The Community for Technology Leaders
RSS Icon
Subscribe
2013 IEEE International Test Conference (ITC) (1999)
Atlantic City, NJ
Sept. 28, 1999 to Sept. 30, 1999
ISBN: 0-7803-5753-1
TABLE OF CONTENTS
Author Index (PDF)
pp. 1162
Session 1: Plenary
null (PDF)
pp. null
Session 2: MCM & Known -Good-Die Testing
null (PDF)
pp. null
Pinshan Jiang , Michigan State University
Se Hyun Park , Andong National University, South Korea
pp. 31
Silvia Chiusano , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
Simone Giovannetti , Caen Microelettronica
Riccardo Mariani , Caen Microelettronica
Alfredo Benso , Politecnico di Torino
pp. 38
Session 3: Dynamic Current Testing
null (PDF)
pp. null
Bram Kruseman , Philips Research Laboratories
Victor Zieren , Philips Research Laboratories
pp. 47
Wanli Jiang , Guidant Corporation
Bapiraju Vinnakota , University of Minnesota, Minneapolis
pp. 57
Zheng Yan , University of Maryland, Baltimore County
James F. Plusquellic , University of Maryland, Baltimore County
Amy Germida , University of Maryland, Baltimore County
pp. 67
Session 4: Low Power And Diagnosis in Bist
null (PDF)
pp. null
Stefan Gerstend?rfer , University of Stuttgart
pp. 77
Debaleena Das , University of Texas, Austin
Nur A. Touba , University of Texas, Austin
pp. 95
Session 5: Volume Production Testing
null (PDF)
pp. null
Jason Parker , Texas Instruments
Gordon Gammie , Texas Instruments
John Olson , Texas Instruments
Craig Force , Texas Instruments
Kenneth M. Butler , Texas Instruments
Sri Jandhyala , Texas Instruments
pp. 103
Simon Martin , Motorola Ireland Ltd.
Norma Barrett , Motorola Ireland Ltd.
pp. 124
Session 6: Microprocessor Testing
null (PDF)
pp. null
Carol Pyron , Motorola, Inc.
Mike Alexander , Motorola, Inc.
James Golab , Motorola, Inc.
George Joos , Motorola, Inc.
Bruce Long , Motorola, Inc.
Robert Molyneaux , Motorola, Inc.
Rajesh Raina , Motorola, Inc.
Nandu Tendolkar , Motorola, Inc.
pp. 137
Session 7: Board Test-Lecture Series
null (PDF)
pp. null
Stephen F. Scheiber , ConsuLogic Consulting Services
pp. 155
Thomas A. Ziaja , IBM Corp. Austin, Texas
pp. 163
Session 8: Delay Testing
null (PDF)
pp. null
Angela Krstic , University of California, Santa Barbara
Yi-Min Jiang , University of California, Santa Barbara
Kwang-Ting (Tim) Cheng , University of California, Santa Barbara
pp. 181
Wei-Yu Chen , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 191
S. Tragoudas , The University of Arizona
pp. 201
Session 9: Analog Test Methods
null (PDF)
pp. null
Dino Ren Tao , LTX Asia International, Inc.
pp. 216
Jeongjin Roh , The University of Texas at Austin
Jacob A. Abraham , The University of Texas at Austin
pp. 221
Abdelhakim Khouas , Universit? Pierre et Marie Curie
Anne Derieux , Universit? Pierre et Marie Curie
pp. 230
Session 10: Virtual And Real Test Software
null (PDF)
pp. null
JJ O Riordan , Analog Devices, Limerick, Ireland
pp. 237
Mitsuo Matsumoto , ADVANTEST Corporation
Yoshiharu Ikeda , Hitachi ULSI Systems Co., Ltd.
pp. 245
David A. Bonnett , ASSET InterTech, Inc.
pp. 252
Session 11: DFT
null (PDF)
pp. null
Eric MacDonald , Advanced PowerPC Development
Nur A. Touba , University of Texas, Austin
pp. 269
Mansour Shashaani , University of Waterloo
Manoj Sachdev , University of Waterloo
pp. 276
Egor S. Sogomonyan , Russian Academy of Sciences
Michael G?ssel , University of Potsdam
Adit D. Singh , Auburn University
pp. 286
Session 12: Embedded Memories
null (PDF)
pp. null
Session 13: MEMS Fault Modeling & Test
null (PDF)
pp. null
S. Mir , TIMA Laboratory
E.F. Cota , TIMA Laboratory
M. Lubaszewski , TIMA Laboratory
B. Charlot , TIMA Laboratory
pp. 319
Tao Jiang , Carnegie Mellon University
pp. 329
Richard W. Beegle , Sandia National Laboratories
Ronald W. Grant , Sandia National Laboratories
pp. 338
Session 14: Industrial Applications of Bist
null (PDF)
pp. null
Michinobu Nakao , Hitachi, Ltd.
