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2013 IEEE International Test Conference (ITC) (2000)
Atlantic City, NJ, USA
Oct. 3, 2000 to Oct. 5, 2000
ISBN: 0-7803-6546-1
TABLE OF CONTENTS
INTRODUCTORY SECTION
Author Index (PDF)
pp. 1157
SPECIAL PANEL: THE PRESS STRIKES BACK
SESSION 1: PLENARY
null (PDF)
pp. null
pp. 12
pp. 13
SESSION 2: SYSTEM TEST-LECTURE SERIES
null (PDF)
pp. null
Jacob Savir , New Jersey Institute of Technology University Heights
pp. 35
Stephen Harrison , Motorola Network Solution Sector
Peter Collins , Motorola Network Solution Sector
Greg Noeninckx , Motorola Network Solution Sector
pp. 45
SESSION 3: ATE SOFTWARE GENERATION
null (PDF)
pp. null
Martin Bell , LogicVision, Inc.
Givargis Danialy , LogicVision, Inc.
Michael Howells , LogicVision, Inc.
Stephen Pateras , LogicVision, Inc.
pp. 55
SESSION 4: DEFECT BEHAVIOR AND ANALYSIS TECHNIQUES
null (PDF)
pp. null
T. M. Eiles , Intel Corporation
K. Wilsher , Schlumberger Technologies
W.K. Lo , Schlumberger Technologies
G. Xiao , Checkpoint Technologies
pp. 80
James C.M. Li , Stanford University
Edward J. McCluskey , Stanford University
pp. 85
Will Moore , Dept. Engineering Science
Guido Gronthoud , Philips Research Laboratories
Keith Baker , Philips Research Laboratories
Maurice Lousberg , Philips Research Laboratories
pp. 95
SESSION 5: BIST: INDUSTRIAL APPLICATIONS
null (PDF)
pp. null
Gundolf Kiefer , University of Stuttgart
Harald Vranken , Philips Research Laboratories
Erik Jan Marinisse , Philips Research Laboratories
Hans-Joachim Wunderlich , University of Stuttgart
pp. 105
Debaleena Das , University of Texas, Austin, TX 78712
Nur A. Touba , University of Texas, Austin, TX 78712 and Cores and System Technology
pp. 115
Michael Cogswell , Test Design Automation, IBM Corp.
Don Pearl , Test Design Automation, IBM Corp.
James Sage , Test Design Automation, IBM Corp.
Alan Troidl , Test Design Automation, IBM Corp.
pp. 123
SESSION 6: MICROPROCESSOR TEST
null (PDF)
pp. null
Rajesh Raina , Motorola Inc.; Somerset Design Center
Robert Bailey , Motorola Inc.; Somerset Design Center
Dawit Belete , Motorola Inc.; Somerset Design Center
Vikram Khosa , Motorola Inc.; Somerset Design Center
Robert Molyneaux , Motorola Inc.; Somerset Design Center
Javier Prado , Motorola Inc.; Somerset Design Center
Ashutosh Razdan , Motorola Inc.; Somerset Design Center
pp. 132
Farideh Golshan , Processor Product Group, Sun Microsystems Inc., Palo Alto, CA
pp. 141
SESSION 7: SYSTEMS TEST
null (PDF)
pp. null
Zan Yang , Electrical Engineering Department, Texas A&M University
Byeong Min , Electrical Engineering Department, Texas A&M University
Gwan Choi , Electrical Engineering Department, Texas A&M University
pp. 160
Politecnico di Torino , Dipartimento di Automatica e Informatica
pp. 170
Subhasish Mitra , Stanford University, Stanford, California
Edward J. McCluskey , Stanford University, Stanford, California
pp. 179
SESSION 8: PRACTICALI TESTING FOR DEEP-SUBMICRON DESIGNS
null (PDF)
pp. null
W. Robert Daasch , LSI Logic Corporation
James McNames , Electrical and Computer Engineering, Portland State University
Daniel Bockelman , Electrical and Computer Engineering, Portland State University
Kevin Cota , Electrical and Computer Engineering, Portland State University
pp. 189
Yukio Okuda , Semiconductor Company, Sony Corp.
