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International Test Conference 1998 (ITC'98)
Embedded Self-Testing Checkers for Low-Cost Arithmetic Codes
Washington, D.C. USA
October 18-October 23
ISBN: 0-7803-5093-6
| ASCII Text | x | ||
| Steffen Tarnick, Albrecht P. Stroele, "Embedded Self-Testing Checkers for Low-Cost Arithmetic Codes," 2012 IEEE International Test Conference, pp. 514, International Test Conference 1998 (ITC'98), 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1998.743194, author = {Steffen Tarnick and Albrecht P. Stroele}, title = {Embedded Self-Testing Checkers for Low-Cost Arithmetic Codes}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1998}, issn = {1089-3539}, pages = {514}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743194}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - Embedded Self-Testing Checkers for Low-Cost Arithmetic Codes SN - 1089-3539 SP EP A1 - Steffen Tarnick, A1 - Albrecht P. Stroele, PY - 1998 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
In highly reliable systems, error detecting codes are employed and errors caused by faulty hardware are indicated on-line by code checkers. We present two novel architectures of embedded self-testing checkers for low-cost arithmetic codes, one based on code word generators and adders, the other based on code word accumulators. In these schemes, the code checker receives all possible code words but one, irrespective of the number of different code words that are produced by the circuit under check (CUC). So any code checker can be employed that is self-testing for all or a particular subset of code words, and the structure of the code checker need not be tailored to the set of code words produced by the CUC. The proposed code word generators and accumulators are built from simple standard hardware structures, counters and end-around-carry adders. They can also be utilized in an off-line BIST environment as pattern generators and test response compactors.
Citation:
Steffen Tarnick, Albrecht P. Stroele, "Embedded Self-Testing Checkers for Low-Cost Arithmetic Codes," itc, pp.514, International Test Conference 1998 (ITC'98), 1998
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