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International Test Conference 1998 (ITC'98)
ANALYSIS OF PATTERN-DEPENDENT AND TIMING-DEPENDENT FAILURES IN AN EXPERIMENTAL TEST CHIP
Washington, D.C. USA
October 18-October 23
ISBN: 0-7803-5093-6
| ASCII Text | x | ||
| Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey, "ANALYSIS OF PATTERN-DEPENDENT AND TIMING-DEPENDENT FAILURES IN AN EXPERIMENTAL TEST CHIP," 2012 IEEE International Test Conference, pp. 184, International Test Conference 1998 (ITC'98), 1998. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1998.743151, author = {Jonathan T.-Y. Chang and Chao-Wen Tseng and Chien-Mo James Li and Mike Purtell and Edward J. McCluskey}, title = {ANALYSIS OF PATTERN-DEPENDENT AND TIMING-DEPENDENT FAILURES IN AN EXPERIMENTAL TEST CHIP}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1998}, issn = {1089-3539}, pages = {184}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1998.743151}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - ANALYSIS OF PATTERN-DEPENDENT AND TIMING-DEPENDENT FAILURES IN AN EXPERIMENTAL TEST CHIP SN - 1089-3539 SP EP A1 - Jonathan T.-Y. Chang, A1 - Chao-Wen Tseng, A1 - Chien-Mo James Li, A1 - Mike Purtell, A1 - Edward J. McCluskey, PY - 1998 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
This paper presents the results for very detailed studies of pattern and timing-dependent failures from the 309 dies in the retest of an experimental test chip. 22 out of the 50 CUTs with pattern-dependent failures had test escapes if the test sets were reordered. Some timing-dependent failures became timing-independent combinational (TIC) defects at very low voltage. Multiple-detect single stuck fault test sets have high transition fault coverage. Most dies with TIC or non-TIC defects were close to gross failures or next to the wafer periphery.
Citation:
Jonathan T.-Y. Chang, Chao-Wen Tseng, Chien-Mo James Li, Mike Purtell, Edward J. McCluskey, "ANALYSIS OF PATTERN-DEPENDENT AND TIMING-DEPENDENT FAILURES IN AN EXPERIMENTAL TEST CHIP," itc, pp.184, International Test Conference 1998 (ITC'98), 1998
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