pp. 199
C. Thibeault , ?cole de Technologie Sup?rieure
pp. 207
Pramodchandran N. Variyam , Texas Instruments, MS 8727, 12500, TI Boulevard, Dallas, TX 75243
pp. 217
SESSION 9: FAULT DIAGNOSIS ALGORITHMS AND TECHNIQUES
null (PDF)
pp. null
Xiaoming Yuy , Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Jue Wuz , Sun Microsystems, Menlo Park, CA
Elizabeth M. Rudnicky , Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
pp. 225
Kazuki Shigeta , Analysis Technology Development Division, NEC
Toshio Ishiyama , Analysis Technology Development Division, NEC
pp. 235
Pankaj Pant , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 245
Srikanth Venkataraman , Intel Corporation, Hillsboro, OR and Santa Clara, CA
Scott B. Drummonds , Intel Corporation, Hillsboro, OR and Santa Clara, CA
pp. 253
SESSION 10: BIST TECHNIQUES AND APPLICATIONS
null (PDF)
pp. null
Subrata Roy , Department of ECE University of California
Gokhan Guner , Department of ECE University of California
Kwang-Ting(Tim) Cheng , Department of ECE University of California
pp. 263
Ismet Bayraktaroglu , Computer Science & Engineering Department University of California, San Diego
Alex Orailoglu , Computer Science & Engineering Department University of California, San Diego
pp. 273
Yasuo Sato , Device Development Center, Hitachi, Ltd. , Ome-shi, Tokyo, Japan
Toyohito Ikeya , Device Development Center, Hitachi, Ltd. , Ome-shi, Tokyo, Japan
Michinobu Nakao , Central Research Laboratory, Hitachi, Ltd. , Kokubunnji-shi, Tokyo, Japan
Takaharu Nagumo , Enterprise Server Division, Hitachi, Ltd. , Hadano-shi, Kanagawa, Japan
pp. 283
M.J. Geuzebroek , Delft University of Technology, Faculty of Information Technology and Systems,
J. Th. van de Linden , Scientificial, Delft, The Netherlands
A.J. van de Goor , Delft University of Technology, Faculty of Information Technology and Systems,
pp. 292
SESSION 11: DESIGN VALIDATION: FROM FUNCTION TO TIMING
null (PDF)
pp. null
Qiushuang Zhang , University of Massachusetts
Ian G. Harris , University of Massachusetts
pp. 302
Chung-Yang (Ric) Huang , University of California, Santa Barbara
Bwolen Yang , Verplex Systems, Inc.
Huan-Chih Tsai , Verplex Systems, Inc.
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 309
Sudhakar M. Reddy , University of Iowa
Irith Pomeranz , University of Iowa
Seiji Kajihara , Kyushu Institute of Technology
Atsushi Murakami , Kyushu Institute of Technology
Sadami Takeoka , Corporate Semiconductor Development Division
Mitsuyasu Ohta , Corporate Semiconductor Development Division
pp. 317
Nabil M. Abdulrazzaq , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 326
SESSION 12: DEFECT-BASED TEST METHODOLOGIES AND THE REAL WORLD-LECTURE SERIES
null (PDF)
pp. null
Edward J. McCluskey , Stanford University, Stanford, CA 94305
Chao-Wen Tseng , Stanford University, Stanford, CA 94305
pp. 336
Ronald A. Richmond , Texas Instruments, Inc.
pp. 344
SESSION 13: TEST TECHNIQUES FOR ADCS
null (PDF)
pp. null
Pramodchandran N. Variyam , Texas Instruments Inc., Dallas, TX.
Vinay Agrawal , Texas Instruments Inc., Dallas, TX.
pp. 349
Turker Kuyel , Texas Instruments Inc.