Seiji Kobayashi , Hitachi, Ltd.
Kazumi Hatayama , Hitachi, Ltd.
Kazuhiko Iijima , Hitachi, Ltd.
Seiji Terada , Hitachi Business Solution, Ltd.
pp. 348
Tony Fryars , Texas Instruments, Ltd.
Nagesh Tamarapalli , Mentor Graphics Corporation
Mark Kassab , Mentor Graphics Corporation
Graham Hetherington , Texas Instruments, Ltd.
Janusz Rajski , Mentor Graphics Corporation
pp. 358
Jerzy Tyszer , Poznan University of Technology
Grzegorz Mrugalski , Poznan University of Technology
pp. 368
Session 15: Production Wafer Test: Where the Probes Meet The Pads
null (PDF)
pp. null
Rich Samuelson , Hewlett-Packard Company
Minh Quach , Hewlett-Packard Company
pp. 378
Session 16: Design Validation & Analysis for Evolving Technologies
null (PDF)
pp. null
S. G?ren , University of California; Santa Cruz
pp. 406
Thomas R?wer , Swiss Federal Institute of Technology
Hubert Kaeslin , Swiss Federal Institute of Technology
Norbert Felber , Swiss Federal Institute of Technology
Manfred Stadler , Swiss Federal Institute of Technology
Markus Thalmann , Siemens Switzerland AG
pp. 414
Kyung Tek Lee , IBM Austin Research Laboratory
pp. 421
Session 17: Board Test: Interconnect Test
null (PDF)
pp. null
Jean-Francois Cote , LogicVision Canada, Inc.
Harry Hulvershorn , LogicVision Canada, Inc.
Benoit Nadeau-Dostie , LogicVision Canada, Inc.
pp. 431
Yuejian Wu , Nortel Networks
pp. 449
Session 18: Enhanced Test & Diagnosis of IC Process Defects
null (PDF)
pp. null
Jason Parker , Texas Instruments
Daniel Shupp , Texas Instruments
Stephanie Butler , Texas Instruments
Hari Balachandran , Texas Instruments
Craig Force , Texas Instruments
Jason Smith , Texas Instruments
pp. 458
Guido Gronthoud , Philips Research Laboratories
Maurice Lousberg , Philips Research Laboratories
Ivo Schanstra , Philips Semiconductors
Charles Hawkins , University of New Mexico
pp. 467
M. Renovell , LIRMM-UMII
A. Ivanov , University of British Columbia
Y. Bertrand , LIRMM-UMII
F. Azais , LIRMM-UMII
S. Rafiq , University of British Columbia
pp. 477
Session 19: Embedded Core Test
null (PDF)
pp. null
Luis Basto , Advanced Micro Devices
Asif Khan , Advanced Micro Devices
Pete Hodakievic , Advanced Micro Devices
pp. 487
Peter Harrod , ARM Ltd
pp. 493
Rochit Rajsuman , Advantest America R&D Center
pp. 499
Session 20: Issues in Tester Accuracy
null (PDF)
pp. null
Y. Cai , Lucent Technologies - Bell Laboratories
C. T. Garrenton , Lucent Technologies - Bell Laboratories
pp. 509
Wajih Dalal , Schlumberger Automated Test Equipment
Song Miao , Schlumberger Automated Test Equipment
pp. 518
Yi Cai , Lucent Technologies
Bill Ortner , Lucent Technologies
pp. 524
Session 21: Mixed-Signal Bist Techniques
null (PDF)
pp. null
Stephen Sunter , LogicVision, Inc.
Aubin Roy , LogicVision, Inc.
pp. 532
B. Provost , Texas A&M University
pp. 541
Gloria Huertas , University of Sevilla
Diego V?zquez , University of Sevilla
Adoraci? Rueda , University of Sevilla
Jos? L. Huertas , University of Sevilla
pp. 549
Session 22: Board Test: Practice Makes Perfect
null (PDF)
pp. null
Frans de Jong , Philips Research
Steffen Hellmold , Fujitsu Mikroelektronik GmbH, Germany
pp. 556
David Rahe , QualMark Corporation
pp. 566
Session 23: Fault Simulation from Bridges to RTL
null (PDF)
pp. null
Imtiaz Shaik , Advanced Micro Devices, Inc.
