inc.
T. W. Williams , Synopsys, Inc.
pp. 721
On RTL Scan Design (Abstract)
Yu Huang , University of Iowa, Iowa City
Chien-Chung Tsai , Mentor Graphics Corporation
Nilanjan Mukherjee , Mentor Graphics Corporation
Omer Samman , Mentor Graphics Corporation
Dan Devries , Mentor Graphics Corporation
Wu-Tung Cheng , Mentor Graphics Corporation
Sudhakar M. Reddy , University of Iowa, Iowa City
pp. 728
Harald Vranken , Philips Research Laboratories
Tom Waayers , Philips Research Laboratories
Hervé Fleury , Philips Semiconductors
David Lelouvier , Philips Semiconductors
pp. 738
Carl Barnhart , IBM Microelectronics
Vanessa Brunkhorst , IBM Microelectronics
Frank Distler , IBM Microelectronics
Owen Farnsworth , IBM Microelectronics
Brion Keller , IBM Microelectronics
Bernd Koenemann , IBM Microelectronics
pp. 748
SESSION 28: MEMORY TESTING
null (PDF)
pp. null
Jin-Fu Li , National Tsing Hua University
Kuo-Liang Cheng , National Tsing Hua University
Chih-Tsun Huang , National Tsing Hua University
Cheng-Wen Wu , National Tsing Hua University
pp. 758
Harold Pilo , IBM Microelectronics Division
R. Dean Adams , IBM Microelectronics Division
Robert E. Busch , IBM Microelectronics Division
Erik A. Nelson , IBM Microelectronics Division
George E. Rudgers , IBM Microelectronics Division
pp. 776
Zaid Al-Ars , Delft University of Technology
Ad J. van de Goor , Delft University of Technology
Jens Braun , Infineon Technologies AG
Detlev Richter , Infineon Technologies AG
pp. 783
SESSION 29: INCREASING DESIGN VALIDATION COVERAGE
null (PDF)
pp. null
Gilly Nativ , IBM Corporation
Steven Mittermaier , IBM Corporation
Shmuel Ur , IBM Corporation
Avi Ziv , IBM Corporation
pp. 793
Qiushuang Zhang , University of Massachusetts
Ian G. Harris , University of Massachusetts
pp. 813
Alessandro Fin , Universit? di Verona, Italy
Franco Fummi , Universit? di Verona, Italy
Graziano Pravadelli , Universit? di Verona, Italy
pp. 821
SESSION 30: PLL AND JITTER TESTING
null (PDF)
pp. null
Seongwon Kim , University of Washington, Seattle
Mani Soma , University of Washington, Seattle
pp. 830
SESSION 31: NEW IDEAS FOR BIST TPG
null (PDF)
pp. null
Hong-Sik Kim , Yonsei Univ.
Jin-kyue Lee , Yonsei Univ.
Sungho Kang , Yonsei Univ.
pp. 878
C. V. Krishna , University of Texas, Austin
Abhijit Jas , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 885
Hua-Guo Liang , University of Stuttgart, Germany
Sybille Hellebrand , University of Innsbruck, Austria
Hans-Joachim Wunderlich , University of Stuttgart, Germany
pp. 894
SESSION 32: TEST AUTOMATION, IMPROVING IC TEST EFFICIENCY
null (PDF)
pp. null
Mark Malinoski , Delta Design Columbus
Burnell G. West , Schlumberger Semiconductor Solutions
pp. 903
Ajay Khoche , Agilent Technologies Inc.
Rohit Kapur , Synopsys Inc.
David Armstrong , Agilent Technologies Inc.
T. W. Williams , Synopsys Inc.
Mick Tegethoff , Agilent Technologies Inc.
Jochen Rivoir , Agilent Technologies Inc.
pp. 916
SESSION 33: FPGA TESTING
null (PDF)
pp. null
M. Renovell , LIRMM-UM2
P. Faure , LIRMM-UM2
J.M. Portal , LIRMM-UM2
Y. Zorian , Logic Vision Inc.
pp. 924
Ian G. Harris , University of Massachusetts at Amherst
Premachandran R. Menon , University of Massachusetts at Amherst
Russell Tessier , University of Massachusetts at Amherst
pp. 932
Cecilia Metra , D.E.I.S. University of Bologna
Andrea Pagano , D.E.I.S. University of Bologna
Bruno Riccò , D.E.I.S. University of Bologna
pp. 939
SESSION 34: RF TESTING
null (PDF)
pp. null
SESSION 35: EMBEDDED MEMORIES TEST AND REPAIR
null (PDF)
pp. null
Peter Jakobsen , IBM Microelectronics Division
Jeffrey Dreibelbis , IBM Microelectronics Division
Gary Pomichter , IBM Microelectronics Division
Darren Anand , IBM Microelectronics Division
John Barth , IBM Microelectronics Division
Michael Nelms , IBM Microelectronics Division
Jeffrey Leach , IBM Microelectronics Division
George Belansek , IBM Microelectronics Division
pp. 975
Yuejian Wu , Nortel Networks
Liviu Calin , Nortel Networks
pp. 985
Volker Schöber , Infineon Technologies AG
Steffen Paul , Infineon Technologies AG
Olivier Picot , Infineon Technologies AG
pp. 995
SESSION 36: LECTURE SERIES mdash; LOGIC BIST CASE STUDIES
null (PDF)
pp. null
Xinli Gu , Cisco Systems, Inc.
Sung Soo Chung , Cisco Systems, Inc.
Frank Tsang , Cisco Systems, Inc.
Jan A. Tofte , Mentor Graphics Corp.