Frank Tsay , Texas Instruments Inc.
pp. 367
SESSION 14: DELAY FAULT TESTING
null (PDF)
pp. null
Atsushi Murakami1 , Kyushu Institute of Technology
Seiji Kajihara , Kyushu Institute of Technology
Tsutomu Sasao , Kyushu Institute of Technology
Irith Pomeranz , University of Iowa
Sudhakar M. Reddy , University of Iowa
pp. 376
Manish Sharma , University of Illinois at Urbana-Champaign
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 385
Haluk Konuk , Agilent Technologies
pp. 393
SESSION 15: OPTIMIZING TEST EFFECTIVENESS
null (PDF)
pp. null
Peter Maxwell , Agilent Technologies
Ismed Hartanto , Agilent Technologies
Lee Bentz , Agilent Technologies
pp. 400
Kenneth M. Butler , Texas Instruments Inc.
Jayashree Saxena , Texas Instruments Inc.
pp. 408
Jais Abraham , Texas Instruments
Narayan Prasad , Texas Instruments
Srinivasa Chakravarthy B.S , Texas Instruments
Ameet Bagwe , Texas Instruments
Rubin A. Parekhji , Texas Instruments
pp. 417
SESSION 16: MEMORY TESTING
null (PDF)
pp. null
Ad J. van de Goor , Delft University of Technology, Faculty of Information Technology and Systems
Alexander Paalvast , Delft University of Technology, Faculty of Information Technology and Systems
pp. 426
Harold Pilo , IBM Microelectronics Division
Stu Hall , IBM Microelectronics Division
Patrick Hansen , IBM Microelectronics Division
Steve Lamphier , IBM Microelectronics Division
Chris Murphy , IBM Microelectronics Division
pp. 436
SESSION 17: DEFECT-BASED TEST METHODOLOGIES AND THE REAL WORLD-LECTURE SERIES
null (PDF)
pp. null
Phil Nigh , IBM Microelectronics
Anne Gattiker , IBM Austin Research Lab
pp. 454
SESSION 18: FROM TESTER TO APPLICATIONS-BEGINNING TO END
null (PDF)
pp. null
Jerry Katz , Advantest America R & D Center, Inc.
Rochit Rajsuman , Advantest America R & D Center, Inc.
pp. 468
Jerry J. Broz , Texas Instruments Corporation, Dallas, TX 75243
James C. Andersen, Ph.D , Applied Precision Incorporated, Issaquah, WA 98027
Reynaldo M. Rincon , Texas Instruments Corporation, Dallas, TX 75243
pp. 477
SESSION 19: TESTS FOR CROSSTALK AND BRIDGING FAULTS
null (PDF)
pp. null
Yi Z hao , University of California, San Diego, La Jolla, CA 92093-0407
Sujit Dey , University of California, San Diego, La Jolla, CA 92093-0407
pp. 492
Rahul Kundu , Carnegie Mellon University
R. D. (Shawn) Blanton , Carnegie Mellon University
pp. 502
SESSION 20: ADVANCES IN TEST GENERATION
null (PDF)
pp. null
Dong Xiang , Tsinghua University
Yi Xu , Tsinghua University
Hideo Fujiwara , Grad. Seh. of Inform. Sci.