Siyad Ma , Chameleon Systems, Inc.
pp. 587
Session 24: Practicing Embedded Core Test
null (PDF)
pp. null
Yervant Zorian , LogicVision
Rohit Kapur , Synopsys
Tony Taylor , Fluence
Erik Jan Marinissen , Philips Research
pp. 616
Robert Aitken , Hewlett-Packard Co.
Fidel Muradali , Hewlett-Packard Co.
pp. 628
Session 25: (Panel) Is Analog Fault Simulation A Key to Product Quality? Practical Considerations
null (PDF)
pp. null
Session 26: On-line Testing Techniques
null (PDF)
pp. null
Flavio Giovanelli , D.E.I.S. University of Bologna
Mani Soma , D.E.E. University of Washington, Seattle
Cecilia Metra , D.E.I.S. University of Bologna
pp. 652
Nirmal Saxena , Stanford University
Chaohuang Zeng , Stanford University
pp. 672
Session 27: System Test-Lecture Series
null (PDF)
pp. null
Robert Bleck , Motorola Inc,
Simon Martin , Motorola Ireland Ltd,
Des Farren , Motorola Ireland Ltd,
pp. 680
Susana Stoica , Ford Motor Company
pp. 689
David Williams , Dell Computer Corporation
pp. 698
Gordon D Robinson , Credence Systems Corporation
pp. 705
Session 28: Production I<sub>DDQ</sub> Testing Beyond Single-Threshold Measurements
null (PDF)
pp. null
C. Thibeault , ?cole de Technologie Sup?rieure
pp. 714
Hari Balachandran , Texas Instruments Inc.
Sri Jandhyala , Texas Instruments Inc.
pp. 730
Peter Maxwell , Hewlett-Packard Company
Pete O'Neill , Hewlett-Packard Company
Rob Aitken , Hewlett-Packard Company
Roland Dudley , Hewlett-Packard Company
Neal Jaarsma , Hewlett-Packard Company
Minh Quach , Hewlett-Packard Company
Don Wiseman , Hewlett-Packard Company
pp. 738
Session 29: Testing Analog to Digital Converters
null (PDF)
pp. null
Turker Kuyel , Texas Instruments Inc.
pp. 747
Session 30: Issues in High-Speed Testing
null (PDF)
pp. null
Mike P. Li , Wavecrest Corporation
Ross Jessen , Wavecrest Corporation
Dennis Petrich , Wavecrest Corporation
pp. 788
Burnell G. West , Schlumberger ATE
pp. 795
D.C. Keezer , Georgia Institute of Technology
Q. Zhou , Georgia Institute of Technology
pp. 801
Session 31: Test Methodology State of Practice & Case Studies
null (PDF)
pp. null
M.H. Konijnenburg , Delft University of Technology
A.J. van de Goor , Delft University of Technology
pp. 820
Session 32: System Test Methods from DFT to End of Life
null (PDF)
pp. null
Session 33: Design for Diagnostics
null (PDF)
pp. null
Moyra McManus , IBM T.J. Watson Research
Daniel Knebel , IBM T.J. Watson Research
Steven Steen , IBM T.J. Watson Research
Dennis Manzer , IBM T.J. Watson Research
Pia Sanda , IBM T.J. Watson Research
Yuen Chan , IBM
pp. 883
Gert Jan van Rootselaar , Philips Research Laboratories
Bart Vermeulen , Philips Research Laboratories
pp. 892
Session 34: Test Synthesis
null (PDF)
pp. null
Han Bin Kim , Virginia Polytechnic Institute and State University
Dong Sam Ha , Virginia Polytechnic Institute and State University
pp. 903
Session 35: Mixed-Signal ATE Issues & Optical Probing
null (PDF)
pp. null
Kenneth R. Wilsher , Schlumberger Test and Transactions
pp. 932
Koji Asami , ADVANTEST Corporation
Shinsuke Tajiri , ADVANTEST Corporation
pp. 947
Session 36: On-line Testing for FPGAS and Processors
null (PDF)
pp. null
Sudip Chakrabarti , Georgia Institute of Technology
Abhijit Chatterjee , Georgia Institute of Technology
pp. 955
M. Pflanz , Brandenburg Technical University at Cottbus, Germany
H.T. Vierhaus , Brandenburg Technical University at Cottbus, Germany
pp. 964
Miron Abramovici , Lucent Technologies
Charles Stroud , University of Kentucky
Carter Hamilton , University of Kentucky
Sajitha Wijesuriya , Lucent Technologies
Vinay Verma , Univ. of Illinois at Chicago
pp. 973
Session 37: Memory Testing
null (PDF)
pp. null
Monica Lobetti-Bondoni , Italtel S.p.A.
