|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
International Test Conference 1998 (ITC'98)
DIAGNOSIS AND CHARACTERIZATION OF TIMING-RELATED DEFECTS BY TIME-DEPENDENT LIGHT EMISSION
Washington, D.C. USA
October 18-October 23
ISBN: 0-7803-5093-6
| ASCII Text | x | ||
| Dan Knebel, Pia Sanda, Moyra MC Manus, J. A. Kash, J. C. Tsang, Dave Vallett, Leendert Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika, "DIAGNOSIS AND CHARACTERIZATION OF TIMING-RELATED DEFECTS BY TIME-DEPENDENT LIGHT EMISSION," 2012 IEEE International Test Conference, pp. 733, International Test Conference 1998 (ITC'98), 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1998.743254, author = {Dan Knebel and Pia Sanda and Moyra MC Manus and J. A. Kash and J. C. Tsang and Dave Vallett and Leendert Huisman and Phil Nigh and Rick Rizzolo and Peilin Song and Franco Motika}, title = {DIAGNOSIS AND CHARACTERIZATION OF TIMING-RELATED DEFECTS BY TIME-DEPENDENT LIGHT EMISSION}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1998}, issn = {1089-3539}, pages = {733}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743254}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - DIAGNOSIS AND CHARACTERIZATION OF TIMING-RELATED DEFECTS BY TIME-DEPENDENT LIGHT EMISSION SN - 1089-3539 SP EP A1 - Dan Knebel, A1 - Pia Sanda, A1 - Moyra MC Manus, A1 - J. A. Kash, A1 - J. C. Tsang, A1 - Dave Vallett, A1 - Leendert Huisman, A1 - Phil Nigh, A1 - Rick Rizzolo, A1 - Peilin Song, A1 - Franco Motika, PY - 1998 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
Technological advances such as flip-chip packaging, multiple hierarchical wiring planes, and ultra-high frequencies reduce the effectiveness of conventional diagnostic techniques. It has recently been demonstrated that light pulses emitted during circuit switching can be used to characterize the behavior of integrated circuits. In this paper, a new method of circuit characterization using this technique is described. An example of the diagnosis of a timing failure caused by a resistive path to a single transistor is described.
Citation:
Dan Knebel, Pia Sanda, Moyra MC Manus, J. A. Kash, J. C. Tsang, Dave Vallett, Leendert Huisman, Phil Nigh, Rick Rizzolo, Peilin Song, Franco Motika, "DIAGNOSIS AND CHARACTERIZATION OF TIMING-RELATED DEFECTS BY TIME-DEPENDENT LIGHT EMISSION," itc, pp.733, International Test Conference 1998 (ITC'98), 1998
Usage of this product signifies your acceptance of the Terms of Use.