This Article 
   
 Share 
   
 Bibliographic References 
   
 Add to: 
 
Digg
Furl
Spurl
Blink
Simpy
Google
Del.icio.us
Y!MyWeb
 
 Search 
   
International Test Conference 2000 (ITC'00)
Identification of Crosstalk Switch Failures in Domino CMOS Circuits
Atlantic City, NJ, USA
October 03-October 05
ISBN: 0-7803-6546-1
Rahul Kundu, Carnegie Mellon University
R. D. (Shawn) Blanton, Carnegie Mellon University
Capacitative coupling will become a dominant problem due to increased parasitic capacitance between adjacent wires and faster signal switching rates. The coupling problem is more acute for domino logic circuits since an irreversible gate output transition can result. We present a method to analyze domino circuits for susceptibility to crosstalk failures from a layout-extracted netlist. Specifi- cally, sites in the circuit that may fail due to crosstalk are identified. In addition, failure sites are partitioned into two categories (faults or design errors) based on their likelihood of occurrence in the context of manufacturing variations. The method has been implemented and applied to a dual-rail dominoWallace tree circuit with little loss in accuracy, resulting in a 37X speedup over a full analysis using Hspice.
Citation:
Rahul Kundu, R. D. (Shawn) Blanton, "Identification of Crosstalk Switch Failures in Domino CMOS Circuits," itc, pp.502, International Test Conference 2000 (ITC'00), 2000
Usage of this product signifies your acceptance of the Terms of Use.