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2013 IEEE International Test Conference (ITC) (1998)
Washington, D.C. USA
Oct. 18, 1998 to Oct. 23, 1998
ISBN: 0-7803-5093-6
TABLE OF CONTENTS
INTRODUCTORY SECTION
Reviewers (PDF)
pp. 17
Author Index (PDF)
pp. 1078
SESSION 1: PLENARY
SESSION 2: ESCAPING THE HIGH COST OF TEST ESCAPES
Phil Nigh , IBM Microelectronics
Dave Vallett , IBM Microelectronics
Atul Patel , IBM Microelectronics
Jason Wright , IBM Microelectronics
pp. 43
SESSION 3: MEMORY TEST ALGORITHMS AND PATTERN GENERATION
S. Hamdioui , Delft University of Technology
A. J. van de Goor , Delft University of Technology
pp. 63
Kamran Zarrineh , State University of New York at Buffalo
Shambhu J. Upadhyaya , State University of New York at Buffalo
Sreejit Chakravarty , Intel Corporation
pp. 73
SESSION 4: DFT IN PRACTICE
Francis Woytowich , IBM Microelectronics Division
Kevin McCauley , IBM Test Design Automation
Ulrich Baur , IBM System/390 Division
pp. 83
E. Kofi Vida-Torku , International Business Machines
pp. 101
SESSION 5: THERMAL ISSUES IN MANUFACTURING TEST
John H. Lienhard V , Massachusetts Institute of Technology
Andreas C. Pfahnl , Kinetrix, Inc.
pp. 109
Andreas C. Pfahnl , Kinetrix, Inc.
John H. Lienhard V , Massachusetts Institute of Technology
Alexander H. Slocum , Massachusetts Institute of Technology
pp. 114
James Maveety , Intel Corporation
Steve Knostman , Schlumberger Test & Transactions
Mark Malinoski , Schlumberger Test & Transactions
pp. 119
SESSION 6: EMBEDDED CORES
Erik Jan Marinissen , Philips Research
Yervant Zorian , LogicVision
pp. 130
SESSION 7: BIST SYNTHESIS
Zhe Zhao , University of Texas at Austin
Bahram Pouya , University of Texas at Austin and Motorola
Nur A. Touba , University of Texas at Austin
pp. 144
Han Bin Kim , Virginia Polytechnic Institute and State University
Takeshi Takahashi , Advantest America R&D Center Inc.
Dong Sam Ha , Virginia Polytechnic Institute and State University
pp. 154
Srinivas Devadas , Massachusetts Institute of Technology
Kurt Keutzer , University of California at Berkeley
pp. 164
SESSION 8: EXPERIMENTAL RESULTS IN CURRENT TESTING
Anne E. Gattiker , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
pp. 174
Jonathan T.-Y. Chang , Stanford University
Chien-Mo James Li , Stanford University
Mike Purtell , Advantest America R&D Center, Inc.
Edward J. McCluskey , Stanford University
pp. 184
Alan W. Righter , Analog Devices
Charles F. Hawkins , University of New Mexico
Jerry M. Soden , Sandia Labs
Peter Maxwell , Hewlett-Packard
pp. 194
Peter Janssen , Philips Research Laboratories
Manoj Sachdev , Philips Research Laboratories
pp. 204
SESSION 9: MCM TESTmdash;THEORY AND APPLICATIONS
Abhijit Chatterjee , Georgia Institute of Technology
Yervant Zorian , LogicVision, Inc.
pp. 214
Math Muris , Philips Electronic Design and Tools
Rodger Schuttert , Philips Electronic Design and Tools
Urs Fawer , Philips Semiconductors AG
pp. 222
D.C. Keezer , Georgia Institute of Technology
K.E. Newman , Georgia Institute of Technology
J.S. Davis , Georgia Institute of Technology
pp. 228
Bruce C. Kim , Michigan State University
Abhijit Chatterjee , Georgia Institute of Technology
pp. 234
SESSION 10: MIXED-SIGNAL TEST TECHNIQUES
Eric Rosenfeld , LTX Corporation
Solomon Max , LTX Corporation
pp. 249
S. Sasho , Asahi Kasei Microsystems Co.
pp. 258
SESSION 11: INTEGRATED PROBE CARD/INTERFACE SOLUTIONS FOR SPECIFIC TEST APPLICATIONS
Hervé DESHAYES , STMicroelectronics
pp. 265
Toshinori Ishii , Mitsubishi Materials Corp.