pp. 520
Robert Butler , IBM MicroElectronics Division
Brion Keller , IBM MicroElectronics Division
Sarala Paliwal , IBM MicroElectronics Division
Richard Schoonover , IBM MicroElectronics Division
pp. 530
Mark W. Weiss , University of Nebraska-Lincoln
Sharad C. Seth , University of Nebraska-Lincoln
Shashank K. Mehta , Pune University
Kent L. Einspahr , Concordia University
pp. 538
SESSION 21: EMBEDDED MEMORIES TEST AND REPAIR
null (PDF)
pp. null
Kamran Zarrineh , Test Design Automation (TDA), IBM Microelectronics, Endicott, NY
R. Dean Adams , Design-For-Test Group, IBM Microelectronics, Essex Junction, VT
Thomas J. Eckenrode , Test Design Automation (TDA), IBM Microelectronics, Endicott, NY
Steven P. Gregor , Test Design Automation (TDA), IBM Microelectronics, Endicott, NY
pp. 547
Tomoya Kawagoe , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Jun Ohtani , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Mitsutaka Niiro , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Tukas Ooishi , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Mitsuhiro Hamada , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
Hideto Hidaka , Manufacturing Technology & Production Management Div., Mitsubishi Electric Corp.,
pp. 567
SESSION 22: BOARD TEST
null (PDF)
pp. null
Frans de Jong , Integrated Circuit Laboratory, Philips Consumer Electronics, The Netherlands
Ben Kup , Integrated Circuit Laboratory, Philips Consumer Electronics, The Netherlands
Rodger Schuttert , Integrated Circuit Laboratory, Philips Consumer Electronics, The Netherlands
pp. 575
Robert W. Barr , Lucent Technologies
Chen-Huan Chiang , Lucent Technologies
Edward L. Wallace , Lucent Technologies
pp. 585
David McClintock , The University of Texas at Austin
Lance Cunningham , The University of Texas at Austin
Takis Petropoulos , The University of Texas at Austin
pp. 593
SESSION 23: TESTER HARDWARE ISSUES IN LEAPING TO 1GHZ
null (PDF)
pp. null
Y. Cai , Lucent Technologies - Bell Laboratories
T. P. Warwick , Evaluation and Product Engineering, Inc.
S. G. Rane , Lucent Technologies - Bell Laboratories
E. Masserrat , Lucent Technologies - Bell Laboratories
pp. 600
SESSION 24: SOC TEST SOLUTIONS
null (PDF)
pp. null
Helmut Lang , Motorola, Inc.
Jens Pfeiffer , Motorola, Inc.
Jeff Maguire , Motorola, Inc.
pp. 638
Silvia CHIUSANO , Politecnico di Torino
PAOLO PRINETTO , Politecnico di Torino
HANS-JOACHIM WUNDERLICH , University of Stuttgart
pp. 644
SESSION 25: LOW-POWER BIST
null (PDF)
pp. null
P. Girard , Universit? Montpellier II / CNRS
L. Guiller , Universit? Montpellier II / CNRS
C. Landrault , Universit? Montpellier II / CNRS
S. Pravossoudovitch , Universit? Montpellier II / CNRS
pp. 652
Nicola Nicolici , Electronic Systems Design Group
Bashir M. Al-Hashimi , Electronic Systems Design Group
pp. 662
SESSION 26: METHODOLOGY AND TOOLS FOR MICROPROCESSOR TEST
null (PDF)
pp. null
Don E. Ross , Mentor Graphics Corporation
Tim Wood , Advanced Micro Devices
Grady Giles , Advanced Micro Devices
pp. 691
Anjali Kinra , Texas Instruments Inc.
Hari Balachandran , Texas Instruments Inc.
Regy Thomas , Texas Instruments Inc.
John Carulli , Texas Instruments Inc.
pp. 701
SESSION 27: BOARD TEST-LECTURE SERIES
null (PDF)
pp. null
Stephen F. Scheiber , ConsuLogic Consulting Services, 276 Longhouse Lane, Slingerlands, NY 12159-3012
pp. 718
Kenneth P. Parker , Agilent Technologies
pp. 724
SESSION 28: EXTRACTION TEST AND DIAGNOSIS OF PHYSICAL DEFECTS
null (PDF)
pp. null
Zoran Stanojevic , Texas A&M University
Hari Balachandran , Texas Instruments, Inc.
D. M. H. Walker , Texas A&M University
Fred Lakhani , International Sematech
Sri Jandhyala , Texas Instruments, Inc.
Jayashree Saxena , Texas Instruments, Inc.
