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International Test Conference 1999 (ITC'99)
Atlantic City, NJ
September 28-September 30
ISBN: 0-7803-5753-1
Table of Contents
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Session 1: Plenary
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Session 2: MCM & Known -Good-Die Testing
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Bruce C. Kim, Michigan State University
Pinshan Jiang, Michigan State University
Se Hyun Park, Andong National University, South Korea
pp. 31
Alfredo Benso, Politecnico di Torino
Silvia Chiusano, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
Simone Giovannetti, Caen Microelettronica
Riccardo Mariani, Caen Microelettronica
Silvano Motto, Caen Microelettronica
pp. 38
Session 3: Dynamic Current Testing
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Bram Kruseman, Philips Research Laboratories
Peter Janssen, Philips Semiconductors
Victor Zieren, Philips Research Laboratories
pp. 47
Amy Germida, University of Maryland, Baltimore County
Zheng Yan, University of Maryland, Baltimore County
James F. Plusquellic, University of Maryland, Baltimore County
Fidel Muradali, Hewlett Packard, Palo Alto
pp. 67
Session 4: Low Power And Diagnosis in Bist
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Session 5: Volume Production Testing
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Hari Balachandran, Texas Instruments
Jason Parker, Texas Instruments
Gordon Gammie, Texas Instruments
John Olson, Texas Instruments
Craig Force, Texas Instruments
Kenneth M. Butler, Texas Instruments
Sri Jandhyala, Texas Instruments
pp. 103
Session 6: Microprocessor Testing
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Carol Pyron, Motorola, Inc.
Mike Alexander, Motorola, Inc.
James Golab, Motorola, Inc.
George Joos, Motorola, Inc.
Bruce Long, Motorola, Inc.
Robert Molyneaux, Motorola, Inc.
Rajesh Raina, Motorola, Inc.
Nandu Tendolkar, Motorola, Inc.
pp. 137
Session 7: Board Test-Lecture Series
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Session 8: Delay Testing
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Angela Krstic, University of California, Santa Barbara
Yi-Min Jiang, University of California, Santa Barbara
Kwang-Ting (Tim) Cheng, University of California, Santa Barbara
pp. 181
Wei-Yu Chen, University of Southern California
Sandeep K. Gupta, University of Southern California
Melvin A. Breuer, University of Southern California
pp. 191
Session 9: Analog Test Methods
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Abdelhakim Khouas, Universit? Pierre et Marie Curie
Anne Derieux, Universit? Pierre et Marie Curie
pp. 230
Session 10: Virtual And Real Test Software
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Session 11: DFT
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Session 12: Embedded Memories
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Session 13: MEMS Fault Modeling & Test
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B. Charlot, TIMA Laboratory
S. Mir, TIMA Laboratory
E.F. Cota, TIMA Laboratory
M. Lubaszewski, TIMA Laboratory
B. Courtois, TIMA Laboratory
pp. 319
Richard W. Beegle, Sandia National Laboratories
Robert W. Brocato, Sandia National Laboratories
Ronald W. Grant, Sandia National Laboratories
pp. 338
Session 14: Industrial Applications of Bist
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Michinobu Nakao, Hitachi, Ltd.
Seiji Kobayashi, Hitachi, Ltd.
Kazumi Hatayama, Hitachi, Ltd.
Kazuhiko Iijima, Hitachi, Ltd.
Seiji Terada, Hitachi Business Solution, Ltd.
pp. 348
Graham Hetherington, Texas Instruments, Ltd.
Tony Fryars, Texas Instruments, Ltd.
Nagesh Tamarapalli, Mentor Graphics Corporation
Mark Kassab, Mentor Graphics Corporation
Abu Hassan, Mentor Graphics Corporation
Janusz Rajski, Mentor Graphics Corporation
pp. 358
Grzegorz Mrugalski, Poznan University of Technology
Jerzy Tyszer, Poznan University of Technology
Janusz Rajski, Mentor Graphics Corporation
pp. 368
Session 15: Production Wafer Test: Where the Probes Meet The Pads
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Session 16: Design Validation & Analysis for Evolving Technologies
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S. G?ren, University of California; Santa Cruz
F. J. Ferguson, University of California; Santa Cruz
pp. 406
Manfred Stadler, Swiss Federal Institute of Technology
Thomas R?wer, Swiss Federal Institute of Technology
Hubert Kaeslin, Swiss Federal Institute of Technology
Norbert Felber, Swiss Federal Institute of Technology
Wolfgang Fichtner, Swiss Federal Institute of Technology
Markus Thalmann, Siemens Switzerland AG
pp. 414
Session 17: Board Test: Interconnect Test
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Benoit Nadeau-Dostie, LogicVision Canada, Inc.