Hamid Rahmanian , Mentor Graphics Corp.
pp. 1002
Snezana Dikic , Ericsson AsiaPacificLab
Lars-Johan Fritz , Ericsson Utvecklings AB
Dario Dell?Aquia , Ericsson Lab
pp. 1011
John Braden , Sun Microsystems, Inc.
Qing Lin , Sun Microsystems, Inc.
Brian Smith , Sun Microsystems, Inc.
pp. 1017
SESSION 37: ADVANCED METHODS IN EMBEDDED CORE TEST
null (PDF)
pp. null
Vikram Iyengar , Duke University
Krishnendu Chakrabarty , Duke University
Erik Jan Marinissen , Philips Research Laboratories
pp. 1023
Chauchin Su , National Central University
Wenliang Tseng , National Central University
pp. 1033
SESSION 38: HOW COULD WE MODEL AND TEST VDSM DEFECTS
null (PDF)
pp. null
M. Renovell , Universit? de Montpellier II
J.M. Gallière , Universit? de Montpellier II
F. Azaïs , Universit? de Montpellier II
Y. Bertrand , Universit? de Montpellier II
pp. 1039
James C.-M. Li , Stanford University
Chao-Wen Tseng , Stanford University
E.J. McCluskey , Stanford University
pp. 1049
Yasuo Sato , Hitachi, Ltd.
Masaki Kohno , Hitachi, Ltd.
Toshio Ikeda , Hitachi, Ltd.
Iwao Yamazaki , Hitachi, Ltd.
Masato Hamamoto , Hitachi, Ltd.
pp. 1059
SESSION 39: PRACTICAL TEST GENERATION TECHNIQUES
null (PDF)
pp. null
Srivaths Ravi , Princeton University
Niraj K. Jha , Princeton University
pp. 1068
Yong Chang Kim , University of Wisconsin-Madison
Vishwani D. Agrawal , CAS Res. Lab, Agere Systems
Kewal K. Saluja , University of Wisconsin-Madison
pp. 1078
Xijiang Lin , Mentor Graphics Corp.
Janusz Rajski , Mentor Graphics Corp.
Irith Pomeranz , Purdue University
Sudhakar M. Reddy , University of Iowa
pp. 1088
SESSION 40: DELVING INTO FACTORS AFFECTING MANUFACTURING COST
null (PDF)
pp. null
Erik H. Volkerink , Agilent Laboratories; MESA Research Institute
Ajay Khoche , Agilent Laboratories
Linda A. Kamas , Agilent Laboratories
Jochen Rivoir , Agilent Laboratories
Hans G. Kerkhoff , MESA Research Institute
pp. 1098
Thiagarajan Trichy , University of Maryland
Peter Sandborn , University of Maryland
Ravi Raghavan , University of Maryland
Shubhada Sahasrabudhe , University of Maryland
pp. 1108
SESSION 41: ATE HARDWARE: FROM GIGAHERTZ TO TERAHERTZ
null (PDF)
pp. null
Atsushi Oshima , Schlumberger Semiconductor Solutions
John Poniatowski , Schlumberger Semiconductor Solutions
Toshihiro Nomura , Schlumberger Semiconductor Solutions
pp. 1128
D.C. Keezer , Georgia Institute of Technology
Q. Zhou , Georgia Institute of Technology
C. Bair , Semiconductor Products Group
J. Kuan , Semiconductor Products Group
B. Poole , Semiconductor Products Group
pp. 1143
PANEL 1: SEARCHING FOR COMMON GROUND BETWEEN LOW-COST AND HIGH-PERFORMANCE ATE SYSTEMS
Gordon D Robinson , Third Millennium Test Solutions
pp. 1156
Anjali Kinra , Texas Instruments
pp. 1157
PANEL 2: OPEN MICROPHONE — WANTED: NEW TEST DIRECTIONS AND PRACTICAL TEST BOTTLENECKS
PANEL 3: CAN ANYONE STILL AFFORD SYSTEM TEST?
PANEL 4: THE CHALLENGES OF MANAGING TEST
Atul Goel , Agilent Technologies, Inc.
pp. 1161
John L. Harris , IBM Microelectronics
pp. 1162
Hwei-tsu Ann Luh , Taiwan Semiconductor Manufacturing Company
pp. 1163
PANEL 5: IS STRIP TESTING THE NEXT ADVANCE FOR SEMICONDUCTOR TEST?
PANEL 6: SYSTEM-IN-A-PACKAGE IS COMING TO CONSUMER PRODUCTS — IS TEST READY?
Larry Gilg , Die Products Consortium
pp. 1169
PANEL 7: AC SCAN: MICROPROCESSORS ARE READY...BUT WHERE IS THE INFRASTRUCTURE?
PANEL 8: DFT-CORRECT BY CONSTRUCTION OR MAKE IT WORK?
Robert C. Aitken , Agilent Technologies
pp. 1176
PANEL 9: LOWERING THE COST OF TEST: ATPG VS. BIST
Cy Hay , Synopsys, Inc.
pp. 1180
Scott Davidson , Sun Microsystems Inc.
pp. 1182
T. W. Williams , Synopsys, Inc.
pp. 1183
PANEL 10: STANDARDIZED TESTING OF AC-COUPLED ICS ON HIGH-SPEED BOARDS AND SYSTEMS
Carl F. Barnhart , IBM Corporation
pp. 1185
2000 ITC BEST PAPER:
Mohamed Hafed , McGill University
Nazmy Abaskharoun , McGill University
Gordon W. Roberts , McGill University
pp. 1190
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