Kenneth M. Butler , Texas Instruments, Inc.
pp. 729
N. Deb , Carnegie Mellon University
R. D. (Shawn) Blanton , Carnegie Mellon University
pp. 739
Charles E. Stroud , University of North Carolina at Charlotte
John M. Emmert , University of North Carolina at Charlotte
James R. Bailey , University of Kentucky
Khushru S. Chhor , Cypress Semiconductor
Dragomir Nikolic , Cypress Semiconductor
pp. 760
SESSION 29: USE MODELS OF IEEE P1500
null (PDF)
pp. null
Erik Jan Marinissen , Philips Research Laboratories
Rohit Kapur , Synopsys, Inc.
Yervant Zorian , LogicVision, Inc.
pp. 770
SESSION 30: QUALITY BIST FOR LOGIC AND FPGA
null (PDF)
pp. null
Sybille Hellebrand , University of Innsbruck
Hua-Guo Liang , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 778
Miron Abramovici , Bell Labs - Lucent Technologies
Charles Stroud , Dept. of Electrical Engineering - University of Kentucky
pp. 785
Xiaoling Sun , University of Alberta
Jian Xu , University of Alberta
Ben Chan , University of Alberta
Pieter Trouborst , Microelectronics Group, Nortel Networks
pp. 795
D. Bakalis , Dept. of Computer Engineering and Informatics, University of Patras, Computer Technology Institute, 3, Kolokotroni Str., 262 61 Patras, Greece
D. Nikolos , Dept. of Computer Engineering and Informatics, University of Patras, Computer Technology Institute, 3, Kolokotroni Str., 262 61 Patras, Greece
X. Kavousianos , Dept. of Computer Engineering and Informatics, University of Patras, 26 500, Rio, Greece
pp. 804
SESSION 31: DETECTING ALL TYPES OF FAULTS QUICKLY
null (PDF)
pp. null
Rao Desineni , Carnegie Mellon University, Pittsburgh, PA 15213
Kumar N. a Dwarkanath , Carnegie Mellon University, Pittsburgh, PA 15213
R. D. (Shawn) Blanton , Carnegie Mellon University, Pittsburgh, PA 15213
pp. 812
Tom Bartenstein , IBM Corporation
pp. 820
Srivaths Ravi , Princeton University, Princeton, NJ 08544
Ganesh Lakshminarayana , NEC USA, Inc., Princeton, NJ 08536
Niraj K. Jha , Princeton University, Princeton, NJ 08544
pp. 829
SESSION 32: FPGA TESTING-LECTURE SERIES
null (PDF)
pp. null
SESSION 33: TEST TECHNIQUES FOR LOW-POWER OPTIMIZATION
null (PDF)
pp. null
Lee Whetsel , Texas Instruments
pp. 863
Bahram Pouya , Motorola, ColdFire Core Technology Center
Alfred L. Crouch , Motorola, ColdFire Core Technology Center
pp. 873
Valentin Muresan , Dublin City University, Ireland
Xiaojun Wang , Dublin City University, Ireland
Valentina Muresan , "Politehnica" University of Timisoara, Romania
Mircea Vladutiu , "Politehnica" University of Timisoara, Romania
pp. 882
SESSION 34: TEST ACCESS DESIGN FOR SOC'S
null (PDF)
pp. null
Alfredo BENSO , Politecnico di Torino
Silvia CHIUSANO , Politecnico di Torino
Stefano DI CARLO , Politecnico di Torino
Paolo PRINETTO , Politecnico di Torino
Fabio RICCIATO , Politecnico di Torino
pp. 892
Mehrdad Nourani , The Univ. of Texas at Dallas
Christos Papachristou , Case Western Reserve Univ.
pp. 902
Erik Jan Marinissen , Philips Research Laboratories
Sandeep Kumar Goel , Indian Institute of Technology
Maurice Lousberg , Philips Research Laboratories
pp. 911
SESSION 35: HOW DO WE KNOW IF FAULT MODELS ARE ACCURATE?