Jean-Francois Cote, LogicVision Canada, Inc.
Harry Hulvershorn, LogicVision Canada, Inc.
Stephen Pateras, LogicVision, Inc.
pp. 431
Session 18: Enhanced Test & Diagnosis of IC Process Defects
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Hari Balachandran, Texas Instruments
Jason Parker, Texas Instruments
Daniel Shupp, Texas Instruments
Stephanie Butler, Texas Instruments
Kenneth M. Butler, Texas Instruments
Craig Force, Texas Instruments
Jason Smith, Texas Instruments
pp. 458
Keith Baker, Philips Research Laboratories
Guido Gronthoud, Philips Research Laboratories
Maurice Lousberg, Philips Research Laboratories
Ivo Schanstra, Philips Semiconductors
Charles Hawkins, University of New Mexico
pp. 467
M. Renovell, LIRMM-UMII
A. Ivanov, University of British Columbia
Y. Bertrand, LIRMM-UMII
F. Azais, LIRMM-UMII
S. Rafiq, University of British Columbia
pp. 477
Session 19: Embedded Core Test
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Luis Basto, Advanced Micro Devices
Asif Khan, Advanced Micro Devices
Pete Hodakievic, Advanced Micro Devices
pp. 487
Session 20: Issues in Tester Accuracy
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Y. Cai, Lucent Technologies - Bell Laboratories
W. R. Ortner, Lucent Technologies - Bell Laboratories
C. T. Garrenton, Lucent Technologies - Bell Laboratories
pp. 509
Wajih Dalal, Schlumberger Automated Test Equipment
Song Miao, Schlumberger Automated Test Equipment
pp. 518
Session 21: Mixed-Signal Bist Techniques
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Session 22: Board Test: Practice Makes Perfect
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Session 23: Fault Simulation from Bridges to RTL
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Siyad Ma, Chameleon Systems, Inc.
Imtiaz Shaik, Advanced Micro Devices, Inc.
R. Scott Fetherston, Advanced Micro Devices, Inc.
pp. 587
Session 24: Practicing Embedded Core Test
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Session 25: (Panel) Is Analog Fault Simulation A Key to Product Quality? Practical Considerations
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Session 26: On-line Testing Techniques
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Cecilia Metra, D.E.I.S. University of Bologna
Flavio Giovanelli, D.E.I.S. University of Bologna
Mani Soma, D.E.E. University of Washington, Seattle
Bruno Ricc?, D.E.I.S. University of Bologna
pp. 652
Session 27: System Test-Lecture Series
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Simon Martin, Motorola Ireland Ltd,
Robert Bleck, Motorola Inc,
Chryssa Dislis, Motorola Ireland Ltd,
Des Farren, Motorola Ireland Ltd,
pp. 680
Session 28: Production IDDQ Testing Beyond Single-Threshold Measurements
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Sri Jandhyala, Texas Instruments Inc.
Hari Balachandran, Texas Instruments Inc.
