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International Test Conference 2001 (ITC'01)
A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT
Baltimore, Maryland
October 30-November 01
ISBN: 0-7803-7171-2
| ASCII Text | x | ||
| Ming-Jun Hsiao, Jing-Reng Huang, Shao-Shen Yang, Tsin-Yuan Chang, "A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT," 2012 IEEE International Test Conference, pp. 315, International Test Conference 2001 (ITC'01), 2001. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.2001.966647, author = {Ming-Jun Hsiao and Jing-Reng Huang and Shao-Shen Yang and Tsin-Yuan Chang}, title = {A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {2001}, isbn = {0-7803-7171-2}, pages = {315}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.2001.966647}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT SN - 0-7803-7171-2 SP EP A1 - Ming-Jun Hsiao, A1 - Jing-Reng Huang, A1 - Shao-Shen Yang, A1 - Tsin-Yuan Chang, PY - 2001 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
A built-in parametric measurement circuit is proposed for time-interval measurement and setup/hold time measurement.The main idea is based on the dual-slope technique.The minimum resolution is set by resistor array configuration,which is 1/16 clock period in this paper and easily extendable to desired precision.The imperfectness,including the offset voltage and the settling time,is considered to improve the accuracy. Moreover a simple calibration method is proposed to reduce the measuring error.Experiments on the SRAM access time measurement and the register setup/hold time measurement show the practicality of the proposed unit.
Citation:
Ming-Jun Hsiao, Jing-Reng Huang, Shao-Shen Yang, Tsin-Yuan Chang, "A BUILT-IN TIMING PARAMETRIC MEASUREMENT UNIT," itc, pp.315, International Test Conference 2001 (ITC'01), 2001
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