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2013 IEEE International Test Conference (ITC) (1997)
Washington D.C.
Nov. 1, 1997 to Nov. 6, 1997
ISBN: 0-7803-4210-0
TABLE OF CONTENTS
INTRODUCTORY SECTION
Reviewers (PDF)
pp. 14
Author Index (PDF)
pp. 1053
SESSION 1: PLENARY
SESSION 2: DYNAMIC CURRENT TESTING
Edward I. Cole Jr. , Sandia National Laboratories
Jerry M. Soden , Sandia National Laboratories
Paiboon Tangyunyong , Sandia National Laboratories
Patrick L. Candelaria , Sandia National Laboratories
Richard W. Beegle , Sandia National Laboratories
Daniel L. Barton , Sandia National Laboratories
Christopher L. Henderson , Sandia National Laboratories
Charles F. Hawkins , University of New Mexico
pp. 23
J. S. Beasley , New Mexico State University
A. W. Righter , Sandia National Laboratories
C. J. Apodaca , Intel Corporation
S. Pour-Mozafari , New Mexico State University
D. Huggett , New Mexico State University
pp. 32
SESSION 3: EMBEDDED CORE TESTING
Bahram Pouya , University of Texas at Austin
Nur A. Touba , University of Texas at Austin
pp. 60
SESSION 4: ATE HARDWARE IMPROVEMENTS FOR HIGH-SPEED TEST
Takahiro Yamaguchi , Advantest Laboratories Ltd.
Marco Tilgner , Tokyo Institute of Technology
Masahiro Ishida , Advantest Laboratories Ltd.
Dong Sam Ha , Virginia Polytechnic Institute and State University
pp. 79
Ben Brown , Teradyne, Inc.
John Donaldson , Teradyne, Inc.
Bob Gage , Teradyne, Inc.
Alexander Joffe , Teradyne, Inc.
pp. 89
D. C. Keezer , Georgia Institute of Technology
R. J. Wenzel , Georgia Institute of Technology
pp. 94
SESSION 5: MCM SYSTEMS TEST
Andrew Flint , AT&T Wireless Services
pp. 101
Thomas G. Foote , International Business Machines Corporation
Dale E. Hoffman , International Business Machines Corporation
William V. Huott , International Business Machines Corporation
Timothy J. Koprowski , International Business Machines Corporation
Bryan J. Robbins , International Business Machines Corporation
Mary P. Kusko , IBM Microelectronics
pp. 106
Otto A. Torreiter , IBM Development Lab Germany
Ulrich Baur , IBM Development Lab Germany
Georg Goecke , IBM Development Lab Germany
Kevin Melocco , IBM Microelectronics
pp. 115
SESSION 6: UNPOWERED OPENS LECTURE SERIES
Ted T. Turner , Hewlett-Packard Company
pp. 124
SESSION 7: IDDQ TESTING
Ralf Arnold , Philips Semiconductors
Thorsten Bode , Philips Semiconductors
Markus Feuser , Philips Semiconductors
Horst-Udo Wedekind , Philips Semiconductors
pp. 127
Antoni Ferré , Universitat Politècnica de Catalunya
Joan Figueras , Universitat Politècnica de Catalunya
pp. 136
Ali Keshavarzi , Intel Corporation
Kaushik Roy , Purdue University
Charles F. Hawkins , University of New Mexico
pp. 146
Anne E. Gattiker , Carnegie Mellon University
Wojciech Maly , Carnegie Mellon University
pp. 156
SESSION 8: PROGRESS ON STANDARDS AND BENCHMARKS
Harry Hulvershorn , LogicVision Canada Inc.
pp. 166
Adam Cron , Motorola
pp. 174
B. Kaminska , Opmaxx, Inc.
K. Arabi , Opmaxx, Inc.
I. Bell , University of Hull
P. Goteti , University of Washington
J. L. Huertas , CNM, Seville
B. Kim , Tufts University
A. Rueda , CNM, Seville
M. Soma , University of Washington
pp. 183
SESSION 9: MEMORY TEST
Theo J. Powell , Texas Instruments, Inc.
Francis Hii , Texas Instruments Singapore, PTE. LTD.