Anura P. Jayasumana, Colorado State University
pp. 730
Peter Maxwell, Hewlett-Packard Company
Pete O'Neill, Hewlett-Packard Company
Rob Aitken, Hewlett-Packard Company
Roland Dudley, Hewlett-Packard Company
Neal Jaarsma, Hewlett-Packard Company
Minh Quach, Hewlett-Packard Company
Don Wiseman, Hewlett-Packard Company
pp. 738
Session 29: Testing Analog to Digital Converters
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Session 30: Issues in High-Speed Testing
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Mike P. Li, Wavecrest Corporation
Jan Wilstrup, Wavecrest Corporation
Ross Jessen, Wavecrest Corporation
Dennis Petrich, Wavecrest Corporation
pp. 788
Session 31: Test Methodology State of Practice & Case Studies
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M.H. Konijnenburg, Delft University of Technology
J.Th. van der Linden, Delft University of Technology
A.J. van de Goor, Delft University of Technology
pp. 820
Session 32: System Test Methods from DFT to End of Life
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Session 33: Design for Diagnostics
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Moyra McManus, IBM T.J. Watson Research
Daniel Knebel, IBM T.J. Watson Research
Steven Steen, IBM T.J. Watson Research
Dennis Manzer, IBM T.J. Watson Research
Pia Sanda, IBM T.J. Watson Research
Yuen Chan, IBM
Stanislav Polonsky, IBM T.J. Watson Research
pp. 883
Session 34: Test Synthesis
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Han Bin Kim, Virginia Polytechnic Institute and State University
Dong Sam Ha, Virginia Polytechnic Institute and State University
pp. 903
Session 35: Mixed-Signal ATE Issues & Optical Probing
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Kenneth R. Wilsher, Schlumberger Test and Transactions
William K. Lo, Schlumberger Test and Transactions
pp. 932
Session 36: On-line Testing for FPGAS and Processors
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M. Pflanz, Brandenburg Technical University at Cottbus, Germany
F. Pompsch, Brandenburg Technical University at Cottbus, Germany
H.T. Vierhaus, Brandenburg Technical University at Cottbus, Germany
pp. 964
Miron Abramovici, Lucent Technologies
Charles Stroud, University of Kentucky
Carter Hamilton, University of Kentucky
Sajitha Wijesuriya, Lucent Technologies
Vinay Verma, Univ. of Illinois at Chicago
pp. 973
Session 37: Memory Testing
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Monica Lobetti-Bondoni, Italtel S.p.A.
Alessio Pricco, Italtel S.p.A.
Alfredo Benso, Politecnico di Torino
Silvia Chiusano, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
pp. 993
Said Hamdioui, Intel Corporation; Delft University of Technology
A. J. van de Goor, Delft University of Technology
pp. 1001
Session 38: Test Generation
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K.-H. Tsai, Mentor Graphics Corporation
R. Tompson, Mentor Graphics Corporation
J. Rajski, Mentor Graphics Corporation
M. Marek-Sadowska, Univ. of California, Santa Barbara
pp. 1021
Session 39: Advanced Solutions for SOC Test
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Alfredo Benso, Politecnico di Torino
Silvia Cataldo, Politecnico di Torino
Silvia Chiusano, Politecnico di Torino
Paolo Prinetto, Politecnico di Torino
Yervant Zorian, Logic Vision
pp. 1038
Session 40: Applying Diagnosis in A Production Test Environment
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David B. Lavo, University of California, Santa Cruz
Tracy Larrabee, University of California, Santa Cruz
Jonathon E. Colburn, University of California, Santa Cruz
pp. 1065
Yun Shao, University of Iowa
Ruifeng Guo, University of Iowa
Irith Pomeranz, University of Iowa
Sudhakar M. Reddy, University of Iowa
pp. 1083
Session 41: Time-to-Market: Lecture Series
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Jim Johnson, Motorola Corporation, Austin TX
pp. 1090
Panel 1: High Time for High-Level ATPG
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Wu-Tung Cheng, Mentor Graphics Corporation
pp. 1113
Chris Papchristou, Case Western Reserve University
pp. 1117
Panel 2: Production Memory Tester-Present And Future
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Panel 3: SIA Roadmaps: Sunset Boulevard For IDDQ
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Panel 4: Thin Gate Oxide Reliability
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James Prendergast, Institute Of Technology Tralee, Clash, Tralee Co. Kerry, Ireland; Raheen Industrial Estate, Limerick, Ireland
pp. 1123
Panel 5: What Do We Need System Test For?
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Panel 6: ITC'99 Benchmark Circuits-Preliminary Results
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Mario Konijnentmrgl, Delft University of Technology
Hans van der Linden, Delft University of Technology
Jeroen Geuzebroek, Delft University of Technology
pp. 1127
Panel 7: Increasing Test Coverage in a VLSI Design
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Panel 8: SCITT: Back to Basics in Mass Production Testing
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Panel 9: DFT is All I Can Afford, Who Cares About Design for Yield or Design for Reliability!
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Scott Fetherston, Advanced Micro Devices
pp. 1144
Panel 10: Output in STIL, Input in STIL
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Marc Loranger, Credence Systems Corporation
pp. 1151
1998 ITC Best Paper:
Phil Nigh, IBM Microelectronics
Dave Vallett, IBM Microelectronics
Atul Patel, IBM Microelectronics
Jason Wright, IBM Microelectronics
Franco Motika, Micrus Corporation
Donato Forlenza, Micrus Corporation
Ray Kurtulik, Micrus Corporation
Wendy Chong, Micrus Corporation
pp. 1152
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