Hideaki Yoshida , Mitsubishi Materials Corp.
pp. 272
Frederick L. Taber Jr. , IBM Corporation
pp. 277
SESSION 12: ACCESS AND TEST APPROACHES FOR EMBEDDED CORES
Robert Arendsen , Philips Semiconductors
Gerard Bos , Philips Semiconductors
Hans Dingemanse , Philips Semiconductors
Maurice Lousberg , Philips Research Laboratories
Erik Jan Marinissen , Philips Research Laboratories
pp. 284
Lee Whetsel , Texas Instruments Inc.
pp. 303
Janusz Rajski , Mentor Graphics Corporation
pp. 313
SESSION 13: TEST SYNTHESIS
J. C. Rau , National Chung-Cheng University
W. B. Jone , National Chung-Cheng University
Y. L. Wu , Chinese University of Hong-Kong
pp. 322
SESSION 14: TRANSISTOR LEVEL TEST TECHNIQUES
Peter Dahlgren , Chalmers University of Technology
pp. 363
SESSION 15: BOARD AND SYSTEM TEST
Reuben Schrift , E&M Engineering (Y.G.R) Ltd.
pp. 382
SESSION 16: RECENT ADVANCES IN BIST
Sajitha Wijesuriya , University of Kentucky
Carter Hamilton , University of Kentucky
Charles Stroud , University of Kentucky
pp. 404
Rainer Dorsch , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 412
Nilanjan Mukherjee , Bell Laboratories, Lucent Technologies
Sudipta Bhawmik , Bell Laboratories, Lucent Technologies
pp. 422
SESSION 17: INTRODUCTION TO MEMS
Kaigham J. Gabriel , Carnegie Mellon University
pp. 432
SESSION 18: ADVANCES IN EMBEDDED CORE TEST
Joep Aerts , Philips Research Laboratories and Eindhoven University of Technology
pp. 448
Abhijit Jas , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 458
SESSION 19: MICROPROCESSOR TESTING
Anjali Kinra , Texas Instruments Inc.
Neal Smith , Texas Instruments Inc.
Jackie Mitchell , Texas Instruments Inc.
Fred Valente , Texas Instruments Inc.
pp. 480
David R. Akeson , Compaq Computer Corporation
Michael K. Gowan , Compaq Computer Corporation
Daniel B. Jackson , Compaq Computer Corporation
pp. 487
SESSION 20: ATE ARCHITECTURES: COST, IDDQ AND MIXED-SIGNAL ISSUES
Ed Chang , Credence Systems Corporation
David Cheung , Credence Systems Corporation
Robert Huston , Credence Systems Corporation
Jim Seaton , Credence Systems Corporation
Gary Smith , Credence Systems Corporation
pp. 500
SESSION 21: CONCURRENT CHECKING
Cecilia Metra , University of Bologna
Michele Favalli , University of Bologna
Bruno Riccò , University of Bologna
pp. 524
Adoración Rueda , Universidad de Sevilla
Eduardo Peralías , Universidad de Sevilla
José L. Huertas , Universidad de Sevilla
pp. 534
SESSION 22: MEMS FAULT MODELING AND DIAGNOSIS
D. Veychard , TIMA Laboratory
S. Mir , TIMA Laboratory
J.M. Karam , TIMA Laboratory
B. Courtois , TIMA Laboratory
pp. 541
Abhijeet Kolpekwar , Carnegie Mellon University
R.D.(Shawn) Blanton , Carnegie Mellon University
David Woodilla , Analog Devices
pp. 551
Abhijeet Kolpekwar , Carnegie Mellon University
Chris Kellen , Carnegie Mellon University
R. D.(Shawn) Blanton , Carnegie Mellon University
pp. 557
SESSION 23: TEST CREATION FOR IMPLICITLY BURNING CORES
Chung Len Lee , National Chiao Tung University
Kuo Chan Huang , National Chiao Tung University
pp. 567
Hyungwon Kim , University of Michigan
John P. Hayes , University of Michigan
pp. 577
Franco Fummi , Politecnico di Milano
Fabrizio Ferrandi , Politecnico di Milano
pp. 587
SESSION 24: REVOLUTION AND EVOLUTION IN TESTER SOFTWARE
John Oonk , Credence Systems Corp.