Alfredo Benso , Politecnico di Torino
Silvia Chiusano , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
pp. 993
Said Hamdioui , Intel Corporation; Delft University of Technology
pp. 1001
Session 38: Test Generation
null (PDF)
pp. null
Peter Wohl , Synopsys Inc.
John Waicukauski , Synopsys Inc.
pp. 1011
K.-H. Tsai , Mentor Graphics Corporation
J. Rajski , Mentor Graphics Corporation
M. Marek-Sadowska , Univ. of California, Santa Barbara
pp. 1021
Session 39: Advanced Solutions for SOC Test
null (PDF)
pp. null
Alfredo Benso , Politecnico di Torino
Silvia Cataldo , Politecnico di Torino
Silvia Chiusano , Politecnico di Torino
Paolo Prinetto , Politecnico di Torino
Yervant Zorian , Logic Vision
pp. 1038
Hyungwon Kim , University of Michigan, Ann Arbor
John P. Hayes , University of Michigan, Ann Arbor
pp. 1045
Session 40: Applying Diagnosis in A Production Test Environment
null (PDF)
pp. null
David B. Lavo , University of California, Santa Cruz
Jonathon E. Colburn , University of California, Santa Cruz
pp. 1065
Franco Motika , IBM/MiCRUS
Dan Knebel , IBM T.J. Watson Research
Julie Lee , IBM
Moyra McManus , IBM T.J. Watson Research
pp. 1073
Ruifeng Guo , University of Iowa
Irith Pomeranz , University of Iowa
Yun Shao , University of Iowa
pp. 1083
Session 41: Time-to-Market: Lecture Series
null (PDF)
pp. null
Jim Johnson , Motorola Corporation, Austin TX
pp. 1090
Jon Turino , SynTest Technologies, Inc.
pp. 1098
Panel 1: High Time for High-Level ATPG
null (PDF)
pp. null
Wu-Tung Cheng , Mentor Graphics Corporation
pp. 1113
Scott Davidson , Sun Microsystems Inc.
pp. 1114
Chris Papchristou , Case Western Reserve University
pp. 1117
Panel 2: Production Memory Tester-Present And Future
null (PDF)
pp. null
Panel 3: SIA Roadmaps: Sunset Boulevard For I<sub>DDQ</sub>
null (PDF)
pp. null
Panel 4: Thin Gate Oxide Reliability
null (PDF)
pp. null
James Prendergast , Institute Of Technology Tralee, Clash, Tralee Co. Kerry, Ireland; Raheen Industrial Estate, Limerick, Ireland
pp. 1123
Panel 5: What Do We Need System Test For?
null (PDF)
pp. null
Panel 6: ITC'99 Benchmark Circuits-Preliminary Results
null (PDF)
pp. null
Mario Konijnentmrgl , Delft University of Technology
Jeroen Geuzebroek , Delft University of Technology
pp. 1127
Raghuram S. Tupuri , Texas Microprocessor Division
pp. 1130
Panel 7: Increasing Test Coverage in a VLSI Design
null (PDF)
pp. null
John Harrington , Lucent Technologies
pp. 1134
Michel Robert , Universit? Montpellier 2
pp. 1135
Panel 8: SCITT: Back to Basics in Mass Production Testing
null (PDF)
pp. null
Panel 9: DFT is All I Can Afford, Who Cares About Design for Yield or Design for Reliability!
null (PDF)
pp. null
Scott Fetherston , Advanced Micro Devices
pp. 1144
Panel 10: Output in STIL, Input in STIL
null (PDF)
pp. null
Marc Loranger , Credence Systems Corporation
pp. 1151
1998 ITC Best Paper:
Dave Vallett , IBM Microelectronics
Atul Patel , IBM Microelectronics
Phil Nigh , IBM Microelectronics
Franco Motika , Micrus Corporation
Donato Forlenza , Micrus Corporation
Ray Kurtulik , Micrus Corporation
Wendy Chong , Micrus Corporation
pp. 1152
11 ms
(Ver 2.0)

Marketing Automation Platform Marketing Automation Tool