null (PDF)
pp. null
Jeff Rearick , Agilent Technologies
Peter Maxwell , Agilent Technologies
pp. 921
Jennifer Dworak , Texas A&M University, College Station, Texas
Micheal R. Grimaila , Texas A&M University, College Station, Texas
Sooryong Lee , Texas A&M University, College Station, Texas
Li-C. Wang , Texas A&M University, College Station, Texas
M. Ray Mecer , Texas A&M University, College Station, Texas
pp. 930
Pradip A. Thaker , Hughes Network Systems
Vishwani D. Agrawal , Bell Labs, Lucent Technologies
Mona E. Zaghloul , George Washington University
pp. 940
SESSION 36: HIGH-FREQUENCY TEST TECHNIQUES
null (PDF)
pp. null
Peter Higgins , Intersil/Teradyne
Jim Lampos , Intersil
pp. 950
Takahiro J. Yamaguchi , Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Mani Soma , Department of Electrical Engineering, University of Washington, Seattle, WA
David Halter , Somerset PowerPC Design Center, Motorola Inc., Austin, TX
Jim Nissen , Somerset PowerPC Design Center, Motorola Inc., Austin, TX
Rajesh Raina , Somerset PowerPC Design Center, Motorola Inc., Austin, TX
Masahiro Ishida , Advantest Laboratories, Ltd., Sendai, Miyagi, Japan
Toshifumi Watanabe , Advantest Corporation, Ora, Gunma, Japan
pp. 955
Doug Matthes , Texas Instruments, Inc.
John Ford , Texas Instruments, Inc.
pp. 965
SESSION 37: CONCURRENT ERROR DETECTION
null (PDF)
pp. null
Santiago Fern?ndez-G?mez , ATI Research Silicon Valley, Inc.
J.J. Rodr?guez-Andina , University of Vigo
E. Mandado , University of Vigo
pp. 979
Subhasish Mitra , Stanford University, Stanford, California
Edward J. McCluskey , Stanford University, Stanford, California
pp. 985
SESSION 38: THE FINAL HURDLE-SIGNALS AND POWER TO THE DUT
null (PDF)
pp. null
Ulf Pillkahn , Siemens AG Munich, Germany
pp. 1005
Gerald H. Johnson , Teradyne Inc., 5301 East River Road, Fridley, MN 55421
pp. 1013
SESSION 39: MIXED-SIGNAL BIST
null (PDF)
pp. null
Jiun-Lang Huang , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 1021
Mohamed Hafed , McGill University
Nazmy Abaskharoun , McGill University
Gordon W. Robert , McGill University
pp. 1031
Anna Maria Brosa , Electronics Dept. Universitat Polit?cnica de Catalunya
Joan Figueras , Electronics Dept. Universitat Polit?cnica de Catalunya
pp. 1041
SESSION 40: NEW METHODS FOR DELAY TESTING
null (PDF)
pp. null
Ali Keshavarzi , Microprocessor Research Labs, Intel Corporation
Kaushik Roy , Purdue University,
Manoj Sachdev , University of Waterloo,
Charles F. Hawkins , The University of New Mexico
K. Soumyanath , Microprocessor Research Labs, Intel Corporation
Vivek De , Microprocessor Research Labs, Intel Corporation
pp. 1051
Seonki Kim , University of Minnesota, Minneapolis, Minnesota
Sreejit Chakravarty , Intel Corporation
Bapiraju Vinnakota , University of Minnesota, Minneapolis, Minnesota
pp. 1060
Jim Plusquellic , Department of CSEE, University of Maryland, Baltimore County
Amy Germida , Department of CSEE, University of Maryland, Baltimore County
Jonathan Hudson , Department of CSEE, University of Maryland, Baltimore County
Ernesto Staroswiecki , Department of CSEE, University of Maryland, Baltimore County
Chintan Patel , Department of CSEE, University of Maryland, Baltimore County
pp. 1070
SESSION 41: PROCESSOR CORE TEST TECHNIQUES
null (PDF)
pp. null
Wei-Cheng Lai , Department of ECE, University of California, Santa Barbara, CA 93106
Angela Krstic , Department of ECE, University of California, Santa Barbara, CA 93106
Kwang-Ting (Tim) Cheng , Department of ECE, University of California, Santa Barbara, CA 93106
pp. 1080
David B. Lavo , Agilent Technologies
pp. 1090
PANEL 1: FUTURE CHALLENGES FOR SYSTEM TEST
PANEL 2: INTERNAL CAD + EDA + SERVICES = TURMOIL, FENCING OR BLISS
Ismed Hartanto , Agilent Technologies, Santa Clara, CA
pp. 1110
Cy Hay , Synopsys, Inc.