pp. 606
Craig Force , Texas Instruments
pp. 612
SESSION 25: PRACTICAL ATPG
Brion Keller , IBM Corporation
Kevin McCauley , IBM Corporation
Joseph Swenton , IBM Corporation
James Youngs , IBM Corporation
pp. 632
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 641
SESSION 26: DFT THEORY
Priyank Kalla , University of Massachusetts at Amherst
Maciej J. Ciesielski , University of Massachusetts at Amherst
pp. 651
Shih-Chieh Chang , National Chung Cheng University
Shi-Sen Chang , National Chung Cheng University
Wen-Ben Jone , National Chung Cheng University
Chien-Chung Tsai , Mentor Graphics Corp.
pp. 658
Yiorgos Makris , University of California at San Diego
pp. 668
SESSION 27: MIXED-SIGNAL DFT
Ara Hajjar , McGill University
Gordon W. Roberts , McGill University
pp. 688
SESSION 29: MICROPROCESSOR TEST TOOLS
Young-Jun Kwon , Silicon Graphics, Inc.
Hong Hao , Silicon Graphics, Inc.
pp. 727
SESSION 30: PUTTING THE ?DEFECT? IN DEFECT DIAGNOSIS
Pia Sanda , IBM T.J. Watson Research
Moyra MC Manus , IBM T.J. Watson Research
J. A. Kash , IBM T.J. Watson Research
J. C. Tsang , IBM T.J. Watson Research
Dave Vallett , IBM Microelectronics
Leendert Huisman , IBM Microelectronics
Phil Nigh , IBM Microelectronics
Franco Motika , Micrus Corporation
pp. 733
Travis Eiles , Intel Corporation
V.R.M. Rao , Intel Corporation
Wai Mun Yee , Intel Corporation
pp. 740
Kenneth M. Butler , Texas Instruments Inc.
Hari Balachandran , Texas Instruments Inc.
David B. Lavo , University of California at Santa Cruz
Tracy Larrabee , University of California at Santa Cruz
Jayashree Saxena , Texas Instruments Inc.
Brian Chess , Hewlett-Packard Corp.
pp. 748
Yuan-Chieh Hsu , University of Southern California
pp. 758
SESSION 31: SYSTEM LEVEL TEST TECHNIQUES AND PROCESSES
A. Benso , Politecnico di Torino
P. Prinetto , Politecnico di Torino
M. Rebaudengo , Politecnico di Torino
M. Sonza Reorda , Politecnico di Torino
pp. 768
Shung-Won Jeng , National Central University
Chauchin Su , National Central University
pp. 774
Israel Beniaminy , IET Intelligent Electronics
Moshe Ben-Bassat , IET Intelligent Electronics
pp. 793
SESSION 32: THE NEED FOR SPEED mdash; TIMING AND JITTER TESTING
Wajih Dalal , Schlumberger Automated Test Equipment
Daniel Rosenthal , Schlumberger Automated Test Equipment
pp. 814
SESSION 33: VECTORS, INTERFACE, PROBES; ATE ISSUES IN AT-SPEED TEST
A. Leyk , Gerhard-Mercator-Universit?t Duisburg
U. Behnke , Gerhard-Mercator-Universit?t Duisburg
V. Wittpahl , Gerhard-Mercator-Universit?t Duisburg
pp. 843
SESSION 34: MANUFACTURING PROCESS MONITORING
Ugonna Echeruo , Compaq Computer Corporation
David R. Akeson , Compaq Computer Corporation
William J. Bowhill , Compaq Computer Corporation
pp. 853
T. M. Mak , Intel Corporation
Debika Bhattacharya , Intel Corporation
Cheryl Prunty , Intel Corporation
Bob Roeder , Intel Corporation
Nermine Ramadan , Intel Corporation
Joel Ferguson , University of California at Santa Cruz
Jianlin Yu , University of California at Santa Cruz
pp. 862
Ivo Schanstra , Philips Semiconductors
Ad J. van de Goor , Delft University of Technology
Kees Veelenturf , Philips Semiconductors
Paul J. van Wijnen , Philips Semiconductors
pp. 872
SESSION 35: FAULT DETECTION AND IDDQ
P. C. Maxwell , Hewlett-Packard Company
J. R. Rearick , Hewlett-Packard Company
pp. 882
Yukio Okuda , Semiconductor Company, Sony Corp.
