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International Test Conference 1997 (ITC'97)
Memory Test -- Debugging Test Vectors Without ATE
Washington D.C.
November 01-November 06
ISBN: 0-7803-4210-0
| ASCII Text | x | ||
| Steve Westfall, "Memory Test -- Debugging Test Vectors Without ATE," 2012 IEEE International Test Conference, pp. 663, International Test Conference 1997 (ITC'97), 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1997.639678, author = {Steve Westfall}, title = {Memory Test -- Debugging Test Vectors Without ATE}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1997}, issn = {1089-3539}, pages = {663}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1997.639678}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - Memory Test -- Debugging Test Vectors Without ATE SN - 1089-3539 SP EP A1 - Steve Westfall, PY - 1997 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
A method for debugging functional production test vectors for memory devices without the use of Automated Test Equipment (ATE) is presented. The method described involves the use of a digital simulation environment; a reactive Hardware Description Language (HDL) ATE model; and ATE rules checking. The method allows for rapidly debugging vectors and test program flows without requiring the use of ATE resources.
Citation:
Steve Westfall, "Memory Test -- Debugging Test Vectors Without ATE," itc, pp.663, International Test Conference 1997 (ITC'97), 1997
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