Dan Cline , Texas Instruments, Inc.
pp. 200
R. Dean Adams , Dartmouth College
Edmond S. Cooley , Dartmouth College
Patrick R. Hansen , Dartmouth College
pp. 217
Ad J. van de Goor , Delft University of Technology
Mike Lin , Intel Inc.
pp. 226
SESSION 10: TEST SYNTHESIS
Kelly A. Ockunzzi , Case Western Reserve University
Christos A. Papachristou , Case Western Reserve University
pp. 236
SESSION 11: UNPOWERED OPENS LECTURE SERIES
Stig Oresjo , Hewlett-Packard Company
pp. 276
SESSION 12: MICROPROCESSOR TEST I
Carol Stolicny , Digital Semiconductor
Richard Davies , Digital Semiconductor
Pamela McKernan , Digital Semiconductor
Tuyen Truong , Digital Semiconductor
pp. 278
Jeff Brauch , Hewlett Packard
Jay Fleischman , Hewlett Packard
pp. 286
Adrian Carbine , Intel Corporation
Derek Feltham , Intel Corporation
pp. 294
SESSION 13: DIAGNOSIS & FAILURE ANALYSIS LECTURE SERIES
Christopher L. Henderson , Sandia National Laboratories
Jerry M. Soden , Sandia National Laboratories
pp. 310
Phil Nigh , IBM Microelectronics
Donato Forlenza , Micrus Corporation
Franco Motika , Micrus Corporation
pp. 319
SESSION 14: DETERMINISTIC BIST
Krishnendu Chakrabarty , Boston University
Brian T. Murray , General Motors R&D Center
Jian Liu , Boston University
Minyao Zhu , Boston University
pp. 328
Christophe FAGOT , UNIVERSITE MONTPELLIER II
Patrick GIRARD , UNIVERSITE MONTPELLIER II
Christian LANDRAULT , UNIVERSITE MONTPELLIER II
pp. 338
Gundolf Kiefer , University of Stuttgart
Hans-Joachim Wunderlich , University of Stuttgart,
pp. 347
SESSION 15: COMPONENTS FOR MCMS: KNOWN-GOOD-DIE AND SUBSTRATES
Von-Kyoung Kim , Sun Microelectronics
Tom Chen , Colorado State University
Mick Tegethoff , Celestica Inc.
pp. 356
Adit D. Singh , Auburn University
Phil Nigh , IBM
C. M. Krishna , University of Massachusetts at Amherst
pp. 362
K. E. Newman , Georgia Institute of Technology
D. C. Keezer , Georgia Institute of Technology
pp. 370
SESSION 16: MIXED-SIGNAL SEMINAR: MEASUREMENT TECHNIQUES
Takahiro Yamaguchi , ADVANTEST Laboratories, Ltd.
Mani Soma , University of Washington
pp. 379
Stephen K. Sunter , LogicVision Inc.
Naveena Nagi , LogicVision Inc.
pp. 389
SESSION 17: MICROPROCESSOR TEST II
R. Scott Fetherston , Advanced Micro Devices
Imtiaz P. Shaik , Advanced Micro Devices
Siyad C. Ma , Advanced Micro Devices
pp. 406
Carol Pyron , Motorola, Inc.
Javier Prado , Motorola, Inc.
James Golab , Motorola, Inc.
pp. 414
Dale Amason , Motorola, Inc.
Alfred L. Crouch , Motorola, Inc.
Renny Eisele , Motorola, Inc.
Grady Giles , Motorola, Inc.
Michael Mateja , Motorola, Inc.
pp. 424
SESSION 18: DIAGNOSIS AND FAILURE ANALYSIS LECTURE SERIES PANEL
Jerry M. Soden , Sandia National Laboratories
Christopher L. Henderson , Sandia National Laboratories
pp. 435
SESSION 19: DESIGN FOR DELAY TEST
Angela Krstić , University of California at Santa Barbara
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
pp. 436
Jacob Savir , New Jersey Institute of Technology
pp. 446
Ramesh C. Tekumalla , University of Massachusetts at Amherst
Prem R. Menon , University of Massachusetts at Amherst
pp. 454
SESSION 20: CONCURRENT CHECKING
Osama K. Abu-Shahla , University of Hull
Ian M. Bell , University of Hull
pp. 463
A. L. Burress , North Carolina A&T State University
P. K. Lala , North Carolina A&T State University
pp. 471
C. Stroud , University of Kentucky
M. Ding , University of Kentucky
S. Seshadri , University of Kentucky
I. Kim , Lucent Technologies
S. Roy , Lucent Technologies
S. Wu , Lucent Technologies
R. Karri , Lucent Technologies
pp. 479
SESSION 21: MIXED-SIGNAL SEMINAR: MEASUREMENTS USING P1149.4
Kenneth P. Parker , Hewlett Packard Company
John E. McDermid , Hewlett Packard Company
Rodney A. Browen , Hewlett Packard Company
Kozo Nuriya , Matsushita Electric Industrial Co., Ltd.
Katsuhiro Hirayama , Matsushita Electric Industrial Co., Ltd.
