|
| This Article | ||
| ||
| Share | ||
| Bibliographic References | ||
| Add to: | ||
 Digg  Furl  Spurl  Blink  Simpy  Google  Del.icio.us  Y!MyWeb | ||
| Search | ||
| ||
International Test Conference 1997 (ITC'97)
Pin Margin Analysis
Washington D.C.
November 01-November 06
ISBN: 0-7803-4210-0
| ASCII Text | x | ||
| Robert E. Huston, "Pin Margin Analysis," 2012 IEEE International Test Conference, pp. 655, International Test Conference 1997 (ITC'97), 1997. | |||
| BibTex | x | ||
| @article{ 10.1109/TEST.1997.639677, author = {Robert E. Huston}, title = {Pin Margin Analysis}, journal ={2012 IEEE International Test Conference}, volume = {0}, year = {1997}, issn = {1089-3539}, pages = {655}, doi = {http://doi.ieeecomputersociety.org/10.1109/TEST.1997.639677}, publisher = {IEEE Computer Society}, address = {Los Alamitos, CA, USA}, } | |||
| RefWorks Procite/RefMan/Endnote | x | ||
| TY - CONF JO - 2012 IEEE International Test Conference TI - Pin Margin Analysis SN - 1089-3539 SP EP A1 - Robert E. Huston, PY - 1997 KW - null VL - 0 JA - 2012 IEEE International Test Conference ER - | |||
A method and tool is described to increase test program standards and lower program maintenance cost through Pin Margin Analysis. Exposure of DUT and ATE characteristics during test program operation will lead to maximizing test margins.
Citation:
Robert E. Huston, "Pin Margin Analysis," itc, pp.655, International Test Conference 1997 (ITC'97), 1997
Usage of this product signifies your acceptance of the Terms of Use.