Masahiro Watanabe , Semiconductor Company, Sony Corp.
pp. 900
SESSION 36: ON-LINE TESTING
A. Paschalis , NCSR "Demokritos"
D. Nikolos , University of Patra
I. Voyiatzis , NCSR "Demokritos"
pp. 918
SESSION 37: CREATING EFFECTIVE TEST SEQUENCES
Carlos G. Parodi , Rutgers University
Michael L. Bushnell , Rutgers University
Shianling Wu , Bell Labs
pp. 934
Ilker Hamzaoglu , University of Illinois at Urbana-Champaign
pp. 944
SESSION 38: TEST STANDARDS mdash; STILL EVOLVING
Tony Taylor , Test Systems Strategies Incorporated
pp. 962
Peter Wohl , Synopsys Inc.
John Waicukauski , Synopsys Inc.
pp. 971
SESSION 39: DESIGN VALIDATION AND DIAGNOSIS
SESSION 40: ALTERNATIVES TO IDDQ
C. Thibeault , ?cole de Technologie Sup?rieure Montr?al
pp. 1019
Wanli Jiang , University of Minnesota
Dechang Sun , University of Minnesota
pp. 1027
SESSION 41: BIST GENERATOR AND ARCHITECTURES
Nagesh Tamarapalli , Mentor Graphics Corporation
Janusz Rajski , Mentor Graphics Corporation
pp. 1047
Gundolf Kiefer , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart
pp. 1057
Huan-Chih Tsai , University of California at Santa Barbara
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
pp. 1065
SESSION 42: NEW IDEAS IN LOGIC DIAGNOSIS
Brian Chess , University of California at Santa Cruz
Tracy Larrabee , University of California at Santa Cruz
Ismed Hartanto , Hewlett-Packard Company
pp. 1084
Vamsi Boppana , Fujitsu Laboratories of America, Inc.
Masahiro Fujita , Fujitsu Laboratories of America, Inc.
pp. 1094
SESSION 43: EMBEDDED MEMORIES
M. Renovell , LIRMM-UM2
J. M. Portal , LIRMM-UM2
J. Figueras , UPC Diagonal
Y. Zorian , Logic Vision Inc.
pp. 1102
Yervant Zorian , Bell Laboratories - Lucent Technologies
Goh Komoriya , Bell Laboratories - Lucent Technologies
Hai Pham , Bell Laboratories - Lucent Technologies
Frank P. Higgins , Bell Laboratories - Lucent Technologies
Jim L. Lewandowski , Bell Laboratories - Lucent Technologies
pp. 1112
Roderick McConnell , Siemens Semiconductor
Udo Möller , Siemens Semiconductor
Detlev Richter , Siemens Semiconductor
pp. 1120
PANEL 1: GOOD ENOUGH QUALITY mdash; WHEN IS ?ENOUGH? ENOUGH?
William R. Simpson , Institute for Defense Analyses
pp. 1127
Bret A. Stewart , Texas Instruments
pp. 1128
Susana Stoica , Ford Motor Company
pp. 1129
PANEL 2: TWO WORLDS COLLIDE: MIXED SIGNAL ASIC TESTING
Mark Burns , Texas Instruments, Inc.
pp. 1132
Ken Lanier , LTX Corporation
pp. 1133
PANEL 3: DIAGNOSTIC WAR STORIES: WHAT SAVED THE DAY? A TECHNIQUE DEBATE
PANEL 4: SCALING DEEPER TO SUBMICRON: ON-LINE TESTING TO THE RESCUE
PANEL 5: THE ROAD TO SYSTEM-ON-CHIP TEST mdash; IT?S A MATTER OF CORES mdash; IS IT?
Todd Rockoff , SIMD Solutions, Inc
pp. 1142
Prab Varma , Veritable Inc.
pp. 1144
PANEL 6: BIST VS. ATE: WHICH IS BETTER, FOR WHICH IC TESTS?
Satoru Tanoi , OKI Electric Industry Co., Ltd.
pp. 1149
PANEL 7: HOW REAL IS THE NEW 1997 SIA ROADMAP?
WAYNE NEEDHAM , INTEL CORPORATION
pp. 1151
Todd Rockoff , SIMD Solutions, Inc
pp. 1154
Burnell G. West , Schlumberger Technologies
pp. 1155
PANEL 8: ACADEMIC RESEARCH: POWER PLANT OR IVORY TOWER?
PANEL 9: FLYING PROBERS mdash; A NEW ERA IN LOADED BOARD FIXTURELESS TEST
PANEL 10: STUCK-AT FAULT: THE FAULT MODEL OF CHOICE FOR THE THIRD MILLENNIUM!?
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 1166
Jeff Rearick , Hewlett-Packard Company
pp. 1167
BEST PAPER:
Anne E. Gattiker , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
pp. 1168
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