- I
- ITC
- 1999
- International Test Conference 1999 (ITC'99)
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International Test Conference 1999 (ITC'99)
Atlantic City, NJ
September 28-September 30
ISBN: 0-7803-5753-1
Table of Contents
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| Session 1: Plenary |
| Session 2: MCM & Known -Good-Die Testing |
| Session 3: Dynamic Current Testing |
Zheng Yan, University of Maryland, Baltimore County
pp. 67
| Session 4: Low Power And Diagnosis in Bist |
| Session 5: Volume Production Testing |
| Session 6: Microprocessor Testing |
| Session 7: Board Test-Lecture Series |
| Session 8: Delay Testing |
| Session 9: Analog Test Methods |
| Session 10: Virtual And Real Test Software |
| Session 11: DFT |
| Session 12: Embedded Memories |
| Session 13: MEMS Fault Modeling & Test |
| Session 14: Industrial Applications of Bist |
| Session 15: Production Wafer Test: Where the Probes Meet The Pads |
| Session 16: Design Validation & Analysis for Evolving Technologies |
S. G?ren, University of California; Santa Cruz
pp. 406
| Session 17: Board Test: Interconnect Test |
| Session 18: Enhanced Test & Diagnosis of IC Process Defects |
S. Rafiq, University of British Columbia
pp. 477
| Session 19: Embedded Core Test |
| Session 20: Issues in Tester Accuracy |
Y. Cai, Lucent Technologies - Bell Laboratories
pp. 509
Song Miao, Schlumberger Automated Test Equipment
pp. 518
| Session 21: Mixed-Signal Bist Techniques |
| Session 22: Board Test: Practice Makes Perfect |
| Session 23: Fault Simulation from Bridges to RTL |
| Session 24: Practicing Embedded Core Test |
| Session 25: (Panel) Is Analog Fault Simulation A Key to Product Quality? Practical Considerations |
| Session 26: On-line Testing Techniques |
Mani Soma, D.E.E. University of Washington, Seattle
pp. 652
| Session 27: System Test-Lecture Series |
| Session 28: Production IDDQ Testing Beyond Single-Threshold Measurements |
| Session 29: Testing Analog to Digital Converters |
| Session 30: Issues in High-Speed Testing |
Q. Zhou, Georgia Institute of Technology
pp. 801
| Session 31: Test Methodology State of Practice & Case Studies |
| Session 32: System Test Methods from DFT to End of Life |
| Session 33: Design for Diagnostics |
| Session 34: Test Synthesis |
Han Bin Kim, Virginia Polytechnic Institute and State University
Dong Sam Ha, Virginia Polytechnic Institute and State University
pp. 903
| Session 35: Mixed-Signal ATE Issues & Optical Probing |
| Session 36: On-line Testing for FPGAS and Processors |
M. Pflanz, Brandenburg Technical University at Cottbus, Germany
F. Pompsch, Brandenburg Technical University at Cottbus, Germany
H.T. Vierhaus, Brandenburg Technical University at Cottbus, Germany
pp. 964
| Session 37: Memory Testing |
| Session 38: Test Generation |
| Session 39: Advanced Solutions for SOC Test |
| Session 40: Applying Diagnosis in A Production Test Environment |
| Session 41: Time-to-Market: Lecture Series |
| Panel 1: High Time for High-Level ATPG |
| Panel 2: Production Memory Tester-Present And Future |
| Panel 3: SIA Roadmaps: Sunset Boulevard For IDDQ |
| Panel 4: Thin Gate Oxide Reliability |
James Prendergast, Institute Of Technology Tralee, Clash, Tralee Co. Kerry, Ireland; Raheen Industrial Estate, Limerick, Ireland
pp. 1123
| Panel 5: What Do We Need System Test For? |
| Panel 6: ITC'99 Benchmark Circuits-Preliminary Results |
| Panel 7: Increasing Test Coverage in a VLSI Design |
| Panel 8: SCITT: Back to Basics in Mass Production Testing |
| Panel 9: DFT is All I Can Afford, Who Cares About Design for Yield or Design for Reliability! |
| Panel 10: Output in STIL, Input in STIL |
| 1998 ITC Best Paper: |
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