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International Test Conference 1998 (ITC'98)
Washington, D.C. USA
October 18-October 23
ISBN: 0-7803-5093-6
| ASCII Text | x | ||
| William R. Ortner, "How Real Is the New SIA Roadmap for Mixed-Signal Test Equipment?," 2012 IEEE International Test Conference, pp. 1153, International Test Conference 1998 (ITC'98), 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1998.743352, author = {William R. Ortner}, title = {How Real Is the New SIA Roadmap for Mixed-Signal Test Equipment?}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1998}, issn = {1089-3539}, pages = {1153}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743352}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - How Real Is the New SIA Roadmap for Mixed-Signal Test Equipment? SN - 1089-3539 SP EP A1 - William R. Ortner, PY - 1998 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
Citation:
William R. Ortner, "How Real Is the New SIA Roadmap for Mixed-Signal Test Equipment?," itc, pp.1153, International Test Conference 1998 (ITC'98), 1998
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