On Applying Non-Classical Defect Models to Automated Diagnosis

Jayashree Saxena; David B. Lavo; Tracy Larrabee; Kenneth M. Butler; Hari Balachandran; F. Joel Ferguson; Brian Chess

doi:10.1109/TEST.1998.743256

I
ITC
1998
International Test Conference 1998 (ITC'98)
Abstract - On Applying Non-Classical Defect Models to Automated Diagnosis

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	Similar Articles Articles by Jayashree Saxena Articles by Kenneth M. Butler Articles by Hari Balachandran Articles by David B. Lavo Articles by Tracy Larrabee Articles by F. Joel Ferguson Articles by Brian Chess

International Test Conference 1998 (ITC'98)

On Applying Non-Classical Defect Models to Automated Diagnosis

Washington, D.C. USA

October 18-October 23

ISBN: 0-7803-5093-6

	ASCII Text	x
	Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, "On Applying Non-Classical Defect Models to Automated Diagnosis," 2012 IEEE International Test Conference, pp. 748, International Test Conference 1998 (ITC'98), 1998.

	BibTex	x
	@article{ 10.1109/TEST.1998.743256, author = {Jayashree Saxena and Kenneth M. Butler and Hari Balachandran and David B. Lavo and Tracy Larrabee and F. Joel Ferguson and Brian Chess}, title = {On Applying Non-Classical Defect Models to Automated Diagnosis}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1998}, issn = {1089-3539}, pages = {748}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743256}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, }

	RefWorks Procite/RefMan/Endnote	x
	TY - CONF JO - 2012 IEEE International Test Conference TI - On Applying Non-Classical Defect Models to Automated Diagnosis SN - 1089-3539 SP EP A1 - Jayashree Saxena, A1 - Kenneth M. Butler, A1 - Hari Balachandran, A1 - David B. Lavo, A1 - Tracy Larrabee, A1 - F. Joel Ferguson, A1 - Brian Chess, PY - 1998 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER -

Jayashree Saxena, Texas Instruments Inc.

Kenneth M. Butler, Texas Instruments Inc.

Hari Balachandran, Texas Instruments Inc.

David B. Lavo, University of California at Santa Cruz

Tracy Larrabee, University of California at Santa Cruz

F. Joel Ferguson, University of California at Santa Cruz

Brian Chess, Hewlett-Packard Corp.

DOI Bookmark: http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743256

Automated fault diagnosis based on the stuck- at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine.

Citation:

Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess, "On Applying Non-Classical Defect Models to Automated Diagnosis," itc, pp.748, International Test Conference 1998 (ITC'98), 1998

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