Akira Matsuzawa , Matsushita Electric Industrial Co., Ltd.
pp. 489
Chauchin Su , National Central University
Yue-Tsang Chen , National Central University
Shyh-Jye Jou , National Central University
pp. 499
José Machado da Silva , Universidade do Porto
Ana C. Leão , Universidade do Porto
José C. Alves , Universidade do Porto
José Silva Matos , Universidade do Porto
pp. 509
SESSION 22: HIGH-PERFORMANCE PROBES AND SOCKETS
R. Dennis Bates , UPSYS-Cerprobe L.L.C.
pp. 533
SESSION 23: BIST AND DFT ECONOMICS
Charles Stroud , University of Kentucky
Eric Lee , University of Kentucky
Miron Abramovici , Bell Labs - Lucent Technologies
pp. 539
Kun-Han Tsai , University of California at Santa Barbara
Janusz Rajski , Mentor Graphics Corporation
Malgorzata Marek-Sadowska , University of California at Santa Barbara
pp. 548
S. Wei , Carnegie Mellon University
P. K. Nag , Carnegie Mellon University
R. D. Blanton , Carnegie Mellon University
A. Gattiker , Carnegie Mellon University
W. Maly , Carnegie Mellon University
pp. 557
SESSION 24: ON-LINE TESTING TECHNIQUES FOR VLSI
E. Böhl , Robert Bosch GmbH
Th. Lindenkreuz , Robert Bosch GmbH
R. Stephan , Robert Bosch GmbH
pp. 567
Cecilia Metra , University of Bologna
Michele Favalli , University of Bologna
Bruno Riccó , University of Bologna
pp. 587
SESSION 25: DEFECT BEHAVIOR, TEST EFFICIENCY AND FAULT MODEL EXTENSION
Haluk Konuk , Hewlett-Packard Company
F. Joel Ferguson , University of California at Santa Cruz
pp. 597
M. Renovell , Universit? de Montpellier II
Y. Bertrand , Universit? de Montpellier II
pp. 607
Thomas Bartenstein , International Business Machines Corp.
Gilbert Vandling , International Business Machines Corp.
pp. 617
SESSION 26: MIXED-SIGNAL SEMINAR PANEL: ON-CHIP 1149.4, WHAT FOR?
SESSION 27: BOARD-LEVEL TEST METHODS
Mathieu GAGNON , ?cole Polytechnique de Montr?al
Bozena KAMINSKA , Opmaxx, Inc.
pp. 626
Jiun-Lang Huang , University of California at Santa Barbara
Kwang-Ting Cheng , University of California at Santa Barbara
pp. 640
SESSION 28: SOFTWARE FOR NEW TEST STRATEGIES
Pin Margin Analysis (Abstract)
Robert E. Huston , Credence Systems Corporation
pp. 655
Steve Westfall , Summit Design, Inc.
pp. 663
SESSION 29: DESIGN-FOR-TEST TOPICS
Richard McGowen , Intel Corporation
F. Joel Ferguson , University of California at Santa Cruz
pp. 685
Nilanjan Mukherjee , Lucent Technologies
Janusz Rajski , Mentor Graphics Corporation
Jerzy Tyszer , Poznali University of Technology
pp. 694
Sridhar Narayanan , Sun Microsystems Inc.
Ashutosh Das , Sun Microsystems Inc.
pp. 704
Subhasish Mitra , Stanford University
LaNae J. Avra , Stanford University
Edward J. McCluskey , Stanford University
pp. 714
SESSION 30: SEQUENTIAL ATPG
Elizabeth M. Rudnick , University of Illinois at Urbana-Champaign
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 723
M. H. Konijnenburg , Delft University of Technology
J.Th. van der Linden , Delft University of Technology
A. J. van de Goor , Delft University of Technology
pp. 733
Raghuram S. Tupuri , Advanced Micro devices
Jacob A. Abraham , University of Texas at Austin
pp. 743
Fulvio CORNO , Politecnico di Torino
Paolo PRINETTO , Politecnico di Torino
Matteo SONZA REORDA , Politecnico di Torino
pp. 753
SESSION 31: MIXED-SIGNAL SEMINAR: BIST/DFT
A. Frisch , Tektronix, Inc.
T. Almy , Tektronix, Inc.
pp. 760
Mani Soma , University of Washington
Thomas M. Bocek , Boeing Defense and Space Group
Tuyen D. Vu , Boeing Defense and Space Group
Jason D. Moffatt , Boeing Defense and Space Group
pp. 768
SESSION 32: TEST ENGINEERING TOPICS
Weiyu Chen , University of Southern California
Sandeep K. Gupta , University of Southern California
Melvin A. Breuer , University of Southern California
pp. 809
SESSION 33: TOOLS AND TECHNIQUES FOR DEFECT TESTING
Rajesh Raina , Motorola Inc.
Charles Njinda , Chromatic Research, Inc.
Robert Molyneaux , IBM Corporation
pp. 819
Ajay Khoche , Viewlogic Systems Inc.