pp. 1111
PANEL 3: NOISE: WHOSE PROBLEM IS IT ANYWAY?
Sandeep Gupta , Department of EE-Systems, USC, Los Angeles, CA
pp. 1113
Melvin A. Breuer , University of Southern California
pp. 1114
Bill Grundmann , Compaq Computer Corporation
pp. 1115
Sandip Kundu , Intel Corporation, MS AN1-2B17
pp. 1116
Nagaraj NS , Texas Instruments Inc.,
pp. 1117
PANEL 4: DFT-FOCUSED CHIP TESTERS: WHAT CAN THEY REALLY DO?
Gordon D Robinson , Credence Systems Corporation, Fremont CA
pp. 1119
Steve Comen , Texas Instruments, Inc
pp. 1120
Peter Muhmenthaler , Infineon Technologies AG
pp. 1122
PANEL 5: WHAT DEFECTS ESCAPE OUR TESTS . . . AND HOW WILL WE DETECT THEM IN THE FUTURE?
Anjali Kinra , Texas Instruments Inc., 12203 Southwest Fwy, MS 706, Bldg2, Stafford TX 77477
pp. 1124
PANEL 6: GOOD DIE IN BAD NEIGHBORHOODS
Jeffrey L. Roehr , Analog Devices, Wilmington Mass.
pp. 1126
Stefan Eichenberger , Philips Semiconductors, CH-8045 Zurich, Switzerland
pp. 1127
Russell B. Miller , Intel Corporation, Chandler, AZ
pp. 1128
Adit D. Singh , Department of Electrical & Computer Engineering
pp. 1129
PANEL 7: TESTING CHALLENGES FOR MEMS
Karen Panetta , Tufts University
pp. 1130
N. R. Aluru , University of Illinois at Urbana-Champaign, Urbana, IL 61801
pp. 1131
Stephen F. Bart , Microcosm Technologies, Inc., 215 First St. Cambridge, MA 02142, sbart@memcad.com
pp. 1132
R. D. (Shawn) Blanton , Carnegie Mellon University
pp. 1133
Karl F. B?hringer , University of Washington, Seattle, WA
pp. 1134
Richard B. Brown , 2403 EECS, University of Michigan, Ann Arbor, MI 48109-2122
pp. 1135
PANEL 8: WIRELESS COMMUNICATION PRODUCTS MEANS A SYSTEM-ON-CHIP WITH RF HEADACHES FOR TESTING. WHERE IS THE MIRACLE PILL?
PANEL 9: BIG-IRON TESTERS ARE A REALITY-THEIR REQUIREMENTS AND ROLE
Ulrich Schoettmer , Agilent Technologies
pp. 1141
PANEL 10: CAN DFT TOTALLY ELIMINATE THE TRADITIONAL FUNCTIONAL TESTING?
Burnell G. West , Schlumberger Semiconductor Solutions San Jose, California, USA
pp. 1146
1999 ITC BEST PAPER:
Peter Maxwell , Hewlett-Packard Company
Pete O?Neill , Hewlett-Packard Company
Rob Aitken , Hewlett-Packard Company
Roland Dudley , Hewlett-Packard Company
Neal Jaarsma , Hewlett-Packard Company
Minh Quac , Hewlett-Packard Company
pp. 1148
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