Erik Brunvand , University of Utah
pp. 829
James P. Cusey , Dallas Semiconductor
Janak H. Patel , University of Illinois at Urbana-Champaign
pp. 838
SESSION 34: SPECIALIZED BIST GENERATORS
Seongmoon Wang , University of Southern California
Sandeep K. Gupta , University of Southern California
pp. 848
J. Li , University of Alberta Edmonton
X. Sun , University of Alberta Edmonton
K. Soon , University of Alberta Edmonton
pp. 858
Dimitris Gizopoulos , NCSR "Demokritos"
Antonis Paschalis , NCSR "Demokritos"
Yervant Zorian , LogicVision, Inc .
Mihalis Psarakis , NCSR "Demokritos"
pp. 868
SESSION 35: ADVANCES IN DIGITAL LOGIC DIAGNOSIS
David B. Lavo , University of California at Santa Cruz
Brian Chess , Hewlett-Packard Corp.
Tracy Larrabee , University of California at Santa Cruz
F. Joel Ferguson , University of California at Santa Cruz
Jayashree Saxena , Texas Instruments Inc.
Kenneth M. Butler , Texas Instruments Inc.
pp. 887
Janusz Rajski , Mentor Graphics Corporation
Jerzy Tyszer , Poznań University of Technology
pp. 894
SESSION 36: MIXED-SIGNAL SEMINAR: FAULT MODELING
R. Voorakaranam , Georgia Institute of Technology
S. Chakrabarti , Georgia Institute of Technology
J. Hou , Georgia Institute of Technology
A. Gomes , Georgia Institute of Technology
S. Cherubal , Georgia Institute of Technology
A. Chatterjee , Georgia Institute of Technology
W. Kao , Cadence Design Systems
pp. 903
Chen-Yang Pan , University of California at Santa Barbara
Kwang-Ting (Tim) Cheng , University of California at Santa Barbara
pp. 913
Abhijeet Kolpekwar , Carnegie Mellon University
R. D. (Shawn) Blanton , Carnegie Mellon University
pp. 923
SESSION 37: NEW FRONTIERS IN TEST
Mitch Aigner , Tektronix, Inc.
pp. 932
Yukiya Miura , Tokyo Metropolitan University
pp. 938
T. Savor , University of Waterloo
R. E. Seviora , University of Waterloo
pp. 948
SESSION 38: DESIGN VERIFICATION AND DIAGNOSIS
Shi-Yu Huang , National Semiconductor Corp.
Kwang-Ting Cheng , University of California at Santa Barbara
Kuang-Chien Chen , Fujitsu Labs. of America
David Ihsin Cheng , Exemplar Logic Inc.
pp. 974
SESSION 39: DELAY FAULT TESTING
Soumitra Bose , NEC USA
Vishwani D. Agrawal , Bell Labs, Lucent Technologies
Thomas G. Szymanski , Bell Labs, Lucent Technologies
pp. 982
Zhongcheng Li , University of California at Berkeley
Yinghua Min , Chinese Academy of Sciences
Robert K. Brayton , University of California at Berkeley
pp. 992
Tapan J. Chakraborty , Bell Labs, Lucent Technologies
Vishwani D. Agrawal , Bell Labs, Lucent Technologies
pp. 998
SESSION 40: TEST LANGUAGE STANDARDS
Peter Wohl , Advanced Test Technologies Inc.
John Waicukauski , Advanced Test Technologies Inc.
pp. 1011
SESSION 41: ADVANCES IN PROBE TECHNOLOGY
PANEL 2: PARTIAL SCAN IS DEAD. LONG LIVE ALMOST-FULL SCAN!
Jeff Rearick , Hewlett-Packard Company
pp. 1032
PANEL 3: ETHICS, PROFESSIONALISM, AND ACCOUNTABILITY — DOES IT EXIST IN TEST?
PANEL 4: VISION SYSTEMS FOR BOARD TEST: MEETING THEIR PROMISE?
PANEL 6: SO WHAT IS AN OPTIMAL TEST MIX? A DISCUSSION OF THE SEMATECH METHODS EXPERIMENT
Phil Nigh , IBM
Ken Butler , Texas Instruments
Peter Maxwell , Hewlett-Packard
Rob Aitken , Hewlett-Packard
Wojciech Maly , Carnegie Mellon University
pp. 1037
PANEL 7: EMBEDDED CORE TEST PLUG-N-PLAY: IS IT ACHIEVABLE?
Thomas L. Anderson , Phoenix Technologies Ltd.
pp. 1039
Rudy Garcia , Schlumberger Technologies,
pp. 1040
PANEL 8: ON-LINE TESTING, INDUSTRIAL PRACTICE AND PERSPECTIVES
BEST PAPER:
Anne Meixner , Intel Corporation
Jash Banik , Intel Corporation
pp. 1043
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